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In this study, the impact of galvanic coupling of magnesium to steel on the corrosion rate, surface morphology, and surface film formation was investigated. In particular, the role of self-corrosion was quantified as previous studies showed discrepancies between model predictions and experimental results that were likely due to significant self-corrosion. This experimental study examined the corrosion of Mg coupled to steel in 5 wt% NaCl at cathode-to-anode area ratios that ranged from 5 to 27. Results showed that self-corrosion was significant and accounted for, on average, one-third of total corrosion. Moreover, self-corrosion varied with time and cathode size, and was accelerated by the high dissolution rate. Film formation was observed on the magnesium surface that inhibited the corrosion rates. This film contained approximately 30% of the Mg lost to corrosion. The morphology of the coupled Mg showed the rapid formation of pits with considerable depth, and was quite distinct from previously studied filiform and disk corrosion for uncoupled Mg. This study demonstrates the important role of self-corrosion during galvanic corrosion of Mg and the need to account for such corrosion when predicting corrosion rates. This study also provides important insight into the processes that control Mg corrosion under several conditions.

Nanometric thin films are used widely throughout various industries and for various applications. Metallic thin films, specifically, are relied upon extensively in the microelectronics industry, among others. For example, alloy thin films are being investigated for CMOS applications, tungsten films find uses as contacts and diffusion barriers, and copper is used often as interconnect material. Appropriate metrology methods must therefore be used to characterize the physical properties of these films. Xray scattering experiments are well suited for the investigation of nano-scaled systems, and are the focus of this doctoral dissertation. Emphasis is placed on (1) phase identification of polycrystalline thin films, (2) the evaluation of the grain size and microstrain of metallic thin films by line profile analysis, and (3) the study of morphological evolution in solid/solid interfaces. To illustrate the continued relevance of x-ray diffraction for phase identification of simple binary alloy systems, Pt-Ru thin films, spanning the compositional range from pure Pt to pure Ru were investigated. In these experiments, a meta-stable extension of the HCP phase is observed in which the steepest change in the electronic work function coincides with a rapid change in the c/a ratio of the HCP phase. For grain size and microstrain analysis, established line profile methods are discussed in terms of Cu and W thin film analysis. Grain sizes obtained by x-ray diffraction are compared to transmission electron microscopy based analyses. Significant discrepancies between x-ray and electron microscopy are attributed to sub-grain misorientations arising from dislocation core spreading at the film/substrate interface. A novel "residual" full width half max parameter is introduced for examining the iv contribution of strain to x-ray peak broadening. The residual width is subsequently used to propose an empirical method of line profile analysis for thin films on substrates. X-ray reflectivity was used to study the evolution of interface roughness with annealing for a series of Cu thin films that were encapsulated in both SiO2 and Ta/SiO2. While all samples follow similar growth dynamics, notable differences in the roughness evolution with high temperature ex-situ annealing were observed. The annealing resulted in a smoothing of only one interface for the SiO2 encapsulated films, while neither interface of the Ta/SiO2 encapsulated films evolved significantly. The fact that only the upper Cu/SiO2 interface evolves is attributed to mechanical pinning of the lower interface to the rigid substrate. The lack of evolution of the Cu/Ta/SiO2 interface is consistent with the lower diffusivity expected of Cu in a Cu/Ta interface as compared to that in a Cu/SiO2 interface. The smoothing of the upper Cu/SiO2 interface qualitatively follows that expected for capillarity driven surface diffusion but with notable quantitative deviation.

<p> Inland degradational trends of coastal dolomite pavements (on the Amabel formation near Tobermory Ontario Map 1) were examined in three wave energy settings: passive, intermediate, and active shores. </p> <p>Six pavement property trends were examined to determine the effect of low fetch lengths (7-10 km - Ford 83) and long shallow wave approach (Map 1) on the break-up of passive coastal pavements (south-west Bear's Rump Island): vegetation cover , grike dimensions, fracturing, pitting, shattering and flaking, and soil and rubble depths. </p> <p> Detailed analysis of small scale surface solution features, "karren", was undertaken at five 1 m sample grids on the intermediate average fetch 70-90 km -Grosset 85) Cyprus Lake provincial park pavements. </p> <p> / Thesis / Bachelor of Arts (BA)

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10 SUMMARY Proteins represent one of the basic building blocks of all organisms. To understand their function at the molecular level is one the critical goals of current biological, biochemical and biophysical research. It is important to characterise all aspects that affect the localisation of proteins into different compartments with specific functions, the dynamic structure of proteins and their role in multiprotein assemblies, because altering these properties can lead to various diseases. Most of the proteomic studies are nowadays performed using biochemical approaches that allow us to study multicellular organism or tissue at once. The disadvantage of these methods is complex preparation of sample and the need for a large number of cells, which leads to the loss of information at the molecular level and in individual cells. On the contrary, microscopy can provide rather detailed information about proteins of interest and at the level of a single cell. A variety of fluorescence microscopy methods in combination with recombinant DNA techniques were applied to elucidate subcellular localisation of transmembrane adaptor proteins (TRAPs) in human lymphocytes and their nanoscopic organisation at the plasma membrane. Linker of activation of T lymphocytes (LAT), phosphoprotein associated with...

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In this report the influence of the growth conditions on the surface morphology of AlGaN/GaN heterostructures grown on sapphire-based and bulk GaN substrates is nondestructively investigated with focus on the decoration of defects and the surface roughness. Under Ga-rich conditions specific types of dislocations are unintentionally decorated with shallow hillocks. In contrast, under Ga-lean conditions deep pits are inherently formed at these defect sites. The structural data show that the dislocation density of the substrate sets the limit for the density of dislocation-mediated surface structures after MBE overgrowth and no noticeable amount of surface defects is introduced during the MBE procedure. Moreover, the transfer of crystallographic information, e.g. the miscut of the substrate to the overgrown structure, is confirmed. The combination of our MBE overgrowth with the employed surface morphology analysis by atomic force microscopy (AFM) provides a unique possibility for a nondestructive, retrospective analysis of the original substrate defect density prior to device processing.

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