Guias de onda de luz foram fabricados por difusão térmica de Titânio em substratos de LiNbO3. Os índices efetivos dos modos guiados foram medidos usando o método de acoplamento por prismas e a equação de onda resolvida numericamente usando a aproximação WKB. Profundidade de difusão, variação máxima do índice de refração e o perfil da concentração de Titânio são calculados para um guia que suporta três modos TE / Optical waveguides have been fabricated by thermal diffusion of Titanium into LiNO3 substrate. The effective indices of guided modes have been measured using a prism coupling method and the wave equation has been solute numerically using the WKB approximation. The diffusion depth, maximum refractive index change and titanium concentration profited was calculated for one waveguide that support three TE modes

A evolução do potencial de superfície de amostras dielétricas é calculada através da resolução de modelos teóricos pelo método numérico de diferenças finitas. São considerados os fenômenos de polarização elétrica, condutividade intrínseca, injeção de carga espacial, dissociação iônica no volume da amostra e difusão de moléculas, através da superfície da amostra, as quais podem se dissociar no volume. A subida do potencial de superfície é calculada para cada caso e também são discutidas as situações nas quais se consideram a ocorrência de dois fenômenos. Procura-se, com a ajuda dos modelos desenvolvidos, interpretar o comportamento geral da subida do potencial em função do tempo para amostras ferroelétricas (polímero PVDF-beta e copolímero P(VDF-TrFE)) e amostras não ferroelétricas (polímero PVDF-alfa). / The finite-difference method has been employed for the determination of the surface potencial buildup of dielectric samples. In the models several processes have been considered such as the electric polarization, intrinsic conductivity, space charge injection, ionic dissociation and diffusion of molecules which dissociates in the sample bulk. The surface potential has been determined for each case considering two different phenomena. The models developed throughout the work are used for interpreting surface potential buildup curves of ferroelectric materials (PVDF-beta and P(VDF-TrFE) copolymers) and also of non-ferroelectric PVDF-alfa samples.

by Leung, Kwok Kong. / Thesis (M.Phil.)--Chinese University of Hong Kong, 1999. / Includes bibliographical references (leaves 67). / Text in English; abstracts in English and Chinese. / by Leung, Kwok Kong. / Abstract --- p.ii / Acknowledgement --- p.iii / Contents --- p.iv / List of Figures --- p.vi / Chapter Chapter 1. --- Introduction --- p.1 / Chapter Chapter 2. --- Transmittance in Metal-Dielectric Multilayers --- p.4 / Chapter 2.1 --- Introduction --- p.4 / Chapter 2.2 --- Transfer matrix approach --- p.5 / Chapter 2.3 --- Transfer matrix simulation --- p.7 / Chapter 2.4 --- Physical explanation --- p.14 / Chapter Chapter 3. --- Optical Nonlinear Response of Composite Layer --- p.17 / Chapter 3.1 --- Transfer matrix formalism for oblique incidence --- p.18 / Chapter 3.1.1 --- Transfer matrix method in nonlinear region --- p.18 / Chapter 3.1.2 --- S-polarization --- p.19 / Chapter 3.1.3 --- P-polarization --- p.19 / Chapter 3.1.4 --- Backward propagation technique --- p.22 / Chapter 3.2 --- Nonlinear phase shift --- p.22 / Chapter 3.3 --- Transfer matrix method approach --- p.24 / Chapter 3.4 --- Analytic solution formalism --- p.26 / Chapter Chapter 4. --- Study of Photonic Band Gap of Nonlinear Dielectrics --- p.33 / Chapter 4.1 --- Introduction --- p.33 / Chapter 4.2 --- Nonlinear response of single thin nonlinear layer --- p.34 / Chapter 4.3 --- Nonlinear response of δ-function between two linear dielectric --- p.37 / Chapter 4.4 --- Photonic band structure --- p.41 / Chapter 4.4.1 --- Photonic band structure of linear thin films --- p.41 / Chapter 4.4.2 --- Photonic band structure of linear layers --- p.42 / Chapter 4.5 --- Photonic band gap of nonlinear dielectric multilayers --- p.46 / Chapter Chapter 5. --- Optical Limiting of Composite Material --- p.49 / Chapter 5.1 --- Transmittance of periodic multilayer structures --- p.50 / Chapter 5.1.1 --- Transmittance properties at low intensity --- p.50 / Chapter 5.1.2 --- Transmittance at high intensity: optical limiting effect --- p.52 / Chapter 5.2 --- The effect of layer thickness on optical limiting --- p.53 / Chapter 5.3 --- Optical limiting property of PBG materials --- p.55 / Chapter Chapter 6. --- Conclusion --- p.63 / Chapter Appendix A. --- Effective dielectric function --- p.64 / Bibliography --- p.67

"In this work we consider an optimal design problem formulated on a two dimensional domain filled with two isotropic dielectric materials. The objective is to find a design that supports an electric field which is as close as possible to a target field, under a constraint on the amount of the better dielectric. In the case of a zero target field, the practical purpose of this problem is to avoid the so called dielectric breakdown of the material caused due to a relatively large electric field. In general, material layout problems of this type fail to have an optimal configuration of the two materials. Instead one must study the behavior of minimizing sequences of configurations. From a practical perspective, optimal or nearly optimal configurations of the two materials are of special interest since they provide the information needed for the manufacturing of optimal designs. Therefore in this work, we develop theoretical and numerical means to support a tractable method for the numerical computation of minimizing sequences of configurations and illustrate our approach through numerical examples. The same method applies if we were to replace the electric field by electric flux, in our objective functional. Similar optimization design problems can be formulated in the mathematically identical contexts of electrostatics and heat conduction."

A medida do teor de umidade de materiais resulta em ganhos econômicos e ambientais ao possibilitar o controle preciso da secagem de produtos agrícolas, de processos de cura e armazenagem, e reduzir perdas de material e consumo de energia. Tal medida pode ser feita através da interação de ondas eletromagnéticas nas frequências de micro-ondas. Apresenta-se o desenvolvimento histórico e o estado da arte dessa área da metrologia que é conhecida por aquametria por micro-ondas. Detalha-se o comportamento das ondas eletromagnéticas em dielétricos, o modelo de espalhamento nas interfaces das amostras, a relação entre a permissividade complexa e a umidade, métodos para a determinação da permissividade, instrumentos, sistemas e aspectos metrológicos da cadeia de medição para espectroscopia dielétrica. Dois novos métodos, com equações explícitas originais para a determinação da permissividade são obtidos. As novas equações resultam em incerteza menor que os métodos clássicos. Uma nova metodologia, através do método de Monte Carlo, é empregada para a avaliação das mesmas. Conclui-se que o desenvolvimento da aquametria passa, necessariamente, pelo aperfeiçoamento dos instrumentos e métodos para determinação da permissividade dos materiais. / The measurement of moisture content of materials results in economic and environmental gains. Monitoring drying and curing of materials prevents loss of products and waste of energy. This can be done through the interaction of electromagnetic waves at microwave frequencies. This dissertation presents the historical development and the state-of-the-art in aquametry, the behavior of electromagnetic waves in dielectrics, sample interface scattering model, the relationship between the complex permittivity and moisture, methods for determining permittivity, instruments and metrological aspects of the measurement chain, and some instruments for dielectric spectroscopy. Two new methods, capable of providing explicit equation for the permittivity, are obtained and the Monte Carlo method is applied to determine their uncertainty. The new equations have lower uncertainty than the classic methods. The general conclusion is that the development of instrumentation and techniques in aquametry must be based in improvements in permittivity measurement.

Optical detection devices such as optical biosensors and optical spectrometers are widely used in many applications for the functions of measurements, inspections and analysis. Due to the large dimension of prisms and gratings, the traditional optical devices normally occupy a large space with complicated components. Since cheaper and smaller optical devices are always in demand, miniaturization has been kept going for years. Thanks to recent fabrication advances, nanophotonic devices such as semiconductor laser chips have been growing in number and diversity. However, the optical biosensor chips and the optical spectrometer chips are seldom reported in the literature. For the reason of improving system integration, the study of ultra-compact, low-cost, high-performance and easy-alignment optical biosensors and optical spectrometers are imperative. This thesis is an endeavor in these two subjects and will present our research work on studying the optical transmission properties of dielectric aperture arrays and developing new optical biosensors and optical spectrometers. / Subsequently, optical transmission properties through a self-mixing interferometer array are studied and a novel high-resolution cost-effective optical spectrometer is proposed. The miniature interferometer-based spectrometer is made of polymethyl methacrylate (PMMA) with a CCD as the detector. The detected intensity of each CCD pixels contains the spectral information. Since each frequency component in the incoming beam corresponds to a unique phase difference of the two beam portions of each optical interferometer, the total intensity received by each CCD pixel, which is resulted from the addition of the interference signals from all the frequency components in the beam, should also be unique. Therefore, the spectrum calculation is a problem to solve an ill-posed linear system by using Tikhonov regularization method. Simulation results show that the resolution can reach picometer level. Apart from the choice of path difference between the interfering beams, the spectral resolution also depends on the signal-to-noise ratio and analogue-digital conversion resolution (dynamic range) of the CCD chip. In addition, the theory of uniform waveguide scattering is explored to expand the possibility of using such mini-interferometers for performing free-space spectral analysis of waveguide devices. At the same time, the method of least squares is used to correct the pixel non-uniformity of the CCD so as to improve the performance of the spectrometer. / The first half of the thesis demonstrates that the optical phase shift associated with the surface plasmon (SP) assisted extraordinary optical transmission (EOT) in nano-hole arrays fabricated in a metal film has a strong dependence on the material refractive index value in close proximity to the holes. A novel refractive index sensor based on detecting the EOT phase shift is proposed by building a model. This device readily provides a 2-D biosensor array platform for non-labeled real-time detection of a variety of organic and biological molecules in a sensor chip format, which leads to a high packing density, minimal analyte volumes, and a large number of parallel channels while facilitating high resolution imaging and supporting a large space-bandwidth product (SBP). Simulation (FDTD Solutions, Lumerical Solutions Inc) results indicate an achievable sensitivity limit of 4.37x10-9 refractive index units (RIU) and a dynamic range as large as 0.17 RIU. / The sensor chip and spectrometer chip introduced here are based on the interference of light transmitted through dielectric aperture arrays. Their compact feature renders these devices ideal for miniaturization and integration as the systems in microfluidics architectures and lab-on-chip designs. / Yang, Tao. / Adviser: H. P. Ho. / Source: Dissertation Abstracts International, Volume: 72-04, Section: B, page: . / Thesis (Ph.D.)--Chinese University of Hong Kong, 2010. / Includes bibliographical references (leaves 150-163). / Electronic reproduction. Hong Kong : Chinese University of Hong Kong, [2012] System requirements: Adobe Acrobat Reader. Available via World Wide Web. / Electronic reproduction. Ann Arbor, MI : ProQuest Information and Learning Company, [200-] System requirements: Adobe Acrobat Reader. Available via World Wide Web. / Abstract also in Chinese.

Luk, Wai Chun = / Thesis (M.Phil.)--Chinese University of Hong Kong, 2010. / Includes bibliographical references (leaves 101-108). / Abstracts in English and Chinese. / Luk, Wai Chun = / Chapter 1 --- Introduction --- p.1 / Chapter 2 --- Theoretical Background --- p.5 / Chapter 2.1 --- Maxwell´ةs equations in matter --- p.5 / Chapter 2.2 --- Dielectric constant of materials --- p.8 / Chapter 2.3 --- Dispersion relation of surface plasmon polaritons --- p.10 / Chapter 2.4 --- Excitation of surface plasmon polaritons --- p.16 / Chapter 2.4.1 --- Prism coupling --- p.17 / Chapter 2.4.2 --- Grating coupling --- p.21 / Chapter 2.5 --- Diffraction of light in gratings --- p.26 / Chapter 2.6 --- Applications --- p.27 / Chapter 3 --- Analysis Methods --- p.29 / Experimental Section --- p.29 / Chapter 3.1 --- Interference Lithography --- p.29 / Chapter 3.2 --- Gold grating fabrication --- p.32 / Chapter 3.2.1 --- Substrate preparation --- p.33 / Chapter 3.2.2 --- Photoresist preparation --- p.34 / Chapter 3.2.3 --- Spin coating of omnicoat and photoresist --- p.35 / Chapter 3.2.4 --- Interference lithography set-up and procedures --- p.35 / Chapter 3.2.5 --- The post-exposed treatments --- p.37 / Chapter 3.2.6 --- The optimal exposure time calibration --- p.37 / Chapter 3.2.7 --- Gold thin film deposition --- p.39 / Chapter 3.2.8 --- Typical gold grating sample --- p.41 / Chapter 3.3 --- Measurement system --- p.41 / Chapter 3.3.1 --- The angle dependent reflectivity measurement --- p.42 / Chapter 3.3.2 --- Data presentation of a typical band structure --- p.45 / Chapter 3.3.3 --- Periodicity measurement of the grating samples --- p.48 / Chapter 3.3.4 --- Diffracted intensity measurement of gratings --- p.52 / Chapter 3.3.5 --- Data presentation of the angle dependent diffracted intensity measurement --- p.53 / Calculation Section --- p.54 / Chapter 3.4 --- RCWA simulations --- p.54 / Chapter 3.4.1 --- The dispersion relation --- p.56 / Chapter 3.4.2 --- The diffracted intensity --- p.56 / Chapter 3.4.3 --- The field pattern graphs --- p.57 / Chapter 4 --- Resonance modes in one-dimensional gold gratings --- p.60 / Chapter 4.1 --- Structure of the gold grating samples --- p.61 / Chapter 4.2 --- Results of angle dependent reflectivity --- p.63 / Chapter 4.2.1 --- Surface Plasmon Polaritons (SPPs) --- p.65 / Chapter 4.2.2 --- Wood´ةs anomaly --- p.65 / Chapter 4.2.3 --- Waveguide Resonance (WG) --- p.67 / Chapter 4.2.4 --- Coupling of SPPs and WG --- p.67 / Chapter 4.3 --- Results of angle dependent diffracted intensity measurement --- p.68 / Chapter 4.4 --- Basic properties of SPPs and WG modes by RCWA --- p.73 / Chapter 4.4.1 --- Sample 1 (D = 40 nm) --- p.74 / Chapter 4.4.1(a) --- λ = 980 nm of Sample 1 --- p.75 / Chapter 4.4.1(b) --- λ = 633 nm of Sample 1 --- p.81 / Chapter 4.4.2 --- Sample 2 (D = 390 nm) --- p.83 / Chapter 4.4.2(a) --- λ = 980 nm of Sample 2 --- p.85 / Chapter 4.4.2(b) --- λ = 725 nm of Sample 2 --- p.87 / Chapter 4.4.2(c) --- λ = 633 nm of Sample 2 --- p.92 / Chapter 4.5 --- Summary --- p.97 / Chapter 5 --- Conclusions --- p.99 / Bibliography --- p.101

Sham, Chun Hong = 金屬光栅光學特性的實驗和理論研究 / 沈鎮康. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2009. / Includes bibliographical references (leaves 109-111). / Abstract also in Chinese. / Sham, Chun Hong = Jin shu guang shan guang xue te xing de shi yan he li lun yan jiu / Shen Zhenkang. / Chapter 1 --- Introduction --- p.1 / Chapter 1.1 --- Background --- p.1 / Chapter 1.2 --- Overview of the Thesis --- p.2 / Chapter 2 --- Basic Theory --- p.4 / Chapter 2.1 --- Dielectric Constant of Metals --- p.5 / Chapter 2.2 --- The Maxwell´ةs Equations --- p.7 / Chapter 2.3 --- Scaling Properties of the Maxwell´ةs Equations --- p.9 / Chapter 2.4 --- Translational Symmetry and the Bloch´ةs Theorem --- p.10 / Chapter 2.4.1 --- Continuous Translational Symmetry --- p.11 / Chapter 2.4.2 --- Discrete Translational Symmetry --- p.12 / Chapter 2.4.3 --- Photonic Bloch´ةs Theorem --- p.13 / Chapter 3 --- Principles of Rigorous Coupled Wave Analysis --- p.14 / Chapter 3.1 --- Mathematical Formulation --- p.15 / Chapter 3.2 --- One-layer systems --- p.15 / Chapter 3.3 --- Layered Systems --- p.19 / Chapter 3.3.1 --- Matching Boundary Conditions --- p.19 / Chapter 3.3.2 --- The Transfer Matrices --- p.21 / Chapter 3.3.3 --- Scattering Matrices --- p.22 / Chapter 3.4 --- Calculation of Reflection and Transmission --- p.24 / Chapter 3.5 --- Calculation of Field Pattern --- p.26 / Chapter 3.5.1 --- Finding the Coefficients --- p.26 / Chapter 3.5.2 --- Summing to Get the Field --- p.27 / Chapter 3.6 --- 5-polarization --- p.27 / Chapter 3.7 --- Analogy to mechanics --- p.29 / Chapter 3.8 --- Conclusion --- p.30 / Chapter 4 --- Numerical Implementation of Rigorous Coupled Wave Analysis --- p.31 / Chapter 4.1 --- Finite Number of Terms --- p.31 / Chapter 4.2 --- Fourier Factorization Rule --- p.32 / Chapter 4.3 --- Calculation of Field Pattern --- p.34 / Chapter 4.4 --- Transfer Matrix for Forward Deduction --- p.36 / Chapter 4.5 --- Calculation of Time-Averaged Poynting Vector --- p.36 / Chapter 4.6 --- Convergence of RCWA --- p.37 / Chapter 4.7 --- Simple Examples --- p.40 / Chapter 4.7.1 --- Oblique Incidence on Vacuum --- p.40 / Chapter 4.7.2 --- Oblique Incidence on Semi-Infinite Glass --- p.41 / Chapter 4.7.3 --- Normal Incidence on a Thin Gold Film --- p.41 / Chapter 5 --- A Tunable All-Direction Light Absorber --- p.43 / Chapter 5.1 --- Description of the Absorber --- p.44 / Chapter 5.2 --- Tunability --- p.45 / Chapter 5.3 --- Theoretical Understanding on the Results --- p.46 / Chapter 5.4 --- Other EM modes Involved --- p.49 / Chapter 5.5 --- Structural Flexibility --- p.54 / Chapter 6 --- Sample Preparation Techniques --- p.57 / Chapter 6.1 --- Interference Lithography --- p.57 / Chapter 6.1.1 --- Basic Principle of IL --- p.58 / Chapter 6.1.2 --- Experimental Setup for IL --- p.59 / Chapter 6.1.3 --- Experimental Procedures for IL --- p.60 / Chapter 6.1.4 --- Tuning the Period --- p.61 / Chapter 6.1.5 --- Tuning Grating Width --- p.62 / Chapter 6.1.6 --- Tuning the grating height --- p.64 / Chapter 6.2 --- Sputtering --- p.65 / Chapter 6.2.1 --- Description of Sputtering System --- p.65 / Chapter 6.2.2 --- Effect of Varying the Position on Sample Holder --- p.66 / Chapter 6.3 --- Chemical deposition of silver --- p.69 / Chapter 7 --- Sample Characterization Techniques --- p.72 / Chapter 7.1 --- Scanning Electron Microscope --- p.72 / Chapter 7.1.1 --- Grating width measurement --- p.72 / Chapter 7.1.2 --- Sidewall Coverage Measurement --- p.73 / Chapter 7.2 --- Thickness Measurement --- p.74 / Chapter 7.3 --- Reflectance Measurement --- p.75 / Chapter 7.3.1 --- Experimental Setup --- p.76 / Chapter 7.3.2 --- Use of Prism --- p.79 / Chapter 8 --- Experimental Realization of All-Direction Light Absorber --- p.82 / Chapter 8.1 --- Reflectance of Glass Substrate --- p.82 / Chapter 8.2 --- Planar Metal-SU8-Metal Systems --- p.87 / Chapter 8.3 --- SU8 Grating on Glass Substrate --- p.89 / Chapter 8.4 --- SU8 Grating on Gold Substrate --- p.92 / Chapter 8.4.1 --- Grating on a Thick Layer of Gold --- p.93 / Chapter 8.4.2 --- Grating on a Thin Layer of Gold --- p.93 / Chapter 8.5 --- Cavities-Embedded Systems and Future Work --- p.96 / Chapter 8.6 --- Summary and Future Experimental Work --- p.100 / Chapter 9 --- Conclusion --- p.102 / Chapter A --- Notes on Glass Cleaning --- p.104 / Chapter B --- An Experiment on Sidewall Coverage --- p.107 / Bibliography --- p.109

Construímos um acelerador de elétrons de baixa energia (opera na faixa de 0,4 - 20 keV) que dispõe dos recursos necessários para ser utilizado como instrumento de pesquisa em áreas relacionadas com os isolantes. Neste trabalho, ele foi empregado para estudar a emissão secundária em polímeros ou, mais especificamente, para mostrar que um novo método de medida de emissão secundária, que designamos \"Método de Medida Dinâmica\", descrito por H. Von Seggern [IEEE Trans. Nucl. Sei. NS-32, p.1503 (1985)] não permite, ao contrário do que se esperava, obter a verdadeira curva de emissão secundária devido à influência exercida pela carga positiva acumulada sobre a emissão. Contudo, no decorrer do trabalho, mostramos que a montagem descrita por ele ainda pode ser utilizada com vantagem para: i) medir precisamente a energia do 2&#176 ponto de cruzamento e ii) para levantar a verdadeira curva de emissão se, ao invés irradiarmos o alvo continuamente, usarmos pulsos de corrente. Além disso, pudemos, analisando o modo como a carga positiva age sobre a emissão nas mais diversas situações. I) estimar a profundidade de escape máxima e média dos secundários; II) mostrar que a carga positiva líquida numa amostra carregada positivamente fica próxima da superfície e III) mostrar que em amostras carregadas negativamente as cargas positivas ficam próximas da superfície e as negativas, em maior número, no volume do material. / We have constructed an accelerator for the generation of low energy e1ectrons (in the 0.4 to 20 keV range). The accelerator is equipped with some devices especially designed for the investigation of the e1ectrical properties of electron-irradiated dielectrics. In this work we have employed it for the study of the secondary electron emission of irradiated polymers. Reference is made to a method proposed bt H. von Seggern [IEEE Trans. Nucl. Sci. NS-32, p.1503 (1985)] which was intended for the determination of the electron emission yield especially between the two cross-over points in a single run, here called the dynamical method. We have been able to prove that, contrary to expectation, this method does not give correct results over the entire emission curve. Rather it gives yield values which are too low by 25% in the region where the emission exhibits a maximum, due to the interaction between the electron emission process and the positive surface charge of the dielectric. However the method needs not to be dismissed entirely. As it is, it can be used advantageously for the precise determination of the energy of the second cross-over point. In addition, with the same set up, the method could be improved by replacing the continuous irradiation of the sample by a pulsed irradiation, leading to results essentially the same as those shown in the literature. Finally, analyzing the process of interaction between the positive charge of the dielectric and the mechanism of electron emission in several situations, we were able: I) to determine the maximum value and the average value of the escape depth of the emitted electrons; II) for a sample with a net positive charge, to show that the positive charge resides very near the surface of incidence; III) for a sample with a net negative charge, to show that the positive charge also resides near the surface while the (prevalent) negative charge resides in the bulk of the material

There is a need in the dairy industry for instrumentation capable of providing on-line information about the moisture content of cheese during manufacture. Present measurement techniques are usually performed off-line and can be susceptible to human error. It is demonstrated that microwave-based moisture sensing techniques offer a number of potential advantages over conventional methods due to the strong interaction of microwaves with water. The permittivity of cream cheese curd and low-fat cheddar cheese curd has been measured over a range of frequencies and moisture contents in order to establish the relationship between these variables. A vector reflection coefficient measurement engine based on a six-port reflectometer has been built and tested. A suitable sensing head has been fabricated from a short length of microstrip transmission line. Two sensor characterisation models have been developed and compared with measured data. A novel algorithm has been developed to resolve the ambiguity inherent in many permittivity measurement techniques. It has been discovered that surface waves can propagate on a grounded dielectric slab covered by a material with a higher dielectric constant, provided the loss factor of the covering medium is greater than zero. It has also been found that the dominant mode of microstrip can radiate when the line is covered by a high-permittivity material, although this can be suppressed if the covering material is sufficiently lossy. There are three principal conclusions to draw from the investigation in this thesis. Firstly, changes in the moisture content of cheese curd during manufacture produce measurable variations in permittivity. Secondly, these changes can be measured accurately and cheaply using off-the-shelf microwave hardware. Finally, considerable attention must be paid to the characterisation of the sensing head if the instrument is to achieve its full potential. Promising results have been obtained in this area, however certain issues pertaining to the propagation of multiple dominant modes and higher order modes have not been fully resolved and would repay further theoretical analysis.