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Mechanische Eigenschaften kristallin-amorpher Schichtpakete / Mechanical properties of crystalline-amorphous multilayersKnorr, Inga 13 December 2012 (has links)
No description available.
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Topographie, Struktur und Dynamik thermisch aufgedampfter Polymerfilme / Topography, structure and dynamics of thermally evaporated polymer filmsVree, Christian 06 July 2009 (has links)
No description available.
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Untersuchung der lokalen strukturellen und elektronischen Eigenschaften von Fe-GaAs Schottky-Kontakten mit atomar aufgelöster Raster-Tunnel-Mikroskopie in Querschnittsgeometrie / Investigation of the structural and local electronic properties of Fe-GaAs Schottky contacts with atomically resolved Scanning Tunneling Microscopy in Cross-sectional configurationWinking, Lars-Helge 29 January 2009 (has links)
No description available.
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Hydrogen in V-Fe thin films and Fe/V-Fe multi-layered thin films / Wasserstoff in V-Fe dünnen Schichten und V-Fe/Fe mehrfachschchtenGemma, Ryota 04 May 2011 (has links)
No description available.
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Glättungsmechanismen beim Ionenbeschuss rauer amorpher Oberflächen / Smoothing mechanisms due to ion bombardment of rough amorphous surfacesVauth, Sebastian 11 October 2007 (has links)
No description available.
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Mechanische Spannungen und Mikrostruktur dünner TiNi- und Ti50Ni50-xCux-Formgedächtnisschichten / Mechanical stresses and microstructure of TiNi and Ti50Ni50-xCux shape memory thin filmsHarms, Henning 06 May 2003 (has links)
No description available.
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Structural and magnetic properties of ultrathin Fe3O4 films: cation- and lattice-site-selective studies by synchrotron radiation-based techniquesPohlmann, Tobias 19 August 2021 (has links)
This work investigates the growth dynamic of the reactive molecular beam epitaxy of Fe3O4 films, and its impact on the cation distribution as well as on the magnetic and structural properties at the surface and the interfaces. In order to study the structure and composition of Fe3O4 films during growth, time-resolved high-energy x-ray diffraction (tr-HEXRD) and time-resolved hard x-ray photoelectron spectroscopy (tr-HAXPES) measurements are used to monitor the deposition process of Fe3O4 ultrathin films on SrTiO3(001), MgO(001) and NiO/MgO(001). For Fe3O4\SrTiO3(001) is found that the film first grows in a disordered island structure, between thicknesses of 1.5nm to 3nm in FeO islands and finally in the inverse spinel structure of Fe3O4, displaying (111) nanofacets on the surface. The films on MgO(001) and NiO/MgO(001) show a similar result, with the exception that the films are not disordered in the early growth stage, but form islands which immediately exhibit a crystalline FeO phase up to a thickness of 1nm. After that, the films grown in the inverse spinel structure on both MgO(001) and NiO/MgO(001). Additionally, the tr-HAXPES measurements of Fe3O4/SrTiO3(001) demonstrate that the FeO phase is only stable during the deposition process, but turns into a Fe3O4 phase when the deposition is interrupted. This suggests that this FeO layer is a strictly dynamic property of the growth process, and might not be retained in the as-grown films. In order to characterize the as-grown films, a technique is introduced to extract the cation depth distribution of Fe3O4 films from magnetooptical depth profiles obtained by fitting x-ray resonant magnetic reflectivity (XRMR) curves. To this end, x-ray absorption (XAS) and x-ray magnetic circular dichroism (XMCD) spectra are recorded as well as XRMR curves to obtain magnetooptical depth profiles. To attribute these magnetooptical depth profiles to the depth distribution of the cations, multiplet calculations are fitted to the XMCD data. From these calculations, the cation contributions at the three resonant energies of the XMCD spectrum can be evaluated. Recording XRMR curves at those energies allows to resolve the magnetooptical depth profiles of the three iron cation species in Fe3O4. This technique is used to resolve the cation stoichiometry at the surface of Fe3O4/MgO(001) films and at the interfaces of Fe3O4/MgO(001) and Fe3O4/NiO. The first unit cell of the Fe3O4(001) surface shows an excess of Fe3+ cations, likely related to a subsurface cation-vacancy reconstruction of the Fe3O4(001) surface, but the magnetic order of the different cation species appears to be not disturbed in this reconstructed layer. Beyond this layer, the magnetic order of all three iron cation species in Fe3O4/MgO(001) is stable for the entire film with no interlayer or magnetic dead layer at the interface. For Fe3O4/NiO films, we unexpectedly observe a magnetooptical absorption at the Ni L3 edge in the NiO film corresponding to a ferromagnetic order throughout the entire NiO film, which is antiferromagnetic in the bulk. Additionally, the magnetooptical profiles indicate a single intermixed layer containing both Fe2+ and Ni2+ cations.
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Investigation of the growth process of thin iron oxide films: Analysis of X-ray Photoemission Spectra by Charge Transfer Multiplet calculationsSuendorf, Martin 19 December 2012 (has links)
Thin metallic films with magnetic properties like magnetite are an interesting material in current technological applications. In the presented work the iron oxide films are grown by molecular beam epitaxy on MgO(001) substrates at temperatures between room temperature and 600K. The film and surface structure are investigated by x-ray reflectometry (XRR), x-ray diffraction (XRD) and low energy electron diffraction (LEED). The chemical properties are investigated by x-ray photoelectron spectroscopy (XPS). Furthermore, charge transfer multiplet (CTM) calculations are performed as a means to gain additional information from photoemission spectra. It is shown that only for temperatures higher than 500K the oxide film forms a spinel structure. A previously unobserved (2x1) surface reconstruction in two orthogonal domains is found for various preparation conditions. The application of CTMs results in good quantitative and qualitative agreement to other methods for the determination of the film stoichiometry. In addition CTMs can well describe the segregation of Mg atoms into the oxide film either during film growth or during film annealing. It is found that initially Mg substitutes Fe on all possible lattice sites, only for prolonged treatment at high temperature do Mg atoms favour the octahedral lattice sites of divalent Fe.
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Wachstum amorpher Schichten: Vergleich von Experiment und Simulation im Bereich Oberflächenrauhigkeit und mechanische Spannungen / Growth of amorphous thin films: Comparison of experiment and simulation concerning surface roughness and mechanical stressesMayr, Stefan Georg 01 November 2000 (has links)
No description available.
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Korngrenzsegregation in Silber-Nickel und Kupfer-Wismut Legierungen / Grain Boundary Segregation in Silver-Nickel and Copper-Bismuth AlloysWolde-Giorgis, Daniel 25 August 2005 (has links)
No description available.
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