Thermoelectric (TE) materials directly convert heat energy into electrical energy. The conversion efficiency of the TE devices depends on the performance of the materials. The conversion efficiency of available thermoelectric materials and devices is low. Therefore, the development of new materials for improving thermoelectric device performance is a highly essential. As the performance of the TE materials depends on TE figure of merit [zT=S2P T ] which consist of three material properties such as Seebeck coefficient (S), electrical resistivity ( ) and thermal conductivity ( ). Thermoelectric figure of merit can be improved by either increase of power factor or decreasing of thermal conductivity or by both. In the present thesis, Cu based chalcogenide compounds are chosen for the study of thermoelectric properties because of their complex crystal structure, which leads to lower values of thermal conductivity. Also, the power factor of these materials can be tuned by the partial substitution doping. In the present thesis, Cu based chalcogenide compounds quaternary chalcogenide compound (Cu2ZnSnSe4), ternary compounds (Cu2SnSe3 and Cu2GeSe3) and tetrahedrite materials (Cu12Sb4S13) have been prepared by solid state synthesis. The prepared compounds are characterized by XRD for the phase identification, Raman Spectroscopy used as complementary technique for XRD, SEM for surface morphology and EPMA for the phase purity and elemental composition analysis respectively. For the evaluation of zT, thermoelectric properties of all the samples have been studied by measuring Seebeck coefficient, resistivity and thermal diffusivity. In the chapter 1, a brief introduction about thermoelectricity and its effects is discussed. Thermoelectric materials parameters such as electrical resistivity, Seebeck coefficient and thermal conductivity for different class of materials are mentioned. The selection of thermoelectric materials and the motivation for choosing the Cu based chalcogenide compounds for thermoelectric applications are discussed. In chapter 2, the details of the experiments carried out for Cu based chalcogenide compounds are presented. In chapter 3, the effect on thermoelectric properties by the cation substitution on quaternary chalcogenide compound Cu2+xZnSn1 xSe4 (0, 0.025, 0.05, 0.075, 0.1, 0.125, and 0.15) is studied. The electrical resistivity of all the samples decreases with an increase in Cu content except for Cu21ZnSn09Se4, most likely due to a higher content of the ZnSe. All the samples showed positive Seebeck coefficients indicating that holes are the majority charge carriers. The thermal conductivity of doped samples was higher as compared to Cu2ZnSnSe4 and this may be due to the larger electronic contribution and the presence of the ZnSe phase in the doped samples. The maximum zT = 0.23 at 673 K is obtained for Cu205ZnSn095Se4. In chapter 4, the effect of multi{substitution of Cu21ZnSn1 xInxSe4 (0, 0.05, 0.075, and 0.1) on transport properties were studied. The Rietveld powder X-ray diffraction data accompanied by electron probe microanalysis (EPMA) and Raman spectra of all the samples con firmed the formation of a tetragonal kesterite structure. The electrical resistivity of all the samples exhibits metallic-like behavior. The positive values of the Seebeck coefficient and the Hall coefficient reveal that holes are the majority charge carriers. The co-doping of copper and indium leads to a significant increase of the electrical resistivity and the Seebeck coefficient as a function of temperature above 650 K. The thermal conductivity of all the samples decreases with increasing temperature. Lattice thermal conductivity is not significantly modified as the doping content may infer negligible mass fluctuation scattering for copper zinc and indium tin substitution. Even though, the power factors (S2 ) of indium-doped samples Cu21ZnSn1 xInxSe4 (x=0.05, 0.075) are almost the same, the maximum zT=0.45 at 773 K was obtained for Cu21Zn09Sn0925In0075Se4 due to its smaller value of thermal conductivity. In chapter 5, thermoelectric properties of Zn doped ternary compounds Cu2ZnxSn1 xSe3 (x = 0, 0.025, 0.05, 0.075) were studied. The undoped com\pound showed a monoclinic crystal structure as a major phase, while the doped compounds showed a cubic crystal structure confirmed by powder XRD (X-Ray Diffraction). The electrical resistivity decreased up to the samples with Zn content x=0.05 in Cu2ZnxSn1 xSe3, and slightly increased in the sample Cu2Zn0075Sn0925Se3 . This behavior is consistent with the changes in the carrier concentration confirmed by room temperature Hall coefficient data. Temperature dependent electrical resistivity of all samples showed heavily doped semiconductor behavior. All the samples exhibit positive Seebeck coefficient (S) and Hall coefficient indicating that the majority of the carriers are holes. A linear increase in Seebeck coefficient with increase in temperature indicates the degenerate semiconductor behavior. The total thermal conductivity of the doped samples increased with a higher amount of doping, due to the increase in the carrier contribution. The total and lattice thermal conductivity of all samples decreased with increasing of temperature, which points toward the dominance of phonon scattering at high temperatures. The maximum zT = 0.34 at 723 K is obtained for the sample Cu2SnSe3 due to a low thermal conductivity compared to the doped samples. In chapter 6, thermoelectric properties of Cu2Ge1 xInxSe3 (x = 0, 0.05, 0.1, 0.15) compounds is studied. The powder X-ray diffraction pattern of the undoped sample revealed an orthorhombic phase. The increase in doping content led to the appearance of additional peaks related to cubic and tetragonal phases along with the orthorhombic phase. This may be due to the substitutional disorder created by indium doping. The electrical resistivity ( ) systematically decreased with an increase in doping content, but increased with the temperature indicating a heavily doped semiconductor behavior. A positive Seebeck coefficient (S) of all samples in the entire temperature range reveal holes as predominant charge carriers. Positive Hall coefficient data for the compounds Cu2Ge1 xInxSe3 (x= 0, 0.1) at room temperature (RT) con rm the sign of Seebeck coefficient. The trend of as a function of doping content for the samples Cu2Ge1 xInxSe3 with x = 0 and 0.1 agrees with the measured charge carrier density calculated from Hall data. The total thermal conductivity increased with rising doping content, attributed to an increase in carrier thermal conductivity. The thermal conductivity decreases with increasing temperature, which indicates the dominance of Umklapp phonon scattering at elevated temperatures. The maximum thermoelectric figure of merit (zT) = 0.23 at 723 K was obtained for Cu2In01Ge09Se3. In chapter 7, thermoelectric properties of Cu12 xMn1 xSb4S13 (x = 0, 0.5, 1.0, 1.5, 2.0) samples were studied. The Rietveld powder XRD pattern and Electron Probe Micro Analysis revealed that all the Mn substituted samples showed a single tetrahedrite phase. The electrical resistivity increased with increasing Mn due to substitution of Mn2+ on the Cu1+ site. The positive Seebeck coefficient for all samples indicates that the dominant carriers are holes. Even though the thermal conductivity decreased as a function of increasing Mn, the thermoelectric figure of merit (zT) decreased, because the decrease of the power factor is stronger than the decrease of the thermal conductivity. The maximum zT = 0.76 at 623 K is obtained for Cu12Sb4S13. In chapter 8, the summary and conclusion of the present work is presented.

Cette thèse concerne la réalisation des films minces d’oxydes et l’étude de leurs propriétés physiques pour les cellules photovoltaïques (PV) et les modules thermoélectriques. Dans une première partie, les propriétés de l’oxyde de titane TiOx (1,45<x<2) sont mises en évidence pour une utilisation en tant qu’oxyde transparent conducteur optiquement actif à disposer en face avant des cellules PV ou, comme couche de couplage optique à intercaler entre le métal réflecteur et la couche absorbante d’une cellule PV. Les couches sont déposées par ablation laser pulse (PLD). Cette méthode permet d’obtenir des couches stoechiométriques ou déficitaires en oxygène grâce au contrôle de la pression d’oxygène pendant le dépôt. Les couches sont dopées par Nb pour un gain en conductivité électrique et/ou par Nd pour la conversion des photons UV en photons du Proche IR. Les films d’une part, isolants, transparents et luminescents ou d’autre part, conducteurs et absorbants ont été obtenus. La présence de polarons et/ou de bipolarons dans les couches TiO₁,₄₅₋₁,₆₀ explique la discontinuité observée sur leurs courbes de thermoconductivité. Une seconde partie du manuscrit concerne la thermoelectricité ou il est question de modifier les propriétés des cobaltites de calcium pour la conversion en énergie électrique des gradients de température faibles, centres autour de 300-365 K. Le contrôle de la concentration en oxygène des films a permis d’obtenir les phases polymorphes CaxCoO₂, Ca₃Co₄O₉, et Ca₃Co₄O₆,₄₋₆,₈ présentant des comportements semiconducteurs ou métalliques en fonction de la température de dépôt. Les films Ca₃Co₄O₆,₄₋₆,₈ montrent de faibles résistivités (3,8-6 mΩ.cm) et des coefficients de Seebeck élevés (S) ≥ 1000 μV/K qui doivent être confirmes pour que de tels films soient utilisés dans les thermogénérateurs. / This thesis concerns the realization of oxide thin films and the study of their properties for photovoltaic or thermoelectric devices. In the first part, the TiOx properties are studied for use as an optically active transparent conductive oxide to put in front of the PV cells or, as optical coupling layer to interpose between the metal reflector and the absorbent layer of a PV cell. The layers are deposited by pulsed laser deposition (PLD). This method allows to get stoichiometric or oxygen deficient layers by controlling the oxygen partial pressure during the growth. The layers are doped with Nb to enhance electrical conductivity and/or with Nd for the conversion of Ultra-Violet photons to Near Infra-Red photons. Insulating and transparent layers, luminescent layers or conducting and absorbent layers are obtained. The TiO₁,₄₅₋₁,₆₀ films show polaronic or bipolaronic conductivity and exhibited the jump of electrical conductivity with jump height and temperature depending on the nature of the dopants. A second part of the manuscript concerns thermoelectricity in which the properties of cobalt calcium oxide are modulated for an efficient conversion of low temperature gradients centered at 300-365K. The control of the oxygen concentration of films allows to obtain the polymorphic phases CaxCoO₂,Ca₃Co₄O₉ and Ca₃Co₄O₆,₄₋₆,₈ having metallic or semiconducting behavior depending on the deposition temperature. The Ca₃Co₄O₆,₄₋₆,₈ films show high Seebeck coefficients (S) ≥ 1 000 μV/K and low electrical resistivity (3.8 to 6 mΩ.cm). Such interesting values have to be confirmed by additional experiments in order to be used as thermoelectric films.

To support the growing global demand for energy, new sustainable solutions are needed both economically and environmentally. Thermoelectric waste heat recovery and energy harvesting could contribute by increasing industrial process efficiency, as well as powering stand-alone devices, microgenerators, and small body appliances.The structural complexity of quaternary chalcogenide materials provides an opportunity for engineering defects and disorder, to modify and possibly improve specific properties. Cu2ZnSnS4 (CZTS, often kesterite), valued for the abundance and non-toxicity of the raw materials, seems particularly suited to explore these possibilities, as it presents several structural defects and polymorphic phase transformations. The aim of this doctoral work is to systematically investigate the effects of structural polymorphism, disorder, and defects on the thermoelectric properties of CZTS, with particular emphasis to their physical origin. A remarkable case is the order-disorder transition of tetragonal CZTS, which is found responsible for a sharp enhancement in the Seebeck coefficient due to a flattening and degeneracy of the electronic energy bands. This effect, involving a randomization of Cu and Zn cations in certain crystallographic planes, is verified in bulk and thin film samples, and applications are proposed to exploit the reversible dependence of electronic properties on disorder. Low-temperature mechanical alloying is instead discovered stabilizing a novel polymorph of CZTS, which disordered cubic structure is studied in detail, and proposed deriving from sphalerite-ZnS. The total cation disorder in this compound provides an uncommon occurrence in thermoelectricity: a concurrent optimization of Seebeck coefficient, electrical and thermal conductivity. These findings, besides providing new and general understanding of CZTS, can cast light on profitable mechanisms to enhance the thermoelectric performance of semiconducting chalcogenides, as well as delineate alternative and fruitful applications.

Der thermische Widerstand ist eine wichtige Kenngröße von Silicium-Germanium-Hetero-Bipolartransistoren (SiGe-HBTs). Bisher kam es bei der quantitativen Bestimmung der thermischen Widerstände von SiGe-HBTs zu deutlichen Abweichungen zwischen Simulation und Messung. Der Unterschied zwischen Simulation und Messung betrug bei den untersuchten HBTs mehr als 30 Prozent. Diese Arbeit widmet sich der Aufklärung und Beseitigung der möglichen Ursachen hierfür. Zu diesem Zweck werden als erstes die Messmethoden analysiert. Es zeigt sich, dass die bisher verwendete Extraktionsmethode sensitiv auf den Early-Effekt (Basisweitenmodulation) reagiert. Im Rahmen der Untersuchungen wurde ein neues Extraktionsverfahren entwickelt. Die neue Extraktions­methode ist unempfindlich gegenüber dem Early-Effekt. Mit Bauelemente­simulationen wird erstmalig die Wirkung des Seebeck-Effektes (Thermospannungen) auf die elektrisch extrahierten thermischen Widerstände demonstriert. Der Seebeck-Effekt bewirkt, dass die elektrisch extrahierten thermischen Widerstände der untersuchten HBTs nahezu 10 Prozent kleiner als die erwarteten Werte sind. Dieser Effekt wurde bisher nicht beachtet und wird hier erstmals nachgewiesen. Weiterhin wird die Abhängigkeit des thermischen Widerstandes vom Arbeitspunkt untersucht. Dabei hat sich gezeigt, dass bis zu einer Basis-Emitter-Spannung von 0,91 Volt die geometrische Form des Wärme abgebenden Gebietes unabhängig vom Arbeitspunkt ist. Anhand von Messungen wird gezeigt, dass die Dotierung die spezifische Wärmeleitfähigkeit von Silicium reduziert. Die Abnahme wird für Dotierungen größer als 1*1019 cm‑3 deutlich sichtbar. Ist die Dotierung größer als 1*1020 cm‑3, beträgt die Abnahme der spezifischen Wärmeleitfähigkeit mehr als 75 Prozent. Mithilfe einer Simulatorkalibrierung wird die spezifische Wärmeleitfähigkeit als Funktion der Dotierung bestimmt. Die erhaltene Funktion kann künftig beim thermischen Entwurf von HBTs verwendet werden. Somit können zukünftig genauere Vorhersagen zum thermischen Widerstand der HBTs gemacht werden. Dies ermöglicht zuverlässigere Aussagen darüber, wie Änderungen des Transistordesigns zur Minimierung des thermischen Widerstandes beitragen. / The thermal resistance is an important parameter of silicon-germanium heterojunction bipolar transistors (SiGe HBTs). Until now, the quantitative determination of the thermal resistance showed significant differences between measurements and simulations. The difference between simulation and measurement of the investigated HBTs was more than 30 percent. This thesis devotes the clarification and elimination of potential sources for it. For this purpose, the measurement methods are analyzed at first. It is shown, that the currently used extraction method is sensitive to the Early effect (basewidth modulation). A now extraction method was developed, which is not sensitive to the Early effect. For the first time, the influence of the Seebeck effect (thermoelectric voltages) on the electrically extracted thermal resistance is shown by device simulations. The Seebeck effect leads to a 10 percent lower extracted thermal resistances compared to the expected values of the investigated HBTs. This effect was not taken into account up to now and is demonstrated here for the first time. Furthermore, the dependence of the thermal resistance on the operating point was investigated. The results show that the shape of the heat source is independent of the operating point if the base emitter voltage is smaller than 0.91 volt. The thermal conductivity of silicon is decreased by increasing doping concentrations. This is shown by measurements. The reduction of the thermal conductivity is well observable for doping concentrations higher than 1*1019 cm‑3. For doping concentration higher than 1*1020 cm‑3 the reduction amounts to more than 75 percent. The thermal conductivity was determined as a function of the doping concentration with the aid of a simulator calibration. This function can be used in the future thermal design of HBTs. It facilitates the optimization of the HBTs with respect to a minimal thermal resistance.