Title from PDF of title page. / Document formatted into pages; contains 87 pages. / Thesis (M.S.M.E.)--University of South Florida, 2003. / Includes bibliographical references. / Text (Electronic thesis) in PDF format. / ABSTRACT: As technology progresses towards smaller electronic packages, thermo-mechanical considerations pose a challenge to package designers. One area of difficulty is the ability to predict the fatigue life of the solder connections. To do this one must be able to accurately model the thermo-mechanical performance of the electronic package. As the solder ball size decreases, it becomes difficult to determine the performance of the package with traditional methods such as the use of strain gages. This is due to the fact that strain gages become limited in size and resolution and lack the ability to measure discreet strain fields as the solder ball size decreases. A solution to the limitations exhibited in strain gages is the use of Moiré interferometry. Moiré interferometry utilizes optical interferometry to measure small, in-plane relative displacements and strains with high sensitivity. / ABSTRACT: Moiré interferometry is a full field technique over the application area, whereas a strain gage gives an average strain for the area encompassed by the gage. This ability to measure full field strains is useful in the analysis of electronic package interconnections; especially when used to measure strains in the solder ball corners, where failure is known to originate. While the improved resolution of the data yielded by the method of Moiré interferometry results in the ability to develop more accurate models, that is not to say the process is simple and without difficulties of it's own. Moiré interferometry is inherently susceptible to error due to experimental and environmental effects; therefore, it is vital to generate a reliable experimental procedure that provides repeatable results. This was achieved in this study by emulating and modifying established procedures to meet our specific application. / ABSTRACT: The developed procedure includes the preparation of the specimen, the replication and transfer of the grids, the use of the PEMI, interpretation of results, and validation of data by finite element analysis using ANSYS software. The data obtained maintained uniformity to the extent required by the scope of this study, and potential sources of error have been identified and should be the subject of further research. / System requirements: World Wide Web browser and PDF reader. / Mode of access: World Wide Web.

The Diploma thesis is focused on reballing of BGA packages with the device PACE TF 2700. It describes the general types of BGA packages, their defects, importance of thermal management to the solder techniques, where it is also talked about the meaning of solders and fluxes for the joint. The work informs about the most common methods of reballing, the proper handling of components and the current situation with BGA stencils on the market. It briefly describes the device operation of PACE TF 2700, that is working on the convection and IR principle of heating components. It deals with the manufacturing of the template, dummy BGA packages, the test plates, creation of the thermo profile, comparing and examining the defects and their causes, which had the most significant impact on the results. The achievements would serve for comparing them with the results of the future laboratory exercises or as a subject for further works.

Graduation thesis is specialized on dilemma of the integrated circuits with ball grid array. Chapter two describes several types of packages and confrontation of their characteristics. Chapter three considers possibilities of corrections these boards bedded with packages, mounting and demounting of these packages, method of camera control and also inspection of the soldering process. Chapter four attend to practical measuring of thermal profiles and their optimalization.

This diplomas thesis deals with specific technologies and manufacture of BGA and QFN packages. Also summarizes the most used test methods for assessing the reliability for. Describes the making of equipment for soldering in a nitrogen atmosphere, followed by comparison solder joints of BGA and QFN forming in different atmosphere. Finally, summarizes knowledge about the process of soldering and desoldering lead-free solders for BGA packages, followed by experimental evaluation of the causes of malfunction of repaired samples.

This thesis is focused on BGA packages and fault detection after rework using X – Ray. There is a description of BGA packages by carrier substrate, techniques of connecting on chip, from mounting packages to repair printed circuit boards (hereafter PCB). Thesis summarizes description of defects, which are created after rework process. There is also description of X – Ray as method for analyzing defects. X – PLANE method used to detect internal structure of BGA packages and it was confirmed by microsection and by software for reconstruction. Description of automatic and manual measurement is follow.

This diploma thesis is focused on detecting of defects on BGA (Ball Grid Array) components using of X-ray. Defects are formed during reflow BGA components during assembly, but also later due to mechanical and thermal stress. Therefore, there is an overview of defects and methods of diagnosis of BGA packages eg .: modern X-ray defect detection or micro sections. There is disclosed a device NORDSON DAGE XD7600NT its operation and setup. The device enables advanced methods of scanning called X-plane. For creating 3D models used reconstructive software called CERA, which uses raw data from the method of X-Plane.

In this thesis it has been studied how operational and workshop data can be used to improve the handling of field quality (FQ) issues for electronic units. This was done by analysing how failure rates can be predicted, how failure mechanisms can be detected and how data-based lifetime models could be developed. The work has been done on an electronic control unit (ECU) that has been subject to a field quality (FQ) issue, determining thermomechanical stress on the solder joints of the BGAs (Ball Grid Array) on the PCBAs (Printed circuit board assembly) to be the main cause of failure. The project is divided into two parts. Part one, "PCBA" where a laboratory study on the effects of thermomechanical cycling on solder joints for different electrical components of the PCBAs are investigated. The second part, "ECU" is the main part of the project investigating data-driven solutions using operational and workshop history data. The results from part one show that the Weibull distribution commonly used to predict lifetimes of electrical components, work well to describe the laboratory results but also that non parametric methods such as kernel distribution can give good results. In part two when Weibull together with Gamma and Normal distributions were tested on the real ECU (electronic control unit) data, it is shown that none of them describe the data well. However, when random forest is used to develop data-based models most of the ECU lifetimes of a separate test dataset can be correctly predicted within a half a year margin. Further using random survival forest it was possible to produce a model with just 0.06 in (OOB) prediction error. This shows that machine learning methods could potentially be used in the purpose of condition based maintenance for ECUs.