In particle induced desorption-ionization mass spectrometry the strength of an analyte's signal under a given set of bombardment conditions is usually considered to be representative of the analytes relative surface activity. This rationale is generally used to explain differences in the technique's sensitivity between and within various classes of compound. In liquid matrix assisted secondary ion mass spectrometry (SIMS) sensitivity enhancement of ionic analytes by pairing with surface active counterions has been demonstrated by several groups. This technique has been utilized in this work to achieve a 10,000 fold enhancement in the signal for ATP on a double focusing magnetic sector instrument and to detect femtomole quantities of nucleoside monophosphates on a time-of-flight instrument. The analyte's signal, however, is dependent on both the analyte bulk concentration and that of the surfactant. Additionally, the surfactant concentration that produces the maximum analyte signal changes with the analyte concentration. In this study, this phenomenon has been modeled in terms of conventional solution equilibria and surface chemical principles. It is assumed that the initial surface composition and the bulk concentration are the boundary conditions of a steady state established by the competing processes of surface sputtering and surface replenishment from the bulk during analysis. Calculated surface excesses correlate well with observed relative ion intensities, suggesting that equilibrium conditions are approached in the sample matrices despite the outwardly dynamic nature of the sputtering processes. / Graduation date: 1994

High resolution mapping of molecular species, specifically sub-micrometer spatial resolution mapping, is at the forefront of recent interest in Secondary Ion Mass Spectrometry (SIMS). Large projectiles, e.g. C60, Au400, display high quasi-molecular ion yields with reduced fragment ion yields compared to atomic or polyatomic projectiles. However, the application of large projectiles in a sub-micrometer beam is hampered by limitations in source brightness and angular emission characteristics which are incompatible with tight focusing. An alternate approach to a focused beam is to reduce the beam intensity to less than 1000 impacts per second (referred to as the event-by-event mode) and localize each projectile impact via an electron emission microscope. The characterization and performance of such an instrument for localizing individual projectile impacts of 15-75keV C60 with sub-micrometer spatial resolution are described here. The quest for localizing single cluster impacts requires an understanding of the relationship between SI and electron emissions. It was found that electron emission is observed independently of the number or type of secondary ion emitted for flat homogeneous samples. The independence of ion and electron emission confirms the rationale for using the emitted electrons to localize individual projectile impacts. Further investigation of electron emission revealed that the electron yield is characteristic of the class of sample investigated (e.g. metal, organic, semiconductor). The electron yield was found to depend on the size and topology of the sample. Additionally, the electron yield increases with increasing projectile velocity. The use of the novel instrumentation presented here, necessitated the development of custom acquisition and analysis software. The analysis of co-emitted species from nano-metric dimensions is enhanced with the ability to perform multiple coincidence/anti-coincidence calculations. New concepts were implemented for integrating localization and mass spectrometry via software solutions for image analysis and localization and subsequently correlation between emitted ions and electrons. The result is software and instrumentation capable of generating ion maps with sub-micrometer spatial resolution.

Secondary ion mass spectrometry (SIMS) is a surface analysis technique which characterizes species sputtered by an energetic particle beam. Bombardment with cluster projectiles offers the following notable advantages over bombardment with atomic ions or small clusters: enhanced emission of molecular ions, low damage cross-section, and reduced molecular fragmentation. Additionally, in the case of Au4004 and C60 impacts, desorption originates from nanometric volumes. These features make clusters useful probes to obtain molecular information from both nano-objects and nano-domains. The "event-by-event bombardment/detection mode" probes nano-objects one-at-a-time, while collecting and storing the corresponding secondary ion (SI) information. Presented here are the first experiments where free-standing nano-objects were bombarded with keV projectiles of atomic to nanoparticle size. The objects are aluminum nano-whiskers, 2 nm in diameter and ~250 nm in length. Au4004 has a diameter of ~2 nm, comparable to the nominal diameter of the nanowhiskers. There are notable differences in the SI response from sample volumes too small for full projectile energy deposition. The whisker spectra are dominated by small clusters?the most abundant species being AlO- and AlO2-. Bulk samples have larger yields for AlO2- than for AlO-, while this trend is reversed in whisker samples. Bulk samples give similar abundances of large SI clusters, while whisker samples give an order of magnitude lower yield of these SIs. Effective yields were calculated in order to determine quantitative differences between the nano-objects and bulk samples. The characterization of individual nano-objects from a mixture is demonstrated with negatively charged polymer spheres that are attracted to and retained by the nano-whiskers. The spheres are monodisperse polystyrene nanoparticles (30nm diameter). Our results show that the event-by-event mode can provide information on the nature, size, relative location, and abundance of nano-objects in the field of view. This study presents the first evidence of quantitative molecular information originating from nano-object mixtures. Biologically relevant systems (solid-supported lipid bilayers) were also characterized using Au5 , Au4004 and C60 . Organization-dependent SI emission was observed for phosphocholine bilayers. Lipid domain formation was also investigated in bilayers formed from cholesterol and a mixed lipid system. Trends in the correlation coefficient suggest that cholesterol segregates from the surrounding lipid environment during raft formation.

The following thesis demonstrates two isotope tracing experiments that measure oxygen transport through electrochemically polarized solid oxides. Cathode-symmetric ‘button’ cells with yttria stabilized zirconia(YSZ) electrolytes and either strontium doped lanthanum manganate(LSM) or composite LSM/YSZ cathodes were studied. The first experiment measured the residence time distributions(RTD) of 34O2. The measured RTDs were compared at different temperatures(700-800°C) and applied potentials(-2 to -8V). Comparisons with simulated RTDs revealed that oxygen transport was laterally heterogeneous. Delamination of the counter electrode is likely the source of the heterogeneity. The second experiment measured a wave of 18O by exposing an interior cross section and applying ToF-SIMS analysis. A depth profile was produced that spans the cathode and electrolyte interface. The depth profile was compared with a variety of limiting oxygen activation scenarios predicted by a simple 1-D model. Comparisons demonstrated that oxygen activation is likely not restricted to the cathode and electrolyte interface.

The following thesis demonstrates two isotope tracing experiments that measure oxygen transport through electrochemically polarized solid oxides. Cathode-symmetric ‘button’ cells with yttria stabilized zirconia(YSZ) electrolytes and either strontium doped lanthanum manganate(LSM) or composite LSM/YSZ cathodes were studied. The first experiment measured the residence time distributions(RTD) of 34O2. The measured RTDs were compared at different temperatures(700-800°C) and applied potentials(-2 to -8V). Comparisons with simulated RTDs revealed that oxygen transport was laterally heterogeneous. Delamination of the counter electrode is likely the source of the heterogeneity. The second experiment measured a wave of 18O by exposing an interior cross section and applying ToF-SIMS analysis. A depth profile was produced that spans the cathode and electrolyte interface. The depth profile was compared with a variety of limiting oxygen activation scenarios predicted by a simple 1-D model. Comparisons demonstrated that oxygen activation is likely not restricted to the cathode and electrolyte interface.

No description available.

abstract: Mass spectrometric analysis requires that atoms from the sample be ionized in the gas phase. Secondary ion mass spectrometry achieves this by sputtering samples with an energetic primary ion beam. Several investigations of the sputtering and ionization process have been conducted. Oxygen is commonly used in secondary ion mass spectrometry (SIMS) to increase ion yields, but also can complicate the interpretation of SIMS analyses. An 18O implant in silicon has been used to quantify the oxygen concentration at the surface of sputtered silicon in order to study the dependence on oxygen of several sputtering and depth profile phenomena. The ion yield dependence of trace elements in silicon on the surface oxygen concentration is a function of the ionization potential of the element. The ion yield is high and unaffected by oxygen for elements with low ionization potential and ranges over several orders of magnitude for elements with high ionization potential. Depth resolution in sputter profiles has been shown to be degraded by the presence of oxygen, the mechanism of this effect has been investigated using an 18O implant to quantify oxygen levels and it is shown that the process does not appear to be a consequence of surface oxide formation. Molecular ions are a source of mass interference in SIMS analysis, and multiply charged atomic ion signals might be interference-free due to the possible instability of multiply-charged molecular ions. Sputtered SiH2+, AlH2+, BeH2+, Mo22+ and Mg22+ ions have been observed and appear surprisingly stable. The formation mechanism of some of these species has been explored. / Dissertation/Thesis / Ph.D. Chemistry 2012

abstract: Boron concentrations and isotopic composition of phlogopite mica, amphibole, and selected coexisting anhydrous phases in mantle-derived xenoliths from the Kaapvaal Craton were measured by secondary ion mass spectrometry in an effort to better understand the B isotope geochemistry of the subcontinental lithospheric mantle (SCLM) and its implications for the global geochemical cycle of B in the mantle. These samples display a wide, and previously unrecognized, range in their boron contents and isotopic compositions reflecting a complex history involving melt depletion and metasomatism by subduction- and plume-derived components, as well as late stage isotopic exchange related to kimberlite emplacements. Micas from ancient lithospheric harzburgite metasomatized by slab-derived fluids suggest extensive B-depletion during subduction, resulting in low-B, isotopically light compositions whereas kimberlite-related metasomatic products and a sample from the 2 Ga Palabora carbonatite have boron isotopic compositions similar to proposed primitive mantle. The results suggest that subduction of oceanic lithosphere plays a limited role in the B geochemistry of the convecting mantle. / Dissertation/Thesis / Masters Thesis Geological Sciences 2014

<p> The interaction mechanisms of an ion beam with a solid target are identified. Basic parameters associated with ion scattering, charge neutralization, inelastic energy losses and secondary ion production are described. Low energy (1-20 kev) experimental studies on these topics are reviewed. A low energy ion mass spectrometer is described. The ion beam is generated by an existing kev ion accelerator and is directed to a newly constructed UHV target chamer. The energy and angular distributions of the backscattered particles are measured with a hemispherical electrostatic analyser and a channeltron detector. A high precision goniometer allows target rotation about two perpendicular axes by angles of 180° and 90° with an accuracy and repeatability of 0.1°. The interaction chamber is bakeable to 250°c and was designed for an ultimate pressure of 10^-11 torr. The data acquisition system chamber scans the energy spectrum automatically so that the radiation dosage at the target is equalized for all channels. </p> / Thesis / Master of Engineering (MEngr)

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