Abstract Electronic devices are subjected to various usage environments, wherein stresses are induced to components and their interconnections. The level of stress affects the interval of failure occurrences. When the stress level and aging characteristics of sub-material parts are known, the failure occurrence can be predicted. However, the predictions are based on uncertainties and a practical method to help to assess the component interconnection reliability is needed. In this thesis a novel method to utilize the accelerated stress test data for the hazard rate estimates is introduced. The hazard rate expectations of the interconnection elements are presented as interconnection failures in time (i-FIT) figures that can be used as a part of the conventional product reliability estimates. The method utilizes second level reliability test results for a packaging type specific failure occurrence estimates. Furthermore, the results can be used as such in the component packaging reliability estimates. Moreover, a novel method to estimate the interconnection failures in terms of costs is presented. In this novel method the interconnection elements are dealt as cost elements. It is also shown that the costs of the interconnection failures could be very high, if the stress-strength characteristics of the interconnection system are wrongly chosen. The lead-free manufacturing has emphasized the thermal compatibility of the materials of the component, the solder and the Printed Wiring Board. Improper materials for Area Array components will result as excessive component warping during the reflow, as is shown in this thesis. A novel method for estimating the amount of component warping during the lead-free reflow is introduced. In this thesis, a method to predict the second level interconnection hazard rate is introduced. The method utilizes the second level reliability test data in the life time predictions of the component solder joints. The resulted hazard rates can be used as a part of product field performance estimates. Also, the effect of the process variation and the material properties on the lead-free solder joint reliability is introduced. / Tiivistelmä Elektronisen laitteen materiaalien yhteensopivuus ja käyttöympäristö määrittävät sen kokemat rasitukset. Laitteen komponentteihin tai niiden liitoksiin kohdistuvat rasitukset aiheuttavat lopulta laitteen vikaantumisen. Vikaantumisten taajuuteen vaikuttavat paitsi rasituksen taso ja tyyppi, myös laitteen materiaalien ominaisuudet. Todellinen vikaantumistaajuus perustuu kuitenkin muihinkin parametreihin, mistä johtuen vikaantumisennusteet voivat olla epätarkkoja. Tästä syystä käytännölliselle liitosten vikaantumisen arviointimenetelmälle on tarve. Tässä väitöskirjassa esitellään uusi komponenttien juotosliitosten arviointimenetelmä, jonka avulla voidaan muuntaa kiihdytetyn rasitustestauksen tulos vikaantumistaajuusarvioksi laitteen todellisessa käyttöympäristössä. Menelmässä hyödynnetään levytason rasitustestauksen tuloksia komponenttien kotelotyyppikohtaisiin vikaantumisennusteisiin. Menetelmää voidaan käyttää sellaisenaan arvioitaessa komponenttikoteloiden luotettavuutta todellisissa rasitus- tai tuoteympäristöissä. Väitöskirjassa esitellään myös uusi menetelmä vikaantuneiden liitosten kustannusten määrittämiseen, mikä auttaa myös uuden liitosteknologian kokonaiskustannusten arvioimisessa. Lisäksi väitöskirjatyössä osoitetaan, että liitosvikojen aiheuttamat kustannukset voivat olla erittäin korkeita, mikäli juotosliitoksiin kohdistuvat rasitukset ylittävät liitosten suunnitellun kestävyyden. Elektroniikan lyijyttömän valmistamisen myötä komponenttien, juotteen ja piirilevyn materiaalien yhteensopivuus korostuu. Väitöskirjatyössä osoitetaan, että yhteensopimattomien materiaalien käyttäminen komponenteissa voi johtaa komponentin liialliseen taipumaan kuumakonvektiojuottamisen aikana. Lisäksi esitellään menetelmä komponentin taipuman arvioimiseksi lämpötilan funktiona. Tässä väitöskirjassa esitellään uusi menetelmä, jolla voidaan arvioida komponenttien juotosliitosten vikaantumista ja vikaantumisen vaikutusta tuotteiden kokonaiskustannuksiin. Menetelmä perustuu kiihdytetyn rasitustestauksen tuloksiin, joita voidaan käyttää juotosliitosten vikaantumisten arvioimiseen tuotteen todellisissa käyttöolosuhteissa. Lisäksi väitöskirjatyössä on arvioitu juotosmateriaalin ja juotosaluemitoituksen vaikutusta juotosliitosten luotettavuuteen.

The doctoral thesis is focused on reliability of lead-free solder SAC 305. Knowledge in the field of fatigue models used in determining the lifetime of solder joints are observed in this thesis. Also such methods of predicting reliability as numerically-analytical methods or reliability experimental tests are mentioned. Practical results of reliability measurement are presented. Experimental data served as the foundation for determining empirical coefficients for the fatigue model based on deformation induced by creep of the solder, which was implemented in the ANSYS environment. Results from different methods were compared and conclusions discussing the suitability of the presented prediction methods are formulated.

International Telemetering Conference Proceedings / October 28-31, 1996 / Town and Country Hotel and Convention Center, San Diego, California / Eutectic (63% tin-37% lead) or near-eutectic (40% tin-60% lead) tin-lead solder is widely used for creating electrical interconnections between the printed wiring board (PWB) and the components mounted on the board surface. For components mounted directly on the PWB mounting pads, that is, surface mounted components, the tin-lead solder also constitutes the mechanical interconnection. Eutectic solder has a melting point of 183°C (361°F). It is important to realize that its homologous temperature, defined as the temperature in degrees Kelvin over its melting point temperature (T(m)), also in degrees Kelvin, is defined as T/T(m). At room temperature (25°C = 298K), eutectic solder's homologous temperature is 0.65. It is widely acknowledged that materials having a homologous temperature ≥ 0.5 are readily subject to creep, and the solder joints of printed wiring assemblies are routinely exposed to temperatures above room temperature. Hence, solder joints tend to be subject to both thermal fatigue and creep. This can lead to premature failures during service conditions. The geometry, that is, the lead configuration, of the joints can also affect failure. Various geometries are better suited to withstand failure than others. The purpose of this paper is to explore solder joint failures of dual in-line (DIP) integrated circuit components, leadless ceramic chip carriers (LCCCs), and gull wing and J-lead surface mount components mounted on PWBs.

Thesis (M.S.)--State University of New York at Binghamton, Department of Mechanical Engineering, 2005. / Includes bibliographical references (leaves 70-72).

Lead-free solders such as SnAg and SnAgCu are used extensively as replacements of SnPb solders in microelectronics packaging. But these alloys have several drawbacks, such as poor wetting ability and formation of intermetallic compounds (IMC). Doping of rare earth element (RE) on SnAg alloys has been found to improve the wetting property, reduce IMCs and their growth, and refine the microstructure which results in improved mechanical properties of the solder. This study focuses on establishing the quantitative effects of RE doping on the microstructure and mechanical behavior of 96.5Sn3.5Ag alloy. SnAg alloys with different amounts of Lanthanum were made. Specimens were cast under typical reflow conditions, and then aged at different temperatures for three different aging times. Quantitative microscopy was conducted on samples with different amounts of La doping. It was found that doping greatly reduces the grain size, as well as the size of the intermetallic particles Ag3Sn. However, the inter-particle spacing remains relatively unaffected by the La doping amount. Creep tests at various temperatures and strain rates were conducted. The results show that La doping increases creep resistance of the SnAg alloy by ~15%. The creep test result can be fit into a modified microstructure dependent Anand model. A new constitutive law was also proposed to account for the hierarchal microstructure over multiple length scales. Specifically, at the sub micrometer scale, the SnAg eutectic region is treated as a particulate-reinforced composite with the Ag3Sn being the particle and Sn being the matrix. At the micrometer length scale, the solder alloys is treated as a two-phase composite with the Sn dendrite as the particle and the SnAg eutectic region as the matrix. Good agreement was found between the model predictions and the creep test results. Fatigue test was performed on bulk samples. It was found that RE doping increases the fatigue life of SnAg alloy by a factor of 5.

Thesis (M.S.)--State University of New York at Binghamton, Thomas J. Watson School of Engineering and Applied Science, Department of Systems Science and Industrial Engineering, 2008. / Includes bibliographical references.

The aim of this masterś thesis is to investigate properties of lead-free low-temperature solders after termal aging. The theoretical part is focused on various types of lead - free solders, pastes used for the manufacture of electrical circuits by thick-film technology and methods of testing the properties of the soldered joints. The practical part deals with the design and production of test substrates for testing the solder joints formed between the SMD component and the ceramic substrate. Two solder bismuth-containing solder was selected for testing, the SAC solder was selected as the reference. After aging with temperature cycling from -30 ° C to 115 ° C, the data obtained by testing the mechanical strength of the solder joint by the shear test is evaluated.

This work deals research of the reliability of leed-free solder joints. It summarizes the basic knowledge of lead-free solder alloys, soldering and testing process, the soldered joints. The work is done selecting the most important factors entering into the soldering process. The method of the DOE sought the optimal combination of factors, which would correspond to the highest quality solder joints.

This work deals with flushing monitoring of spreading velocity on solder finishes Niau, OSP, Sn deposited on copper plated base material FR4 using digital cameras. After the reflow process is measured by length of spreading solder and size of wetting angle. It evaluates and compares the time dependence of velocity of spreading solder, length of solder spreading and wetting angle for NiAu, OSP, Sn finishes at different temperatures reflow and surface treatment.

This thesis deals with the design and implementation of a device for measuring pull strength by surface mounted devices (SMD). It analyzes the theory of pull strength testing of solder joints with emphasis on standard IEC 62137-1-3 and describes the selection of components utilized to create mechanical construction and electrical parts. These electronic parts made or innovated in this work were control system based on microcontroler Atmega164P, power circuit for stepper motor and communication of measure equipment TEST 321 with PC. The whole design is complemented by simulation of mechanical stress to the critical components using ANSYS. The conclusion summarizes the most important parameters of this equipment.