University of Macau / Faculty of Science and Technology / Department of Electrical and Computer Engineering

University of Macau / Institute of Chinese Medical Sciences

The GSM network technology has been developed and improved during several years which have led to an increased complexity. The complexity results in more network parameters and together with different scenarios and situations they form a complex set of configurations. The definition of the network parameters is generally a manual process using static values during test execution. This practice can be costly, difficult and laborious and as the network complexity continues to increase, this problem will continue to grow.This thesis presents an implementation of an automated performance optimization algorithm that utilizes genetic algorithms for optimizing the network parameters. The implementation has been used for proving that the concept of automated optimization is working and most of the work has been carried out in order to use it in practice. The implementation has been applied to the Link Quality Control algorithm and the Improved ACK/NACK feature, which is an apart of GSM EDGE Evolution. / GSM-nätsteknologin har utvecklats och förbättrats under lång tid, vilket har lett till en ökad komplexitet. Denna ökade komplexitet har resulterat i fler nätverksparameterar, tillstånd och standarder. Tillsammans utgör de en komplex uppsättning av olika konfigurationer. Dessa nätverksparameterar har hittills huvudsakligen bestämts med hjälp av en manuell optimeringsprocess. Detta tillvägagångssätt är både dyrt, svårt och tidskrävande och allt eftersom komplexiteten av GSM-näten ökar kommer problemet att bli större.Detta examensarbete presenterar en implementering av en algoritm för automatiserad optimering av prestanda som huvudsakligen använder sig av genetiska algoritmer för att optimera värdet av nätverksparametrarna. Implementeringen har använts för att påvisa att konceptet med en automatiserad optimering fungerar och det mesta av arbetet har utförts för att kunna använda detta i praktiken. Implementeringen har tillämpats på Link Quality Control-algoritmen och Improved ACK/NACK-funktionaliteten, vilket är en del av GSM EDGE Evolution.

Audit is a service of society that takes place in the public interest. To guarantee the quality of auditing a quality control is done with predetermined time intervals. The purpose of this paper is to investigate and analyze the concept quality and the procedure of the quality control and further to tie concepts like trust and ethics to the audit profession. To make the picture complete the paper also provides an insight regarding what deficiencies in quality, in other words failures, means to the audit profession. By performing semi-structured interviews with seven qualified auditors, active on different auditing firms in Skåne, substantial information was collected. The main purpose of the interviews was to find out what auditors perceive as good quality in the auditing profession and to clarify the performed procedure concerning internal quality control. The respondents’ experiences and reflections are compiled in an empirical analysis where similarities and differences are described. To simplify the picture the auditing profession is put in relation to everyday situations where Lisa makes everyday purchases where quality, trust and control have a great significance for the choice she is about to make. The result is based on the respondents’ perceptions and the theory we used. The paper result in a position that quality is hard to define and that the easiest way to define it is to conform to current regulations. Another result is that the quality control is necessary to demonstrate confidence to stakeholders and that an audit failure is when the auditor fails to comply with his/her planning. / Revision är en samhällsnyttig funktion som sker i allmänhetens intresse. För att säkerställa kvalitén på revideringen utförs kvalitetskontroller med bestämda tidsintervall. Syftet med denna uppsats är att undersöka samt analysera kvalité och förfarandet vid kvalitetskontrollen samt att knyta an större begrepp som förtroende och etik till revisionsbranschen. För att ge en komplett bild ger uppsatsen även en inblick över vad brister i kvalitén, genom misslyckanden, innebär för revisionsbranschen. Genom att utföra semistrukturerade intervjuer med sju kvalificerade revisorer, verksamma på olika revisionsbyråer i Skåneregionen, samlades väsentlig information in. Intervjuerna syftade till att få en uppfattning om vad revisorn anser vara god kvalité inom revisionsbranschen samt klargöra hur en intern kvalitetskontroll går till. Respondenternas erfarenheter och reflektioner sammanställs i en empirisk analys där likheter och skillnader utgör analysen. För att ge en förenklad bild av revisionsbranschen ställs den i relation till vardagliga situationer i en slutanalys där Lisa har huvudrollen. Lisa gör vardagliga inköp där kvalité, förtroende och kontroll har stor betydelse för vilket val hon kan tänkas göra. Resultatet utgör respondenternas uppfattningar i relation till den teori vi har använt. Uppsatsen resulterar i ett ställningstagande om att kvalité är svårdefinierat och att det lättaste är att definiera kvalité genom att följa gällande regelverk, att kvalitetskontrollen behövs för att visa tillit till intressenterna samt att ett misslyckande är när revisorn misslyckas med att följa sin planering.

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This dissertation evaluates the following thesis statement: Program analysis techniques can enable and support the debugging of failures in widely-used applications by (1) capturing, replaying, and, as much as possible, anonymizing failing executions and (2) highlighting subsets of failure-inducing inputs that are likely to be helpful for debugging such failures. To investigate this thesis, I developed techniques for recording, minimizing, and replaying executions captured from users' machines, anonymizing execution recordings, and automatically identifying failure-relevant inputs. I then performed experiments to evaluate the techniques in realistic scenarios using real applications and real failures. The results of these experiments demonstrate that the techniques can reduce the cost and difficulty of debugging.

In this thesis, we first investigate the use of automated variance estimators in distribution-free statistical process control (SPC) charts for univariate autocorrelated processes. We introduce two variance estimators---the standardized time series overlapping area estimator and the so-called quick-and-dirty autoregressive estimator---that can be obtained from a training data set and used effectively with distribution-free SPC charts when those charts are applied to processes exhibiting nonnormal responses or correlation between successive responses. In particular, we incorporate the two estimators into DFTC-VE, a new distribution-free tabular CUSUM chart developed for autocorrelated processes; and we compare its performance with other state-of-the-art distribution-free SPC charts. Using either of the two variance estimators, the DFTC-VE outperforms its competitors in terms of both in-control and out-of-control average run lengths when all the competing procedures are tested on the same set of independently sampled realizations of selected autocorrelated processes with normal or nonnormal noise components. Next, we develop WDFTC, a wavelet-based distribution-free CUSUM chart for detecting shifts in the mean of a high-dimensional profile with noisy components that may exhibit nonnormality, variance heterogeneity, or correlation between profile components. A profile describes the relationship between a selected quality characteristic and an input (design) variable over the experimental region. Exploiting a discrete wavelet transform (DWT) of the mean in-control profile, WDFTC selects a reduced-dimension vector of the associated DWT components from which the mean in-control profile can be approximated with minimal weighted relative reconstruction error. Based on randomly sampled Phase I (in-control) profiles, the covariance matrix of the corresponding reduced-dimension DWT vectors is estimated using a matrix-regularization method; then the DWT vectors are aggregated (batched) so that the nonoverlapping batch means of the reduced-dimension DWT vectors have manageable covariances. To monitor shifts in the mean profile during Phase II operation, WDFTC computes a Hotelling's T-square--type statistic from successive nonoverlapping batch means and applies a CUSUM procedure to those statistics, where the associated control limits are evaluated analytically from the Phase I data. We compare WDFTC with other state-of-the-art profile-monitoring charts using both normal and nonnormal noise components having homogeneous or heterogenous variances as well as independent or correlated components; and we show that WDFTC performs well, especially for local shifts of small to medium size, in terms of both in-control and out-of-control average run lengths.

Thesis (Ph. D.)--Institute of Paper Chemistry, 1974. / Bibliography: leaves 122-124.

Log processor heads have become increasingly used in New Zealand (NZ) forest harvesting operations to increase productivity and improve worker safety. Information regarding the measurement accuracy and productivity of new model processor heads is limited. As a result, log quality control (QC) is carried out on logs that have been merchandised by a processor head. This task can have a high risk for injury from man – machine interaction. A trend between studies was that older model Waratah’s did not have sufficient measurement accuracy to alleviate the requirement for log QC. In this study, a Waratah HTH 625c processor head operating in NZ was analysed for measurement accuracy and productivity. Measurement accuracy was considered by measuring logs for length, diameter and branch size. A comparison of two methods of processing was also considered to determine measurement accuracy, productivity and production efficiency for the way logs are delimbed and merchandised. Once gathered, the data was then analysed to identify significant effects, trends and relationships between variables. Length measurements were highly accurate but diameter measurements were under- estimated. It was also evident that although there was absolute accuracy, there was a high variability in measurements with underestimating and overestimating. Branch size was also found to have a significant impact in reducing length measurement accuracy and productivity. Single pass processing has significantly higher production efficiency than two pass processing, although single pass processing had a higher length error associated with it. The Waratah HTH 625c processor head has better measurement accuracy than older model Waratah’s. However, logs are still cut out-of-spec which will require a log QC to identify. As measurement technology is further improved in processor heads, and improvements to NZ’s plantation resource (improved form and smaller branching) are realised at harvest age, measurement accuracy and productivity of log processor heads will further improve.

Semiconductor manufacturing is characterized by a dynamic, varying environment and the technology to produce integrated circuits is always shifting in response to the demand for faster and new products, and the time between the development of a new profitable method of manufacturing and its transfer to tangible production is very short. The semiconductor industry has adopted the use of advanced process control (APC), namely a set of automated methodologies to reach desired process goals in operating individual process steps. That is because the ultimate motivation for APC is improved device yield and a typical semiconductor manufacturing process can have several hundred unit processes, any of which could be a yield limiter if a given unit procedure is out of control. APC uses information about the materials to be processed, metrology data, and the desired output results to choose which model and control plan to employ. The current focus of APC for semiconductor manufacturers is run-to-run control. Many metrology applications have become key enablers for the conventionally labeled “value-added” processing steps in lithography and etch and are now integral parts of these processes. The economic advantage of effective metrology applications increases with the difficulty of the manufacturing process. Frequent measurement facilitates products reaching its target but it increases the cost and cycle time. If lots of measurements are skipped, the product quality does not be guaranteed due to process error from uncompensated drift and step disturbance. Thus, it is necessary to optimize the sampling plan in order to quickly identify the sources of prediction errors and decrease the metrology cost and cycle time. The goal of this research intend to understand the relationship between metrology and advanced process control (APC) in semiconductor manufacturing and develop an enhanced sampling strategy in order to maximize the value of metrology and control for critical wafer features. / text