An instrument, adding the capability to measure 3D volumetric chemical composition, has been constructed by me as a member of the Sánchez Nano Laboratory. The laboratory's in situ atomic force microscope (AFM) and secondary ion mass spectrometry systems (SIMS) are functional and integrated as one instrument. The SIMS utilizes a Ga focused ion beam (FIB) combined with a quadrupole mass analyzer. The AFM is comprised of a 6-axis stage, three coarse axes and three fine. The coarse stage is used for placing the AFM tip anywhere inside a (13x13x5 mm3) (xyz) volume. Thus the tip can be moved in and out of the FIB processing region with ease. The planned range for the Z-axis piezo was 60 µm, but was reduced after it was damaged from arc events. The repaired Z-axis piezo is now operated at a smaller nominal range of 18 µm (16.7 µm after pre-loading), still quite respectable for an AFM. The noise floor of the AFM is approximately 0.4 nm Rq. The voxel size for the combined instrument is targeted at 50 nm or larger. Thus 0.4 nm of xyz uncertainty is acceptable. The instrument has been used for analyzing samples using FIB beam currents of 250 pA and 5.75 nA. Coarse tip approaches can take a long time so an abbreviated technique is employed. Because of the relatively long thro of the Z piezo, the tip can be disengaged by deactivating the servo PID. Once disengaged, it can be moved laterally out of the way of the FIB-SIMS using the coarse stage. This instrument has been used to acquire volumetric data on AlTiC using AFM tip diameters of 18.9 nm and 30.6 nm. Acquisition times are very long, requiring multiple days to acquire a 50-image stack. New features to be added include auto stigmation, auto beam shift, more software automation, etc. Longer term upgrades to include a new lower voltage Z-piezo with strain-gauge feedback and a new design to extend the life for the coarse XY nano-positioners. This AFM-SIMS instrument, as constructed, has proven to be a great proof of concept vehicle. In the future it will be used to analyze micro fossils and it will also be used as a part of an intensive teaching curriculum.

Graduation date: 1993

In particle induced desorption-ionization mass spectrometry the strength of an analyte's signal under a given set of bombardment conditions is usually considered to be representative of the analytes relative surface activity. This rationale is generally used to explain differences in the technique's sensitivity between and within various classes of compound. In liquid matrix assisted secondary ion mass spectrometry (SIMS) sensitivity enhancement of ionic analytes by pairing with surface active counterions has been demonstrated by several groups. This technique has been utilized in this work to achieve a 10,000 fold enhancement in the signal for ATP on a double focusing magnetic sector instrument and to detect femtomole quantities of nucleoside monophosphates on a time-of-flight instrument. The analyte's signal, however, is dependent on both the analyte bulk concentration and that of the surfactant. Additionally, the surfactant concentration that produces the maximum analyte signal changes with the analyte concentration. In this study, this phenomenon has been modeled in terms of conventional solution equilibria and surface chemical principles. It is assumed that the initial surface composition and the bulk concentration are the boundary conditions of a steady state established by the competing processes of surface sputtering and surface replenishment from the bulk during analysis. Calculated surface excesses correlate well with observed relative ion intensities, suggesting that equilibrium conditions are approached in the sample matrices despite the outwardly dynamic nature of the sputtering processes. / Graduation date: 1994

High resolution mapping of molecular species, specifically sub-micrometer spatial resolution mapping, is at the forefront of recent interest in Secondary Ion Mass Spectrometry (SIMS). Large projectiles, e.g. C60, Au400, display high quasi-molecular ion yields with reduced fragment ion yields compared to atomic or polyatomic projectiles. However, the application of large projectiles in a sub-micrometer beam is hampered by limitations in source brightness and angular emission characteristics which are incompatible with tight focusing. An alternate approach to a focused beam is to reduce the beam intensity to less than 1000 impacts per second (referred to as the event-by-event mode) and localize each projectile impact via an electron emission microscope. The characterization and performance of such an instrument for localizing individual projectile impacts of 15-75keV C60 with sub-micrometer spatial resolution are described here. The quest for localizing single cluster impacts requires an understanding of the relationship between SI and electron emissions. It was found that electron emission is observed independently of the number or type of secondary ion emitted for flat homogeneous samples. The independence of ion and electron emission confirms the rationale for using the emitted electrons to localize individual projectile impacts. Further investigation of electron emission revealed that the electron yield is characteristic of the class of sample investigated (e.g. metal, organic, semiconductor). The electron yield was found to depend on the size and topology of the sample. Additionally, the electron yield increases with increasing projectile velocity. The use of the novel instrumentation presented here, necessitated the development of custom acquisition and analysis software. The analysis of co-emitted species from nano-metric dimensions is enhanced with the ability to perform multiple coincidence/anti-coincidence calculations. New concepts were implemented for integrating localization and mass spectrometry via software solutions for image analysis and localization and subsequently correlation between emitted ions and electrons. The result is software and instrumentation capable of generating ion maps with sub-micrometer spatial resolution.

Secondary ion mass spectrometry (SIMS) is a surface analysis technique which characterizes species sputtered by an energetic particle beam. Bombardment with cluster projectiles offers the following notable advantages over bombardment with atomic ions or small clusters: enhanced emission of molecular ions, low damage cross-section, and reduced molecular fragmentation. Additionally, in the case of Au4004 and C60 impacts, desorption originates from nanometric volumes. These features make clusters useful probes to obtain molecular information from both nano-objects and nano-domains. The "event-by-event bombardment/detection mode" probes nano-objects one-at-a-time, while collecting and storing the corresponding secondary ion (SI) information. Presented here are the first experiments where free-standing nano-objects were bombarded with keV projectiles of atomic to nanoparticle size. The objects are aluminum nano-whiskers, 2 nm in diameter and ~250 nm in length. Au4004 has a diameter of ~2 nm, comparable to the nominal diameter of the nanowhiskers. There are notable differences in the SI response from sample volumes too small for full projectile energy deposition. The whisker spectra are dominated by small clusters?the most abundant species being AlO- and AlO2-. Bulk samples have larger yields for AlO2- than for AlO-, while this trend is reversed in whisker samples. Bulk samples give similar abundances of large SI clusters, while whisker samples give an order of magnitude lower yield of these SIs. Effective yields were calculated in order to determine quantitative differences between the nano-objects and bulk samples. The characterization of individual nano-objects from a mixture is demonstrated with negatively charged polymer spheres that are attracted to and retained by the nano-whiskers. The spheres are monodisperse polystyrene nanoparticles (30nm diameter). Our results show that the event-by-event mode can provide information on the nature, size, relative location, and abundance of nano-objects in the field of view. This study presents the first evidence of quantitative molecular information originating from nano-object mixtures. Biologically relevant systems (solid-supported lipid bilayers) were also characterized using Au5 , Au4004 and C60 . Organization-dependent SI emission was observed for phosphocholine bilayers. Lipid domain formation was also investigated in bilayers formed from cholesterol and a mixed lipid system. Trends in the correlation coefficient suggest that cholesterol segregates from the surrounding lipid environment during raft formation.

The following thesis demonstrates two isotope tracing experiments that measure oxygen transport through electrochemically polarized solid oxides. Cathode-symmetric ‘button’ cells with yttria stabilized zirconia(YSZ) electrolytes and either strontium doped lanthanum manganate(LSM) or composite LSM/YSZ cathodes were studied. The first experiment measured the residence time distributions(RTD) of 34O2. The measured RTDs were compared at different temperatures(700-800°C) and applied potentials(-2 to -8V). Comparisons with simulated RTDs revealed that oxygen transport was laterally heterogeneous. Delamination of the counter electrode is likely the source of the heterogeneity. The second experiment measured a wave of 18O by exposing an interior cross section and applying ToF-SIMS analysis. A depth profile was produced that spans the cathode and electrolyte interface. The depth profile was compared with a variety of limiting oxygen activation scenarios predicted by a simple 1-D model. Comparisons demonstrated that oxygen activation is likely not restricted to the cathode and electrolyte interface.

The following thesis demonstrates two isotope tracing experiments that measure oxygen transport through electrochemically polarized solid oxides. Cathode-symmetric ‘button’ cells with yttria stabilized zirconia(YSZ) electrolytes and either strontium doped lanthanum manganate(LSM) or composite LSM/YSZ cathodes were studied. The first experiment measured the residence time distributions(RTD) of 34O2. The measured RTDs were compared at different temperatures(700-800°C) and applied potentials(-2 to -8V). Comparisons with simulated RTDs revealed that oxygen transport was laterally heterogeneous. Delamination of the counter electrode is likely the source of the heterogeneity. The second experiment measured a wave of 18O by exposing an interior cross section and applying ToF-SIMS analysis. A depth profile was produced that spans the cathode and electrolyte interface. The depth profile was compared with a variety of limiting oxygen activation scenarios predicted by a simple 1-D model. Comparisons demonstrated that oxygen activation is likely not restricted to the cathode and electrolyte interface.

No description available.

abstract: Mass spectrometric analysis requires that atoms from the sample be ionized in the gas phase. Secondary ion mass spectrometry achieves this by sputtering samples with an energetic primary ion beam. Several investigations of the sputtering and ionization process have been conducted. Oxygen is commonly used in secondary ion mass spectrometry (SIMS) to increase ion yields, but also can complicate the interpretation of SIMS analyses. An 18O implant in silicon has been used to quantify the oxygen concentration at the surface of sputtered silicon in order to study the dependence on oxygen of several sputtering and depth profile phenomena. The ion yield dependence of trace elements in silicon on the surface oxygen concentration is a function of the ionization potential of the element. The ion yield is high and unaffected by oxygen for elements with low ionization potential and ranges over several orders of magnitude for elements with high ionization potential. Depth resolution in sputter profiles has been shown to be degraded by the presence of oxygen, the mechanism of this effect has been investigated using an 18O implant to quantify oxygen levels and it is shown that the process does not appear to be a consequence of surface oxide formation. Molecular ions are a source of mass interference in SIMS analysis, and multiply charged atomic ion signals might be interference-free due to the possible instability of multiply-charged molecular ions. Sputtered SiH2+, AlH2+, BeH2+, Mo22+ and Mg22+ ions have been observed and appear surprisingly stable. The formation mechanism of some of these species has been explored. / Dissertation/Thesis / Ph.D. Chemistry 2012

abstract: Boron concentrations and isotopic composition of phlogopite mica, amphibole, and selected coexisting anhydrous phases in mantle-derived xenoliths from the Kaapvaal Craton were measured by secondary ion mass spectrometry in an effort to better understand the B isotope geochemistry of the subcontinental lithospheric mantle (SCLM) and its implications for the global geochemical cycle of B in the mantle. These samples display a wide, and previously unrecognized, range in their boron contents and isotopic compositions reflecting a complex history involving melt depletion and metasomatism by subduction- and plume-derived components, as well as late stage isotopic exchange related to kimberlite emplacements. Micas from ancient lithospheric harzburgite metasomatized by slab-derived fluids suggest extensive B-depletion during subduction, resulting in low-B, isotopically light compositions whereas kimberlite-related metasomatic products and a sample from the 2 Ga Palabora carbonatite have boron isotopic compositions similar to proposed primitive mantle. The results suggest that subduction of oceanic lithosphere plays a limited role in the B geochemistry of the convecting mantle. / Dissertation/Thesis / Masters Thesis Geological Sciences 2014