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In-process stress analysis of flip chip assemblies during underfill cure and environmental stress testingPalaniappan, Prema 08 1900 (has links)
No description available.
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Thermal management in 3D packagingRavinuthala, Sridhar. January 2008 (has links)
Thesis (M.S.)--State University of New York at Binghamton, Thomas J. Watson School of Engineering and Applied Science, Department of Mechanical Engineering, 2008. / Includes bibliographical references.
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A Non-Contact Measurement Technique At The Micro ScaleGhosh, Santaneel January 2005 (has links)
During their production and normal use, electronic packages experience large temperature excursions, leading to high thermo-mechanical stress gradients that cause fatigue failure of the solder joints. In order to prevent premature failure and prolong the fatigue life of solder joints, there is a pressing need for the characterization of the solder, especially lead-free solder, at the micro-level (joint size). The characterization and modeling of solder behavior at the appropriate scale is a major issue. However, direct measurement techniques are not applicable to characterize the deformation response of solder joints because of their micro scale dimensions. Therefore, a non-contact measurement technique utilizing a Scanning Electron Microscope (SEM) in conjunction with Digital Image Correlation (DIC) has been developed. Validation was achieved by performing a four-point bending test in both an in-house optical system with DIC and inside the SEM. This non-contact measurement technique was then used to extract the stress-strain response of the solder. Mechanical tests were performed on solder joints that were created using the same type of solder balls used in the electronic industry and were representative of normal joint scales. The SEM-DIC technique has been proven to be applicable for the determining the stress-strain response of solder material at the micro-scale.This study resulted in a validated material characterization technique specifically designed for micro-scale material response. One of the main contributions of this study is that the method is a lot simpler and cheaper, yet highly effective, compared to the previous methods. This technique is also readily applicable to the measurement of the stress-strain response of any micro-scale specimen, such as other metals, polymers, etc. Also, the measured displacement field by obtained by DIC can be used as the base for calculating the strain field on the surface of a specimen.
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The design and implementation of a flexible manufacturing system for a surface mounting production lineChodos, Mark, Steven January 1990 (has links)
A project report submitted to the Faculty of Engineering,
University of the Witwatersrand, Johannesburg, in partial
fulfillment of the requirements for the degree of Master of
Science in Engineering. / The viability of introducing a Surface Mount
production line is chiefly determined by the
reliability characteristics of the components being
used. Surface Mount Technology (SMT) is entirely new
and although related to traditional through-hole
processes, requires different components, assembly
techniques and design methods. The purpose of the
literature survey is primarily to determine whether
surface mount components meet today's industrial
requirements with respect to their manufacturing
reliability and availability. A brief review of the
evolution of SMT is also presented. This study finds
that the implementation of SMT should be given highest
priority by manufacturing companies in order to
maintain their share of the marketplace.
Surface Mount Technology embodies a totally new
automated circuit assembly process, using a new
generation of electronic comporents: surface mounted
devices (SMDs). Smaller than conventional components,
SMDs are placed onto the surface of the substrate.
From this, the fundamental difference between SMD
assembly and convencional through-hole component
assembly arises; SMD component positioning is
relative, not absolute.
When a through-hole component is inserted into a pcb,
either the leads go through the hales or they don't.
An SMD, however, is placed onto the substrate surface,
it's position only relative to the solder lands, and
placement accuracy is therefore influenced by
variations in the substrate track pattern, component
size, and placement machine accuracy.
Other factors influence the layout of SMD substrates.
For example, will the board be a mixed-print ( a
combination of through-hole components and SMDs) or an
all-SMD design? Will SMDs be placed on one side of the
substrate or both? And there are process
considerations like what type of machine will place
the components and how will they be soldered?
This project describes in detail the processes
involved in setting up an SMT facility. A simulation
program was developed to verify the viability of these
processes. The simulation program was also applied to
an existing SMT facility and together with developed
optimization software, attempted to identify and
resolve some of the major problems. All this was
achieved, and the extent to which simulation could be
used as an efficient production tool, was highlighted. / AC2017
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Characterization of copper diffusion in advanced packaging /Zhang, Xiaodong. January 2007 (has links)
Thesis (Ph.D.)--Hong Kong University of Science and Technology, 2007. / Includes bibliographical references (leaves 134-144). Also available in electronic version.
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Numerical simulation of CTE mismatch and thermal-structural stresses in the design of interconnects /Peter, Geoffrey J. M. January 2001 (has links)
Thesis (Ph. D.)--OGI School of Science and Engineering at OHSU, 2001.
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Optimization of metallization and process variables in low temperature wire bonding technology /Chan, Yu Hin. January 2003 (has links)
Thesis (M. Phil.)--Hong Kong University of Science and Technology, 2003. / Includes bibliographical references (leaves 129-132). Also available in electronic version. Access restricted to campus users.
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Thermoreversible gelation of aromatic hydrocarbonsGoldmann, Edward Louis. January 2002 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2002. / Vita. Includes bibliographical references. Available also from UMI Company.
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Study on adhesion of underfill materials for flip chip packagingLuo, Shijian 05 1900 (has links)
No description available.
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Toward a comprehensive cost model for multichip module (MCM) manufacturingPierce, Daniel W. 12 1900 (has links)
No description available.
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