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The Phase Change Memories (PCM) based on chalcogenide glasses are being considered recently as a possible replacement for conventional Non Volatile Random Access Memories (NVRAM). The main advantages of chalcogenide phase change memories are their direct write/overwrite capability, lower voltages of operation, large write/erase cycles, easiness to integrate with logic, etc. The phase change random access memories work on the principle of memory switching exhibited by chalcogenide glasses during which a local structural change (between amorphous and crystalline states) occurs due to an applied electric field. The development of newer phase change materials for NVRAM applications is based on synthesizing newer glass compositions and investigating their electrical switching characteristics by applying current/voltage pulses of different waveforms. The thermal studies on chalcogenide glasses which provide information about thermal stability, glass forming ability, etc., are also important while selecting a chalcogenide glass for PCM applications. The present thesis work deals with electrical switching and thermal studies on certain silicon based ternary telluride glasses (As-Te-Si, Ge-Te-Si and Al-Te-Si). The effect of network topological thresholds on the composition dependence of switching voltages and thermal parameters such as glass transition temperature, specific heat capacity, non-reversing enthalpy, etc., of these glasses has been investigated. The first chapter of the thesis provides an introduction to various properties of chalcogenide glasses, including their applications in phase change memories. The fundamental aspects of amorphous solids such as glass formation, glass transition, etc., are presented. Further, the concepts of rigidity percolation and self organization in glassy networks and the influence of local structural effects on the properties of glassy chalcogenides are discussed. Also, a brief history of evolution of phase change memories is presented. The second chapter deals with the experimental techniques employed in this thesis work; for sample preparation and for electrical switching studies, Alternating Differential Scanning Calorimetry (ADSC), Raman spectroscopy, NMR spectroscopy, etc. The third chapter discusses the electrical switching and thermal studies on As30Te70-xSix (2 ≤ x ≤ 22) and As40Te60-xSix (2 ≤ x ≤ 17) glasses. The composition dependence of electrical switching voltage (VT) and thermal parameters such as glass transition temperature (Tg), crystallization temperature (Tc), thermal stability (Tc-Tg), etc., reveals the occurrence of extended rigidity percolation and chemical thresholds in As30Te70-xSix and As40Te60-xSix glasses. Chapter 4 presents the electrical switching and thermal studies on Ge15Te85-xSix glasses (2 ≤ x ≤ 12). These glasses have been found to exhibit memory type electrical switching. While Ge15Te85-xSix glasses with x ≤ 5 exhibit a normal electrical switching, an unstable behavior is seen in the I-V characteristics of Ge15Te85-xSix glasses with x > 5 during the transition to ON state. Further, the switching voltage (VT) and initial resistance (R) are found to increase with addition of Si, exhibiting a change in slope at the rigidity percolation threshold of the Ge15Te85-xSix system. The ADSC studies on these glasses indicate the presence of an extended stiffness transition and a thermally reversing window in Ge15Te85-xSix in the composition range of 2 ≤ x ≤ 6. The fifth chapter deals with electrical switching investigations, thermal and structural studies on Al15Te85-xSix glasses (2 ≤ x ≤ 12). These glasses have been found to exhibit two crystallization reactions (Tc1 and Tc2) for compositions with x < 8 and a single stage crystallization is seen for compositions above x = 8. Also, a trough is seen in the composition dependence of non-reversing enthalpy (ΔHNR), based on which it is proposed that there is a thermally reversing window in Al15Te85-xSix glasses in the composition range 4 ≤ x ≤ 8. Further, Al15Te85-xSix glasses are found to exhibit a threshold type electrical switching at ON state currents less than 2 mA. The start and the end of the thermally reversing window seen in the thermal studies are exemplified by a kink and saturation in the composition dependence of switching voltages respectively. 27Al Solid State NMR measurements reveal that in Al15Te85-xSix glasses, Al atoms reside in 4-fold as well as 6-fold coordinated environments. Unlike in Al-As-Te glasses, there is no correlation seen between the composition dependence of the fraction of 4-fold and 6-fold coordinated aluminum atoms and the switching behavior of Al-Te-Si samples. Chapter 6 provides a comparison of the properties of the three glassy systems studied (As-Te-Si, Ge-Te-Si and Al-Te-Si), made to identify the system better suited for phase change memory applications. It is found that the Ge-Te-Si glassy system has better electrical/thermal properties for phase change memory applications. The seventh chapter describes easily reversible SET-RESET processes in Ge15Te83Si2 glass which is a promising candidate for phase change memory applications. This sample exhibits memory switching at a comparatively low threshold electric field (Eth) of 7.3 kV/cm. The SET and RESET processes have been achieved with 1 mA triangular current pulse for the SET process and 1 mA rectangle pulse (of 10 msec width) for RESET operation respectively. Further, a self-resetting effect is seen in this material upon excitation with a saw-tooth/square pulse. About 6.5x104 SET-RESET cycles have been achieved without any damage to the device. In chapter 8, results of in-situ Raman scattering studies on the structural changes occurring during the SET and RESET processes in Ge15Te83Si2 sample, are presented. It is found that the degree of disorder in the glass is reduced from OFF to SET state. The local structure of the sample under RESET condition is similar to that in the OFF state. The Raman results are found to be consistent with the switching results which indicate that the Ge15Te83Si2 glass can be SET and RESET easily. Further, Electron Microscopic studies on switched samples indicate the formation of nanometer sized particles of cSiTe2. A summary of the results obtained and the scope for future work are included in the chapter 9 of the thesis.

The search for alternate and renewable energy resources as well as the efficient use of energy and development of such systems that can help to save the energy consumption is needed because of exponential growth in world population, limited conventional fossil fuel resources, and to meet the increasing demand of clean and environment friendly substitutes. Hydrogen being the simplest, most abundant and clean energy carrier has the potential to fulfill some of these requirements provided the development of efficient, safe and durable systems for its production, storage and usage. Chemical hydrides, complex hydrides and nanomaterials, where the hydrogen is either chemically bonded to the metal ions or physiosorbed, are the possible means to overcome the difficulties associated with the storage and usage of hydrogen at favorable conditions. We have studied the structural and electronic properties of some of the chemical hydrides, complex hydrides and functionalized nanostructures to understand the kinetics and thermodynamics of these materials. Another active field relating to energy storage is rechargeable batteries. We have studied the detailed crystal and electronic structures of Li and Mg based cathode materials and calculated the average intercalation voltage of the corresponding batteries. We found that transition metal doped MgH2 nanocluster is a material to use efficiently not only in batteries but also in fuel-cell technologies. MAX phases can be used to develop the systems to save the energy consumption. We have chosen one compound from each of all known types of MAX phases and analyzed the structural, electronic, and mechanical properties using the hybrid functional. We suggest that the proper treatment of correlation effects is important for the correct description of Cr2AlC and Cr2GeC by the good choice of Hubbard 'U' in DFT+U method. Hydrogen is fascinating to physicists due to predicted possibility of metallization and high temperature superconductivity. On the basis of our ab initio molecular dynamics studies, we propose that the recent claim of conductive hydrogen by experiments might be explained by the diffusion of hydrogen at relevant pressure and temperature. In this thesis we also present the studies of phase change memory materials, oxides and amorphization of oxide materials, spintronics and sulfide materials.

La thèse de Giovanni BETTI BENEVENTI portes sur la caractérisation électrique et la modélisationphysique de dispositifs de mémoire non-volatile à changement de phase. Cette thèse a été effectuée dans le cadre d’une cotutelle avec l’Università degli Studi di Modena e Reggio Emilia (Italie).Le manuscrit en anglais comporte quatre chapitres précédés d’une introduction et terminés par uneconclusion générale.Le premier chapitre présent un résumé concernant l’état de l’art des mémoires a changement de phase. Le deuxième chapitre est consacré aux résultats de caractérisation matériau et électrique obtenus sur déposition blanket et dispositifs de mémoire à changement de phase (PCM) basées sur le nouveau matériau GeTe dopé carbone (GeTeC).Le chapitre trois s’intéresse à l’implémentation et à la caractérisation expérimentale d’un setup demesure de bruit a basse fréquence sur dispositifs électroniques a deux terminaux développé auxlaboratoires de l’Università degli Studi di Modena e Reggio Emilia en Italie.Enfin, dans le dernier chapitre est présentée une analyse rigoureuse de l’effet d’auto-chauffage Joulesur la caractéristique I-V des mémoires a changement de phase intégrant le matériau dans la phase polycristalline. / Within this Ph.D. thesis work new topics in the field of Non-Volatile Memories technologies have been investigated, with special emphasis on the study of novel materials to be integrated in Phase-Change Memory (PCM) devices, namely:(a) Investigation of new phase-change materialsWe have fabricated PCM devices integrating a novel chalcogenide material: Carbon-doped GeTe (or simply, GeTeC). We have shown that C doping leads to very good data retention performances: PCM cells integrating GeTeC10% can guarantee a 10 years fail temperature of about 127°C, compared to the 85°C of GST. Furthermore, C doping reduces also fail time dispersion. Then our analysis has pointed out the reduction of both RESET current and power for increasing carbon content. In particular, GeTeC10% PCM devices yield about a 30% of RESET current reduction in comparison to GST and GeTe ones, corresponding to about 50% of RESET energy decrease.Then, resistance window and programming time of GeTeC devices are comparable to those of GST.(b) Advanced electrical characterization techniquesWe have implemented, characterized and modeled a measurement setup for low-frequency noise characterization on two-terminal semiconductor devices.(c) Modeling for comprehension of physical phenomenaWe have studied the impact of Self-induced Joule-Heating (SJH) effect on the I-V characteristics of fcc polycrystalline-GST-based PCM cells in the memory readout region. The investigation has been carried out by means of electrical characterization and electro-thermal simulations.

La recherche dans le domaine de l’informatique neuro-inspirée suscite beaucoup d'intérêt depuis quelques années. Avec des applications potentielles dans des domaines tels que le traitement de données à grande échelle, la robotique ou encore les systèmes autonomes intelligents pour ne citer qu'eux, des paradigmes de calcul bio-inspirés sont étudies pour la prochaine génération solutions informatiques (post-Moore, non-Von Neumann) ultra-basse consommation. Dans ce travail, nous discutons les rôles que les différentes technologies de mémoire résistive non-volatiles émergentes (RRAM), notamment (i) Phase Change Memory (PCM), (ii) Conductive-Bridge Memory (CBRAM) et de la mémoire basée sur une structure Metal-Oxide (OXRAM) peuvent jouer dans des dispositifs neuromorphiques dédies. Nous nous concentrons sur l'émulation des effets de plasticité synaptique comme la potentialisation à long terme (Long Term Potentiation, LTP), la dépression à long terme (Long Term Depression, LTD) et la théorie STDP (Spike-Timing Dependent Plasticity) avec des synapses RRAM. Nous avons développé à la fois de nouvelles architectures de faiblement énergivore, des méthodologies de programmation ainsi que des règles d’apprentissages simplifiées inspirées de la théorie STDP spécifiquement optimisées pour certaines technologies RRAM. Nous montrons l’implémentation de systèmes neuromorphiques a grande échelle et efficace énergétiquement selon deux approches différentes: (i) des synapses multi-niveaux déterministes et (ii) des synapses stochastiques binaires. Des prototypes d'applications telles que l’extraction de schéma visuel et auditif complexe sont également montres en utilisant des réseaux de neurones impulsionnels (Feed-forward Spiking Neural Network, SNN). Nous introduisons également une nouvelle méthodologie pour concevoir des neurones stochastiques très compacts qui exploitent les caractéristiques physiques intrinsèques des appareils CBRAM. / Research in the field of neuromorphic- and cognitive- computing has generated a lot of interest in recent years. With potential application in fields such as large-scale data driven computing, robotics, intelligent autonomous systems to name a few, bio-inspired computing paradigms are being investigated as the next generation (post-Moore, non-Von Neumann) ultra-low power computing solutions. In this work we discuss the role that different emerging non-volatile resistive memory technologies (RRAM), specifically (i) Phase Change Memory (PCM), (ii) Conductive-Bridge Memory (CBRAM) and Metal-Oxide based Memory (OXRAM) can play in dedicated neuromorphic hardware. We focus on the emulation of synaptic plasticity effects such as long-term potentiation (LTP), long term depression (LTD) and spike-timing dependent plasticity (STDP) with RRAM synapses. We developed novel low-power architectures, programming methodologies, and simplified STDP-like learning rules, optimized specifically for some RRAM technologies. We show the implementation of large-scale energy efficient neuromorphic systems with two different approaches (i) deterministic multi-level synapses and (ii) stochastic-binary synapses. Prototype applications such as complex visual- and auditory- pattern extraction are also shown using feed-forward spiking neural networks (SNN). We also introduce a novel methodology to design low-area efficient stochastic neurons that exploit intrinsic physical effects of CBRAM devices.

Chalcogenide glass based Phase Change Memories (PCMs) are being considered recently as promising alternatives to conventional non-volatile Random Access Memories (NVRAMs). PCMs offer high performance & low power consumption, in addition to other advantages, such as high scalability, high endurance and compatibility with complementary metal oxide semiconductors (CMOS) technologies. Basically PCM is a resistance variable non-volatile memory in which the memory bit state is defined by the resistance of the material. In this case, the initial ‘OFF’ state (logic zero) corresponds to the high resistance amorphous state and the logic 1 or ‘ON’ state corresponds to low resistance crystalline state. The present thesis work deals with electrical, thermal, mechanical and optical characterization of certain tellurium based chalcogenide glasses in bulk and thin film form for phase change memory applications. A comparative study has been done on the electrical switching behavior of Ge-Te-Se & Ge-Te-Si amorphous thin film samples with their bulk counterparts. Further, electrical switching and thermal studies have been undertaken on bulk Ge-Te-Bi and Ge-Te-Sn series of samples. The composition dependence of switching voltages of bulk and thin film samples studied has been explained on the basis of different factors responsible for electrical switching. The thesis contains ten chapters: Chapter 1 deals with a brief introduction on chalcogenides and their applicability in phase change memories. The glass transition phenomenon, synthesis of chalcogenide alloys, different structural models of amorphous semiconductors and electrical switching behavior are also discussed in detail in this chapter. Further, a brief description of optical and mechanical properties along with the principles of few characterization techniques used is discussed. Also, a brief overview on PCM application of chalcogenides is presented. The second chapter provides the details of various experimental techniques used to measure electrical, thermal, optical and mechanical properties of few tellurium based chalcogenide glassy systems. In the third chapter, the electrical switching behavior of amorphous Al23Te77 thin film devices, deposited in co-planar geometry, has been discussed. It is found that these samples exhibit memory type electrical switching. Scanning Electron Microscopic studies show the formation of a crystalline filament in the electrode region which is responsible for switching of the device from high resistance OFF state to low resistance ON state. The switching behavior of thin film Al-Te samples is found to be similar to that of bulk samples, with the threshold fields of bulk samples being higher. This has been understood on the basis of higher thermal conductance in bulk, which reduces the Joule heating and temperature rise in the electrode region. Electrical switching and thermal behavior of bulk; melt quenched Ge18Te82-xBix glasses (1 ≤ x ≤ 4) are presented in chapter 4. Ge-Te-Bi glasses have been found to exhibit memory type electrical switching behavior, which is in agreement with the lower thermal diffusivity values of these samples. A linear variation in switching voltages (also known as threshold voltages) (Vt) has been found with increase in thickness. The switching voltages have been found to decrease with an increase in temperature which is due to the decrease in the activation energy for crystallization at higher temperatures. Further, Vt of Ge18Te82-xBix glasses have been found to decrease with the increase in Bi content, indicating that in the Ge-Te-Bi system, the resistivity of the additive has a stronger role to play in the composition dependence of Vt, in comparison with the network connectivity and rigidity factors. In addition, the composition dependence of crystallization activation energy has been found to show a decrease with an increase in Bi content. X-ray diffraction studies on thermally crystallized samples reveal the presence of hexagonal Te, GeTe and Bi2Te3 phases. The fifth chapter deals with the electrical switching studies and optical band gap measurements on GexSe35-xTe65 (17 ≤ x ≤ 23) amorphous thin film samples. These thin film samples coated with sandwich geometry are found to switch with very low voltages as compared to bulk samples of the same chalcogenide glasses. The switching voltages and optical band gap are found to increase with the addition of Ge at the expense of Se. High structural cross linking with progressive addition of 4-fold coordinated Ge atoms could be the one of the reasons of increasing switching voltage and stronger Ge-Se bond strength could be the reason of increasing band gap for these chalcogenide glasses. In chapter 6, electrical switching studies on amorphous Ge15Te85-xSix (1 ≤ x ≤ 6) thin film samples have been described and the results are compared with their bulk counterparts. Similar trend has been found for both bulk and film samples when the threshold field is varied with composition. Optical band gap has been measured as a function of composition for these films, which also shows a behavior similar to that of switching voltages. The increasing trend in the variation with composition of electrical switching voltages and optical band gap are due to the increase in network connectivity and rigidity as Si atoms are incorporated into the Ge-Te system. Chapter 7 summarizes the electrical switching and glass forming ability of the Ge-Te-Sn glasses of two different composition tie-lines, namely Ge15Te85-xSnx and Ge17Te83-xSnx. Glasses belonging to both the series have been found to exhibit memory type of electrical switching behavior. The thickness dependence of threshold voltages is also found to support the memory switching behavior of the system. Further, ADSC studies are undertaken to explore the thermal behavior of these glasses which indicates that the crystallization tendency increases as Sn concentration is increased in the Ge-Te network. XRD studies done on two samples from both the series, reveal the fact that Sn atoms do not take part actively to enhance the network connectivity and rigidity. The composition dependence of crystallization temperature, metallicity factor and results of XRD studies are put together to explain the variation with composition of threshold voltages for both the series of samples. In chapter 8, investigations on the electrical switching behavior of Ge15Te85-xSnx (1 ≤ x ≤ 5) and Ge17Te83-xSnx (1 ≤ x ≤ 4) amorphous thin films have been discussed. Both the series of samples have been found to exhibit memory type of electrical switching behavior. The composition dependence of threshold voltage shows a decreasing trend, which has been explained on the basis of the Chemically Ordered Network (CON) model, bond strength and the metallicity factor. The optical band gap variation of both the series also exhibits a similar decreasing trend with composition. The observed behavior has been understood on the basis of higher atomic radius of Sn atom than Ge atom, which makes the energy difference between bonding and anti bonding state less at band edge. Chapter 9 deals with the nano-indentation studies on Ge15Te85-xSix (0 ≤ x ≤ 9) bulk glasses. The composition dependence of young’s modulus and hardness is studied systematically in this glassy system. The density of the samples of different compositions has also been measured, which strongly supports the variation of Young’s Modulus and hardness with composition. The composition dependence of mechanical properties of Ge-Te-Si samples has been understood on the basis of the presence of an intermediate phase and a thermally reversing window in this glassy system. A summary of the significant results obtained in the present thesis work is presented in the last chapter along with the scope for future work.

La diffraction électronique en mode précession (PED) est une méthode récente d’acquisition de clichésde diffraction permettant de minimiser les interactions dynamiques. L’objectif de cette thèse est dedévelopper une méthodologie d’acquisition et de traitement des clichés de diffraction en modeprécession afin de mesurer les champs de déformation en combinant une résolution spatialenanométrique et une sensibilité inférieure à 10-3 typiquement obtenues par d’autres techniques usuellesde microscopie, telle que l’imagerie haute-résolution. Les mesures ont été réalisées sur un JEOL 2010Aéquipé du module de précession Digistar produit par la société Nanomegas.Un système modèle constitué de multicouches Si/SiGe de concentrations connues en Ge a été utilisépour évaluer les performances de la méthodologie développée dans cette thèse. Les résultats indiquentune sensibilité sur la mesure de contraintes qui atteint, au mieux, 1x10-4 et un accord excellent avec lescontraintes simulées par éléments finis. Cette nouvelle méthode a pu ensuite être appliquée sur despuits quantique d’InGaAs et sur des transistors de type Ω−gate.La dernière partie traite d’un nouvel algorithme permettant d’évaluer de manière robuste et rapide lapolycristallinité des matériaux à partir d’une mesure PED. Nous donnons des exemples d’applicationde cette méthode sur divers dispositifs / Precession electron diffraction (PED) is a recent technique used to minimize acquired diffractionpatterns dynamic effects. The primary intention of this PhD work is to improve PED (PrecessionElectron Diffraction) data analysis and treatment methodologies in order to measure the strain at thenanoscale. The strain measurement is intended to reach a 10-3 strain precision as well as usualmicroscopy techniques like high-resolution imaging. To this end, measurements were made with aJEOL 2010A with a Digistar Nanomegas precession module.The approach developed has been used and tested by measuring the strain in a Si/SiGe multilayeredreference sample with a known Ge Content. Strain measurements reached 1x10-4 sensitivity withexcellent finite element strain simulation agreement. This process has been also applied to measure thestrain in microelectronic InGaAs Quantum Well and an "Ω-gate" experimental transistor devices.The second approach developed has been made to provide a robust means of studying electrontransparent nanomaterial polycrystallinity with precession. Examples of applications of this analysismethod are shown on different devices.

La diffraction électronique en mode précession (PED) est une méthode récente d’acquisition de clichésde diffraction permettant de minimiser les interactions dynamiques. L’objectif de cette thèse est dedévelopper une méthodologie d’acquisition et de traitement des clichés de diffraction en modeprécession afin de mesurer les champs de déformation en combinant une résolution spatialenanométrique et une sensibilité inférieure à 10-3 typiquement obtenues par d’autres techniques usuellesde microscopie, telle que l’imagerie haute-résolution. Les mesures ont été réalisées sur un JEOL 2010Aéquipé du module de précession Digistar produit par la société Nanomegas.Un système modèle constitué de multicouches Si/SiGe de concentrations connues en Ge a été utilisépour évaluer les performances de la méthodologie développée dans cette thèse. Les résultats indiquentune sensibilité sur la mesure de contraintes qui atteint, au mieux, 1x10-4 et un accord excellent avec lescontraintes simulées par éléments finis. Cette nouvelle méthode a pu ensuite être appliquée sur despuits quantique d’InGaAs et sur des transistors de type Ω−gate.La dernière partie traite d’un nouvel algorithme permettant d’évaluer de manière robuste et rapide lapolycristallinité des matériaux à partir d’une mesure PED. Nous donnons des exemples d’applicationde cette méthode sur divers dispositifs / Precession electron diffraction (PED) is a recent technique used to minimize acquired diffractionpatterns dynamic effects. The primary intention of this PhD work is to improve PED (PrecessionElectron Diffraction) data analysis and treatment methodologies in order to measure the strain at thenanoscale. The strain measurement is intended to reach a 10-3 strain precision as well as usualmicroscopy techniques like high-resolution imaging. To this end, measurements were made with aJEOL 2010A with a Digistar Nanomegas precession module.The approach developed has been used and tested by measuring the strain in a Si/SiGe multilayeredreference sample with a known Ge Content. Strain measurements reached 1x10-4 sensitivity withexcellent finite element strain simulation agreement. This process has been also applied to measure thestrain in microelectronic InGaAs Quantum Well and an "Ω-gate" experimental transistor devices.The second approach developed has been made to provide a robust means of studying electrontransparent nanomaterial polycrystallinity with precession. Examples of applications of this analysismethod are shown on different devices.

Chalcogenide glasses are a class of covalent amorphous semiconductors with interesting properties. The presence of short-range order and the pinned Fermi level are the two important properties that make them suitable for many applications. With flash memory technology reaching the scaling limit as per Moore’s law, alternate materials and techniques are being researched at for realizing next generation non-volatile memories. Two such possibilities that are being looked at are Phase Change Memory (PCM) and Programmable Metallization Cell (PMC) both of which make use of chalcogenide materials. This thesis starts with a survey of the work done so far in realizing PCMs in reality. For chalcogenides to be used as a main memory or as a replacement to FLASH technology, the electrical switching parameters like switching voltage, programming current, ON state and OFF state resistances, switching time and optical parameters like band gap are to be considered. A survey on the work done in this regard has revealed that various parameters such as chemical composition of the PC material, nature of additives used to enhance the performance of PCM, topological thresholds (Rigidity Percolation Threshold and Chemical Threshold), device geometry, thickness of the active volume, etc., influence the electrical switching parameters. This has motivated to further investigate the material and experimental parameters that affect switching and also to explore the possibility of multi level switching. In this thesis work, the feasibility of using two chalcogenide systems namely Si15Te85-xGex and Ge15Te85-xAgx in the form of amorphous thin films for PCM application is explored. In the process, electrical switching experiments have been carried out on thin films belonging to these systems and the results obtained are found to exhibit some interesting anomalies. Further experiments and analysis have been carried out to understand these anomalies. Finally, the dynamics of electrical switching has been investigated and presented for amorphous Si15Te85-xGex thin films. From these studies, it is also seen that multi state switching/multiple resistance levels of the material can be achieved by current controlled switching, the mechanisms of which have been further probed using XRD analysis and AFM studies. In addition, investigations have been carried out on the electrical switching behavior of amorphous Ge15Te85-xAgx thin film devices and optical band gap studies on amorphous Ge15Te85-xAgx thin films. Chapter one of the thesis, gives a brief introduction to the limitations in existing memory technology and the alternative memory technologies that are being researched, based on which it can be inferred that PCM is a promising candidate for the next generation non volatile memory. This chapter also discusses the principle of using PCM to store data, realization of PCM using chalcogenides, the material properties to be considered in designing PCM, the trade offs in the process of design and the current trends in PCM technology. Chapter two provides a brief review of the electrical switching phenomenon observed in various bulk chalcogenide glasses, as electrical switching is the underlying principle behind the working of a PCM. In the process of designing a memory, many parameters like read/write operation speed, data retentivity and life, etc., have to be optimized for which a thorough understanding on the dependence of electrical switching mechanism on various material parameters is essential. In this chapter, the dependence of electrical switching on parameters like network topological thresholds and electrical and thermal properties of the material is discussed. Doping is an efficient way of controlling the electrical parameters of chalcogenides. The nature of dopant also influences switching parameters and this also is briefly discussed. Chapter three provides a brief introduction to the different experimental techniques used for the thesis work such as bulk chalcogenide glass preparation, preparation of thin amorphous films, measurement of film thickness, confirmation of amorphous nature of the films using X-Ray Diffraction (XRD), electrical switching experiments using a custom made setup, crystallization study using XRD and Atomic Force Microscopy (AFM) and optical band gap studies using UV-Vis spectrometer. Vt is an important parameter in the design of a PCM. Chapter four discusses the dependence of Switching voltage, Vt, on input energy. It is already established that the Vt is influenced by the composition of the base glass, nature of dopants, thickness of films and by the ambient temperature. Based on the results of electrical switching experiments in Si15Te74Ge11 amorphous thin films a comprehensive analysis has been done to understand the kinetics of electrical switching. Chapter five discusses a current controlled crystallization technique that can be used to realize multi-bit storage with a single layer of chalcogenide material. In case of PCM, data is stored as structural information; the memory cell in the amorphous state is read as data ‘0’ and the memory cell in crystalline state is read as data ‘1’. This is accomplished through the process of electrical switching. In order to increase the memory density or storage density, multi-bit storage is being probed at by having multiple layers of chalcogenide material. However, with this technique, the problems of inter-diffusion between different layers cannot be ruled out. In this thesis work, a current controlled crystallization technique has been used to achieve multiple stable resistance states in Si15Te75Ge10 thin films. Chapter six discusses the mechanism behind multi state switching exhibited by certain compositions of Si15Te85-xGex thin films. Crystallization studies on certain Si15Te85-xGex films have been carried out using XRD and AFM to understand the phenomenon of multiple states. The results of these experiments and analysis are presented in this chapter. Chapter seven discusses the results of electrical switching experiments and optical band gap studies on amorphous Ge15Te85-xAgx thin films. Chapter eight gives the conclusion and scope for future work.

In this review the different concepts of nanoscale resistive switching memory devices are described and classified according to their I–V behaviour and the underlying physical switching mechanisms. By means of the most important representative devices, the current state of electrical performance characteristics is illuminated in-depth. Moreover, the ability of resistive switching devices to be integrated into state-of-the-art CMOS circuits under the additional consideration with a suitable selector device for memory array operation is assessed. From this analysis, and by factoring in the maturity of the different concepts, a ranking methodology for application of the nanoscale resistive switching memory devices in the memory landscape is derived. Finally, the suitability of the different device concepts for beyond pure memory applications, such as brain inspired and neuromorphic computational or logic in memory applications that strive to overcome the vanNeumann bottleneck, is discussed.