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Architecture de communication générique pour un système de bus du commerce électroniqueTagmouti, Siham January 2003 (has links)
Mémoire numérisé par la Direction des bibliothèques de l'Université de Montréal.
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Network information discovery and structural optimization in the WOS's context by using distributed algorithmsYuen, Sai Ho January 2002 (has links)
Mémoire numérisé par la Direction des bibliothèques de l'Université de Montréal.
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人文社會科學引文索引資料庫之系統結構與欄位設計研究 / The structure and field description of humanity and social science citation database research林佳怡, Lin, Chia Yi Unknown Date (has links)
本研究旨在針對WoS、Scopus、CSSCI、CCD、TSSCI、THCI與ACI等七個引文索引資料庫,觀察與統計現有引文索引資料庫之系統文獻來源、查詢功能、索引欄位、輸出欄位、引文分析功能及其檢索結果分析與個人化功能等,藉此瞭解現有引文索引資料庫之現況與不足之處,並輔以資料庫使用者、圖書館館員以及資料庫建置專家之訪談,瞭解建置人文社會科學引文索引資料庫之阻礙、後續維護管理問題、推廣問題以及與國際接軌之建議作法,進而對人文社會科學引文索引資料庫的建置提出建議。
本研究結果歸納如下:(1)系統文獻來源為綜合性較佳,較能建構出較完整的引文網路。(2)查詢功能、索引欄位、輸出欄位、引文分析、檢索結果分析與個人化功能宜參考WoS、Scopus與CCD三個建置較齊全之資料庫,提供使用者較全面的系統功能。(3)建置阻礙包括參考文獻引文格式的差異問題、拖刊問題、選刊問題、建檔的人力與資源問題、以及名稱的權威檔等問題。(4)後續維護管理問題包括人力與經費、資料庫的推廣、資料庫所採取的營運模式問題、資料的來源問題、以及引文資料的建檔問題。(5)若欲推廣資料庫,必須建置功能及內容完整之資料庫,讓使用者感受到資料庫的查詢具有引文網路的架構。(6)資料庫在建置時就須參考國外資料庫在處理引文資料庫時所注重的重點,例如各項索引與輸出欄位等,將來與國外接軌或合併的可行性才有可能提高。
本研究結果可供期刊出版商提升自我品質之參考,亦可對建置人文社會科學引文索引資料庫各項系統功能提出建置建議,希冀有朝一日能建置出媲美國外大型引文索引資料庫的臺灣人文社會科學引文索引資料庫。 / Citation index databases have been explored and made impact on academic research for several decades. The Web of Science (WOS) of Thomson Reuters ISI is one of the most well-known citation databases in the world, and the Scopus of Elsevier is also a famous citation databases. In addition, the Mainland China has also developed Chinese Social Sciences Citation Index (CSSCI) database and Chinese Citation Database (CCD) since recent twenty years. Under the sponsorship of the National Science Council in Taiwan, the Taiwan Social Science Research Center established the Taiwan Social Sciences Citation Index (TSSCI) database in 1996 and the Center for Humanities Research built up Taiwan Humanities Citation Index (THCI) database in 1999. On the other hand, Airiti Incorporation has developed Academic Citation Index (ACI). However, the application of TSSCI, THCI and ACI reveals many design flaws and use limitations for both databases, some search functions are different and not available, and it is therefore difficult for users to get information through the same search interface. It is truly important to construct an integrate citation index database for Taiwan humanity and social science researchers. Working with an information service company, the purpose of the present study is to propose a design plan to establish a Taiwan humanity and social science citation
database.
The following issues will be investigated in this study: 1. Collecting source literature and citation literature from humanity and social science journals publishing by Taiwan academic institutes. 2. Designing the structure of citation index system, types and contents of the database. 3. Setting up the standards for description on database fields. 4. Developing the basic, advanced and other information retrieval functions. 5. Seeking for the integration with WoS to fulfill the goal of information resources sharing and the promotion of global visualization. 6. Building the quantitative indicator for evaluating the humanity and social science research.
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Contamination des wafers et de l'atmosphère des salles blanches de la micro-électronique : développement analytique et étude in-situ / Contamination of wafers and the atmosphere of microelectronic clean rooms : analytical development and field studyHayeck, Nathalie 10 September 2015 (has links)
La miniaturisation et la complexification croissante des composants microélectroniques induit une sensibilisation et une fragilisation accrue des composants vis-à-vis des contaminations présentes dans les zones de productions appelées “salles blanches”. Dans ces espaces, le contrôle actuel de la contamination organique n’est pas suffisant puisqu’il ne permet pas d’éviter la contamination de surface des plaquettes de silicium et des optiques des robots de production utilisés pour la photolithographie. Un contrôle accru des concentrations des contaminants organiques dans les atmosphères des salles blanches devient donc nécessaire et de nouvelles méthodes analytiques doivent être développées et validées. Dans le cadre de ce travail, des méthodes d’analyse ont été développées et validées afin de disposer d’une gamme d’outils permettant un suivi rigoureux des contaminations. Ces outils permettent d’identifier et de quantifier les contaminations surfaciques des plaquettes de silicium par des composés organiques semi-volatils (phtalates et organophosphorés) mais aussi de déterminer les concentrations de composés organiques volatils présents dans l’atmosphère des salles blanches. Ces méthodes font appel aux technologies du WOS/ATD-GC-MS « Wafer Outgassing System/Automated Thermal Desorber–Gas Chromatography–Mass Spectrometry » et de la DART-ToF-MS « Direct Analysis in Real Time-Time of Flight–Mass Spectrometry » pour les analyses de surfaces et au PTR-ToF-MS « Proton Transfer Reaction – Time of Flight - Mass Spectrometry » pour l’analyse de l’atmosphère. / The recent advances in the miniaturization and complexification of microelectronic components induce an increase in the sensitivity of these components regarding the organic contamination present in the production zone called “clean room”. Although, the control of organic contamination in the clean room is very rigorous it does not avoid the contamination of silicon wafer surfaces and robot lenses used in the photolithography process. The later implies that new analytical methodologies should be developed and validated. In this work, analytical methods were developed and validated in order to have a panel of tools which allows careful monitoring of organic contaminants. These tools allow the identification and quantitation of the contamination of silicon wafer surface by semi-volatiles organic compounds (phthalates and organophosphates) and the determination of volatile organic compounds concentrations in the clean room atmosphere. These methods uses the WOS/ATD-GC-MS « Wafer Outgassing System/Automated Thermal Desorber–Gas Chromatography–Mass Spectrometry » technology and the DART-ToF-MS « Direct Analysis in Real Time-Time of Flight–Mass Spectrometry » technology for wafer surface analysis and the PTR-ToF-MS « Proton Transfer Reaction – Time of Flight - Mass Spectrometry » technology for gas-phase analysis.
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