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Tecnologias submicrônicas (DSM) têm inserido novos desafios ao projeto de circuitos devido a redução de geometrias, redução na tensão de alimentação, aumento da freqüência e aumento da densidade de lógica. Estas características reduzem significativamente a confiabilidade dos circuitos integrados devido a suscetibilidade a efeitos como crosstalk e acoplamento de substrato. Ainda, os efeitos da radiação são mais significantes devido as partículas com baixa energia começam a ser um problema em tecnologias DSM. Todas essas características enfatizam a necessidade de novas ferramentas de automação. Um dos objetivos desta tese é desenvolver novas ferramentas aptas a lidar com estes desafios. Esta tese é dividida em duas grandes contribuições. A primeira está relacionada com o desenvolvimento de uma nova metodologia com o objetivo de gerar circuitos otimizados em respeito ao atraso e ao consumo de potência. Um novo fluxo de projeto é apresentado na qual o circuito é otimizado no nível de transistor. Esta metodologia permite otimizar cada transistor de acordo com as capacitâncias associadas. Diferente da metodologia tradicional, o leiaute é gerado sob demanda depois do processo de otimização de transistores. Resultados mostram melhora de 11% em relação ao atraso dos circuitos e 30% de redução no consumo de potência em comparação à metodologia tradicional. A segunda contribuição está relacionada com o desenvolvimento de técnicas de geração de circuitos tolerantes a radiação. Uma técnica CWSP é usada para aplicar redundância temporal em elementos seqüenciais. Esta técnica apresenta baixa utilização de área, mas as penalidades no atraso estão totalmente relacionadas com a duração do pulso que se planeja atenuar. Além disso, uma nova metodologia de dimensionamento de transistores para falhas transientes é apresentada. A metodologia de dimensionamento é baseada em um modelo analítico. O modelo considera independente blocos de transistores PMOS e NMOS. Então, somente transistores diretamente relacionados à atenuação são dimensionados. Resultados mostram área, atraso e consumo de potência reduzido em comparação com as técnicas CWSP e TMR, permitindo o desenvolvimento de circuitos com alta freqüência. / Deep submicron (DSM) technologies have increased the challenges in circuit designs due to geometry shrinking, power supply reduction, frequency increasing and high logic density. The reliability of integrated circuits is significantly reduced as a consequence of the susceptibility to crosstalk and substrate coupling. In addition, radiation effects are also more significant because particles with low energy, without importance in older technologies, start to be a problem in DSM technologies. All these characteristics emphasize the need for new Electronic Design Automation (EDA) tools. One of the goals of this thesis is to develop EDA tools able to cope with these DSM challenges. This thesis is divided in two major contributions. The first contribution is related to the development of a new methodology able to generate optimized circuits in respect to timing and power consumption. A new design flow is proposed in which the circuit is optimized at transistor level. This methodology allows the optimization of every single transistor according to the capacitances associated to it. Different from the traditional standard cell approach, the layout is generated on demand after a transistor level optimization process. Results show an average 11% delay improvement and more than 30% power saving in comparison with the traditional design flow. The second contribution of this thesis is related with the development of techniques for radiation-hardened circuits. The Code Word State Preserving (CWSP) technique is used to apply timing redundancy into latches and flipflops. This technique presents low area overhead, but timing penalties are totally related with the glitch duration is being attenuated. Further, a new transistor sizing methodology for Single Event Transient (SET) attenuation is proposed. The sizing method is based on an analytic model. The model considers independently pull-up and pull-down blocks. Thus, only transistors directly related to the SET attenuation are sized. Results show smaller area, timing and power consumption overhead in comparison with TMR and CWSP techniques allowing the development of high frequency circuits, with lower area and power overhead.

This thesis describes the architecture, verification, qualification, and packaging of a 16-channel silicon-germanium (SiGe) Remote Electronics Unit (REU) designed for use in extreme environment applications encountered on NASA's exploration roadmap. The SiGe REU was targeted for operation outside the protective electronic "vaults" in a lunar environment that exhibits cyclic temperature swings from -180ºC to 120ºC, a total ionizing dose (TID) radiation level of 100 krad, and heavy ion exposure (single event effects) over the mission lifetime. The REU leverages SiGe BiCMOS technological advantages and design methodologies, enabling exceptional extreme environment robustness. It utilizes a mixed-signal Remote Sensor Interface (RSI) ASIC and an HDL-based Remote Digital Control (RDC) architecture to read data from up to 16 sensors using three different analog channel types with customizable gain, current stimulus, calibration, and sample rate with 12-bit analog-to-digital conversion. The SiGe REU exhibits excellent channel sensitivity throughout the temperature range, hardness to at least 100 krad TID exposure, and single event latchup immunity, representing the cutting edge in cold-capable electronic systems. The SiGe REU is the first example within a potential paradigm shift in space-based electronics.

Tecnologias submicrônicas (DSM) têm inserido novos desafios ao projeto de circuitos devido a redução de geometrias, redução na tensão de alimentação, aumento da freqüência e aumento da densidade de lógica. Estas características reduzem significativamente a confiabilidade dos circuitos integrados devido a suscetibilidade a efeitos como crosstalk e acoplamento de substrato. Ainda, os efeitos da radiação são mais significantes devido as partículas com baixa energia começam a ser um problema em tecnologias DSM. Todas essas características enfatizam a necessidade de novas ferramentas de automação. Um dos objetivos desta tese é desenvolver novas ferramentas aptas a lidar com estes desafios. Esta tese é dividida em duas grandes contribuições. A primeira está relacionada com o desenvolvimento de uma nova metodologia com o objetivo de gerar circuitos otimizados em respeito ao atraso e ao consumo de potência. Um novo fluxo de projeto é apresentado na qual o circuito é otimizado no nível de transistor. Esta metodologia permite otimizar cada transistor de acordo com as capacitâncias associadas. Diferente da metodologia tradicional, o leiaute é gerado sob demanda depois do processo de otimização de transistores. Resultados mostram melhora de 11% em relação ao atraso dos circuitos e 30% de redução no consumo de potência em comparação à metodologia tradicional. A segunda contribuição está relacionada com o desenvolvimento de técnicas de geração de circuitos tolerantes a radiação. Uma técnica CWSP é usada para aplicar redundância temporal em elementos seqüenciais. Esta técnica apresenta baixa utilização de área, mas as penalidades no atraso estão totalmente relacionadas com a duração do pulso que se planeja atenuar. Além disso, uma nova metodologia de dimensionamento de transistores para falhas transientes é apresentada. A metodologia de dimensionamento é baseada em um modelo analítico. O modelo considera independente blocos de transistores PMOS e NMOS. Então, somente transistores diretamente relacionados à atenuação são dimensionados. Resultados mostram área, atraso e consumo de potência reduzido em comparação com as técnicas CWSP e TMR, permitindo o desenvolvimento de circuitos com alta freqüência. / Deep submicron (DSM) technologies have increased the challenges in circuit designs due to geometry shrinking, power supply reduction, frequency increasing and high logic density. The reliability of integrated circuits is significantly reduced as a consequence of the susceptibility to crosstalk and substrate coupling. In addition, radiation effects are also more significant because particles with low energy, without importance in older technologies, start to be a problem in DSM technologies. All these characteristics emphasize the need for new Electronic Design Automation (EDA) tools. One of the goals of this thesis is to develop EDA tools able to cope with these DSM challenges. This thesis is divided in two major contributions. The first contribution is related to the development of a new methodology able to generate optimized circuits in respect to timing and power consumption. A new design flow is proposed in which the circuit is optimized at transistor level. This methodology allows the optimization of every single transistor according to the capacitances associated to it. Different from the traditional standard cell approach, the layout is generated on demand after a transistor level optimization process. Results show an average 11% delay improvement and more than 30% power saving in comparison with the traditional design flow. The second contribution of this thesis is related with the development of techniques for radiation-hardened circuits. The Code Word State Preserving (CWSP) technique is used to apply timing redundancy into latches and flipflops. This technique presents low area overhead, but timing penalties are totally related with the glitch duration is being attenuated. Further, a new transistor sizing methodology for Single Event Transient (SET) attenuation is proposed. The sizing method is based on an analytic model. The model considers independently pull-up and pull-down blocks. Thus, only transistors directly related to the SET attenuation are sized. Results show smaller area, timing and power consumption overhead in comparison with TMR and CWSP techniques allowing the development of high frequency circuits, with lower area and power overhead.

Tecnologias submicrônicas (DSM) têm inserido novos desafios ao projeto de circuitos devido a redução de geometrias, redução na tensão de alimentação, aumento da freqüência e aumento da densidade de lógica. Estas características reduzem significativamente a confiabilidade dos circuitos integrados devido a suscetibilidade a efeitos como crosstalk e acoplamento de substrato. Ainda, os efeitos da radiação são mais significantes devido as partículas com baixa energia começam a ser um problema em tecnologias DSM. Todas essas características enfatizam a necessidade de novas ferramentas de automação. Um dos objetivos desta tese é desenvolver novas ferramentas aptas a lidar com estes desafios. Esta tese é dividida em duas grandes contribuições. A primeira está relacionada com o desenvolvimento de uma nova metodologia com o objetivo de gerar circuitos otimizados em respeito ao atraso e ao consumo de potência. Um novo fluxo de projeto é apresentado na qual o circuito é otimizado no nível de transistor. Esta metodologia permite otimizar cada transistor de acordo com as capacitâncias associadas. Diferente da metodologia tradicional, o leiaute é gerado sob demanda depois do processo de otimização de transistores. Resultados mostram melhora de 11% em relação ao atraso dos circuitos e 30% de redução no consumo de potência em comparação à metodologia tradicional. A segunda contribuição está relacionada com o desenvolvimento de técnicas de geração de circuitos tolerantes a radiação. Uma técnica CWSP é usada para aplicar redundância temporal em elementos seqüenciais. Esta técnica apresenta baixa utilização de área, mas as penalidades no atraso estão totalmente relacionadas com a duração do pulso que se planeja atenuar. Além disso, uma nova metodologia de dimensionamento de transistores para falhas transientes é apresentada. A metodologia de dimensionamento é baseada em um modelo analítico. O modelo considera independente blocos de transistores PMOS e NMOS. Então, somente transistores diretamente relacionados à atenuação são dimensionados. Resultados mostram área, atraso e consumo de potência reduzido em comparação com as técnicas CWSP e TMR, permitindo o desenvolvimento de circuitos com alta freqüência. / Deep submicron (DSM) technologies have increased the challenges in circuit designs due to geometry shrinking, power supply reduction, frequency increasing and high logic density. The reliability of integrated circuits is significantly reduced as a consequence of the susceptibility to crosstalk and substrate coupling. In addition, radiation effects are also more significant because particles with low energy, without importance in older technologies, start to be a problem in DSM technologies. All these characteristics emphasize the need for new Electronic Design Automation (EDA) tools. One of the goals of this thesis is to develop EDA tools able to cope with these DSM challenges. This thesis is divided in two major contributions. The first contribution is related to the development of a new methodology able to generate optimized circuits in respect to timing and power consumption. A new design flow is proposed in which the circuit is optimized at transistor level. This methodology allows the optimization of every single transistor according to the capacitances associated to it. Different from the traditional standard cell approach, the layout is generated on demand after a transistor level optimization process. Results show an average 11% delay improvement and more than 30% power saving in comparison with the traditional design flow. The second contribution of this thesis is related with the development of techniques for radiation-hardened circuits. The Code Word State Preserving (CWSP) technique is used to apply timing redundancy into latches and flipflops. This technique presents low area overhead, but timing penalties are totally related with the glitch duration is being attenuated. Further, a new transistor sizing methodology for Single Event Transient (SET) attenuation is proposed. The sizing method is based on an analytic model. The model considers independently pull-up and pull-down blocks. Thus, only transistors directly related to the SET attenuation are sized. Results show smaller area, timing and power consumption overhead in comparison with TMR and CWSP techniques allowing the development of high frequency circuits, with lower area and power overhead.

Power converters used in high reliability radiation hardened space applications trail their commercial counterparts in terms of power density and efficiency. This is due to the additional challenges that arise in the design of space rated power converters from the harsh environment they need to operate in, to the limited availability of space qualified components and field demonstrated power converter topologies. New radiation hardened Gallium Nitride (GaN) Field Effect Transistors (FETs) with their inherent radiation tolerance and superior performance over Silicon Power Metal Oxide Semiconductor Field Effect Transistors (MOSFETs) are a promising alternative to improve power density and performance in space power converters. This thesis presents the considerations and design of a practical implementation of the Phase Shifted Full Bridge DC-DC Isolated converter with synchronous rectification for space applications. Recently released radiation hardened GaN FETs were used in the Full Bridge and synchronous rectifier power stages. A survey outlining the benefits of new radiation hardened GaN FETs for space power applications compared to current radiation hardened power MOSFETs is included. In addition, this work presents the overall design process followed to design the DC-DC converter power stage, as well as a comprehensive power loss analysis. Furthermore, this work includes details to implement a conventional hard-switched Full Bridge DC-DC converter for this application. An efficiency and component stress comparison was performed between the hard-switched Full Bridge design and the Phase Shifted Full Bridge DC-DC converter design. This comparison highlights the benefits of phase shift modulation (PSM) and zero voltage switching (ZVS) for GaN FET applications. Furthermore, different magnetic designs were characterized and compared for efficiency in both converters. The DC-DC converters implemented in this work regulate the output to a nominal 20 V, delivering 500 W from a nominal 100 V DC Bus input. Complete fault analysis and protection circuitry required for a space-qualified implementation is not addressed by this work. / MS / Recently released radiation-hardened Gallium Nitride (GaN) Field Effect Transistors (FETs) offer the opportunity to increase efficiency and power density of space DC-DC power converters. The current state of the art for space DC-DC power conversion trails their commercial counterparts in terms of power density and efficiency. This is mainly due to two factors. The first factor is related to the additional challenges that arise in the design of space rated power converters from the harsh environment they need to operate in, to the limited availability of space qualified components and field demonstrated converter topologies. The second factor lies in producing reliable radiation hardened power Metal Oxide Semiconductor Field Effect Transistors (MOSFETs). GaN FETs not only have better electrical performance than power MOSFETs, they have also demonstrated inherent tolerance to radiation. This results in less structural device changes needed to make GaN FETs operate reliably under high radiation compared to their MOSFETs counterparts. This work outlines the design implications of using newly released radiation hardened GaN FETs to implement a fixed frequency isolated Phase Shifted Full Bridge DC-DC converter while strictly abiding to the design constraints found in space-power converter applications. In addition, a one-to-one performance comparison was made between the soft-switched Phase Shift modulated Full Bridge and the conventional hard-switched Full Bridge DC-DC converter. Finally, different magnetic designs were evaluated in the laboratory to assess their impact on converter efficiency.

The high demands on data processing and bandwidth in wireless/wireline communication and aerospace systems have been pushing forward circuit design techniques to their limitations to obtain maximum performances with respect to high operating frequency, low noise, small area, and low power consumption. Clock generators are essential components in numerous circuits, for instance, frequency synthesizers for high speed transceivers, clock sources for microprocessors, noise suppressed zero-delay buffers in system-on-chips (SOCs), and clock and data recovery (CDR) systems. Furthermore, clock generators are required to provide low jitter and high precision clocks in fully integrated image reject receivers and an ultra-wide tunability in time-interleaved applications. We explore several circuit design techniques and implementations of low jitter clock generator in this thesis. Firstly, a low jitter and wide range digital phase-locked loop (DPLL) operating 8 ~ 16 GHz is illustrated using a dual path digital loop filter (DLF). In order to mitigate the phase jitter in the phase detector (PD), we implement the separate loop filter and the output is not affected by the proportional path. For the stable operation, a 4 ~ 8 GHz linear phase interpolator (PI) is implemented in the proportional path. In addition, we design a low phase noise digitally controlled oscillator (DCO) using inductive tuning technique based on switched mutual coupling for wide operating range. The proposed DPLL implemented in 65 nm CMOS technology shows an outstanding figure-of-merit (FOM) over other state-of-art DPLLs in term of root mean square (RMS) and deterministic jitter (DJ). Secondly, we discuss a radiation-hardened-by-design (RHBD) PLL using a feedback voltage-controlled oscillator (FBVCO) in order to reduce DJ due to the radiation attack on the control voltage. Different from a conventional open loop VCO, the proposed FBVCO has a negative control loop and is composed of an open loop VCO, an integrator and a switched-capacitor resistor. Since the input to output of the FBVCO has a low-pass characteristic, any disturbance on the control voltage should be filtered and cannot affect the output phase. We are able to reduce the output frequency variation approximately 75% compared to the conventional PLL when the radiation pulse strikes on the control voltage. The proposed RHBD PLL is implemented in 130 nm and consumes 6.2 mW at 400 MHz operating frequency. Thirdly, a novel adaptive-bandwidth PLL is illustrated to optimize the jitter performance in a wide operating frequency range. We achieve a constant ratio of bandwidth and reference frequency with a closed loop VCO and an overdamping system with a charge pump (CP) current proportional to the VCO frequency for the adaptive-bandwidth technique. The proposed adaptive-bandwidth PLL presents 0.6% RMS jitter over the entire frequency range from 320 MHz to 2.56 GHz, which is 70% smaller than the conventional fixed-bandwidth PLL. Finally, we have developed a new feedback DCO to achieve a linear gain of DCO so that the DPLL can provide stability and a wide operating range in different process variations. Due to the negative feedback loop of the proposed DCO, the feedback DCO presents a linear gain from an input digital word to an output frequency. Moreover, we can control the bandwidth of the feedback DCO to optimize the total output phase noise in DPLL. In simulation, we can obtain 17 MHz/LSB of the peak-to-peak gain of the feedback DCO, which is reduced 96% over the conventional DCO.

La miniaturisation des circuits intégrés numériques tend à augmenter leur sensibilité aux radiations. Ainsi le rayonnement naturel peut induire des événements singuliers et porter atteinte à la fiabilité des circuits.Cette thèse porte sur la modélisation des mécanismes à l'origine de ces événements singuliers et sur le développement de solutions de durcissement par conception permettant de limiter l'impact des radiations sur le taux d'erreur.Dans une première partie, nous avons notamment développé une approche dénommée RWDD (Random-Walk Drift- Diffusion) modélisant le transport et la collection de charges au sein d'un circuit, sur la base d'équations physiques sans paramètre d'ajustement. Ce modèle particulaire et sa résolution numérique transitoire permettent de coupler le transport des charges avec un simulateur circuit, tenant ainsi compte de l'évolution temporelle des champs électriques dans la structure. Le modèle RWDD a été intégré avec succès dans une plateforme de simulation capable d'estimer la réponse d'un circuit suite à l'impact d'une particule ionisante.Dans une seconde partie, des solutions de durcissement permettant de limiter l'impact des radiations sur la fiabilité des circuits ont été développées. A l'échelle des cellules élémentaires, de nouvelles bascules robustes aux radiations ont été proposées, en limitant leur impact les performances. Au niveau système, une méthodologie de duplication de l'arbre d'horloge a été développée. Enfin, un flot de triplication a été conçu pour les systèmes dont la fiabilité est critique. L'ensemble de ces solutions a été implémenté en technologie 65 nm et UTBB-FDSOI 28 nm et leur efficacité vérifiée expérimentalement. / The extreme technology scaling of digital circuits leads to increase their sensitivity to ionizing radiation, whether in spatial or terrestrial environments. Natural radiation can now induce single event effects in deca-nanometer circuits and impact their reliability.This thesis focuses on the modeling of single event mechanisms and the development of hardening by design solutions that mitigate radiation threat on the circuit error rate.In a first part of this work, we have developed a physical model for both the transport and collection of radiation-induced charges in a biased circuit, derived from pure physics-based equations without any fitting parameter. This model is called Random-Walk Drift-Diffusion (RWDD). This particle-level model and its numerical transient solving allows the coupling of the charge collection process with a circuit simulator, taking into account the time variations of the electrical fields in the structure. The RWDD model is able to simulate the behavior of a circuit following a radiation impact, independently of the implemented function and the considered technology.In a second part of our work, hardening solutions that limit radiation impacts on circuit reliability have been developed. At elementary cell level, new radiation-hardened latch architectures have been proposed, with a limited impact on performances. At system level, a clock tree duplication methodology has been proposed, leaning on specific latches. Finally, a triplication flow has been design for critical applications. All these solutions have been implemented in 65 nm and UTBB-FDSOI 28nm technologies and radiation test have been performed to measure their hardening efficiency.

CubeSat missions needs components that are tolerant against the radiation in space. The hardware components must be reliable, and it must not compromise the functionality on-board during the mission. At the same time, the cost of hardware and its development should not be high. Hence, this thesis discusses the design and development of a CubeSat architecture using a Commercial Off-The- Shelf (COTS) Multi-Processor System on Chip (MPSoC). The architecture employs an affordable Rad-Hard Micro-Controller Unit as a Supervisor for the MPSoC. Also, it uses several radiation mitigation techniques such as the Latch-up protection circuit to protect it against Single-Event Latch-ups (SELs), Readback scrubbing for Non- Volatile Memories (NVMs) such as NOR Flash and Configuration scrubbing for the FPGA present in the MPSoC to protect it against Single-Event Upset (SEU)s, reliable communication using Cyclic Redundancy Check (CRC) and Space packet protocol. Apart from such functionalities, the Supervisor executes tasks such as Watchdog that monitors the liveliness of the applications running in the MPSoC, data logging, performing Over-The-Air Software/Firmware update. The thesis work implements functionalities such as Communication, Readback memory scrubbing, Configuration scrubbing using SEM-IP, Watchdog, and Software/Firmware update. The execution times of the functionalities are presented for the application done in the Supervisor. As for the Configuration scrubbing that was implemented in Programmable Logic (PL)/FPGA, results of area and latency are reported. / CubeSat-uppdrag behöver komponenter som är toleranta mot strålningen i rymden. Maskinvarukomponenterna måste vara pålitliga och funktionaliteten ombord får inte äventyras under uppdraget. Samtidigt bör kostnaden för hårdvara och dess utveckling inte vara hög. Därför diskuterar denna avhandling design och utveckling av en CubeSatarkitektur med hjälp av COTS (eng. Custom-off-The-Shelf) MPSoC (eng. Multi Processor System-on-Chip). Arkitekturen använder en prisvärd strålningshärdad (eng. Rad-Hard) Micro-Controller Unit(MCU) som Övervakare för MPSoC:en och använder också flera tekniker för att begränsa strålningens effekter såsom kretser för att skydda kretsen från s.k. Single Event Latch-Ups (SELs), återläsningsskrubbning för icke-volatila minnen (eng. Non-Volatile Memories) NVMs som NOR Flash och skrubbning av konfigurationsminnet skrubbning för FPGA:er i MPSoC:en för att skydda dem mot Single-Event Upsets (SEUs), och tillhandahålla pålitlig kommunikation mha CRC och Space Packet Protocol. Bortsett från sådana funktioner utför Övervakaren uppgifter som Watchdog för att övervaka att applikationerna som körs i MPSoC:en fortfarande är vid liv, dataloggning, och Over- the-Air-uppdateringar av programvaran/Firmware. Examensarbetet implementerar funktioner såsom kommunikation, återläsningsskrubbning av minnet, konfigurationsminnesskrubbning mha SEM- IP, Watchdog och uppdatering av programvara/firmware. Exekveringstiderna för utförandet av funktionerna presenteras för den applikationen som körs i Övervakaren. När det gäller konfigurationsminnesskrubbningen som implementerats i den programmerbara logiken i FPGA:n, rapporteras area och latens.