De nos jours, les mémoires embarquées sont les composants les plus denses dans les "System-On-Chips" (SOCs), représentant actuellement plus que 90% de leur superficie totale. Parmi les différents types de mémoires, les SRAMs sont très largement utilisées dans la conception des SOCs, particulièrement en raison de leur haute performance et haute densité d'intégration. En revanche, les SRAMs conçues en utilisant des technologies submicroniques sont devenus les principaux contributeurs de la consommation d'énergie globale des SOCs. Par conséquent, un effort élevé est actuellement consacré à la conception des SRAMs à faible consommation. En plus, en raison de leur structure dense, les SRAMs sont devenus de plus en plus susceptibles aux défauts physiques comparativement aux autres blocs du circuit, notamment dans les technologies les plus récentes. Par conséquent, les SRAMs se posent actuellement comme le principal détracteur du rendement des SOCs, ce qui cause la nécessité de développer des solutions de test efficaces ciblant ces dispositifs.Dans cette thèse, des simulations électriques ont été réalisées pour prédire les comportements fautifs causés par des défauts réalistes affectant les blocs de circuits spécifiques aux technologies SRAM faible consommation. Selon les comportements fautifs identifiés, différents tests fonctionnels, ainsi que des solutions de tests matériels, ont été proposés pour détecter les défauts étudiés. Par ailleurs, ce travail démontre que les circuits d'écriture et lecture, couramment incorporés dans les SRAMs faible consommation, peuvent être réutilisés pour augmenter le stress dans les SRAMs lors du test, ce qui permet d'améliorer la détection des défauts affectant la mémoire. / Nowadays, embedded memories are the densest components within System-On-Chips (SOCs), accounting for more than 90% of the overall SOC area. Among different types of memories, SRAMs are still widely used for realizing complex SOCs, especially because they allow high access performance, high density and fast integration in CMOS designs. On the other hand, high density SRAMs designed with deep-submicrometer technologies have become the main contributor to the overall SOC power consumption. Hence, there is an increasing need to design low-power SRAMs, which embed mechanisms to reduce their power consumption. Moreover, due to their dense structure, SRAMs are more are more prone to defects compared to other circuit blocks, especially in recent technologies. Hence, SRAMs are arising as the main SOC yield detractor, which raises the need to develop efficient test solutions targeting such devices.In this thesis, failure analysis based on electrical simulations has been exploited to predict faulty behaviors caused by realistic defects affecting circuit blocks that are specific to low-power SRAMs, such as power gating mechanisms and voltage regulation systems. Based on identified faulty behaviors, efficient March tests and low area overhead design for testability schemes have been proposed to detect studied defects. Moreover, the reuse of read and write assist circuits, which are commonly embedded in low-power SRAMs, has been evaluated as an alternative to increase stress in the SRAM during test phase and then improve the defect coverage.

Submitted by PPG Ci?ncia da Computa??o (ppgcc@pucrs.br) on 2018-06-15T14:23:09Z No. of bitstreams: 1 LEONARDO REZENDE JURACY_DIS.pdf: 2268947 bytes, checksum: bedc63f7c14296e039a798403cdeec80 (MD5) / Approved for entry into archive by Sheila Dias (sheila.dias@pucrs.br) on 2018-06-26T12:27:11Z (GMT) No. of bitstreams: 1 LEONARDO REZENDE JURACY_DIS.pdf: 2268947 bytes, checksum: bedc63f7c14296e039a798403cdeec80 (MD5) / Made available in DSpace on 2018-06-26T12:45:06Z (GMT). No. of bitstreams: 1 LEONARDO REZENDE JURACY_DIS.pdf: 2268947 bytes, checksum: bedc63f7c14296e039a798403cdeec80 (MD5) Previous issue date: 2018-03-21 / Atualmente, a abordagem s?ncrona ? a mais utilizada em projeto de circuitos integrados por ser altamente automatizado pelas ferramentas comerciais e por incorporar margens de tempo para garantir o funcionamento correto nos piores cen?rios de varia??es de processo e ambiente, limitando otimiza??es no per?odo do rel?gio e aumentando o consumo de pot?ncia. Por um lado, circuitos ass?ncronos apresentam algumas vantagens em potencial quando comparados com os circuitos s?ncronos, como menor consumo de pot?ncia e maior vaz?o de dados, mas tamb?m podem sofrer com varia??es de processo e ambiente. Por outro lado, circuitos resilientes s?o uma alternativa para manter o circuito funcionando na presen?a de efeitos de varia??o. Sendo assim, foi proposto o circuito Blade que combina as vantagens de circuitos ass?ncronos com circuitos resilientes. Blade utiliza latches em sua implementa??o e mant?m seu desempenho em cen?rios de caso m?dio. Independentemente do estilo de projeto (s?ncrono ou ass?ncrono), durante o processo de fabrica??o de circuitos integrados, algumas imperfei??es podem acontecer, causando defeitos que reduzem o rendimento de fabrica??o. Circuitos defeituosos podem apresentar um comportamento falho, gerando uma sa?da diferente da esperada, devendo ser identificados antes de sua comercializa??o. Metodologias de teste podem ajudar na identifica??o e diagn?stico desse comportamento falho. Projeto visando testabilidade (do ingl?s, Design for Testability - DfT) aumenta a testabilidade do circuito adicionando um grau de controlabilidade e observabilidade atrav?s de diferentes t?cnicas. Scan ? uma t?cnica de DfT que fornece para um equipamento de teste externo acesso aos elementos de mem?ria internos do circuito, permitindo inser??o de padr?es de teste e compara??o da resposta. O objetivo deste trabalho ? propor uma abordagem de DfT estrutural, completamente autom?tica e integrada com as ferramentas comerciais de projeto de circuitos, incluindo uma s?rie de m?todos para lidar com os desafios relacionados ao teste de circuitos ass?ncronos e resilientes, com foco no Blade. O fluxo de DfT proposto ? avaliado usando um m?dulo criptogr?fico e um microprocessador. Os resultados obtidos para o m?dulo criptogr?fico mostram uma cobertura de falha de 98,17% para falhas do tipo stuck-at e 89,37% para falhas do tipo path-delay, com um acr?scimo de ?rea de 112,16%. Os resultados obtidos para o microprocessador mostram uma cobertura de 96,04% para falhas do tipo stuck-at e 99,00% para falhas do tipo path-delay, com um acr?scimo de ?rea de 50,57%. / Nowadays, the synchronous circuits design approach is the most used design method since it is highly automated by commercial computer-aided design (CAD) tools. Synchronous designs incorporate timing margins to ensure the correct behavior under the worstcase scenario of process and environmental variations, limiting its clock period optimization and increasing power consumption. On one hand, asynchronous designs present some potential advantages when compared to synchronous ones, such as less power consumption and more data throughput, but they may also suffer with the process and environmental variations. On the other hand, resilient circuits techniques are an alternative to keep the design working in presence of effects of variability. Thus, Blade template has been proposed, combining the advantages of both asynchronous and resilient circuits. The Blade template employs latches in its implementation and supports average-case circuit performance. Independently of the design style (synchronous or asynchronous), during the fabrication process of integrated circuits, some imperfections can occur, causing defects that reduce the fabrication yield. These defective ICs can present a faulty behavior, which produces an output different from the expected, and it must be identified before the circuit commercialization. Test methodologies help to find and diagnose this faulty behavior. Design for Testability (DfT) increases circuit testability by adding a degree of controllability and observability through different test techniques. Scan design is a DfT technique that provides for an external test equipment the access to the internal memory elements of a circuit, allowing test pattern insertion and response comparison. The goal of this work is to propose a fully integrated and automated structural DfT approach using commercial EDA tools and to propose a series of design methods to address the challenges related to testing asynchronous and resilient designs, with focus on Blade template. The proposed DfT flow is evaluated with a criptocore module and a microprocessor. The obtained results for the criptocore module show a fault coverage of 98.17% for stuck-at fault model and 89.37% for path-delay fault model, with an area overhead of 112.16%. The obtained results for the microprocessor show a fault coverage of 96.04% for stuck-at fault model and 99.00% for path-delay fault model, with an area overhead of 50.57%.

The 21st century is considered as the era of mass communication and electronic information exchange. There is a dramatic increase in electronic communications and e-transactions worldwide. However, this advancement results in the appearance of many security issues, especially when the exchanged information is sensitive and/or confidential. A significant aspect of security is authentication, which in most of the cases is provided through a cryptographic hash function. As happens for the majority of security primitives, software design and implementation of hash functions is becoming more prevalent today. However, hardware is the embodiment of choice for military and safety-critical commercial applications due to the physical protection and increased performance that they offer. Hence, similarly to general hardware designs, regarding cryptographic hash function ones, three crucial issues, among others, arise: performance, reliability, and flexibility. In this PhD dissertation, hardware solutions regarding cryptographic hash functions, addressing the aforementionted three crucial issues are proposed. Specifically, a design methodology for developing high-throughput and area-efficient sole hardware architectures of the most widely-used cryptographic hash families, i.e. the SHA-1 and SHA-2, is proposed. This methodology incorporates several algorithmic-, system-, and circuit-level techniques in an efficient, recursive way, exploiting the changes in the design’s graph dependencies that are resulted by a technique’s application. Additionally, high-throughput and area-efficient hardware designs for the above families as well as new ones (e.g. JH and Skein), are also proposed. These architectures outperform significantly all the similar ones existing in the literature. Furthermore, a design methodology for developing Totally Self-Checking (TSC) architectures of the most widely-used cryptographic hash families, namely the SHA-1 and SHA-2 ones is proposed for the first time. As any RTL architecture for the above hash families is composed by similar functional blocks, the proposed methodology is general and can be applied to any RTL architecture of the SHA-1 and SHA-2 families. Based on the above methodology, TSC architectures of the two representatice hash functions, i.e. SHA-1 and SHA-256, are provided, which are significantlty more efficient in terms of Throughput/Area, Area, and Power than the corresponding ones that are derived using only hardware redundancy. Moreover, a design methodology for developing hardware architectures that realize more than one cryptographic hash function (mutli-mode architectures) with reasonable throughput and area penalty is proposed. Due to the fact that any architecture for the above hash families is composed by similar functional blocks, the proposed methodology can be applied to any RTL architecture of the SHA-1 and SHA-2 families. The flow exploits specific features appeared in SHA-1 and SHA-2 families and for that reason it is tailored to produce optimized multi-mode architectures for them. Based on the above methodology, two multi-mode architectures, namely a SHA256/512 and a SHA1/256/512, are introduced. They achieve high throughput rates, outperforming all the existing similar ones in terms of throughput/area cost factor. At the same time, they are area-efficient. Specifically, they occupy less area compared to the corresponding architectures that are derived by simply designing the sole hash cores together and feeding them to a commercial FPGA synthesis/P&R/mapping tool. Finally, the extracted knowledge from the above research activities was exploited in three additional works that deal with: (a) a data locality methodology for matrix–matrix multiplication, (b) a methodology for Speeding-Up Fast Fourier Transform focusing on memory architecture utilization, and (c) a near-optimal microprocessor & accelerators co-design with latency & throughput constraints. / Ο 21ος αιώνας θεωρείται η εποχή της μαζικής επικοινωνίας και της ηλεκτρονικής πληροφορίας. Υπάρχει μία δραματική αύξηση των τηλεπικοινωνιών και των ηλεκτρονικών συναλλαγών σε όλο τον κόσμο. Αυτές οι ηλεκτρονικές επικοινωνίες και συναλλαγές ποικίλουν από αποστολή και λήψη πακέτων δεδομένων μέσω του Διαδικτύου ή αποθήκευση πολυμεσικών δεδομένων, έως και κρίσιμες οικονομικές ή/και στρατιωτικές υπηρεσίες. Όμως, αυτή η εξέλιξη αναδεικνύει την ανάγκη για περισσότερη ασφάλεια, ιδιαίτερα στις περιπτώσεις όπου οι πληροφορίες που ανταλλάσονται αφορούν ευαίσθητα ή/και εμπιστευτικά δεδομένα. Σε αυτές τις περιπτώσεις, η ασφάλεια θεωρείται αναπόσπαστο χαρακτηριστικό των εμπλεκομένων εφαρμογών και συστημάτων. Οι συναρτήσεις κατακερματισμού παίζουν έναν πολύ σημαντικό ρόλο στον τομέα της ασφάλειας και, όπως συμβαίνει στην πλειοψηφία των βασικών αλγορίθμων ασφαλείας, οι υλοποιήσεις σε λογισμικό (software) επικρατούν στις μέρες μας. Παρόλα αυτά, οι υλοποιήσεις σε υλικό (hardware) είναι η κύρια επιλογή οσον αφορά στρατιωτικές εφαρμογές και εμπορικές εφαρμογές κρίσιμης ασφάλειας. Η NSA, για παράδειγμα, εξουσιοδοτεί μόνο υλοποιήσεις σε υλικό. Αυτό γιατί οι υλοποιήσεις σε υλικό είναι πολύ γρηγορότερες από τις αντίστοιχες σε λογισμικό, ενώ προσφέρουν και υψηλά επίπεδα «φυσικής» ασφάλειας λόγω κατασκευής. Έτσι, όσον αφορά τις κρυπτογραφικές συναρτήσεις κατακερματισμού, όπως ίσχυει γενικά στις υλοποιήσεις υλικού, ανακύπτουν τρία (ανάμεσα σε άλλα) κύρια θέματα: Επιδόσεις, Αξιοπιστία, Ευελιξία. Σκοπός της παρούσας διατριβής είναι να παράσχει λύσεις υλοποίησης σε υλικό για κρυπτογραφικές συναρτήσεις κατακερματισμού, στοχεύοντας στα τρία κύρια ζητήματα που αφορούν υλοποιήσεις σε υλικό, τα οποία και προαναφέρθηκαν (Επιδόσεις, Αξιοπιστία, Ευελιξία). Συγκεκριμένα, προτείνονται μεθοδολογίες σχεδιασμού αρχιτεκτονικών υλικού (καθώς και οι αρχιτεκτονικές αυτές καθαυτές) για τις οικογένειες SHA-1 και SHA-2 οι οποίες επιτυγχάνουν υψηλή ρυθμαπόδοση με λογική αύξηση της επιφάνειας ολοκλήρωσης. Επίσης, προτείνονται αρχιτεκτονικές οι οποίες επιτυγχάνουν υψηλή ρυθμαπόδοση με λογική αύξηση της επιφάνειας ολοκλήρωσης για νέες κρυπτογραφικές συναρτήσεις, δηλαδή για τις JH και Skein. Ακόμα, προτείνονται μεθοδολογίες σχεδιασμού αρχιτεκτονικών υλικού (καθώς και οι αρχιτεκτονικές αυτές καθαυτές) για τις οικογένειες SHA-1 και SHA-2 οι οποίες έχουν τη δυνατότητα να ανιχνέυουν πιθανά λάθη κατά τη λειτουργία τους ενώ επιτυγχάνουν υψηλή ρυθμαπόδοση με λογική αύξηση της επιφάνειας ολοκλήρωσης. Τέλος, προτείνονται μεθοδολογίες σχεδιασμού πολύ-τροπων αρχιτεκτονικών υλικού (καθώς και οι αρχιτεκτονικές αυτές καθ’αυτές) για τις οικογένειες SHA-1 και SHA-2 οι οποίες έχουν τη δυνατότητα να υποστηρίξουν παραπάνω από μία συνάρτηση ενώ επιτυγχάνουν υψηλή ρυθμαπόδοση με λογική αύξηση της επιφάνειας ολοκλήρωσης.

Submitted by PPG Ci?ncia da Computa??o (ppgcc@pucrs.br) on 2018-05-21T13:19:36Z No. of bitstreams: 1 FELIPE_AUGUSTO_KUENTZER_TES.pdf: 3277301 bytes, checksum: 7e77c5eb72299302d091329bde56b953 (MD5) / Approved for entry into archive by Sheila Dias (sheila.dias@pucrs.br) on 2018-06-01T12:13:22Z (GMT) No. of bitstreams: 1 FELIPE_AUGUSTO_KUENTZER_TES.pdf: 3277301 bytes, checksum: 7e77c5eb72299302d091329bde56b953 (MD5) / Made available in DSpace on 2018-06-01T12:33:57Z (GMT). No. of bitstreams: 1 FELIPE_AUGUSTO_KUENTZER_TES.pdf: 3277301 bytes, checksum: 7e77c5eb72299302d091329bde56b953 (MD5) Previous issue date: 2018-03-28 / ? medida que o projeto de VLSI avan?a para tecnologias ultra submicron, as margens de atraso adicionadas para compensar variabilidades de processo de fabrica??o, temperatura de opera??o e tens?o de alimenta??o, tornam-se uma parte significativa do per?odo de rel?gio em circuitos s?ncronos tradicionais. As arquiteturas resilientes a varia??es de atraso surgiram como uma solu??o promissora para aliviar essas margens de tempo projetadas para o pior caso, melhorando o desempenho do sistema e reduzindo o consumo de energia. Essas arquiteturas incorporam circuitos adicionais para detec??o e recupera??o de viola??es de atraso que podem surgir ao projetar o circuito com margens de tempo menores. Os sistemas ass?ncronos apresentam potencial para melhorar a efici?ncia energ?tica e o desempenho devido ? aus?ncia de um sinal de rel?gio global. Al?m disso, os circuitos ass?ncronos s?o conhecidos por serem robustos a varia??es de processo, tens?o e temperatura. Blade ? um modelo que incorpora as vantagens de projeto ass?ncrono e resilientes a varia??es de atraso. No entanto, o Blade ainda apresenta desafios em rela??o ? sua testabilidade, o que dificulta sua aplica??o comercial ou em larga escala. Embora o projeto visando testabilidade com Scan seja amplamente utilizado na ind?stria, os altos custos de sil?cio associados com o seu uso no Blade podem ser proibitivos. Por outro lado, os circuitos ass?ncronos podem apresentar vantagens para testes funcionais, enquanto o circuito resiliente fornece feedback cont?nuo durante o funcionamento normal do circuito, uma caracter?stica que pode ser aplicada para testes concorrentes. Nesta Tese, a testabilidade do Blade ? avaliada sob uma perspectiva diferente, onde o circuito implementado com o Blade apresenta propriedades de confiabilidade que podem ser exploradas para testes. Inicialmente, um m?todo de classifica??o de falhas que relaciona padr?es comportamentais com falhas estruturais dentro da l?gica de detec??o de erro e uma nova implementa??o orientada para teste desse m?dulo de detec??o s?o propostos. A parte de controle ? analisada para falhas internas, e um novo projeto ? proposto, onde o teste ? melhorado e o circuito pode ser otimizado pelo fluxo de projeto. Um m?todo original de medi??o de tempo das linhas de atraso tamb?m ? abordado. Finalmente, o teste de falhas de atrasos em caminhos cr?ticos do caminho de dados ? explorado como uma consequ?ncia natural de um circuito implementado com Blade, onde o monitoramento cont?nuo para detec??o de viola??es de atraso fornece a informa??o necess?ria para a detec??o concorrente de viola??es que extrapolam a capacidade de recupera??o do circuito resiliente. A integra??o de todas as contribui??es fornece uma cobertura de falha satisfat?ria para um custo de ?rea que, para os circuitos avaliados nesta Tese, pode variar de 4,24% a 6,87%, enquanto que a abordagem Scan para os mesmos circuitos apresenta custo que varia de 50,19% a 112,70% em ?rea, respectivamente. As contribui??es desta Tese demonstraram que, com algumas melhorias na arquitetura do Blade, ? poss?vel expandir sua confiabilidade para al?m de um sistema de toler?ncia a viola??es de atraso no caminho de dados, e tamb?m um avan?o para teste de falhas (inclusive falhas online) de todo o circuito, bem como melhorar seu rendimento, e lidar com quest?es de envelhecimento. / As the VLSI design moves into ultra-deep-submicron technologies, timing margins added due to variabilities in the manufacturing process, operation temperature and supply voltage become a significant part of the clock period in traditional synchronous circuits. Timing resilient architectures emerged as a promising solution to alleviate these worst-case timing margins, improving system performance and/or reducing energy consumption. These architectures embed additional circuits for detecting and recovering from timing violations that may arise after designing the circuit with reduced time margins. Asynchronous systems, on the other hand, have a potential to improve energy efficiency and performance due to the absence of a global clock. Moreover, asynchronous circuits are known to be robust to process, voltage and temperature variations. Blade is an asynchronous timing resilient template that leverages the advantages of both asynchronous and timing resilient techniques. However, Blade still presents challenges regarding its testability, which hinders its commercial or large-scale application. Although the design for testability with scan chains is widely applied in the industry, the high silicon costs associated with its use in Blade can be prohibitive. Asynchronous circuits can also present advantages for functional testing, and the timing resilient characteristic provides continuous feedback during normal circuit operation, which can be applied for concurrent testing. In this Thesis, Blade?s testability is evaluated from a different perspective, where circuits implemented with Blade present reliability properties that can be explored for stuck-at and delay faults testing. Initially, a fault classification method that relates behavioral patterns with structural faults inside the error detection logic and a new test-driven implementation of this detection module are proposed. The control part is analyzed for internal faults, and a new design is proposed, where the test coverage is improved and the circuit can be further optimized by the design flow. An original method for time measuring delay lines is also addressed. Finally, delay fault testing of critical paths in the data path is explored as a natural consequence of a Blade circuit, where the continuous monitoring for detecting timing violations provide the necessary feedback for online detection of these delay faults. The integration of all the contributions provides a satisfactory fault coverage for an area overhead that, for the evaluated circuits in this thesis, can vary from 4.24% to 6.87%, while the scan approach for the same circuits implies an area overhead varying from 50.19% to 112.70%, respectively. The contributions of this Thesis demonstrated that with a few improvements in the Blade architecture it is possible to expand its reliability beyond a timing resilient system to delay violations in the data path, but also advances for fault testing (including online faults) of the entire circuit, yield, and aging.

A circuit testing nowadays is expensive and complex process. That’s why circuits testing, errors finding and fixing require more and more investments. One of possible ways of reducing cost and speed up testing process is increasing controllability and observability of circuits. It takes a lot of time to find out circuit’s controllability and observability that’s why that process have to be computerized. For that purpose was decided to create software which will be helpful for circuit designers in that process. As a result it will help designers in making design for testability schemes. Research and training action for system on chip using internet software is dedicated for users that have C/C++ system on chip code from every place in the world, using only web browser, would be able put that code in to the server, test it and retrieve it‘s observability results in text and visual modes and also increase system’s on chip observability level. And as well review and get acquainted with systems on chip that are already on the server and are stored on it. Software architecture uses client-server mode. All computations are performed on a server side. System is realized on Apache server with Linux OS. System modules are realized using HTML, JAVA, PHP, JavaScript, C++ and CGI programming languages. Web page is working independent from users OS, user needs only web browser (Internet Explorer not older than 3.0 ver., Opera not older than 6.0 ver., Netscape Navigator not older... [to full text]

Ο όγκος των δεδομένων που απαιτούνται για τον έλεγχο της ορθής λειτουργίας ενός συστήματος που υλοποιείται σε ένα ολοκληρωμένο κύκλωμα είναι πάρα πολύ μεγάλος. Αυτό συνεπάγεται ότι ο χρόνος που απαιτείται για τον έλεγχο της ορθής λειτουργίας του ολοκληρωμένου κυκλώματος μπορεί να είναι απαγορευτικά μεγάλος. Για τη μείωση του απαιτούμενου χρόνου χρησιμοποιούνται διάφορες τεχνικές συμπίεσης των δεδομένων δοκιμής. Κάποιες από αυτές τις τεχνικές βασίζονται στην αποστολή κοινών δεδομένων δοκιμής ταυτόχρονα σε περισσότερες από μία μονάδες του ολοκληρωμένου κυκλώματος. Στην εργασία αυτή υλοποιούμε μια από αυτές τις τεχνικές που βασίζεται στην ύπαρξη μονοπατιών ολίσθησης (scan paths) στις μονάδες του ολοκληρωμένου κυκλώματος. Για την περαιτέρω μείωση του χρόνου που απαιτείται για τον έλεγχο της ορθής λειτουργίας του ολοκληρωμένου κυκλώματος γίνεται χρονοπρογραμματισμός της σειράς με την οποία θα ελεγχθεί η ορθή λειτουργία των διαφόρων μονάδων του ολοκληρωμένου κυκλώματος. / The volume of data that is required to test a SoC is too much big. This means that the time that is required for testing can be prohibitorily big. For the reduction of required time are used various techniques of data compaction.Some of these techniques are based on broadcasting the same value to all of the cores on a SoC.In this work we use one of these techniques that are based on the existence of scan chains in the core (broadcast scan).For further reduction of time that is required for testing a circuit we use a core testing schedule algorithm.

This study explores the possibilities for reducing the number of pins needed for scan mode interface. In the first part of this paper the existing solutions and methods that are usable for this purpose are described. Specific four pin, three pin, two pin, one pin and zero pin interfaces are designed in second part. Advantages and disadvantages of existing solutions and methods as well as designed and proposed interface are summarized in the conclusion.

Práce se zabývá metodami pro testování lineárních analogových obvodů v kmitočtové oblasti. Cílem je navrhnout efektivní metody pro automatické generování testovacího plánu. Snížením počtu měření a výpočetní náročnosti lze výrazně snížit náklady za testování. Práce se zabývá multifrekveční parametrickou poruchovou analýzou, která byla plně implementována do programu Matlab. Vhodnou volbou testovacích kmitočtů lze potlačit chyby měření a chyby způsobené výrobními tolerancemi obvodových prvků. Navržené metody pro optimální volbu kmitočtů byly statisticky ověřeny metodou MonteCarlo. Pro zvýšení přesnosti a snížení výpočetní náročnosti poruchové analýzy byly vyvinuty postupy založené na metodě nejmenších čtverců a přibližné symbolické analýze.