Semiconductor nanotechnology is today a very well studied subject, and demonstrations of possible applications and concepts are abundant. However, well-controlled mass-fabrication on the nanoscale is still a great challenge, and the lack of nanofabrication methods that provide the combination of required fabrication precision and high throughput, limits the large-scale use of nanodevices. This work aims in resolving some of the issues related to nanostructure fabrication, and deals with development of nanofabrication processes, the use of size-reduction for reaching true nanoscale dimensions (20 nm or below), and finally the optical and electrical characterization to understand the physics of the more successful structures and devices in this work. Due to its widespread use in microelectronics, silicon was the material of choice throughout this work. Initially, a fabrication process based on electron beam lithography (EBL) was designed, allowing controlled fabrication of devices of dimensions down to 30 nm, although, generally, initial device dimensions were above 70 nm, allowing the flexible but low-throughput EBL, to be replaced by state-of-the-art optical lithography in the case of industrialization of the process. A few main processes were developed throughout the course of this work, which were capable of defining silicon nanopillar and nano-wall arrays from bulk silicon, and silicon nanowire devices from silicon-on-insulator (SOI) material. Secondly, size-reduction, as a means of providing access to few-nanometer dimensions not available by current lithography techniques was investigated. An additional goal of the size-reduction studies was to find self-limiting mechanisms in the process, that would limit the impact of variations in the size and other imperfections of the initial structures. Thermal oxidation was investigated mainly for self-limited size-reduction of silicon nanopillars, resulting in well-defined quantum dot arrays of few-nm dimensions. Electrochemical etching was employed to size-reduce both silicon nanopillars and silicon nanowires down into the 10-nm regime. This being a novel application, a more thorough study of electrochemical etching of low-dimensional and thin-layer structures was performed as well as development of a micro-electrochemical cell, enabling electrochemical etching of fabricated nanowire devices with improved control. Finally, the combination of nanofabrication and size-reduction resulted in two successful device structures: Sparse and spatially well-controlled single silicon quantum dot arrays, and electrically connected size-reduced silicon nanowires. The quantum dot arrays were investigated through photoluminescence spectroscopy demonstrating for the first time atomic-like photoemission from single silicon quantum dots. The silicon nanowire devices were electrically characterized. The current transport through the device was determined to be through inversion layer electrons with surface states of the nanowire surfaces greatly affecting the conductance of the nanowire. A model was also proposed, capable of relating physical and electrical properties of the nanowires, as well as demonstrating the considerable influence of charged surface states on the nanowire conductance. / QC 20101101

The frequency demands of radiating systems are moving into the terahertz band with potential applications that include sensing, imaging, and extremely broadband communication. One commonly used method for generating and detecting terahertz waves is to excite a voltage-biased photoconductive antenna with an extremely short laser pulse. The pulsed laser generates charge carriers in a photoconductive substrate which are swept onto the metallic antenna traces to produce an electric current that radiates or detects a terahertz band signal. Therefore, analysis of a photoconductive antenna requires simultaneous solutions of both semiconductor physics equations (including drift-diffusion and continuity relations) and Maxwell’s equations. A multi-physics analysis scheme based on the Discontinuous-Galerkin Finite-Element Time-Domain (DGFETD) is presented that couples the semiconductor drift-diffusion equations with the electromagnetic Maxwell’s equations. A simple port model is discussed that efficiently couples the two equation sets. Various photoconductive antennas were fabricated using TiAu metallization on a GaAs substrate and the fabrication process is detailed. Computed emission intensities are compared with measured data. Optimized antenna designs based on the analysis are presented for a variety of antenna configurations.

This doctorate thesis focuses on investigating the parameter space involved in numerically modeling the bandgap engineering of a GaInP/InGaAs/Ge lattice matched multi-junction solar cell (MJSC) using InAs/InGaAs quantum dots (QDs) in the middle sub-cell. The simulation environment – TCAD Sentaurus – solves the semiconductor equations using finite element and finite difference methods throughout well-defined meshes in the device to simulate the optoelectronic behavior first for single junction solar cells and subsequently for MJSCs with and without quantum dots under concentrated illumination of up to 1000 suns’ equivalent intensity. The MJSC device models include appropriate quantum tunneling effects arising in the tunnel junctions which serve as transparent sub-cell interconnects. These tunneling models are calibrated to measurements of AlGaAs/GaAs and AlGaAs/AlGaAs tunnel junctions reaching tunneling peak current densities above 1000 A/cm^2. Self-assembled InAs/GaAs quantum dots (QDs) are treated as an effective medium through a description of appropriate generation and recombination processes. The former includes analytical expressions for the absorption coefficient that amalgamates the contributions from the quantum dot, the InAs wetting layer (WL) and the bulk states. The latter includes radiative and non-radiative lifetimes with carrier capture and escape considerations from the confinement potentials of the QDs. The simulated external quantum efficiency was calibrated to a commercial device from Cyrium Technologies Inc., and required 130 layers of the QD effective medium to match the contribution from the QD ground state. The current – voltage simulations under standard testing conditions (1 kW/cm^2, T=298 K) demonstrated an efficiency of 29.1%, an absolute drop of 1.5% over a control structure. Although a 5% relative increase in photocurrent was observed, a 5% relative drop in open circuit voltage and an absolute drop of 3.4% in fill factor resulted from integrating lower bandgap nanostructures with shorter minority carrier lifetimes. However, these results are considered a worst case scenario since maximum capture and minimum escape rates are assumed for the effective medium model. Decreasing the band offsets demonstrated an absolute boost in efficiency of 0.5% over a control structure, thus outlining the potential benefits of using nanostructures in bandgap engineering MJSCs.

This doctorate thesis focuses on investigating the parameter space involved in numerically modeling the bandgap engineering of a GaInP/InGaAs/Ge lattice matched multi-junction solar cell (MJSC) using InAs/InGaAs quantum dots (QDs) in the middle sub-cell. The simulation environment – TCAD Sentaurus – solves the semiconductor equations using finite element and finite difference methods throughout well-defined meshes in the device to simulate the optoelectronic behavior first for single junction solar cells and subsequently for MJSCs with and without quantum dots under concentrated illumination of up to 1000 suns’ equivalent intensity. The MJSC device models include appropriate quantum tunneling effects arising in the tunnel junctions which serve as transparent sub-cell interconnects. These tunneling models are calibrated to measurements of AlGaAs/GaAs and AlGaAs/AlGaAs tunnel junctions reaching tunneling peak current densities above 1000 A/cm^2. Self-assembled InAs/GaAs quantum dots (QDs) are treated as an effective medium through a description of appropriate generation and recombination processes. The former includes analytical expressions for the absorption coefficient that amalgamates the contributions from the quantum dot, the InAs wetting layer (WL) and the bulk states. The latter includes radiative and non-radiative lifetimes with carrier capture and escape considerations from the confinement potentials of the QDs. The simulated external quantum efficiency was calibrated to a commercial device from Cyrium Technologies Inc., and required 130 layers of the QD effective medium to match the contribution from the QD ground state. The current – voltage simulations under standard testing conditions (1 kW/cm^2, T=298 K) demonstrated an efficiency of 29.1%, an absolute drop of 1.5% over a control structure. Although a 5% relative increase in photocurrent was observed, a 5% relative drop in open circuit voltage and an absolute drop of 3.4% in fill factor resulted from integrating lower bandgap nanostructures with shorter minority carrier lifetimes. However, these results are considered a worst case scenario since maximum capture and minimum escape rates are assumed for the effective medium model. Decreasing the band offsets demonstrated an absolute boost in efficiency of 0.5% over a control structure, thus outlining the potential benefits of using nanostructures in bandgap engineering MJSCs.

Die vorliegende Arbeit befasst sich mit dem vertieften Verständnis der Rekombinationsdynamik von polaren ZnO/MgZnO-Quantengraben(QW)-Strukturen zur exakten Bestimmung des unabgeschirmten Grundzustandes und der Analyse der zugrundeliegenden Emissionsprozesse. Dafür werden ausgehend von Beobachtungen an ZnO-Dünnschichten die Eigenschaften von mittels PLD hergestellten QWs unter dem Einfluss des internen elektrischen Feldes mit Hilfe der zeitintegrierten (TI-) und zeitaufgelösten (TR-) Photolumineszenz(PL)-Spektroskopie untersucht. Die Differenz der spontanen und piezoelektrischen Polarisation zwischen ZnO und MgZnO führt zur Ausbildung eines internen elektrischen Feldes und damit zum Auftreten des quantum-confined Stark effect (QCSE). Es wird gezeigt, dass der QCSE durch eine Durchmischung der Grenzflächen stark vermindert wird. Für QWs mit schwachem QCSE ist die Übergangsenergie und Zerfallszeit des Grundzustandes experimentell gut bestimmbar. Bei starkem QCSE müssen jedoch bereits bei geringen Anregungsdichten (1E10 /cm²) Abschirmeffekte berücksichtigt werden. Dadurch ist es sehr schwierig, den unabgeschirmten Grundzustand mittels herkömmlicher experimenteller Methoden mit einem aussagekräftigen Signal-Rausch-Verhältnis zu bestimmen. Es wird gezeigt, dass für QWs mit einer Dicke > 4 nm die Übergangsenergie des unabgeschirmten Grundzustandes nicht durch TI-PL-Messungen bestimmt werden kann. TR-PL-Messungen zeigen energetisch tiefere Übergangsenergien, jedoch ebenfalls nicht den unabgeschirmten Grundzustand. Mit einem eingeführten Modell zur Beschreibung der zeitabhängigen Abschirmung des Grundzustandsniveaus wird die Zerfallszeit für QW-Dicken in einem Bereich von 1 - 10 nm bestimmt. Durch die selbstkonsistente Lösung von Schrödinger- und Poissongleichung werden die Übergangsenergie und Zerfallszeit der Exzitonen im QW in Abhängigkeit der Feldstärke und auch der Ladungsträgerdichte berechnet. Dadurch ist eine exaktere Bestimmung der Feldstärke möglich. Zusätzlich wird durch die vergleichende Untersuchung von QWs unterschiedlicher Dicke, Potentialhöhe und Wachstumsunterlage die spontane und piezoelektrische Polarisation der Materialien experimentell bestimmt. Mittels temperaturabhängiger Messungen wird der Ursprung der Lumineszenz für QW-Dicken > 2 nm der Rekombination freier Exzitonen im QW zugeschrieben. Für dünnere QWs ist der temperaturabhängige Verlauf des PL-Maximums durch Lokalisation der Exzitonen bestimmt.

Die vorliegende Arbeit befasst sich mit der Untersuchung von weitbandlückigen Halbleitern mittels Raman-Spektroskopie. Diese wurde vorwiegend unter Verwendung von Licht einer Wellenlänge von 325 nm im ultravioletten Spektralbereich angeregt. Damit konnten zum einen aufgrund eines erhöhten Streuquerschnittes Messungen zur Probencharakterisierung durchgeführt werden, die mit Anregung im sichtbaren Spektralbereich nicht möglich gewesen wären. Zum anderen wurden bei dieser Anregungswellenlänge auftretende Resonanzeffekte untersucht. Dabei werden zwei verschiedene Materialsysteme behandelt: zum einen Kristalle mit Wurtzitstruktur und zum anderen binäre und ternäre Sesquioxide mit Metallionen der III. Hauptgruppe. An den Kristallen mit Wurtzitstruktur wurde die Streuung des Anregungslichts mit Energie oberhalb der Bandlücke an longitudinal-optischen (LO) Phononen untersucht. Die Streuung an einzelnen LO-Phononen wird unter diesen Anregungsbedingungen von einem Prozess dominiert, der eine elastische Streuung beinhaltet, durch die die Impulserhaltung verletzt wird. Es wurde ein Modell aufgestellt, dass zwischen einer elastischen Streuung an der Oberfläche und an Punktdefekten unterscheidet, und mit Hilfe von Experimenten verifiziert. Weiterhin wurde der Einfluss von Ladungsträgern auf die Energie der LO-Phononen untersucht und es wird eine Anwendung dieser Erkenntnisse zur Charakterisierung der Oberfläche von Zinkoxid vorgestellt. An den binären Oxiden des Galliums und Indiums wurden die Energien der Phononenmoden ermittelt und die resonante Verstärkung bei der verwendeten Anregungswellenlänge untersucht. Für das Galliumoxid wurde dabei insbesondere die Anisotropie des Materials berücksichtigt. Für das Indiumoxid wird dargestellt, dass durch die resonante Anregung alle Phononenmoden beobachtet werden können, was insbesondere auch die Bestimmung der Phononenmoden von Dünnschichtproben ermöglicht. Weiterhin waren Mischkristalle des Galliumoxids Untersuchungsgegenstand, in denen das Gallium teilweise durch Indium oder Aluminium ersetzt wurde. Die Phononenenergien wurden in Abhängigkeit der Zusammensetzung ermittelt und der Einfluss von strukturellen Eigenschaften darauf sowie das Auftreten von Phasenübergängen untersucht.

No description available.

Power-efficient circuits are a vital step in moving towards a greener future. Battery life can get substantially improved by decreasing the amount of power a circuit needs. Lower power also leads to less excess heat generated. Electronics are within everything today – from phones and microwaves to cars! If we want to optimize the electronics to require less power, we need to understand it. In some integrated circuits that utilize bipolar transistors, it has been concluded that the main limitation regarding low-power, high-temperature operations is leakage currents that arise in reverse biased p–n junctions. There is a lack of understanding regarding the magnitude of these leakage currents, especially at higher temperatures. This thesis aims to provide an understanding of the magnitude of the leakage currents in lateral gated PNP bipolar transistors and to provide empirical models of these currents.A discussion of semiconductor physics takes place, explaining how leakage currents arise in reverse-biased pn junctions. Measurements were taken on a chip with the help of different instruments and a relay network that configured the experimental setup into different circuits while measurements were being conducted.It was shown that the leakage currents are clearly exponential to temperature, as was expected. Empirical models are created with the help of the Gauss-Newton linearization method and shown to be of the form<img src="http://www.diva-portal.org/cgi-bin/mimetex.cgi?$y=%20%5Ctheta_1%20%5Cmathrm%7Be%7D%5E%7B%5Ctheta_2%5Cleft(T-%5Ctheta_4%5Cright)%7D+%5Ctheta_3$" data-classname="equation" data-title="" />,where 𝜃 are parameters for the different models.A discussion is held on the impact of the results and how to improve upon them. Numerous sources of error are discussed, and further work is recommended.

The commercial breakthrough of ZnO-based devices is hampered mainly by the unipolar n-type conductivity of this material. Hydrogen, which is known to form both electrically active and inactive complexes in ZnO, is considered as a main cause of this behavior. However, the existing literature is incomplete and partly contradictory. The object of the present thesis is a comprehensive investigation of the properties of two hydrogen-induced shallow donors HBC and HO, the hydrogen molecule H2, and a hydrogen-related defect, which gives rise to local vibrational modes (LVMs) at 3303 and 3320 cm-1, in ZnO and their interaction. The defects are characterized by Raman spectroscopy, infrared absorption spectroscopy, photoconductivtity (PC) and photoluminescence measurements. Based on the PC technique, a novel and highly sensitive spectroscopic approach is established, which is applicable for probing LVMs in strongly absorbing spectral regions. This technique enables the detection of the local modes of HO at 742 and 792 cm-1 in the neutral charge state. In consequence, earlier theoretical predictions regarding the microscopic structure of this shallow donor can be verified. In Raman measurements the electronic 1s→2s transition of HO is identified at 273 cm-1. This quantity is found to blue-shift with the HO defect concentration. A similar blue-shift of the 1s→2s(2p) donor transition of HBC is assigned to local lattice strain which was generated during high temperature processes. A Raman study of the H2 molecule covers its formation, stability, lattice position and interplay with the ZnO host. In particular, the role of H2 for the continuous generation of HO and HBC and the related n-type behavior is elaborated. The analysis unambiguously confirms that the so-called “hidden hydrogen” species is indeed H2. Moreover, the observation of the ortho-para-conversion process and the coupling to the host phonons contribute to a general understanding of H2 in semiconductors. Experimental results of the LVMs of 3303 and 3320 cm-1 in conjunction with model calculations yield an underlying defect containing three hydrogen atoms. This complex Y–H3 exhibits two configurations, which differ only in the orientation of one chemical bond. The findings are consistent equally with a zinc vacancy decorated with three hydrogen atoms and an ammonia molecule, respectively. Earlier models proposed in the literature are discarded. Measurements of concentration profiles by using Raman spectroscopy reveal the local distribution of the hydrogen-related defects as well as lattice imperfections. At the surface, where oxygen vacancies are present, HO is identified as the dominant shallow donor. Below, in parts of the crystal with low damage, HBC is the prevalent defect. In the sample center, characterized by a significant amount of zinc vacancies, the concentrations of H2 and Y–H3 show their maxima. By recording concentration profiles after thermal treatments a spatially resolved investigation of the interplay of these hydrogen-related defects is possible. / Der kommerzielle Durchbruch von ZnO-basierten Bauelementen ist hauptsächlich durch die beständige n-Typ Leitung des Materials eingeschränkt. Wasserstoff, der sowohl elektrisch aktive als auch inaktive Komplexe in ZnO formt, gilt als ein Hauptverursacher dieses Verhaltens. Jedoch ist die bestehende Literatur zu derartigen Defekten unvollständig, teils auch widersprüchlich. Gegenstand der vorliegenden Arbeit sind umfassende Untersuchungen der beiden wasserstoffinduzierten Donatoren HBC und HO, des Wasserstoffmoleküls H2 und eines Wasserstoffdefekts mit lokalen Schwingungsmoden (LSMn) bei 3303 und 3320 cm-1 in ZnO hinsichtlich ihrer Eigenschaften und gegenseitigen Wechselwirkung. Die Charakterisierung der Komplexe erfolgt mit Hilfe von Raman-Spektroskopie, Infrarot-Absorptionsspektroskopie, Photoleitfähigkeits- (PC) und Photolumineszenzmessungen. Basierend auf der PC Technik wird eine neuartige, hochsensitive Spektroskopiemethode etabliert, welche auch in stark absorbierenden Spektralbereichen anwendbar ist. Diese Technik ermöglicht erstmals die Detektion der LSMn von HO bei 742 und 792 cm-1 im neutralen Ladungszustand. Das experimentelle Ergebnis verifiziert theoretische Vorhersagen zur mikroskopischen Struktur dieses flachen Donators. In Raman-Messungen wird der elektrische 1s→2s Übergang von HO bei 273 cm-1 identifiziert und eine Blauverschiebung dieser Größe mit zunehmender HO-Konzentration beobachtet. Der Donator HBC zeigt ebenfalls eine Blauverschiebung des elektrischen 1s→2s(2p) Übergangs, welche durch lokale Gitterverzerrungen nach Hochtemperaturbehandlungen bedingt ist. Eine Raman-Studie charakterisiert das H2-Molekül in Bezug auf seine Bildung, Stabilität, Gitterposition und die Wechselwirkung mit dem ZnO-Kristall. Insbesondere wird seine Rolle für die fortwährende Bildung der Donatoren HO und HBC und des damit verbundenen n-Typ Verhaltens herausgearbeitet. Die Analyse ergibt die eindeutige Identifizierung der in der Literatur mit „hidden hydrogen“ bezeichneten Spezies als H2. Darüber hinaus tragen die beobachteten Umwandlungsprozesse zwischen ortho-H2 und para-H2 sowie die Kopplung an das Phononenspektrum zu einem generellen Verständnis von Wasserstoffmolekülen in Halbleitern bei. Die experimentellen Ergebnisse der LSMn bei 3303 und 3320 cm-1 in Kombination mit Modellrechnungen ergeben einen zugrundeliegenden Defekt mit drei Wasserstoffatomen. Dieser Komplex Y–H3 weist zwei Konfigurationen auf, welche sich durch die Orientierung von nur einer chemischen Bindung unterscheiden. Die Beobachtungen sind mit einer Zinkvakanz besetzt mit drei Wasserstoffatomen bzw. einem Ammoniakmolekül als mikroskopische Struktur gleichermaßen erklärbar. Bisherige Modelle aus der Literatur können damit widerlegt werden. Messungen von Konzentrationsprofilen mit Raman-Spektroskopie offenbaren die lokale Verteilung der Wasserstoffdefekte sowie von Gitterstörungen. An der Oberfläche, im Beisein von Sauerstoffvakanzen, ist HO der dominante flache Donator. In dem sich anschließenden ungestörten Kristallverbund ist hingegen der Donator HBC vorherrschend. In Zentrum, welches von Zinkvakanzen geprägt ist, sind die Konzentrationen von H2 und Y–H3 maximal. In Verbindung mit Temperaturbehandlungen ist eine räumlich aufgelöste Untersuchung der Wechselwirkung möglich.

This thesis work aims at a better understanding of magneto-optical properties of dilute nitrides and II-VI diluted magnetic semiconductor quantum structures. The thesis is divided into two parts. The first part gives an introduction of the research fields, together with a brief summary of the scientific results included in the thesis. The second part consists of seven scientific articles that present the main findings of the thesis work. Below is a short summary of the thesis. Dilute nitrides have been of great scientific interest since their development in the early 1990s, because of their unusual fundamental physical properties as well as their potential for device applications. Incorporation of a small amount of N in conventional Ga(In)As or Ga(In)P semiconductors leads to dramatic modifications in both electronic and optical properties of the materials. This makes the dilute nitrides ideally suited for novel optoelectronic devices such as light emitting devices for fiber-optic communications, highly efficient visible light emitting devices, multi-junction solar cells, etc. In addition, diluted nitrides open a window for combining Si-based electronics with III-V compounds-based optoelectronics on Si wafers, promising for novel optoelectronic integrated circuits. Full exploration and optimization of this new material system in device applications requires a detailed understanding of their physical properties. Papers I and II report detailed studies of effects of post-growth rapid thermal annealing (RTA) and growth conditions (i.e. presence of N ions, N2 flow, growth temperature and In alloying) on the formation of grown-in defects in Ga(In)NP. High N2 flow and bombardment of impinging N ions on grown sample surface is found to facilitate formation of defects, such as Ga interstitial (Gai) related defects, revealed by optically detected magnetic resonance (ODMR). These defects act as competing carrier recombination centers, which efficiently decrease photoluminescence (PL) intensity. Incorporation of a small amount of In (e.g. 5.1%) in GaNP seems to play a minor role in the formation of the defects. In GaInNP with 45% of In, on the other hand, the defects were found to be abundant. Effect of RTA on the defects is found to depend on initial configurations of Gai related defects formed during the growth. In Paper III, the first identification of an interfacial defect at a heterojunction between two semiconductors (i.e. GaP/GaNP) is presented. The interface nature of the defect is clearly manifested by the observation of ODMR lines originating from only two out of four equivalent &lt;111&gt; orientations. Based on its resolved hyperfine interaction between an unpaired electronic spin (S=1/2) and a nuclear spin (I=1/2), the defect is concluded to involve a P atom at its core with a defect/impurity partner along a &lt;111&gt; direction. Defect formation is shown to be facilitated by N ion bombardment. In Paper IV, the effects of post-growth hydrogenation on the efficiency of the nonradiative (NR) recombination centers in GaNP are studied. Based on the ODMR results, incorporation of H is found to increase the efficiency of the NR recombination via defects such as Ga interstitials. In Paper V, we report on our results from a systematic study of layered structures containing an InGaNAs/GaAs quantum well, by the optically detected cyclotron resonance (ODCR) technique. By monitoring PL emissions from various layers, the predominant ODCR peak is shown to be related to electrons in GaAs/AlAs superlattices. This demonstrates the role of the SL as an escape route for the carriers confined within the InGaNAs/GaAs single quantum well. The last two papers are within a relatively new field of spintronics which utilizes not only the charge (as in conventional electronics) but also the quantum mechanical property of spin of the electron. Spintronics offers a pathway towards integration of information storage, processing and communications into a single technology. Spintronics also promises advantages over conventional charge-based electronics since spin can be manipulated on a much shorter time scale and at lower cost of energy. Success of semiconductor-based spintronics relies on our ability to inject spin polarized electrons or holes into semiconductors, spin transport with minimum loss and reliable spin detection. In Papers VI and VII, we study the efficiency and mechanism for carrier/exciton and spin injection from a diluted magnetic semiconductor (DMS) ZnMnSe quantum well into nonmagnetic CdSe quantum dots (QD’s) by means of spin-polarized magneto PL combined with tunable laser spectroscopy. By means of a detailed rate equation analysis presented in Paper VI, the injected spin polarization is deduced to be about 32%, decreasing from 100% before the injection. The observed spin loss is shown to occur during the spin injection process. In Paper VII, we present evidence that energy transfer is the dominant mechanism for carrier/exciton injection from the DMS to the QD’s. This is based on the fact that carrier/exciton injection efficiency is independent of the width of the ZnSe tunneling barrier inserted between the DMS and QD’s. In sharp contrast, spin injection efficiency is found to be largely suppressed in the structures with wide barriers, pointing towards increasing spin loss.