While conventional test point insertions commonly used in design for testability can improve fault coverage, the test points selected may not necessarily be the best candidates to aid <em>silicon diagnosis</em>. In this thesis, test point insertions are conducted with the aim to detect more faults and also synergistically distinguish currently indistinguishable fault-pairs. We achieve this by identifying those points in the circuit, which are not only hard-to-test but also lie on distinguishable frontiers, as Testability-Diagnosability (TD) points. To this end, we propose a novel low-cost metric to identify such TD points. Further, we propose a new DFT + DFD architecture, which adds just one pin (to identify test/functional mode) and small additional combinational logic to the circuit under test. Our experiments indicate that the proposed architecture can distinguish 4x more previously indistinguishable fault-pairs than existing DFT architectures while maintaining similar fault coverages. Further, the experiments illustrate that quality results can be achieved with an area overhead of around 5%. Additional experiments conducted on hard-to-test circuits show an increase in <em>fault coverage</em> by 48% while maintaining similar diagnostic resolution. Built-in Self Test (BIST) is a technique of adding additional blocks of hardware to the circuits to allow them to perform self-testing. This enables the circuits to test themselves thereby reducing the dependency on the expensive external automated test equipment (ATE). At the end of a test session, BIST generates a signature which is a compaction of the obtained output responses of the circuit for that session. Comparison of this signature with the reference signature categorizes the circuit as error free or buggy. While BIST provides a quick and low cost alternative to check circuit's correctness, diagnosis in BIST environment remains poor because of the limited information present in the lossily compacted final signature. The signature does not give any information about the possible defect location in the circuit. To facilitate diagnosis, researchers have proposed the use of two additional on-chip embedded memories,response memory to store reference responses and fail memory to store failing responses. We propose a novel architecture in which only one additional memory is required. Experimental results conducted on benchmark circuits substantiate that the same fault coverage can be maintained using just 5% of the available test vectors. This reduces the size of memory required to store responses which in turn reduces area overhead. Further, by adding test points to the circuit using our proposed architecture, we can improve the diagnostic resolution by 60% with respect to external testing. / Master of Science

In der vorliegenden Arbeit werden eine sichere FPGA-Stellwerksplattform und ein Transformationsverfahren entwickelt, mit dem die Schaltungen bestehender Relaisstellwerke in eine FPGA-Logik überführt werden können. Die FPGA-Stellwerksplattform ersetzt die Innenanlage eines Relaisstellwerks. Ihre Schnittstellen entsprechen den bisherigen Schnittstellen am Kabelabschlussgestell und zur Bedien- und Meldeeinrichtung. Damit ist eine einfache Migration bestehender Stellwerke möglich. Das Sicherheitskonzept basiert auf einer zweikanaligen Struktur mit sicherem Vergleicher und zusätzlichen Selbsttests zur schnellen, datenflussunabhängigen Ausfalloffenbarung. Die erreichbare Gefährdungsrate liegt im Bereich von SIL 4 und entspricht damit dem Sicherheitsziel für Stellwerke der Deutschen Bahn. Die Transformation sieht eine Trennung der Stellwerkslogik in Logik- und Leistungsteil vor. Der Logikteil wird auf dem FPGA realisiert. Die im Leistungsteil verbliebenen Kontakte und Überwacherrelais werden durch sichere Stellteile ersetzt. Die logischen Ansteuerbedingungen der Relais werden in Schaltnetze überführt. Die gesteuerten Relais werden durch Instanzen generischer Zustandsmodelle ersetzt. Für jeden verwendeten Relaistyp wurde ein entsprechendes Modell entwickelt, das bei der Transformation als Baustein eingesetzt werden kann. Die generischen Zustandsmodelle berücksichtigen auch die sicherheitsrelevanten konstruktiven Eigenschaften der Relais. So wird bei der Auftrennung einer Schaltung in Logik- und Leistungsteil sichergestellt, dass die in getrennte Schaltungsteile überführten Öffner und Schließer eines Relais nie gleichzeitig geschlossen sein können (Zwangsführung der Kontakte). Dies ist eine Voraussetzung für die Beibehaltung der sicherheitsrelevanten Funktionsbedingungen der Originalschaltung. Das Transformationsverfahren und die implementierten Mechanismen zur Ausfalloffenbarung sind unabhängig von der Anwenderlogik und vom gewählten Schaltkreistyp. Damit kann der generierte VHDL-Code bei Obsoleszenz eines Schaltkreises auch auf andere FPGA-Typen portiert werden. In einer Ressourcenabschätzung wird gezeigt, dass der gewählte Lösungsansatz geeignet ist, die Schaltungen kleinerer Relaisstellwerke vollständig auf einem FPGA zu realisieren. Die Anwendung des vorgestellten Verfahrens wird am Beispiel der Weichengruppe des Stellwerkstyps GS II DR demonstriert. Das Transformationsverfahren ist aber auch für andere Stellwerksbauformen geeignet. Dabei ist es unerheblich, ob diese nach dem tabellarischen Verschlussplanprinzip oder dem Spurplanprinzip arbeiten.

In der vorliegenden Arbeit werden eine sichere FPGA-Stellwerksplattform und ein Transformationsverfahren entwickelt, mit dem die Schaltungen bestehender Relaisstellwerke in eine FPGA-Logik überführt werden können. Die FPGA-Stellwerksplattform ersetzt die Innenanlage eines Relaisstellwerks. Ihre Schnittstellen entsprechen den bisherigen Schnittstellen am Kabelabschlussgestell und zur Bedien- und Meldeeinrichtung. Damit ist eine einfache Migration bestehender Stellwerke möglich. Das Sicherheitskonzept basiert auf einer zweikanaligen Struktur mit sicherem Vergleicher und zusätzlichen Selbsttests zur schnellen, datenflussunabhängigen Ausfalloffenbarung. Die erreichbare Gefährdungsrate liegt im Bereich von SIL 4 und entspricht damit dem Sicherheitsziel für Stellwerke der Deutschen Bahn. Die Transformation sieht eine Trennung der Stellwerkslogik in Logik- und Leistungsteil vor. Der Logikteil wird auf dem FPGA realisiert. Die im Leistungsteil verbliebenen Kontakte und Überwacherrelais werden durch sichere Stellteile ersetzt. Die logischen Ansteuerbedingungen der Relais werden in Schaltnetze überführt. Die gesteuerten Relais werden durch Instanzen generischer Zustandsmodelle ersetzt. Für jeden verwendeten Relaistyp wurde ein entsprechendes Modell entwickelt, das bei der Transformation als Baustein eingesetzt werden kann. Die generischen Zustandsmodelle berücksichtigen auch die sicherheitsrelevanten konstruktiven Eigenschaften der Relais. So wird bei der Auftrennung einer Schaltung in Logik- und Leistungsteil sichergestellt, dass die in getrennte Schaltungsteile überführten Öffner und Schließer eines Relais nie gleichzeitig geschlossen sein können (Zwangsführung der Kontakte). Dies ist eine Voraussetzung für die Beibehaltung der sicherheitsrelevanten Funktionsbedingungen der Originalschaltung. Das Transformationsverfahren und die implementierten Mechanismen zur Ausfalloffenbarung sind unabhängig von der Anwenderlogik und vom gewählten Schaltkreistyp. Damit kann der generierte VHDL-Code bei Obsoleszenz eines Schaltkreises auch auf andere FPGA-Typen portiert werden. In einer Ressourcenabschätzung wird gezeigt, dass der gewählte Lösungsansatz geeignet ist, die Schaltungen kleinerer Relaisstellwerke vollständig auf einem FPGA zu realisieren. Die Anwendung des vorgestellten Verfahrens wird am Beispiel der Weichengruppe des Stellwerkstyps GS II DR demonstriert. Das Transformationsverfahren ist aber auch für andere Stellwerksbauformen geeignet. Dabei ist es unerheblich, ob diese nach dem tabellarischen Verschlussplanprinzip oder dem Spurplanprinzip arbeiten.

International Telemetering Conference Proceedings / October 27-30, 1997 / Riviera Hotel and Convention Center, Las Vegas, Nevada / Telemetry & Instrumentation, in conjunction with NASA’s Kennedy Space Center, has developed a commercial, intelligent, data acquisition module that performs all functions associated with acquiring and digitizing a transducer measurement. These functions include transducer excitation, signal gain and anti-aliasing filtering, A/D conversion, linearization and digital filtering, and sample rate decimation. The functions are programmable and are set up from information stored in a local Transducer Electronic Data Sheet (TEDS). In addition, the module performs continuous self-calibration and self-test to maintain 0.01% accuracy over its entire operating temperature range for periods of one year without manual recalibration. The module operates in conjunction with a VME-based data acquisition system.

The objective of this dissertation is to propose circuit architectures and techniques for built-in test and calibration of phase-locked loops. The design of phase-locked loops is first investigated to achieve a robust performance over process, temperature, voltage corners with minimum overhead. Different design techniques including adding loop programmability, increasing area efficiency, reducing noise immunity, and increasing frequency coverage are discussed. Secondly, built-in testing of phase-lock loops using sensors are proposed for loop dynamic parameters and reference spur. An integrator is designed to extract the subtle response from the system so that target parameters can be predicted. Different testing methodologies are applied different specification testing as well. Finally, an on chip phase-locked loop design is implemented for reference spur calibration. The phase-locked loop is designed with a programmable reference spur range. A static phase offset detector is included to identify the optimal setting of reference spur in the feedback system. The integrated jitter performance is improved by the calibration mechanism. The results of this thesis serve as an on-chip built-in self-test and self-calibration solution for embedded phase-locked loops in a high integration system.

abstract: This dissertation proposes and presents two different passive sigma-delta modulator zoom Analog to Digital Converter (ADC) architectures. The first ADC is fullydifferential, synthesizable zoom-ADC architecture with a passive loop filter for lowfrequency Built in Self-Test (BIST) applications. The detailed ADC architecture and a step by step process designing the zoom-ADC along with a synthesis tool that can target various design specifications are presented. The design flow does not rely on extensive knowledge of an experienced ADC designer. Two example set of BIST ADCs have been synthesized with different performance requirements in 65nm CMOS process. The first ADC achieves 90.4dB Signal to Noise Ratio (SNR) in 512µs measurement time and consumes 17µW power. Another example achieves 78.2dB SNR in 31.25µs measurement time and consumes 63µW power. The second ADC architecture is a multi-mode, dynamically zooming passive sigma-delta modulator. The architecture is based on a 5b interpolating flash ADC as the zooming unit, and a passive discrete time sigma delta modulator as the fine conversion unit. The proposed ADC provides an Oversampling Ratio (OSR)- independent, dynamic zooming technique, employing an interpolating zooming front-end. The modulator covers between 0.1 MHz and 10 MHz signal bandwidth which makes it suitable for cellular applications including 4G radio systems. By reconfiguring the OSR, bias current, and component parameters, optimal power consumption can be achieved for every mode. The ADC is implemented in 0.13 µm CMOS technology and it achieves an SNDR of 82.2/77.1/74.2/68 dB for 0.1/1.92/5/10MHz bandwidth with 1.3/5.7/9.6/11.9mW power consumption from a 1.2 V supply. / Dissertation/Thesis / Doctoral Dissertation Electrical Engineering 2018

This work consists of two main parts: i) Design and implementation of a compact current-reusing 2.4GHz direct-modulation transmitter with on-chip automatic tuning; ii) Design and implementation of a novel highly-reconfigurable, continuously tunable, power-adjustable Active-RC filter for multiple standards. The design, analysis, and experimental verification of a proposed self-calibrating, current reused 2.4GHz, direct-modulation transmitter are introduced. A stacked arrangement of the power amplifier/voltage-controlled oscillator is presented along with a novel LC-tank-tuning algorithm with a simple, low-cost, on-chip implementation. To transmit maximum power, the tuning loop ensures the PA's resonant tank is centered around the operating frequency, and the loop requires no ADC, DSP, or external signal generator. This work also details the proposed tuning-loop algorithm and examines the frequency-dependent nonlinear power-detector. The system was implemented in TSMC 0.18[mu]m CMOS, occupies 0.7 mm² (TX) + 0.1 mm² (self tuning), and was measured in a QFN48 package on FR4 PCB. Automatically adjusting the tank-tuning bits within their tuning range results in >4dB increase in output power. With the self-tuning circuit active, the transmitter delivers a measured output power of > 0dBm to a 100-[omega] differential load, and the system consumes 22.9 mA from a 2.2-V supply. A biquad design methodology and a baseband low-pass filter is presented for wireless and wireline applications with reconfigurable frequency response, selectable order (1st/3rd/5th), continuously tunable cutoff frequency (1MHz-20MHz) and adjustable power consumption (3mW-7.5mW). A discrete capacitor array coarsely tunes the low-pass filter, and a novel Continuous Impedance Multiplier (CIM) then finely tunes the filter. Resistive/capacitive networks select between the Chebyshev and Inverse Chebyshev approximation types. Also, a new stability metric for biquads, Minimum Acceptable Phase Margin (MAPM), is presented and discussed in the context of filter compensation and passband ripple considerations. Experimental results yield an IIP3 of 31.3dBm, a THD of -40dB at 447mV[subscript pk, diff] input signal amplitude, and a DR of 71.4dB. The filters tunable range covers frequencies from 1MHz to 20MHz. In Inverse Chebyshev mode, the filter achieves a passband group delay variation less than ±2:5%. The design is fabricated in 0.13[mu]m CMOS, occupies 1.53mm², and operates from a 1-V supply.

Nickel allergy is the most prevalent contact allergy and has been discussed as a possible riskfactor for hand eczema. However, hand eczema is one of the most frequently occurring skindiseases and has multifactorial origin. The aim of this thesis was to study the association between nickel allergy and hand eczema in the general population. There are only a fewpopulation-based studies previously published, that include patch testing. In addition, this thesis aimed to evaluate methods to follow the prevalence of nickel allergy.The study cohort consisted of 908 women who had been patch tested for the occurrence of nickel allergy as schoolgirls. Twenty years later, they were invited to participate in a follow-up questionnaire study. The response rate was 81%. In total, 17.6% of respondents reported handeczema after the age of 15 years and there was no statistically significant difference in the occurrence of hand eczema between those who were nickel-positive and those who were nickel negativeas schoolgirls. To further investigate possible links, another study was performed,which included a second questionnaire, a clinical investigation and patch testing. All schoolgirls from the baseline study who were still living in the area as adults were invited to participate and the participation rate was 77%. Patch test showed 30.1% nickel-positive individuals.When all participants were included in the analysis, there was no statistically significant difference between nickel-positive and nickel-negative women regarding occurrence of hand eczema. The most important risk factor for hand eczema was childhood eczema. Adjusted prevalence proportion ratio (PPR) for hand eczema after age 15 in relation to nickel patch testresults was 1.03 (95% CI 0.71--1.50) and in relation to childhood eczema 3.68 (95% CI 2.45--5.54). When women with and without history of childhood eczema were analyzed separately, the hand eczema risk was doubled in nickel-positive women without history of childhood eczema. In conclusion, the risk of hand eczema in nickel-positive women may previously havebeen overestimated. Next, the validity of self-reported nickel allergy was investigated. In the established cohort; two questions regarding nickel allergy were compared with patch test results. The validity of self-reported nickel allergy was low, and the questions regarding nickel allergy overestimated the true prevalence of nickel allergy. The positive predictive values were 59% and 60%. Another method for estimating the prevalence of nickel allergy, namely self-patch testing, was validated in the last study. In total, 191 patients from three different dermatology departments participated. The validity of self-testing for nickel allergy was adequate, with sensitivity 72%and proportion of agreement 86%. / Nickelallergi är vanligt förekommande. Prevalensen i Skandinavien är 15--25% hos kvinnor och cirka 3% hos män. Sambandet mellan nickelallergi och uppkomst av handeksem har tidigare diskuterats och i vissa studier anges att 30--45% av alla individer med nickelallergi får handeksem. Det finns dock endast ett fåtal publicerade studier där personer ur normalbefolkningen har lapptestats för nickel. Handeksem ärvanligt och har ofta flera olika kombinerade orsaker. Det övergripande syftet med avhandlingen var att studera nickelallergins betydelse för uppkomst av handeksem. Detfinns ett intresse av att följa förekomsten av nickelallergi över tid, speciellt sedan det i början av 2000-talet infördes ett EU-direktiv som begränsar nickelinnehåll i klockor,smycken, metallknappar etc. Ytterligare ett syfte med avhandlingen var att utvärderaepidemiologiska metoder för att följa förekomsten av nickelallergi.Den första studien var en uppföljningsstudie av 908 flickor ur normalbefolkningen,vilka i skolåldern lapptestats med nickel. Tjugo år senare skickades en enkät till dessa kvinnor, svarsfrekvensen var hög (81%). Förekomsten av självrapporterat handeksemefter 15 års ålder var 17.6%. Det förelåg ingen signifikant skillnad i förekomst avhandeksem mellan de kvinnor som var nickelallergiska som barn jämfört med dem som inte var nickelallergiska. År 2006 utfördes ytterligare en studie, som inkluderade de kvinnor som fortfarande bodde i Örebro län. Studien omfattade en klinisk undersökning av händerna samt ett lapptest. 30% av kvinnorna var positiva för nickel.Det förelåg ingen signifikant skillnad i förekomst av handeksem mellan de som var positiva för nickel och de som var negativa. Vid separat analys av de kvinnor som angav tidigare barneksem jämfört med dem som aldrig hade haft barneksem visade det sig att risken för handeksem var dubbelt så stor hos nickelallergiker i den gruppen som aldrig hade haft barneksem. Båda studierna visade att barneksem var den största riskfaktorn för att få handeksem som vuxen, med en 3-4 gånger ökad risk. Den tredje studien var en validering av självrapporterad nickelallergi. Överensstämmelsen var låg mellan enkätfrågor gällande nickelallergi och lapptestverifierad nickelallergi. Av dem som själva bedömde sig vara nickelallergiska var endast 59% positiva enligt lapptest. För att följa förekomsten av nickelallergi i befolkningen behövs därför andra metoder. I den fjärde studien utvärderades ett självtest för nickelallergi. 191 patienter från tre olika hudkliniker i Sverige deltog i studien. Validiteten för metoden självtest var tillfredsställande, sensitiviteten var 72%och graden av överensstämmelse var 86%.

Le test de production des imageurs CMOS est une étape clé du flot de fabrication afin de garantir des produits répondant aux critères de qualité et exempts de défauts de fabrication. Ces tests sont classifiés en test électrique et test optique. Le test électrique est basé sur du test structurel qui vérifie la partie numérique et certain blocks analogiques. La plus grande partie des circuits analogiques et la matrice des capteurs sont testés par le test optique. Ce test est basé sur des captures d'images et sur une recherche des défauts au moyen d'algorithmes de calcul spécifiques appliqué sur les images. Proche du fonctionnement applicatif, ils sont qualifies de test fonctionnels. La couverture des défauts obtenue par les tests de type fonctionnel est généralement inférieure à celle obtenue par un test structurel. L'objectif de cette thèse est d'étudier et développer des solutions de test alternatives aux tests fonctionnels afin d'obtenir des meilleurs taux de couverture de défauts, améliorant ainsi la fiabilité, tout en réduisant le temps de test et son coût. Parmi les défauts optiques qui ont causé des retours client par le passés, le défaut qui présent Horizontal Fixed Pattern Noise (HFPN) donnent lieu à un taux de couverture insuffisant. Ces recherches ont été orientées vers l'amélioration du taux de couverture de défauts dite de HFPN dans le test de production des imageurs CMOS.Le HFPN est défini comme une sorte d'image défaillante qui présente sous la forme des bandes résiduelles horizontales. Il est principalement causé par les défauts dans les lignes d'interconnexion qui alimentent et pilotent les pixels. La détection d'un défaut HFPN dans les tests optiques actuels est par comparer les valeurs moyennes de chaque ligne de pixels avec les lignes adjacentes. Si la différence d'une ligne par rapport aux lignes adjacentes est supérieur à la limites spécifié, la ligne est constaté comme défectueuse. Cette limite est donc difficile d'être ajusté face à un compromis entre le taux de couverture de ce défaut et le rendement.Dans cette thèse, nous avons proposé d'abord une amélioration de l'algorithme de détection pour améliorer le test optique actuelle. L'amélioration de test optique est validée par des résultats de test en production en appliquant le nouvel algorithme. Par la suite, une technique d'auto test (BIST) pour la détection des défauts dans les lignes d'interconnexion de matrice des pixels est étudiée et évalué. Enfin, une puce imageur avec le technique d'auto test embarqué est conçu et fabriqué pour la validation expérimentale. / Current production testing of CMOS imager sensors is mainly based on capturing images and detecting failures by image processing with special algorithms. The fault coverage of this costly optical test is not sufficient given the quality requirements. Studies on devices produced at large volume have shown that Horizontal Fixed Pattern Noise (HFPN) is one of the common image failures encountered on products that present fault coverage problems, and this is the main cause of customer returns for many products. A detailed analysis of failed devices has demonstrated that HFPN failures arise from changes of electronic circuit topology in pixel addressing decoders or the metal lines required for pixel powering and control. These changes are usually due to the presence of spot defects, causing some pixels in a row to operate incorrectly, leading to an HFPN failure. Moreover, defects resulting in partially degraded metal lines may not induce image failure in limited industrial test conditions, passing the optical tests. Later, these defects may produce an image failure in the field, either because the capture conditions would be more stringent, or because the defects would evolve into catastrophic faults due to electromigration. In this paper, we have first enhanced the HFPN detection algorithm in order to improve the fault coverage of the optical test. Next, a built-in self-test structure is presented for the on-chip detection of catastrophic and non-catastrophic defects in the pixel power and control lines.

Neste trabalho o teste de dispositivos analógicos programáveis é abordado. Diversas metodologias de teste analógico existentes são estudadas e algumas delas são utilizadas nas estratégias desenvolvidas. Dois FPAAs (Field Programmable Analog Arrays) comerciais de fabricantes e modelos distintos são utilizados para validar as estratégias de teste propostas. O primeiro dispositivo estudado é um FPAA de tempo contínuo (capaz de implementar circuitos contínuos no tempo) da Lattice Semiconductors. Tal dispositivo é marcado pela característica estrutural de sua programabilidade. Por esta razão, a estratégia a ele aplicada é baseada em um método de teste também estrutural, conhecido como OBT (Oscillation-Based Test). Neste método o circuito é dividido em blocos simples que são transformados em osciladores. Os parâmetros do sinal obtido, tais como a freqüência de oscilação e a amplitude, têm relação direta com os componentes utilizados na implementação do oscilador. Desta maneira, é possível detectar falhas no FPAA observando os parâmetros do sinal gerado. Esta estratégia é estudada inicialmente considerando uma análise externa dos parâmetros do sinal. Como uma alternativa de redução de custos e melhoria na cobertura de falhas, um analisador de resposta baseado em um duplo integrador é adotado, permitindo que a avaliação do sinal gerado pelo oscilador seja feita internamente, utilizando-se os recursos programáveis do próprio FPAA. Os resultados obtidos para as análises interna e externa são então comparados. O segundo FPAA estudado, da Anadigm Company, é um dispositivo a capacitores chaveados que tem como característica a programabilidade funcional. Por esta razão o desenvolvimento de uma técnica de teste estrutural é dificultado, pois não se conhece detalhes da arquitetura do componente. Por esta razão, uma técnica de teste funcional, conhecida como Transient Response Analysis Method, é aplicada ao teste deste FPAA. Neste método o circuito sob teste é dividido em blocos funcionais de primeira e segunda ordem e a resposta transiente destes blocos para um dado estímulo de entrada é analisada. O bloco sob teste é então duplicado e um esquema de auto-teste integrado baseado em redundância é desenvolvido, com o intuito de se obter um sinal de erro. Este sinal de erro representa a diferença das respostas transientes dos blocos duplicados. Como proposta para se aumentar a observabilidade do sinal de erro o mesmo é integrado ao longo tempo, aumentando a capacidade de detecção de falhas quando utilizado este método. Em ambas estratégias o objetivo principal do trabalho é testar os blocos analógicos programáveis dos FPAAs explorando ao máximo a programabilidade dos dispositivos e utilizando recursos pré-existentes para auxiliar no teste. Os resultados obtidos mostram que as estratégias desenvolvidas configuram boas alternativas para o auto-teste integrado deste tipo de componente. / This work addresses the test of programmable analog devices. Several analog test methodologies are studied and some of them are applied in the developed strategies. In order to validate these strategies, two commercial FPAAs (Field Programmable Analog Arrays), of different vendors and distinct models, are considered as devices under test. The first studied device is a continuous-time FPAA from Lattice Semiconductors. One important characteristic of such device is the structural programmability. For this reason the test strategy applied to this FPAA is based in a structural method known as OBT (Oscillation-Based Test). In this method, blocks of the circuit under test are individually converted into oscillators. The parameters of the generated signal, such as the frequency and amplitude, can be expressed as function of the components used in the oscillator implementation. This way, it is possible to detect faults in the FPAA simply observing such parameters. This method is firstly studied considering an external analysis of the signal parameters. However, in a second moment, an internal response analyzer, based on a double integrator, is built with the available programmable resources of the FPAA. This way, overall test cost is reduced, while the fault coverage is increased with no area overhead. The obtained results considering the external analysis and the built-in response evaluation are compared. The second considered FPAA, from Anadigm Company, is a switched capacitor device whose programming characteristic is strictly functional. Thus, a structural test method cannot be easily developed and applied without the previous knowledge of he device architectural details. For this reason, a functional test method known as TRAM (Transient Response Analysis Method) is adopted. In this method the Circuit Under Test (CUT) is programmed to implement first and second order blocks and the transient response of these blocks for a given input stimuli is analyzed. Taking advantage of the inherent programmability of the FPAAs, a BIST-based scheme is used in order to obtain an error signal representing the difference between the fault-free and faulty Configurable Analog Blocks (CABs). As a proposal to augmenting the observability, the error signal is integrated, enhancing de fault detection capability when using this method. In both developed strategies the main objective is to test the CABs of the FPAAs exploiting the device programmability, using the existing resources in order to aid the test. The obtained results show that the developed strategies represent good alternatives to the built-in self-test of such type of device.