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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
1

Optimization of Bonding Geometry for a Planar Power Module to Minimize Thermal Impedance and Thermo-Mechanical Stress

Cao, Xiao 06 December 2011 (has links)
This study focuses on development a planar power module with low thermal impedance and thermo-mechanical stress for high density integration of power electronics systems. With the development semiconductor technology, the heat flux generated in power device keeps increasing. As a result, more and more stringent requirements were imposed on the thermal and reliability design of power electronics packaging. In this dissertation, a boundary-dependent RC transient thermal model was developed to predict the peak transient temperature of semiconductor device in the power module. Compared to conventional RC thermal models, the RC values in the proposed model are functions of boundary conditions, geometries, and the material properties of the power module. Thus, the proposed model can provide more accurate prediction for the junction temperature of power devices under variable conditions. In addition, the transient thermal model can be extracted based on only steady-state thermal simulation, which significantly reduced the computing time. To detect the peak transient temperature in a fully packaged power module, a method for thermal impedance measurement was proposed. In the proposed method, the gate-emitter voltage of an IGBT which is much more sensitive to the temperature change than the widely used forward voltage drop of a pn junction was monitored and used as temperature sensitive parameter. A completed test circuit was designed to measure the thermal impedance of the power module using the gate-emitter voltage. With the designed test set-up, in spite of the temperature dependency of the IGBT electrical characteristics, the power dissipation in the IGBT can be regulated to be constant by adjusting the gate voltage via feedback control during the heating phase. The developed measurement system was used to evaluate thermal performance and reliability of three different die-attach materials. From the prediction of the proposed thermal model, it was found that the conventional single-sided power module with wirebond connection cannot achieve both good steady-state and transient thermal performance under high heat transfer coefficient conditions. As a result, a plate-bonded planar power module was designed to resolve the issue. The comparison of thermal performance for conventional power module and the plate-bonded power module shows that the plate-bonded power module has both better steady-state and transient thermal performance than the wirebonded power module. However, due to CTE mismatch between the copper plate and the silicon device, large thermo-mechanical stress is induced in the bonding layer of the power module. To reduce the stress in the plate-bonded power module, an improved structure called trenched copper plate structure was proposed. In the proposed structure, the large copper plate on top of the semiconductor can be partitioned into several smaller pieces that are connected together using a thin layer copper foil. The FEM simulation shows that, with the improved structure, the maximum von Mises stress and plastic strain in the solder layer were reduced by 18.7% and 67.8%, respectively. However, the thermal impedance of the power module increases with reduction of the stress. Therefore, the trade-off between these two factors was discussed. To verify better reliability brought by the trenched copper plate structure, twenty-four samples with three different copper plate structures were fabricated and thermally cycled from -40°C to 105°C. To detect the failure at the bonding layer, the curvature of these samples were measured using laser scanning before and after cycling. By monitoring the change of curvature, the degradation of bonding layer can be detected. Experimental results showed that the samples with different copper plate structure had similar curvature before thermal cycle. The curvatures of the samples with single copper plate decreased more than 80% after only 100 cycles. For the samples with 2 × 2 copper plate and the samples with 3 × 3 copper plate, the curvatures became 75.8% and 77.5% of the original values, respectively, indicating better reliability than the samples with single copper plate. The x-ray pictures of cross-sectioned samples confirmed that after 300 cycles, the bonding layer for the sample with single copper plate has many cracks and delaminations starting from the edge. / Ph. D.
2

Planar metallization failure modes in integrated power electtonics modules

Zhu, Ning 10 May 2006 (has links)
Miniaturizing circuit size and increasing power density are the latest trends in modern power electronics development. In order to meet the requirements of higher frequency and higher power density in power electronics applications, planar interconnections are utilized to achieve a higher integration level. Power switching devices, passive power components, and EMI (Electromagnetic Interference) filters can all be integrated into planar power modules by using planar metallization, which is a technology involving electrical, mechanical, material, and thermal issues. By processing high dielectric materials, magnetic materials, or silicon chips using compatible manufacturing procedures, and by carefully designing structures and interconnections, we can realize the conventional discrete inductors, capacitors, and switch circuits with planar modules. Compared with conventional discrete components, the integrated planar modules have several advantages including lower profiles, better form factors, and less labor-intensive processing steps. In addition, planar interconnections reduce the wire bond inductive and resistive parasitic parameters, especially for high frequency applications. However, planar integration technology is a packaging approach with a large contact area between different materials. This may result in unknown failure mechanisms in power applications. Extensive research has already been done to study the performance, processing, and reliability of the planar interconnects in thin film structures. The thickness of the thin films used in integrated circuits (IC) or microelectronics applications ranges from the magnitude of nanometers to that of micrometers. In this work, we are interested in adopting planar interconnections to Integrated Power Electronics Modules (IPEM). In Integrated Power Electronics Modules (IPEMs), copper traces, especially bus traces, need to conduct current ranging from a few amps to tens of amps. One of the major differences between IC and IPEM is that the metal layer in IPEMs (normally >75µm) is much thicker than that of the thin films in IC (normally <1µm). The other major difference, which is also a feature of IPEM, is that the planar metallization is deposited on different brittle substrates. In active IPEM, switching devices are in a bare die form with no encapsulation. The copper deposition is on top of the silicon chips and the insulation polyimide layer. One of the key elements for passive IPEM and the EMI IPEM is the integrated inductor-capacitor (LC) module, which realizes equivalent inductors and capacitors in one single module. The deposition processes for silicon substrates and ceramic substrates are compatible and both the silicon and ceramic materials are brittle. Under high current and high temperature conditions, these copper depositions on brittle materials will cause detrimental failure spots. Over the last few years, the design, manufacture, optimization, and testing of the IPEMs has been developed and well documented. Up to this time , the research on failure mechanisms of conventional integrated power modules has led to the understanding of failures centered on wire bond or solder layer. However, investigation on the reliability and failure modes of IPEM is lacking, particularly that which uses metallization on brittle substrates for high current operations. In this study, we conduct experiments to measure and calculate the residual stresses induced during the process. We also, theoretically model and simulate the thermo-mechanical stresses caused by the mismatch of thermal expansion coefficients between different materials in the integrated power modules. In order to verify the simulation results, the integrated power modules are manufactured and subjected to the lifetime tests, in which both power cycling and temperature cycling tests are carried out. The failure mode analysis indicates that there are different failure modes for copper films under tensile or compressive stresses. The failure detection process verifies that delamination and silicon cracks happen to copper films due to compressive and tensile stresses respectively. This study confirms that the high stresses between the metallization and the silicon are the failure drivers in integrated power electronics modules.. We also discuss the driving forces behind several different failure modes. Further understanding of thesefailure mechanisms enables the failure modes to be engineered for safer electrical operation of IPEM modules and helps to enhance the reliability of system-level operation. It is also the basis to improve the design and to optimize the process parameters so that IPEM modules can have a high resistance to recognized failures. / Ph. D.
3

Development of Bi-Directional Module using Wafer-Bonded Chips

Kim, Woochan 06 January 2015 (has links)
Double-sided module exhibits electrical and thermal characteristics that are superior to wire-bonded counterpart. Such structure, however, induces more than twice the thermo-mechanical stress in a single-layer structure. Compressive posts have been developed and integrated into the double-sided module to reduce the stress to a level acceptable by silicon dice. For a 14 mm x 21 mm module carrying 6.6 mm x 6.6 mm die, finite-element simulation suggested an optimal design having four posts located 1 mm from the die; the z-direction stress at the chip was reduced from 17 MPa to 0.6 MPa. / Ph. D.
4

Thermo-mechanical Fatigue of Electrical Insulation System in Electrical machine / Termomekanisk utmattning av elektriska isolationssystem i elektriska maskiner

Elschich, Ahmed January 2017 (has links)
Electrical machines in electrified heavy-duty vehicles are subjected to dynamic temperature loadings during normal operation due to the different driving conditions. The Electrical Insulation System (EIS) in a stator winding is aged as an effect of these dynamic thermal loads. The thermal loads are usually high constant temperatures and thermal cycling. The high average constant thermal load is well-known in the electrical machine industry but little is known about the effect of temperature cycling. In this project, the ageing of the EIS in stator windings due to temperature cycling is examined. In this project, computational simulations of different simplified models that represent the electrical insulation system are made to analyse the thermo-mechanical stresses that is induced due to thermal cycling. Furthermore, a test object was designed and simulated to replicate the stress levels obtained from the simulations. The test object is to ease the physical testing of electrical insulation system. Testing a complete stator takes time and has the disadvantage of having a high mass, therefore a test object is designed and a test method is provided. The results from the finite element analysis indicate that the mechanical stresses induced will affect the lifetime of the electrical insulation system. A sensitivity study of several thermal cycling parameters was performed, the stator core length, the cycle rate and the temperature cycle amplitude. The results obtained indicate that the stator core length is too short to have a significant effect on the thermo-mechanical stresses induced. The results of the sensitivity study of the temperature cycle rate and the temperature cycle amplitude showed that these parameters increase the thermo-mechanical stresses induced. The results from the simulations of the test object is similar to the results from the simulations of the stator windings, which means that the tests object is valid for testing. The test method that is most appropriate is the power cycling test method, because it replicates the actual application of stator windings. The thermally induced stresses exposing the slot insulation exceeds the yield strength of the material, therefore plastic deformation may occur only after one thermal cycle. The other components in the stator are exposed to stresses below the yield strength. The thermally induced stresses exposing the slot insulation are high enough to low cycle fatigue the electrical insulation system, thus thermo-mechanical fatigue is an ageing factor of the electrical insulation system.
5

Thermomechanical stress analysis of the main insulation system of traction electrical machines

Ismail, Dahman, Andrei, Alexis January 2020 (has links)
More efficiency heavy-duty vehicles are developed with higher range, updated electronic and mechanical parts. The fuel efficiency and pollution of carbon dioxide need to be lower to achieve new EU regulations. The global population increases with an increased number of heavy-duty vehicles. This, in turn, increases the emission. By taking the electrical and mechanical parts to the next step, the global emission problems can be massively reduced. Electrical machines are the next step towards a cleaner future. The main goal of this study to investigate the electrical machine’s insulation system. Thermo-mechanical stresses due to thermal cycling affect the electrical machines and its sub-components. By using a FEM application with simplified models of the electrical machine, results are obtained and discussed. Specifically, if 2D-models are sufficient enough to represent a 3D-model. How good different 2D-models can represent the 3D-model is compared and discussed in this study. A physical experimental analysis is done to verify and calibrate the FE-models. Which one of the less frequent higher amplitude or more frequent, lower amplitude thermal cycling affects the insulation system most is determined. The simulations could be done with either, coupled-temperature displacement analysis or sequentially coupled analysis. Coupled-temperature displacement is the fastest method to use in the simulation models. A 3D-model is the best way to describe an object and is therefore implemented. Two additional 2D-models are developed for faster computation and to investigate if the models can represent the three-dimensional geometry. All the models have specific boundary conditions to make the models more simplified. Sensitivity studies have been done to determine which parameter affects the induced thermo-mechanical stresses the most. A physical experimental setup is also implemented to validate and calibrate the simulation model. The result of the 3D-model is most accurate when simulating a three-dimensional object. Simulation results have shown that epoxy, one of the main components in the insulation system, is most critical in terms of reaching breakdown first, followed by paper insulation and copper coating. This is a typical result of all three simulation models. Whereas it is concluded that some 2D-models can present the 3D-model, others can’t. The dependent factor is the different cross-section of the electrical machine. The physical experiment shows similar results between simulation in terms of strain at a lower temperature, and the deviation gets larger as the temperature increases. The 3D-model is the model that has the best representation of a real electrical machine as it accounts for all the normal and shear stress components in all directions, but also because it has better boundary conditions compared to the 2D-models. The 2D-model in XY-plane has shown similar results to the 3D-model. One of the main insulation system components, epoxy, is exposed to the highest stresses compared to its yield and ultimate strength, followed by the paper insulation and copper coating. The sensitivity study has concluded that the axial length of the stator does not affect the stress amplitudes. The most critical parameter that affects the thermo-mechanical stresses is the temperature amplitude, the materials CTE and the thickness of the jointed layer. All maximum stress amplitudes of all the components are located at the free end. / Mer effektiva tunga fordon utvecklas med högre räckvidd, uppdaterade elektroniska och mekaniska delar. Bränsleeffektiviteten och föroreningen av koldioxid måste vara lägre för att uppnå nya EU-förordningar. Antalet tunga fordon ökar i takt med att den globala befolkningen ökar, detta leder i sin tur till ökad utsläpp av bland annat koldioxid. Genom att ta de elektriska och mekaniska delarna till nästa steg kan de globala utsläppsproblemen minskas massivt. Elektriska maskiner för framdrivning är nästa steg mot en renare framtid. Studiens huvudmål för att undersöka den elektriska maskinens isoleringssystem. Termomekaniska påfrestningar på grund av termisk cykling påverkar de elektriska maskinerna och dess delkomponenter. Genom att använda en FEM-applikation med förenklade modeller av den elektriska maskinen erhålls och diskuteras resultat. Specifikt om 2D-modeller är tillräckliga för att representera en 3D-modell. Hur tillräckligt de olika 2D-modeller kan representera 3D-modellen jämförs och diskuteras i denna studie. Ett fysiskt experiment utförs för att validera och kalibrera FEA-modellerna. Vilken av de mindre frekventa cykler med högre amplitud eller mer frekventa cyckler med lägre amplitud påverkar isoleringssystemet mest har undersökts. Simuleringarna kan göras med antingen, temperatur kopplad förskjutnings analys eller sekventiellt kopplad analys. Temperatur kopplad kopplad förskjutning är den snabbaste metoden att använda i simuleringsmodellerna. En 3D-modell är det bästa sättet att beskriva ett objekt och har därför implementerats. Ytterligare två, 2Dmodeller är framtagna i FEM-miljö för snabbare beräkning och för att undersöka om 2D-modellerna kan representera den tredimensionella geometrin. Samtliga tre modeller har specifika randvillkor för att förenkla modellerna. Känslighetsstudier görs för att bestämma vilken parameter som påverkar de inducerade termomekaniska spänningarna mest. Ett fysiskt experiment har utförsts för att validera och kalibrera simuleringsmodellerna. Resultatet visar att 3D-modellen representerar ett tre dimensonellt objekt bäst. Simuleringsresultat har visat att epoxy, som är en av huvudkomponenterna i isoleringssystemet, är mest kritisk när det gäller att först nå brott- och sträckgräns, följt av pappersisolering och koppar beläggningen. Detta är ett typiskt resultat av alla tre simuleringsmodeller. Slutsatsen visar att vissa 2D-modeller kan presentera 3D-modellen, andra kan inte. Den beroende faktorn beror på ur vilket tvärsnitt man tittar på den elektriska maskinen. Det fysiska experimentet visar liknande resultat jämfört med simuleringen när det gäller belastning vid en lägre temperatur, och avvikelsen blir större när temperaturen ökar. 3D-modellen, är den modell som har den bästa representationen av en riktig elektrisk maskin eftersom den inkluderar normal- och skjuvspänningskomponenter i alla riktningar. Anledningen är att den har bättre randvillkor jämfört med 2Dmodellerna. 2D-modellen i XY-planet har visat liknande resultat som 3D-modellen. En av huvudkomponenterna i isoleringssystemet, epoxy, utsätts för de högsta spänningarna jämfört med dess sträck- och den brottgräns, följt av pappersisolering och koppar beläggning. Känslighetsstudien har kommit fram till att statorns axiella längd inte påverkar spänningsamplituderna. Den mest kritiska parametern som påverkar de termomekaniska spänningarna är temperatur amplituden, materialens CTE och tjockleken på det skarvade skiktet. Alla maximala spänningsamplituder för samtliga tre komponenter är belägna i den fria änden.

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