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The design of a high speed circuit accepting a bipolar analog signal with a 3 db bandwidth of 20 MHZ and an eight bit unipolar gain control signal is presented in this thesis. The system produces the product of these two signals at a rate of one digital byte every 25 nsec. At the heart of the system are two multiplying digital to analog converters (DACs) operating in parallel. The circuit design was based on a statistically validated model for a multiplying DAC. This circuit could be used for controlling the intensity of each picture element (i.e. pixel) for many existing video display systems.

Paclitaxel is a natural occurring diterpene alkaloid originally isolated from the bark of Taxus brevifolia. It is now one of the most important chemotherapeutic agents for clinical treatment of ovarian and breast cancers. Recent clinical trials have also shown paclitaxel's potential for the treatment of non-small-cell lung cancer, head and neck cancer, and other types of cancers. While tremendous chemical research efforts have been made in the past years, which established the fundamental structure-activity relationships of the paclitaxel molecule, and provided analogs for biochemical studies to elucidate the precise mechanism of action and for the development of second-generation agents, many areas remain to be explored. In continuation of our efforts in the structure-activity relationships study of A-norpaclitaxel, five new analogs modified at the C-1 substituent and analogs with expanded B-ring or contracted C-ring have now been prepared. Preliminary biological studies indicated that the volume rather than functionality at the C-1 position plays a role in determining the anticancer activity by controlling the relative position of the tetracyclic ring system, which in turn controls the positions of the most critical functionalities such as the C-2 benzoyl, the C-4 acetate, and the C-13 side chain. The optimum conformation could possibly be modulated by ring contraction or expansion, as suggested by the improved activity of a B-lactone-A-norpaclitaxel analog. Chemical investigations were also carried out in the C-6 and C-7 positions and led to the synthesis of five new analogs. Of particular importance, 6a-hydroxy-paclitaxel, the major human metabolite of paclitaxel, was synthesized for the first time through a C-7 epimerization reaction. The availability of the major human metabolite through synthesis makes it possible to perform in vivo biological investigations on the metabolite, and it also offers an important opportunity for the production of standard HPLC samples of the metabolites which could be useful in the clinical monitoring of paclitaxel's disposition in human patients. Previous modifications at the C-4 position suggested that analogs with an acyl group other than an acetate at C-4 may exert similar activity to paclitaxel. Little was known, however, on the conformation-activity relationships of the C-4 position. In order to further explore the C-4 chemistry, a mild C-4 acylation method using acid as the acyl source was successfully developed. The new method was exemplified by the synthesis of water-soluble paclitaxel analogs with hydrophilic functional groups at the terminal of the C-4 acyl moiety. This method should be applicable to a variety of similar carboxylic acids and offer an alternative or even better approach for the preparation of C-4 modified paclitaxel analogs. Lastly, in addition to the extension of paclitaxel analog library, specially designed analogs have been sought to probe the active conformation of paclitaxel. An analog that has a bridge to tie up the C-4 acyl group with an inert position would be useful for this purpose. With successful demonstration of the above C-4 acylation method, combined with the well established C-6 chemistry, the synthesis of such a novel C-4 and C-6 bridged paclitaxel analog was completed. / Ph. D.

This research report discussed modern sample and hold theory and techniques and then uses them to develop a new differential sampling concept to solve a real engineering problem, involving the synchronous demodulation of three amplitude modulated direction cosine signals in an unusual noise environment. The problem is discussed in detail and a detailed circuit design solution given. Additionally, the results of a breadboard test of the concept is given that shows the circuit to have a 60dB offset voltage rejection ratio.

The object of this thesis is (1) to demonstrate the value of an electronic analog computer for the solution of non-linear ordinary differential equations particularly when a large family of solutions is required; and (2) to obtain as a by-product results of practical applicability to servomechanism selection and analysis.

ITC/USA 2006 Conference Proceedings / The Forty-Second Annual International Telemetering Conference and Technical Exhibition / October 23-26, 2006 / Town and Country Resort & Convention Center, San Diego, California / The transition of PCM recording from analog to digital recorders was completed at many test ranges more than a decade ago as marked by delivery of data on S-VHS tape, CD-ROM, DVD, ZIP disc, JAZ disc, 8mm tape and DLT tape for low rate data and D-1 cassettes for high rate data. Data then quickly began distribution via the internet and other networks. Analog recorders have remained a necessary legacy for the long transition to convert from analog to digital (PCM) data transmission from the test vehicles. However, the new digital recorder capabilities have removed this requirement to convert the transmissions from the test vehicle. Analog signal and predetection recording on digital recorders has been successfully demonstrated at costs below the existing analog recorders. Application of new techniques in a methodical transition program to the new digital recorders has proven the many benefits of recording wider bandwidths with excellent repeatability. Repeatability issues are primarily in the very low error sources of the processing system because the major analog error sources of the analog tape recorders, analog time code readers, analog demodulators, etc have been greatly reduced. This paper provides test results of recording higher signal rates and bandwidths of the new programs and describes the techniques and implementation through procedures of the Western Range transition from analog to digital recorders. Surprising results show predetection and analog signal recording costs are nearly the same as PCM recording costs due to the price of deliverable media with respect to mission recording requirements.

Com a crescente demanda por produtos eletrônicos de consumo de alta complexidade, o mercado necessita de um rápido ciclo de desenvolvimento de produto com baixo custo. O projeto de equipamentos eletrônicos baseado no uso de núcleos de propriedade intelectual ("IP cores") proporciona flexibilidade e velocidade de desenvolvimento dos chamados "sistemas num chip". Entretanto, os custos do teste destes sistemas podem alcançar um percentual significativo do valor total de produção, principalmente no caso de sistemas contendo "IP cores" analógicos ou "mixed-signal". Técnicas de teste embarcado (BIST e DFT) para circuitos analógicos, embora potencialmente capazes de minimizar o problema, apresentam limitações que restringem seu emprego a casos específicos. Algumas técnicas são dependentes do circuito, necessitando reconfiguração do circuito sob teste, e não são, em geral, utilizáveis em RF. No ambiente de "sistemas num chip", como recursos de processamento e memória estão disponíveis, eles poderiam ser utilizados durante o teste. No entanto, a sobrecarga de adicionar conversores AD e DA pode ser muito onerosa para a maior parte dos sistemas, e o roteamento analógico dos sinais pode não ser possível, além de poder introduzir distorção do sinal. Neste trabalho um digitalizador simples e de baixo custo é usado ao invés de um conversor AD para possibilitar a implementação de estratégias de teste no ambiente de "sistemas num chip". Graças ao baixo acréscimo de área analógica do conversor, múltiplos pontos de teste podem ser usados. Graças ao desempenho do conversor, é possível observar características dos sinais analógicos presentes nos "IP cores", incluindo a faixa de freqüências de RF usada em transceptores para comunicações sem fio. O digitalizador foi utilizado com sucesso no teste de circuitos analógicos de baixa freqüência e de RF. Como o teste é baseado no domínio freqüência, características nãolineares como produtos de intermodulação podem também ser avaliadas. Especificamente, resultados práticos com protótipos foram obtidos para filtros de banda base e para um mixer a 100MHz. A aplicação do conversor para avaliação da figura de ruído também foi abordada, e resultados experimentais utilizando amplificadores operacionais convencionais foram obtidos para freqüências na faixa de áudio. O método proposto é capaz de melhorar a testabilidade de projetos que utilizam circuitos de sinais mistos, sendo adequado ao uso no ambiente de "sistemas num chip" usado em muitos produtos atualmente. / With the ever increasing demands for high complexity consumer electronic products, market pressures demand faster product development and lower cost. SoCbased design can provide the required design flexibility and speed by allowing the use of IP cores. However, testing costs in the SoC environment can reach a substantial percent of the total production cost. Analog testing costs may dominate the total test cost, as testing of analog circuits usually require functional verification of the circuit and special testing procedures. For RF analog circuits commonly used in wireless applications, testing is further complicated because of the high frequencies involved. In summary, reducing analog test cost is of major importance in the electronic industry today. BIST techniques for analog circuits, though potentially able to solve the analog test cost problem, have some limitations. Some techniques are circuit dependent, requiring reconfiguration of the circuit being tested, and are generally not usable in RF circuits. In the SoC environment, as processing and memory resources are available, they could be used in the test. However, the overhead for adding additional AD and DA converters may be too costly for most systems, and analog routing of signals may not be feasible and may introduce signal distortion. In this work a simple and low cost digitizer is used instead of an ADC in order to enable analog testing strategies to be implemented in a SoC environment. Thanks to the low analog area overhead of the converter, multiple analog test points can be observed and specific analog test strategies can be enabled. As the digitizer is always connected to the analog test point, it is not necessary to include muxes and switches that would degrade the signal path. For RF analog circuits, this is specially useful, as the circuit impedance is fixed and the influence of the digitizer can be accounted for in the design phase. Thanks to the simplicity of the converter, it is able to reach higher frequencies, and enables the implementation of low cost RF test strategies. The digitizer has been applied successfully in the testing of both low frequency and RF analog circuits. Also, as testing is based on frequency-domain characteristics, nonlinear characteristics like intermodulation products can also be evaluated. Specifically, practical results were obtained for prototyped base band filters and a 100MHz mixer. The application of the converter for noise figure evaluation was also addressed, and experimental results for low frequency amplifiers using conventional opamps were obtained. The proposed method is able to enhance the testability of current mixed-signal designs, being suitable for the SoC environment used in many industrial products nowadays.

Com a crescente demanda por produtos eletrônicos de consumo de alta complexidade, o mercado necessita de um rápido ciclo de desenvolvimento de produto com baixo custo. O projeto de equipamentos eletrônicos baseado no uso de núcleos de propriedade intelectual ("IP cores") proporciona flexibilidade e velocidade de desenvolvimento dos chamados "sistemas num chip". Entretanto, os custos do teste destes sistemas podem alcançar um percentual significativo do valor total de produção, principalmente no caso de sistemas contendo "IP cores" analógicos ou "mixed-signal". Técnicas de teste embarcado (BIST e DFT) para circuitos analógicos, embora potencialmente capazes de minimizar o problema, apresentam limitações que restringem seu emprego a casos específicos. Algumas técnicas são dependentes do circuito, necessitando reconfiguração do circuito sob teste, e não são, em geral, utilizáveis em RF. No ambiente de "sistemas num chip", como recursos de processamento e memória estão disponíveis, eles poderiam ser utilizados durante o teste. No entanto, a sobrecarga de adicionar conversores AD e DA pode ser muito onerosa para a maior parte dos sistemas, e o roteamento analógico dos sinais pode não ser possível, além de poder introduzir distorção do sinal. Neste trabalho um digitalizador simples e de baixo custo é usado ao invés de um conversor AD para possibilitar a implementação de estratégias de teste no ambiente de "sistemas num chip". Graças ao baixo acréscimo de área analógica do conversor, múltiplos pontos de teste podem ser usados. Graças ao desempenho do conversor, é possível observar características dos sinais analógicos presentes nos "IP cores", incluindo a faixa de freqüências de RF usada em transceptores para comunicações sem fio. O digitalizador foi utilizado com sucesso no teste de circuitos analógicos de baixa freqüência e de RF. Como o teste é baseado no domínio freqüência, características nãolineares como produtos de intermodulação podem também ser avaliadas. Especificamente, resultados práticos com protótipos foram obtidos para filtros de banda base e para um mixer a 100MHz. A aplicação do conversor para avaliação da figura de ruído também foi abordada, e resultados experimentais utilizando amplificadores operacionais convencionais foram obtidos para freqüências na faixa de áudio. O método proposto é capaz de melhorar a testabilidade de projetos que utilizam circuitos de sinais mistos, sendo adequado ao uso no ambiente de "sistemas num chip" usado em muitos produtos atualmente. / With the ever increasing demands for high complexity consumer electronic products, market pressures demand faster product development and lower cost. SoCbased design can provide the required design flexibility and speed by allowing the use of IP cores. However, testing costs in the SoC environment can reach a substantial percent of the total production cost. Analog testing costs may dominate the total test cost, as testing of analog circuits usually require functional verification of the circuit and special testing procedures. For RF analog circuits commonly used in wireless applications, testing is further complicated because of the high frequencies involved. In summary, reducing analog test cost is of major importance in the electronic industry today. BIST techniques for analog circuits, though potentially able to solve the analog test cost problem, have some limitations. Some techniques are circuit dependent, requiring reconfiguration of the circuit being tested, and are generally not usable in RF circuits. In the SoC environment, as processing and memory resources are available, they could be used in the test. However, the overhead for adding additional AD and DA converters may be too costly for most systems, and analog routing of signals may not be feasible and may introduce signal distortion. In this work a simple and low cost digitizer is used instead of an ADC in order to enable analog testing strategies to be implemented in a SoC environment. Thanks to the low analog area overhead of the converter, multiple analog test points can be observed and specific analog test strategies can be enabled. As the digitizer is always connected to the analog test point, it is not necessary to include muxes and switches that would degrade the signal path. For RF analog circuits, this is specially useful, as the circuit impedance is fixed and the influence of the digitizer can be accounted for in the design phase. Thanks to the simplicity of the converter, it is able to reach higher frequencies, and enables the implementation of low cost RF test strategies. The digitizer has been applied successfully in the testing of both low frequency and RF analog circuits. Also, as testing is based on frequency-domain characteristics, nonlinear characteristics like intermodulation products can also be evaluated. Specifically, practical results were obtained for prototyped base band filters and a 100MHz mixer. The application of the converter for noise figure evaluation was also addressed, and experimental results for low frequency amplifiers using conventional opamps were obtained. The proposed method is able to enhance the testability of current mixed-signal designs, being suitable for the SoC environment used in many industrial products nowadays.

Com a crescente demanda por produtos eletrônicos de consumo de alta complexidade, o mercado necessita de um rápido ciclo de desenvolvimento de produto com baixo custo. O projeto de equipamentos eletrônicos baseado no uso de núcleos de propriedade intelectual ("IP cores") proporciona flexibilidade e velocidade de desenvolvimento dos chamados "sistemas num chip". Entretanto, os custos do teste destes sistemas podem alcançar um percentual significativo do valor total de produção, principalmente no caso de sistemas contendo "IP cores" analógicos ou "mixed-signal". Técnicas de teste embarcado (BIST e DFT) para circuitos analógicos, embora potencialmente capazes de minimizar o problema, apresentam limitações que restringem seu emprego a casos específicos. Algumas técnicas são dependentes do circuito, necessitando reconfiguração do circuito sob teste, e não são, em geral, utilizáveis em RF. No ambiente de "sistemas num chip", como recursos de processamento e memória estão disponíveis, eles poderiam ser utilizados durante o teste. No entanto, a sobrecarga de adicionar conversores AD e DA pode ser muito onerosa para a maior parte dos sistemas, e o roteamento analógico dos sinais pode não ser possível, além de poder introduzir distorção do sinal. Neste trabalho um digitalizador simples e de baixo custo é usado ao invés de um conversor AD para possibilitar a implementação de estratégias de teste no ambiente de "sistemas num chip". Graças ao baixo acréscimo de área analógica do conversor, múltiplos pontos de teste podem ser usados. Graças ao desempenho do conversor, é possível observar características dos sinais analógicos presentes nos "IP cores", incluindo a faixa de freqüências de RF usada em transceptores para comunicações sem fio. O digitalizador foi utilizado com sucesso no teste de circuitos analógicos de baixa freqüência e de RF. Como o teste é baseado no domínio freqüência, características nãolineares como produtos de intermodulação podem também ser avaliadas. Especificamente, resultados práticos com protótipos foram obtidos para filtros de banda base e para um mixer a 100MHz. A aplicação do conversor para avaliação da figura de ruído também foi abordada, e resultados experimentais utilizando amplificadores operacionais convencionais foram obtidos para freqüências na faixa de áudio. O método proposto é capaz de melhorar a testabilidade de projetos que utilizam circuitos de sinais mistos, sendo adequado ao uso no ambiente de "sistemas num chip" usado em muitos produtos atualmente. / With the ever increasing demands for high complexity consumer electronic products, market pressures demand faster product development and lower cost. SoCbased design can provide the required design flexibility and speed by allowing the use of IP cores. However, testing costs in the SoC environment can reach a substantial percent of the total production cost. Analog testing costs may dominate the total test cost, as testing of analog circuits usually require functional verification of the circuit and special testing procedures. For RF analog circuits commonly used in wireless applications, testing is further complicated because of the high frequencies involved. In summary, reducing analog test cost is of major importance in the electronic industry today. BIST techniques for analog circuits, though potentially able to solve the analog test cost problem, have some limitations. Some techniques are circuit dependent, requiring reconfiguration of the circuit being tested, and are generally not usable in RF circuits. In the SoC environment, as processing and memory resources are available, they could be used in the test. However, the overhead for adding additional AD and DA converters may be too costly for most systems, and analog routing of signals may not be feasible and may introduce signal distortion. In this work a simple and low cost digitizer is used instead of an ADC in order to enable analog testing strategies to be implemented in a SoC environment. Thanks to the low analog area overhead of the converter, multiple analog test points can be observed and specific analog test strategies can be enabled. As the digitizer is always connected to the analog test point, it is not necessary to include muxes and switches that would degrade the signal path. For RF analog circuits, this is specially useful, as the circuit impedance is fixed and the influence of the digitizer can be accounted for in the design phase. Thanks to the simplicity of the converter, it is able to reach higher frequencies, and enables the implementation of low cost RF test strategies. The digitizer has been applied successfully in the testing of both low frequency and RF analog circuits. Also, as testing is based on frequency-domain characteristics, nonlinear characteristics like intermodulation products can also be evaluated. Specifically, practical results were obtained for prototyped base band filters and a 100MHz mixer. The application of the converter for noise figure evaluation was also addressed, and experimental results for low frequency amplifiers using conventional opamps were obtained. The proposed method is able to enhance the testability of current mixed-signal designs, being suitable for the SoC environment used in many industrial products nowadays.