The objective of this research is to explore high-speed analog-to-digital converters (ADCs) using silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs) for wireless digital receiver applications. The stringent requirements of ADCs for the high-performance next-generation wireless digital receiver include (1) low power, (2) low cost, (3) wide input signal bandwidth, (4) high sampling rate, and (5) medium to high resolution. The proposed research achieves the objective by implementing high-performance ADC's key building blocks and integrating these building blocks into a complete sigma-delta analog-to-digital modulator that satisfies the demanding specifications of next-generation wireless digital receiver applications. The scope of this research is divided into two main parts: (1) high-performance key building blocks of the ADC, and (2) high-speed sigma-delta analog-to-digital modulator. The research on ADC's building blocks includes the design of two high-speed track-and-hold amplifiers (THA) and two wide-bandwidth comparators operating at the sampling rate > 10 GS/sec with satisfying resolution. The research on high-speed sigma-delta analog-to-digital modulator includes the design and experimental characterization of a high-speed second-order low-pass sigma-delta modulator, which can operate with a sampling rate up to 20 GS/sec and with a medium resolution. The research is envisioned to demonstrate that the SiGe HBT technology is an ideal platform for the design of high-speed ADCs.

This thesis focuses on the design and implementation of low power Σ∆ ADCs in 130 nanometer CMOS technology. The design issues in the implementation of a third order ADC with a multi-bit and single bit quantizer are discussed. The advancement in CMOS technology has led to designing as much of electronics systems as possible with the digital circuits and digital signal processing replacing analog processing in most cases. Hence there is a need for digitizing analog signals with analog to digital converter (ADC). In communication systems this needs to be done immediately after the antenna in a receiver system. As this is difficult to implement due to high speed and high power consumption, RF signal is converted to a lower intermediate frequency (IF) and digitized. This work stresses low power implementation of high bandwidth Σ∆ ADCs for digitizing the IF. Design techniques involved in the implementation of a third order continuous time Σ∆ ADC with a 4 bit quantizer as well as a single bit quantizer for wide bandwidth are discussed. Moreover, a third order continuous time audio ADC implementation was also done. The behavioural modelling of the Σ∆ ADC along with clock jitter non-linearity model was developed and the issues in circuit design techniques are addressed. The continuous time ADCs’ major problem, namely, excess loop delay is discussed in detail and an efficient compensation technique for the same is implemented which allows a large reduction of power consumed by the ADC. Choice of loop filter architecture, quantizer and transistor level implementation are given that result in better immunity to offsets and process variations. Both the ADCs have been implemented using UMC 130 nm Mixed-mode RF-CMOS process and the simulation results for the multi-bit ADC gives a peak SNR of 56dB with a dynamic range of 65dB with power consumption of 2mW. The audio ADC achieves a peak SNR of 94.2dB with a dynamic range of 91dB.

Analog-to-digital converter (ADC) is the main workhorse in a digital waveform recorder. Strictly speaking, an ADC is supposed to perform uniformly, irrespective of the characteristics of the signal to be acquired. However, because of certain hardware related inconsistencies, its performance declines, particularly, when acquiring non-repetitive, fast-rising, high frequency signals. The error and distortion contributed due to its declining performance, for the entire range of signals, can be comprehensively characterized by the static and dynamic nonlinearities. Actual testing of ADCs is the only way of estimating these indices. These characteristics reveal information at the microscopic level, such as bit-level aberrations, code transitions, response and settling trends, etc. These tests attain greater significance, when the digitizer is part of a reference measuring or a calibration system, because, the levels of accuracies to be achieved in such a setup may become comparable to the error introduced by the ADC. Hence, testing ADCs is a priority. International and national standards exist for testing digital waveform recorders and ADCs. For several years, the matter related to reducing static test time of high-resolution ADCs was highlighted through many publications. A critical examination of the literature indicates the major schools-of-thought pursued so far, are, (i) refinements to ramp/triangular signal based static testing, (ii) proposals for use of alternative methods and/or test signals for static test, (iii) innovative ways of achieving a relaxation in signal source requirements and, (iv) efforts to combine static and dynamic test into a single test with an appropriate test signal. As a consequence of the literature review, objectives of the thesis were formulated. They attempt to resolve- (i) Conceive a suitable test signal for simultaneous estimation of static and dynamic nonlinearity through a single test (ii) Explore possibility of employing a low-linearity ramp signal to estimate static nonlinearity (iii) Estimating static nonlinearity by exploiting linearity property of a sine signal • In the first part of the thesis, a method is proposed for the concurrent estimation of static and dynamic nonlinearity characteristics of an ADC, with the application of a single test signal. The novelty arises from the fact that the test signal proposed is new, and so is the concept of extracting the static and dynamic nonlinearity from the ADC output. This was achieved by conceiving a test signal, comprising of a high frequency sinusoid (which addresses the dynamic requirement), modulated by a low frequency ramp (which addresses the static requirement). • Static characteristics of an ADC can be determined directly from the histogram-based quasi-static approach by measuring the ADC output, when excited by an ideal ramp/triangular signal of sufficiently low frequency. This approach requires only a fraction of time compared to the conventional DC test, is straightforward, easy to implement, and, in principle is an accepted method as per the revised IEEE-1057. However, the only drawback is that ramp signal sources are not ideal. Thus, nonlinearity present in the ramp signal gets superimposed on the measured ADC characteristics, which renders them, as such, unusable. The second part of the work describes a proposal to get rid of the ramp signal nonlinearity, before it is applied to the ADC. A simple method is presented which employs a low-linearity ramp signal, but yet causes only a fraction of influence on the measured ADC static characteristics. • The third part of the thesis describes a novel method to estimate the actual static characteristics of an ADC using a low frequency sine signal, say, less than 10 Hz, by employing the histogram-based approach. It is based on the well known fact that variation of sine signal is ‘reasonably linear,’ when the angle is small. In the proposed method, the ADC under test has to be ‘fed’ with this ‘linear’ portion of the sine wave. Due to harmonics and offset in input excitation, this ‘linear’ part of the sine signal is marginally different, compared to an ideal ramp signal of equal amplitude. However, since it is a sinusoid, this difference can be accurately determined and later compensated from the measured ADC output. Thus, the corrected ADC output will correspond to the true ADC static nonlinearity. The proposed approach successfully addresses all the three concerns while estimating static linearity, i.e. it is time-efficient, excites all the ADC code-bins reasonably uniformly and tackles the source linearity issue quite nicely. These proposals are novel, simple, easy to implement, time-efficient and importantly static nonlinearity characteristics determined from them are in good agreement with that estimated by the original DC-based technique. Implementation of each method is discussed along with experimental results, for two 8-bit digital oscilloscopes and a 10-bit real time digitizer. Further details are presented in the thesis.

This thesis presents a study on solutions to high-speed analog-to-digital conversion in CMOS image sensors using time-interpolation methods. Data conversion is one of the few remaining speed bottlenecks in conventional 2D imagers. At the same time, as pixel dark current continues to improve, the resolution requirements on imaging data converters impose very high system-level design challenges. The focus of the presented investigations here is to shed light on methods in Time-to-Digital Converter interpolation of single-slope ADCs. By using high-factor time-interpolation, the resolution of single-slope converters can be increased without sacrificing conversion time or power. This work emphasizes on solutions for improvement of multiphase clock interpolation schemes, following an all-digital design paradigm. Presented is a digital calibration scheme which allows a complete elimination of analog clock generation blocks, such as PLL or DLL in Flash TDC-interpolated single-slope converters. To match the multiphase clocks in time-interpolated single-slope ADCs, the latter are generated by a conventional open-loop delay line. In order to correct the process voltage and temperature drift of the delay line, a digital backend calibration has been developed. It is also executed online, in-column, and at the end of each sample conversion. The introduced concept has been tested in silicon, and has showed promising results for its introduction in practical mass-production scenarios. Methods for reference voltage generation in single-slope ADCs have also been looked at. The origins of error and noise phenomenona, which occur during both the discrete and continuous-time conversion phases in a single-slope ADC have been mathematically formalized. A method for practical measurement of noise on the ramp reference voltage has also been presented. Multiphase clock interpolation schemes are difficult for implementation when high interpolation factors are used, due to their quadratic clock phase growth with resolution. To allow high interpolation factors a time-domain binary search concept with error calibration has been introduced. Although the study being conceptual, it shows promising results for highly efficient implementations, if a solution to stable column-level unit delays can be found. The latter is listed as a matter of future investigations.

The objective of the research is to develop high-speed ADCs and mixed-signal demodulator for multi-gigabit communication systems using millimeter-wave frequency bands in standard CMOS technology. With rapid advancements in semiconductor technologies, mobile communication devices have become more versatile, portable, and inexpensive over the last few decades. However, plagued by the short lifetime of batteries, low power consumption has become an extremely important specification in developing mobile communication devices. The ever-expanding demand of consumers to access and share information ubiquitously at faster speeds requires higher throughputs, increased signal-processing functionalities at lower power and lower costs. In today’s technology, high-speed signal processing and data converters are incorporated in almost all modern multi-gigabit communication systems. They are key enabling technologies for scalable digital design and implementation of baseband signal processors. Ultimately, the merits of a high performance mixed-signal receiver, such as data rate, sensitivity, signal dynamic range, bit-error rate, and power consumption, are directly related to the quality of the embedded ADCs. Therefore, this dissertation focuses on the analysis and design of high-speed ADCs and a novel broadband mixed-signal demodulator with a fully-integrated DSP composed of low-cost CMOS circuitry. The proposed system features a novel dual-mode solution to demodulate multi-gigabit BPSK and ASK signals. This approach reduces the resolution requirement of high-speed ADCs, while dramatically reducing its power consumption for multi-gigabit wireless communication systems.

Commercialization of infrared (IR) vision is of vital importance for many applications, such as automobile and health care. The main obstacle in front of the further spread of this technology is the high price. The cost reduction is achieved by placing on-chip electronics and diminishing the camera size, where one of the important components is the analog-to-digital converter (ADC). This thesis reports the design of a successive approximation register (SAR) ADC for low-cost microbolometers and its test electronics. Imaging ADCs are optimized only for the specific application in order to achieve the lowest power, yet the highest performance. The successive approximation architecture is chosen, due to its low-power, small-area nature, high resolution potential, and the achievable speed, as the ADC needs to support a 160x120 imager at a frame rate of 25 frames/sec (fps). The resolution of the ADC is 14 bit at a sampling rate of 700 Ksample/sec (Ksps). The noise level is at the order of 1.3 LSBs. The true resolution of the ADC is set to be higher than the need of the current low-cost microbolometers, so that it is not the limiting factor for the overall noise specifications. The design is made using a 0.18&micro / m CMOS process, for easy porting of design to the next generation low-cost microbolometers. An optional dual buffer approach is used for improved linearity, a modified, resistive digital-to-analog converter (DAC) is used for enhanced digital correction, and a highly configurable digital controller is designed for on-silicon modification of the device. Also, a secondary 16-bit high performance ADC with the same topology is designed in this thesis. The target of the high resolution ADC is low speed sensors, such as temperature sensors or very small array sizes of infrared sensors. Both of the SAR ADCs are designed without switched capacitor circuits, the operation speed can be minimized as low as DC if an extremely low power operation is required. A compact test setup is designed and implemented for the ADC. It consists of a custom designed proximity card, an FPGA card, and a PC. The proximity card is designed for high resolution ADC testing and includes all analog utilities such as voltage references, voltage regulators, digital buffers, high resolution DACs for reference generation, voltage buffers, and a very high resolution &Delta / -&Sigma / DAC for input voltage generation. The proximity card is fabricated and supports automated tests, because many components surrounding the ADC are digitally controllable. The FPGA card is selected as a commercially available card with USB control. The full chip functionalities and performances of both ADCs are simulated. The complete layouts of both versions are finished and submitted to the foundry. The ADC prototypes consist of more than 7500 transistors including the digital circuitry. The power dissipation of the 16-bit ADC is around 10mW, where the 14-bit device consumes 30mW. Each of the dies is 1mm x 5mm, whereas the active circuits occupy around 0.5mm x 1.5mm silicon area. These chips are the first steps in METU for the realization of the digital-in digital-out low cost microbolometers and low cost sensors.

The advent of deep submicron technology has resulted in a new generation of highly integrated mixed-signal system-on-chips (SoCs) and system-on-packages (SoPs). As a result, the cost of electrical products has sharply declined, and their performance has greatly improved. However, a testing throughput still remains one of the major contribution factors to final cost of the electrical products. In addition, highly precise and robust test methods and equipment are needed to promise non-defective products to customers. Hence, the testing is a critical part of the manufacturing process in the semiconductor industry. Testing such highly integrated systems and devices requires high-performance and high-cost equipment. Analog-to-digital converters (A/D converters) are the largest volume mixed-signal circuits, and they play a key role in communication between the analog and digital domains in many mixed-signal systems. Due to the increasing complexity of the mixed-signal systems and the availability of the new generations of highly integrated systems, reliable and robust data conversion schemes are necessary for many mixed-signal designs. Many applications such as telecommunications, instrumentation, sensing, and data acquisition have demanded data converters that support ultra high-speed, wide-bandwidths, and high-precision with excellent dynamic performance and low-noise. However, as resolutions and speeds in the A/D converters increase, testing becomes much harder and more expensive. In this research work, low-cost test strategies to reduce overall test cost for high-precision A/D converters are developed. The testing of data converters can be classified as dynamic (or alternating current (AC)) performance test and static (or direct current (DC)) performance test [1]. In the dynamic specification test, a low-cost test stimulus is generated using an optimization algorithm to stimulate high-precision sigma-delta A/D converters under test. Dynamic specifications are accurately predicted in two different ways using concepts of an alternate-based test and a signature-based test. For this test purpose, the output pulse stream of a sigma-delta modulator is made observable and useful. This technique does not require spectrally pure input signals, so the test cost can be reduced compared to a conventional test method. In addition, two low-cost test strategies for static specification testing of high-resolution A/D converters are developed using a polynomial-fitting method. The cost of testing can be significantly reduced as a result of the measurement of fewer samples than a conventional histogram test. While one test strategy needs no expensive high-precision stimulus generator, which can reduce the test cost, the other test strategy finds the optimal set of test-measurement points for the maximum fault coverage, which can use minimum-code measurement as a production test solution. The theoretical concepts of the proposed test strategies are developed in software simulation and validated by hardware experiments using a commercially available A/D converter and designed converters on printed circuit board (PCB). This thesis provides low-cost test solutions for the high-resolution A/D converters.

With increase in frequency and convergence toward mixed signal systems, supplying stable voltages to integrated circuits and blocking noise coupling in the systems are major problems. Electromagnetic band gap (EBG) structures have been in the limelight for power/ground noise isolation in mixed signal applications due to their capability to suppress unwanted electromagnetic mode transmission in certain frequency bands. The EBG structures have proven effective in isolating the power/ground noise in systems that use a common power supply. However, while the EBG structures have the potential to present many advantages in noise suppression applications, there is no method in the prior art that enables reliable and efficient synthesis of these EBG structures. Therefore, in this research, a novel EBG synthesis method for mixed signal applications is presented. For one-dimensional periodic structures, three new approaches such as current path approximation method, border to border radius, power loss method have been introduced and combined for synthesis. For two-dimensional EBG structures, a novel EBG synthesis method using genetic algorithm (GA) has been presented. In this method, genetic algorithm (GA) is utilized as a solution-searching technique. Synthesis procedure has been automated by combining GA with multilayer finite-difference method and dispersion diagram analysis method. As a real application for EBG structures, EBG structures have been applied to a GHz ADC load board design for power/ground noise suppression.

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