The mm-wave frequency range is being increasingly researched to close the gap between 100 to 1000 GHz, the least explored region of the electromagnetic spectrum, often termed as the 'THz Gap'. The ever increasing demand for compact, portable and reliable THz (Terahertz) devices and the huge market potential for THz system have led to an enormous amount of research and development in the area for a number of years. The Gunn Diode is expected to play a significant role in the development of low cost solid state oscillators which will form an essential part of these THz systems.Gunn and mixer diodes will 'power' future THz systems. The THz frequencies generation methodology is based on a two-stage module. The initial frequency source is provided by a high frequency Gunn diode and is the main focus of this work. The output from this diode is then coupled into a multiplier module. The multiplier provides higher frequencies by the generation of harmonics of the input signal by means of a non-linear element, such as Schottky diode Varactor. A realistic Schottky diode model developed in SILVACOTM is presented in this work.This thesis describes the work done to develop predictive models for Gunn Diode devices using SILVACOTM. These physically-based simulations provide the opportunity to increase understanding of the effects of changes to the device's physical structure, theoretical concepts and its general operation. Thorough understanding of device physics was achieved to develop a reliable Gunn diode model. The model development included device physical structure building, material properties specification, physical models definition and using appropriate biasing conditions.The initial goal of the work was to develop a 2D model for a Gunn diode commercially manufactured by e2v Technologies Plc. for use in second harmonic mode 77GHz Intelligent Adaptive Cruise Control (ACC) systems for automobiles. This particular device was chosen as its operation is well understood and a wealth of data is available for validation of the developed physical model. The comparisons of modelled device results with measured results of a manufactured device are discussed in detail. Both the modelled and measured devices yielded similar I-V characteristics and so validated the choice of the physical models selected for the simulations. During the course of this research 2D, 3D rectangular, 3D cylindrical and cylindrical modelled device structures were developed and compared to measured results.The injector doping spike concentration was varied to study its influence on the electric field in the transit region, and was compared with published and measured data.Simulated DC characteristics were also compared with measured results for higher frequency devices. The devices mostly correspond to material previously grown for experimental studies in the development of D-band GaAs Gunn devices. Ambient temperature variations were also included in both simulated and measured data.Transient solutions were used to obtain a time dependent response such as determining the device oscillating frequency under biased condition. These solutions provided modelled device time-domain responses. The time-domain simulations of higher frequency devices which were developed used modelling measured approach are discussed. The studied devices include 77GHz (2nd harmonic), 125 GHz (2nd harmonic) and 100 GHz fundamental devices.During the course of this research, twelve research papers were disseminated. The results obtained have proved that the modelling techniques used, have provided predictive models for novel Transferred Electron Devices (TEDs) operating above 100GHz.

Current leakage in GaN thin films limits reliable device fabrication. A variety of Ga and N rich MBE GaN thin films grown by Rf, NH3, and Rf+ NH3, are examined with electrical measurements on NiIAu Schottky diodes and CAFM. Current-voltage (IV) mechanisms will identify conduction mechanisms on diodes, and CAFM measurements will investigate the microstructure of conduction in GaN thin films. With CAFM, enhanced conduction has been shown to decorate some extended defects and surface features, while CAFM spectroscopy on a MODFET structure indicates a correlation between extended defects and field conduction behavior at room temperature. A remedy for poor conduction characteristics is presented in molten KOH etching, as evidenced by CAFM measurements, Schottky diodes, and MODFET's. The aim of this study is to identify anomalous conduction mechanisms, the likely cause of anomalous conduction, and a method for improving the conduction characteristics. Keywords: 111-Nitride, 111-V, Gallium Nitride, GaN, Electrical Properties, Conduction, Conductivity, Mobility, Hall Measurements, Resistivity, Schottky Diode, Modulation Doped Field Effect Transistor (MODFET), Conductive Atomic Force Microscopy (AFM), Defects, Molten Potassium Hydroxide (KOH) etching, Silvaco, Atlas, and Illumination.

Parmi les nitrures III-V, le matériau InGaN a été intensément étudié depuis les années 2000 pour des applications photovoltaïques, en particulier pour des cellules multi-jonctions, grâce à son large gap modulable pouvant couvrir quasiment tout le spectre solaire. On pourrait alors atteindre de hauts rendements tout en assurant de bas coûts. Cependant, l'un des problèmes de l'InGaN est l'absence de substrat accordé en maille provoquant une grande densité de défauts et limitant ainsi les performances des composants. Nous avons donc étudié la faisabilité de cellules solaires simples jonctions à base d'InGaN sur des substrats alternatifs comme le silicium et le verre afin de baisser les coûts et d'avoir de larges applications. Afin d'adapter l'InGaN sur ces substrats alternatifs, nous avons utilisé une couche tampon en ZnO. Ce travail a été réalisé dans le cadre du projet ANR NewPVonGlass. Plus particulièrement, dans ce projet, mon travail avait pour objectifs de réaliser des caractérisations électriques et optiques des matériaux et des composants. Les deux premières parties de cette thèse introduisent le matériau InGaN et l'effet photovoltaïque. Les techniques de caractérisation utilisées sont expliquées dans le troisième chapitre. Ensuite, les résultats obtenus lors de la caractérisation cristalline du matériau InGaN sont présentés en fonction du substrat, de la concentration d'indium et de l'épaisseur de la couche. Puis, la cinquième partie développe les caractérisations des premières cellules à base d'InGaN sur saphir. Enfin, dans le dernier chapitre, des simulations de cellules solaires à base d'InGaN ont été réalisées. Le modèle développé nous a permis d'optimiser la structure et le dopage du composant et de déterminer les paramètres critiques. Nous montrons donc, dans ce travail, le développement d'une cellule solaire à base d'InGaN : des caractérisations des matériaux de base à celles des cellules solaires, en passant par la modélisation.

L'astronomie gamma des Très Hautes Energies utilise jusqu'à aujourd'hui exclusivement comme détecteurs le Photomultiplicateur à Tube (PMT) pour capter les faibles flux lumineux des gerbes atmosphériques. Mais une alternative commence à apparaitre : les photodiodes à avalanche polarisées en mode Geiger appelées APD Geiger. Le PMT est un détecteur conçu dans les années 70 qui présente certes de nombreux avantages mais qui souffre également d'inconvénients comme la taille, le coût, le poids ou encore la sensibilité aux champs magnétiques et surtout la difficulté à réaliser une pixellisation en matrice. Les APD-Geiger, sont des dispositifs à semi-conducteur composés d'une jonction PN intégrée dans une technologie spéciale pour la détection de très faible flux lumineux grâce à leur polarisation au delà de la tension d'avalanche. Les APD-Geiger présentent un gain de photoélectrons très élevé (~106), bien que dépendant fortement de la tension de polarisation au delà de l'avalanche. Ces photodiodes présentent de nombreux avantages par rapport aux photomultiplicateurs, notamment du point de vue de leur miniaturisation pour des applications basées sur l'imagerie, comme la détection de flashs Tcherenkov en astronomie gamma. Dans cette thèse, nous présentons l'étude, la conception et la réalisation de cette structure technologique basée sur du Silicium. Cette structure a montré sa fiabilité pour la détection de faibles flux lumineux avec une tension de claquage de 12V et un courant de fuite ne dépassant pas 10pA au claquage. Nous avons également mis au point, différents modèles physiques et électriques indispensables aux démarches d'optimisation technologiques ainsi qu'au développement des circuits de commande et de lecture, i.e. la base de toute technologie d'imagerie. Le travail présenté ici consiste en l'étude, la conception et la réalisation d'une matrice de pixels à haute sensibilité. Un projet de télescope Cerenkov basé sur cette technologie innovante est finalement présenté

abstract: The thesis focuses on cost-efficient integration of the electro-chemical residue sensor (ECRS), a novel sensor developed for the in situ and real-time measurement of the residual impurities left on the wafer surface and in the fine structures of patterned wafers during typical rinse processes, and wireless transponder circuitry that is based on RFID technology. The proposed technology uses only the NMOS FD-SOI transistors with amorphous silicon as active material with silicon nitride as a gate dielectric. The proposed transistor was simulated under the SILVACO ATLAS Simulation Framework. A parametric study was performed to study the impact of different gate lengths (6 μm to 56 μm), electron motilities (0.1 cm2/Vs to 1 cm2/Vs), gate dielectric (SiO2 and SiNx) and active materials (a-Si and poly-Si) specifications. Level-1 models, that are accurate enough to acquire insight into the circuit behavior and perform preliminary design, were successfully constructed by analyzing drain current and gate to node capacitance characteristics against drain to source and gate to source voltages. Using the model corresponding to SiNx as gate dielectric, a-Si:H as active material with electron mobility equal to 0.4 cm2/V-sec, an operational amplifier was designed and was tested in unity gain configuration at modest load-frequency specifications. / Dissertation/Thesis / M.S. Electrical Engineering 2010

This thesis presents the modeling and fabrication of a new solid-state device meant to be used for digital logic circuits. Most current logic circuits are based on MOSFETs. The new logic device uses some of the same operating principles, but also relies on optical illumination to provide input power. In order to obtain the desired current-voltage behavior of the new device, the Silvaco (Atlas) device simulation was used to give some insight into the correct doping levels in the semiconductor and device geometries. Prototypes were fabricated on p-type silicon wafers using CMOS fabrication processes including oxide growth, photolithography, precise plasma or chemical wet etching, diffusion processes, and thin film evaporation. Electrical measurements were done by using an HP4156 parameter analyzer to measure several output voltage signals at one time while an illuminating the device with laser light. The current-voltage characteristics under different biasing conditions with an optical illumination condition were measured and showed characteristics similar to an nMOS transistor.