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Orientador: Carlos Alberto dos Reis Filho / Dissertação (mestrado) - Universidade Estadual de Campinas, Faculdade de Engenharia Elétrica e de Computação / Made available in DSpace on 2018-08-16T07:16:47Z (GMT). No. of bitstreams: 1 Lima_JoseErickdeSouza_M.pdf: 6787187 bytes, checksum: 105b3b5aec8638e48cd17d79b4962b1d (MD5) Previous issue date: 2010 / Resumo: Este trabalho descreve um sistema constituído de diversos instrumentos, que se encontram interligados e gerenciados por um aplicativo de software, implementando um ambiente compacto para a caracterização de conversores analógico-digitais, de acordo com os procedimentos descritos nas normas IEEE 1057-1994 e IEEE 1241-2000. O sistema desenvolvido possui limitações quanto aos tipos de conversores analógico-digitais que podem ser testados, devidas às restrições impostas pelos equipamentos disponíveis neste momento. Sua estrutura, no entanto, foi concebida para permitir a expansão destes limites com a troca dos instrumentos limitantes à medida que estes forem adquiridos. A avaliação da sua funcionalidade foi realizada testando dois conversores analógico-digitais que têm características distintas. Enquanto um dos dispositivos testados tem resolução nominal de 10 bits e taxa de conversão de 80 MSPS, o outro tem resolução de 8 bits e taxa de conversão nominal de 8kSPS. A motivação para o desenvolvimento deste sistema está no projeto de conversores analógico-digitais integrados que se encontra em andamento no LPM-FEEC-Unicamp. A disponibilidade de um ambiente de teste com as propriedades do sistema desenvolvido é um requisito importante para o sucesso do projeto, pois viabiliza a verificação imediata dos circuitos construídos, reduzindo o tempo de convergência às metas do projeto / Abstract: This paper describes a system composed of various instruments, which are interconnected and managed by a software application, implementing a compact environment for characterization of analog-digital converters, according to the procedures described in IEEE 1057-1994 and IEEE 1241 -2000. The developed system has limitations on the kinds of analog-digital converters that can be tested due to restrictions imposed by the equipment available at the moment. Its structure, however, was designed to allow the expansion of these limits with the exchange of the limiting instruments as they are acquired. The evaluation of its functionality was performed by testing two analog-digital converters that have distinct characteristics. While one of the tested devices has nominal resolution of 10 bits and conversion rate of 80 MSPS, the other has 8-bit resolution and conversion rate four orders of magnitude below. The motivation for developing this system is the design of integrated analog-digital converters that is being carried on at the LPM-FEEC-Unicamp. The availability of a test environment with the properties of the developed system is an important requisite for the success of the project because it enables the immediate verification of the constructed circuits, thus reducing the convergence time to the project goals / Mestrado / Eletrônica, Microeletrônica e Optoeletrônica / Mestre em Engenharia Elétrica

Testing analog circuits is more difficult than digital circuits. The reasons for this difficulty include continuous time and amplitude signals, lack of well-accepted testing techniques and time and cost required for its realization. The traditional method for testing analog circuits involves measuring all the performance parameters and comparing the measured parameters with the limits of the data-sheet specifications. Because of the large number of data-sheet specifications, the test generation and application requires long test times and expensive test equipment. This thesis proposes an implicit functional testing technique for analog circuits that can be easily implemented in BIST circuitry. The proposed technique does not require measuring data-sheet performance parameters. To simplify the testing only time domain digital input is required. For each circuit under test (CUT) a cross-covariance signature is computed from the test input and CUT's output. The proposed method requires a training sample of the CUT to be binned to the data-sheet specifications. The binned CUT sample cross-covariance signatures are mapped with a supervised machine learning classifier. For each bin, the classifiers select unique sub-sets of the cross-covariance signature. The trained classifier is then used to bin newly manufactured copies of the CUT. The proposed technique is evaluated on synthetic data generated from the Monte Carlo simulation of the nominal circuit. Results show the machine learning classifier must be chosen to match the imbalanced bin populations common in analog circuit testing. For sample sizes of 700+ and training for individual bins, classifier test escape rates ranged from 1000 DPM to 10,000 DPM.

With a decreasing minimum feature size in very large scale integration (VLSI) complementary metal oxide semiconductor (CMOS) technology, the number of transistors that can be integrated on a single chip is increasing rapidly. Ensuring that these extremely dense chips are almost free of defects, and at the same time, cost-effective requires planning from the initial stage of design. This research proposes a concurrent engineering-based design methodology for layout optimization. The proposed method for layout optimization is iterative, and layout changes in each design iteration are made based on the principles of physical design for testability (P-DFT). P-DFT modifies a design such that the circuit has fewer faults, difficult to detect faults are made easier to detect, and difficult to detect faults are made less likely to occur. To implement this design methodology, a mathematical model is required to evaluate alternate designs. This research proposes an evaluation measure: the cost quality model. The cost quality model extends known test quality and testability estimation measures for gate-level circuits to switch-level circuits. To provide high fidelity in testability estimation and reasonable CPU time overhead, the cost quality model uses inductive fault analysis techniques to extract a realistic circuit fault list, I_DDQ test generation techniques to generate tests for these faults, statistical models to reduce computational overhead due to test generation and fault simulation, yield simulation tools, and mathematical models to estimate test quality and costs. To demonstrate the effectiveness of this model, results are presented for CMOS layouts of benchmark circuits and modifications of these layouts. / Master of Science

Test cost is a critical component in the overall cost of the product. Test cost varies in direct proportion with test time. This thesis introduces a data driven feed forward adaptive technique for reducing test time at wafer sort while maintaining the product defect level. Test data from first insertion of wafer is statistically analyzed to make a decision about adaptive test flow at subsequent insertions. The data driven feed forward technique uses a statistical screen to analyze test data from first probe of wafer and provides recommendations for test elimination at second insertions. At the second insertion dies are subjected to only the optimum number of tests for a reduced test flow. This technique is applicable only for the products which are tested at two or more insertions. The statistical screen identifies the dies for reduced test flow based upon correlation of tests across insertions. The tests which are repeated at both the insertions and are highly correlated are the candidates of elimination at second insertion. The feed forward technique is applied to a mixed signal analog product and figures of merit are evaluated. Application of technique to the production data shows that there is an average 55% test time reduction when a single site is tested per touchdown and up to 10% when 16 sites are tested in parallel per touchdown.

The proliferation of wireless communication devices in the recent past has increased the pressure on semiconductor manufacturers to produce quality radio frequency (RF) modules and systems at a low cost. This entails reducing their test cost as well, since the cost of testing modern RF devices can be up to 40% of their manufacturing cost. The high test cost of these devices can be mainly attributed to (a) the expensive nature of the RF automated test equipment (ATE) used to perform wafer-level and fully packaged RF functionality tests, (b) limited test point access for the application and capture of test signals, (c) the long test development and application times, and (d) the lack of diagnostic tools to evaluate and improve the performance of loadboards and test resources in high-volume tests. In this thesis, a framework for the efficient production testing of high-performance RF modules and systems using low-cost ATE is presented. This framework uses low-speed, low-resolution test resources to generate reliable tests for complex RF systems. Also, the test resources will be evaluated and improved ahead of high-volume tests to improve test yield and throughput. The components of the proposed framework are: (1) Genetic ATPG for reliable test stimulus generation using low-resolution test resources: A genetic algorithm (GA) based automatic test pattern generator (ATPG) to optimize the alternate test stimulus for reliable testing of complex RF systems using low-resolution, low-cost test resources. These test resources may be on-chip or off-chip. (2) Concurrent voltage/current alternate test methodology: A testing framework for efficiently testing the high-frequency specifications of RF systems using low-frequency spectral and/or transient current signatures. Suitable on-chip and/or off-chip design-for-test (DfT) resources are used to enable the source and capture operations at lower frequencies. (3) Loadboard checker: A checker tool to accurately characterize/diagnose the DfT resources on the RF loadboards used to enable test of RF devices/systems using low-cost ATE. (4) Advanced test signal processing algorithms: The performance of the low-cost ATE resources, in terms of their linearity/resolution, will be evaluated and improved to enable the accurate capture of the test response signals.

This thesis proposes a multifaceted production test and post-silicon yield enhancement framework for RF systems. The three main components of the proposed framework are the design, production test, and post-test phase of the overall integrated circuit (IC) development cycle. First, a circuit-sizing method is presented for incorporating test considerations into algorithms for automatic circuit synthesis/device resizing. The sizing problem is solved by using a cost metric that can be incorporated at minimal computational cost into existing optimization tools for manufacturing yield enhancement. Along with the circuit-sizing method introduced in the design phase, a low-cost test and diagnosis method is presented for multi-parametric faults in wireless systems. This test and diagnosis method allows accurate prediction of the end-to-end specifications as well as for the specifications of all the embedded modules. The procedure is based on application of optimized test stimulus and the use of a simple diode-based envelope detector to extract the transient test response envelope at RF signal nodes. This eliminates the need to make RF measurements using expensive standard testers. To further improve the parametric yield of RF circuits, a performance drift-aware adaptation scheme is proposed that automatically compensates for the loss of circuit performance in the presence of process variations. This work includes a diagnosis algorithm to identify faulty circuits within the system and a compensation process that adjusts tunable components to reduce the effects of performance variations. As a result, all the mentioned components contribute to producing a low-cost production test and to enhancing post-silicon parametric yield.

The test of digital integrated circuits compares the test pattern results for the device under test (DUT) to the expected test pattern results of a standard reference. The standard response is typically obtained from simulations. The test pattern and response are created and evaluated assuming ideal test conditions. The standard response is normally stored within automated test equipment (ATE). However the use of ATE is the major contributor to the test cost. This thesis explores an alternative strategy to the standard response. As an alternative to the stored standard response, the response is estimated by fault tolerant technique. The purpose of the fault tolerant technique is to eliminate the need of standard response and enable online/real-time testing. Fault tolerant techniques use redundancy and majority voting to estimate the standard response. Redundancy in the circuit leads to fault aliasing. Fault aliasing misleads the majority voter in estimating the standard response. The statistics and phenomenon of aliasing are analyzed for benchmark circuits. The impact of fault aliasing on test with respect to coverage, test escape and over-kill is analyzed. The results show that aliasing can be detected with additional test vectors and get 100% fault coverage.