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Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometryLehmann, Daniel, Seidel, Falko, Zahn, Dietrich R.T. 06 March 2014 (has links) (PDF)
An optical surface roughness model is presented, which allows a reliable determination of the dielectric function of thin films with high surface roughnesses of more than 10 nm peak to valley distance by means of spectroscopic ellipsometry. Starting from histogram evaluation of atomic force microscopy (AFM) topography measurements a specific roughness layer (RL) model was developed for an organic thin film grown in vacuum which is well suited as an example. Theoretical description based on counting statistics allows generalizing the RL model developed to be used for all non-conducting materials. Finally, a direct input of root mean square (RMS) values found by AFM measurements into the proposed model is presented, which is important for complex ellipsometric evaluation models where a reduction of the amount of unknown parameters can be crucial. Exemplarily, the evaluation of a N,N’-dimethoxyethyl-3,4,9,10-perylene-tetracarboxylic-diimide (DiMethoxyethyl-PTCDI) film is presented, which exhibits a very high surface roughness, i.e. showing no homogeneous film at all.
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Contribuição ao estudo da função dielétrica de superfície por espectroscopia de perda de energia de fotoelétrons induzidos por raios-X (XPS-PEELS) / Contribution à l’étude de la fonction dieléctrique de surface par spectroscopie de perte d’énergie des photoélectrons induits par rayons-X (XPS-PEELS) / Contribution to the study of the dielectric function of surface by energy loss spectroscopy of photoelectrons induced by X-rays (XPS-PEELS)Santana, Victor Mancir Da Silva 19 May 2017 (has links)
Cette étude, expérimentale et théorique, de physique des surfaces développe une méthode basée sur la spectroscopie de perte d'énergie des photoélectrons, pour déterminer les propriétés électroniques d'un matériau à partir de mesures XPS. Sur la base de la physique de la photoémission dans un solide homogène, la technique XPS-PEELS donne accès à la fonction de perte d'énergie ELF(E, q) liée à la partie imaginaire et la fonction diélectrique sur une large plage d’énergie (environ 50 eV) avec une sensibilité typique de ≈ 5 nm en profondeur. Dans les métaux ou les semi-conducteurs à faible gap, qui présentent un chevauchement important entre le pic quasi-élastique ZLP(E) et la région des pertes d'énergie, la technique est rendue applicable par la méthode de transformée de Fourier développée dans cette thèse. Les distributions en énergie de la source de rayons X et de la fonction d’appareil sont directement mesurées. La forme asymétrique du pic quasi-élastique ZLP(E) est obtenue à partir de la densité d’états électroniques (calcul par une méthode DFT), à l’aide du modèle de Hopfield-Wertheim-Citrin décrivant la réponse des électrons de valence à la création du trou (théorie multi-corps). L'algorithme XPS-PEELS utilise l'ensemble du spectre sans soustraction empirique d’une ligne de base. Il considère deux types d'excitations de plasmon - intrinsèques et extrinsèques - avec des taux de création différents mais impose la même distribution en énergie. Cette méthode originale permet d’accéder à des excitations électroniques de faible énergie (pertes proches du pic XPS) ; dans le cas de l'aluminium métallique, la transition inter-bandes est observée à 1.80 eV. En tant que technique de spectroscopie électronique, les effets de dispersion de la fonction de perte ELF(E, q) ont été considérés en utilisant un code TD-DFT (Exciting); quel que soit le niveau d'approximation (RPA, ALDA, LRC), les calculs ne décrivent pas correctement la largeur du spectre ELF expérimental (2.3 eV). À la fin du travail, nous comparons la méthode de la transformée de Fourier avec une méthode empirique d'élimination du pic élastique, valable pour les isolants, dans le cas de l'oxyde d'aluminium Al₂O₃. / This surface physics study, experimental and theoretical, develops a technique based on the energy loss spectroscopy of photoelectrons, to determine electronic properties of a material from XPS measurements. Based on the physics of photoemission in a homogeneous solid, the XPS-PEELS technique provides the energy loss function ELF(E, q) related to the imaginary part and the dielectric function with energy extension up to 50 eV and a typical sensitivity of ≈ 5 nm in depth. In metals or low-gap semiconductors, with important overlap between the elastic peak and the energy loss region, the technique became applicable by the Fourier transform method developed in this thesis. In addition to the distribution of the X-ray source and analyzer apparatus function, the asymmetric shape of the no-loss peak ZLP(E) is based on the calculation of the Density of Electronic States (DFT method) and the Hopfield-Wertheim-Citrin model describing the response of valence electrons to the creation of the hole (many body theory). The XPS-PEELS algorithm uses the entire spectrum without any empirical background subtraction. It considers two types of plasmon excitations - intrinsic and extrinsic - with different rates of creation but imposing the same distribution in energy. This original method was applied to the aluminum metal, allowing the analysis of the loss function and revealing interband excitations (1.80 eV) at low energy, very close to the no-loss peak. As an electron spectroscopy technique, dispersion effects of the loss function ELF(E, q) were considered using a TD-DFT code (Exciting); for any level of approximation (RPA, ALDA, LRC), the calculations do not describe properly the high width (2.3 eV) of the experimental ELF. At the end of the work, we compare the Fourier transform method with an empirical method of elastic peak elimination, valid for insulators, in the case of aluminum oxide Al₂O₃.
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Confinement effect on semiconductor nanowires propertiesNduwimana, Alexis 02 November 2007 (has links)
Confinement effect on semiconductor nanowires properties.
Alexis Nduwimana
100 pages
Directed by Dr. Mei-Yin Chou
We study the effect of confinement on various properties of semiconductor
nanowires. First, we study the size and direction dependence of the band gap of
germanium nanowires. We use the density functional theory in the local density approximation. Results shows that the band gap decreases with the diameter The susceptibility of these nanowires is also computed. Second, we look at the confinement effect on the piezoelectric coefficients of ZnO and AlN nanowires. The Berry phase method is used. It is found that depending on passivation, thepiezoelectric effect can decrease or increase. Finally, we study the size and direction dependence of the melting temperature of silicon nanowires. We use the molecular dynamics with the Stillinger Weber potential. Results indicate that the melting temperature increases with the nanowire diameter and that it is direction dependent.
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Opacification de matériaux oxydes au passage solide-liquide : rôle de la structure et de la dynamique / Opacification of dielectric oxides near the melting pointEckes, Myriam 29 November 2012 (has links)
Avec l’augmentation de la température, certains composés oxydes, transparents dans le proche infrarouge, deviennent progressivement opaques à l’approche de la fusion. Un tel comportement est inhabituel et impacte profondément leurs propriétés radiatives. Afin de comprendre ce phénomène, des mesures par spectroscopie d’émission infrarouge ont été effectuées depuis la température ambiante jusqu’à la fusion sur plusieurs oxydes cristallins (Mg2SiO4, LiAlO2, LiGaO2, ZnO, YAlO3, LaAlO3, LiNbO3, MgO). Ces données ont été complétées ponctuellement par des mesures de conductivité électriques, de RMN et de diffraction des rayons X en température. L’analyse des données expérimentales du facteur d’émission menée à l’aide d’un modèle de fonction diélectrique semi-quantique et incluant un terme de Drude étendu, a permis de caractériser finement la réponse de ces matériaux et de proposer une origine physique pour le mécanisme responsable de l’opacification. Le phénomène est thermiquement activé et peut être expliqué par la formation et la mobilité de polarons. Ce travail a également montré l’existence d’un lien étroit entre la microstructure des composés et les caractéristiques de l’opacification. / With increasing temperature, some oxide compounds that are transparent in the near infrared range become progressively opaque when approaching the liquid phase. Such a behavior is unusual and deeply impacts their thermal radiative properties. To understand this phenomenon, infrared emittance spectra were acquired from room temperature up to the liquid state on several crystalline oxides (Mg2SiO4, LiAlO2, LiGaO2, ZnO, YAlO3, LaAlO3, LiNbO3, MgO). These data have been selectively completed by electrical conductivity measurements, NMR and X-ray diffraction experiments versus temperature. The analysis of the experimental emittance data with a semi-quantum dielectric function model including an extended Drude term, allowed to characterize finely the material responses and to suggest a physical origin for the opacification mechanism. The phenomenon is thermally activated and can be explained by the formation and the mobility of polarons. This work also showed the existence of a close link between the material microstructure and the characteristics of the opacification.
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Real Time Spectroscopic Ellipsometry (RTSE) Analysis of Three Stage CIGS Deposition by co-EvaporationPradhan, Puja January 2017 (has links)
No description available.
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Étude de la dynamique électronique des plasmas denses et tièdes par interférométrie optique / Study of warm dense plasma electronic dynamics by optical interferometryDeneuville, François 28 February 2013 (has links)
La matière dense et tiède (WDM) est un régime caractérisé par une densité proche du solide pour une température avoisinant celle de Fermi. Pour étudier cet état de la matière, dans cette thèse, une expérience d'interférométrie dans le domaine des fréquences est mise en place afin de mesurer la phase et la réflectivité - dans les deux directions de polarisation S et P - d'une onde sonde en réflexion sur un échantillon chauffé de manière très brève par une impulsion laser ultra-courte (sub-100fs). Il est alors porté dans un état hors-équilibre. Une méthode basée sur les mesures de réflectivité est mise en place pour contrôler la forme de l'interface entre le vide et la matière chauffée. Pour des fluences laser de l'ordre de 1 J/cm2, l'hydrodynamique d'un échantillon chauffé est étudiée par la mesure du déplacement de la surface et comparée au code hydrodynamique à deux températures ESTHER. Ensuite, la fonction diélectrique à 800 nm et 400 nm est déduite des mesures expérimentales et certaines quantités en sont extraites comme la densité électronique, la température électronique et les fréquences de collision en régime WDM. Elles sont par la suite comparées avec des modèles couramment utilisés. / The Warm Dense Matter (WDM) regime is characterised by a density close to the solid density and an electron temperature close to the Fermi temperature. In this work, the nonequilibrium Warm Dense Matter is studied during the solid to liquid phase transition induced by an ultra short laser interacting with a solid. A 30 femtoseconds time resolution pump-probe experiment (FDI) is set up, yielding to the measurement of the heated sample complex reflectivity for both S and P polarisation.We have determined a criterion based on the measured reflectivities, which permits to control the interface shape of the probed matter. For pump laser fluences around 1 J/cm2, the hydrodynamics of the heated matter is studied and experimental results are compared to the two-temperatures code ESTHER. Furthermore, the evolution of the dielectric function at 800 nm and 400 nm is inferred from our measurements on a sub-picosecond time-scale. Within the Drude-Lorentz model for the conduction electrons, the dielectric function yields information such as ionisation state, electronic temperature and electron collision frequency.
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Electron microscopic studies of low-k inter-metal dielectricsSingh, Pradeep Kumar 26 September 2014 (has links) (PDF)
Die fortwährende Verkleinerung der Strukturbreiten in der Mikroelektronik erfordert es, herkömmliche SiO2 Dielektrika durch Materialien mit kleinerer Dielektrizitätskonstante zu ersetzen. Dafür sind verschiedene „low-k Materialien“ entwickelt worden. Unter diesen sind die Organosilikatgläser, die aus SiO2 Netzwerken mit eingelagerten Methylgruppen bestehen wegen ihrer ausgezeichneten Eigenschaften besonders interessant als Dielektrika zwischen metallischen Leiterbahnen. In dieser Arbeit sind fünf verschiedene dieser „low-k Materialien“ untersucht worden: ein dichtes und vier poröse Materialien, die alle durch plasmagestützte chemische Gasphasenabscheidung hergestellt wurden. Die strukturellen, chemischen und dielektrischen Eigenschaften der Materialien wurden mit Hilfe der analytischen Durchstrahlungselektronenmikroskopie unter Verwendung eines abbildenden GATAN-Energiespektrometers untersucht.
Die Bestimmung der radialen Verteilungsfunktion (RDF) zur Charakterisierung der atomaren Nahordnung ermöglicht uns die Ermittlung mittlerer Bindungslängen und – winkel sowie der mikroskopischen Dichte des Materials. Gegenüber SiO2 wurden in den untersuchten „low-k Materialien“ stark veränderte mittlere Si-O, O-O und Si-Si Bindungslängen gefunden. Dieses wirkt sich natürlich auch auf die mittleren Si-O-Si bzw. O-Si-O Bindungswinkel aus, und wie erwartet war auch die mikroskopische Dichte der „low-k Materialien“ kleiner als die Dichte des SiO2.
Elektronen Energieverlustspektroskopie (EELS) und Photoelektronenspektroskopie (XPS) wurden zur Charakterisierung der chemischen Umgebung der Atome in den „low-k Materialien“ herangezogen. Die Energien von Ionisationskanten und die Bindungsenergien der Silizium-2p und Sauerstoff-1s Elektronen waren in den „low-k Materialien“ größer als im SiO2. Die Kohlenstoffatome kamen in den „low-k Materialien“ sowohl sp2 als auch sp3 hybridisiert vor. sp2-Hybridisierung liegt vor, wenn Bindungen wie Si=CH2 und C=C im Netzwerk vorkommen, während sp3 Hybridisierung z.B. dann vorkommt, wenn freie Si-Bindungen durch –CH3 Gruppen abgesättigt werden. Die Anteile an sp2- bzw. sp3-hybridisierten Kohlenstoffatome wurden aus der Feinstruktur der K-Energieverlustkanten des Kohlenstoffs abgeschätzt. Das ergab, daß die meisten Kohlenstoffatome in den „low-k Materialien“ sp2-hybridisiert sind.
Die dielektrischen Eigenschaften wurden durch Kramers-Kronig-Transformation einer Energieverlustfunktion ermittelt, die aus dem Niedrigverlust-EELS-Spektrum im Bereich der Plasmonenanregungen gewonnen wurde. Die Bandlücke des SiO2 beträgt ungefähr 9 eV während dichte „low-k Materialien“ aufgrund der Unregelmäßigkeiten in ihrem SiO2-Netzwerk zusätzliche Zustandsdichten innerhalb der Bandlücke aufweisen. Die Erzeugung von Poren im „low-k Material“ vermindert offenbar die Zustandsdichte im Bereich der Bandlücke und erweitert diese im Vergleich zum SiO2. Eine Modellrechnung mit der Dichtefunktionaltheorie für ein Strukturmodell, das den „low-k Materialien“ nahe kommt, ist zum Vergleich mit der experimentell gefundenen kombinierten Zustandsdichte herangezogen worden und zeigt eine gute Übereinstimmung. Die im Standard-Herstellungsprozeß vorkommenden Verfahren des Plasmaätzens und der Plasmaveraschung können die Struktur des „low-k Materials“ z.B. an den Seitenwänden von Ätzgräben verändern. Die gestörten Bereiche wurden mit der energiegefilterten Elektronenmikroskopie untersucht. Dabei wurde gefunden, daß sich die Strukturveränderungen der Seitenwände bis zu einer Tiefe in der Größenordnung von ungefähr 10 Nanometern erstrecken. Diese Bereiche sind verarmt an Kohlenstoff und ähneln folglich mehr einem SiO2-Dielektrikum. Die Kohlenstoffverarmung erstreckt sich in die „low-k Schicht“ in Form eines gaussartigen Profils mit maximaler Kohlenstoffkonzentration in der Mitte der Schicht. Die Sauerstoffkonzentration und die mikroskopische Dichte steigen in der Nähe der Seitenwände.
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Dielectric Formulation Of The One Dimensional Electron GasTas, Murat 01 April 2004 (has links) (PDF)
The charge and spin density correlations in a one dimensional electron gas (1DEG) confined in a semiconductor quantum wire structure at zero temperature are studied. The dielectric formulation of the many--body problem is employed and the longitudinal dielectric function, local-field correction, static structure factor, pair correlation function, ground state energy, compressibility, spin-dependent effective interaction potentials, paramagnon dispersion and static spin response function of the 1DEG are computed within the self-consistent field approximations of Singwi et al., known as the STLS and SSTL. The results are compared with those of other groups,
and those obtained for two-dimensional electron gas systems whenever it is possible.
It is observed that the SSTL satisfies the compressibility sum rule better than the STLS. Calculating the ground state energy of the 1DEG in unpolarized and fully polarized states, it is shown that both STLS and SSTL predict a Bloch transition for 1DEG systems at low electron densities.
Finally, the coupled plasmon-phonon modes in semiconductor quantum wires are calculated within the Fermi and Luttinger liquid theories. The coupling of electrons to bulk longitudinal optical phonons without dispersion and to acoustic phonons via deformation potential with a linear dispersion are considered. Using the dielectric formalism, a unified picture of the collective coupled plasmon-phonon modes is presented. Considerable differences between the predictions of the Fermi and Luttinger liquid approaches at large wave vector values,
which may be observed experimentally, are found.
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A theoretical framework for interpretation and prediction of magneto-optical measurementsFrilén, Viktor January 2023 (has links)
The interplay of experiments and theory is essential to deepen our understanding of magnetization dynamics. This thesis aims to serve as a bridge between these two aspects by establishing a mathematical framework that enables the computation of optical observable quantities based on theoretical models. The equations are cast in a matrix representation that is well-suited for performing numerical simulations. Additionally, the generality of these methods enables their application to layered media with any geometry, regardless of whether they possess magnetic properties or not. Furthermore, it explores the various perspectives and physical mechanisms involved in magneto-optic measurements to provide the reader with a self consistent introduction to the subject matter. Numerical calculations are presented for bulk Fe, alternating layers of Fe/Au and Ni with a MgO coating and a SiO substrate for different energies, angle of incident and magnetization direction. The results demonstrate the effectiveness of the method in predicting measurable outcomes from theoretical considerations and enables the analysis of optimal experimental configurations. / Samverkan mellan experiment och teori är avgörande för fördjupa vår förståelse av magnetiska system och deras dynamik. Målet med denna uppsats är att etablera en koppling mellan dessa två aspekter genom att formulera ett matematiskt ramverk som möjliggör beräkningar av optiska observerbara storheter baserat på teoretiska modeller. Ekvationerna formuleras med matriser vilket är väl lämpat för att utföra numeriska simuleringar. Dessutom möjliggör metodens generella natur tillämpning på skiktade material av godtycklig geometri, oavsett om de har magnetiska egenskaper eller inte. Vidare utforskar uppsatsen olika perspektiv och fysikaliska mekanismer som är involverade i magneto-optiska mätningar för att ge läsaren en självständig introduktion till ämnet. Numeriska beräkningar presenteras för bulkjärn, växlande lager av Fe/Au och Ni med en MgO-beläggning och ett SiO-substrat för olika energier, infallsvinkel och magnetiseringsriktning. Resultaten visar på metodens förmåga att förutsäga mätbara resultat baserat på teoretiska överväganden och tillåter analys av optimala experimentella uppställningar.
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[pt] DETECÇÃO ÓPTICA DE PROPRIEDADES GEOMÉTRICAS QUÂNTICAS EM SUPERCONDUTORES SINGLETOS / [en] OPTICAL DETECTION OF QUANTUM GEOMETRICAL PROPERTIES IN SINGLET SUPERCONDUCTORSDAVID FERNANDO PORLLES LOPEZ 02 July 2024 (has links)
[pt] A geometria quântica na física da matéria condensada nos permite
entender várias propriedades geométricas dos estados da zona de Brillouin,
como a curvatura de Berry e a métrica quântica. Especialmente em relação
a esta última, foram observados estudos que mostram sua relação com a
supercondutividade. Motivados por estas investigações, esta dissertação visa
investigar as propriedades geométricas quânticas de supercondutores singletos,
como os tipos s-wave e d-wave, e identificar sua relação com várias respostas
eletromagnéticas. Começamos mostrando a descrição desses supercondutores
através da teoria do campo médio, posteriormente analisando sua métrica
quântica, que é definida pela sobreposição de dois estados de quasihole em
momentos ligeiramente diferentes. Subsequentemente, estudamos o número de
fidelidade, que é definido como a integração de momento da métrica quântica
e representa a distância média entre estados de quasihole vizinhos. Além
disso, expressamos esse número de fidelidade como um marcador de fidelidade
definido localmente em cada sítio da rede, o que nos permite observar o
efeito de impurezas não magnéticas nesse marcador. Para supercondutores
de tipo s-wave, mostramos que respostas eletromagnéticas como a absorção no
infravermelho estão relacionadas à métrica quântica, enquanto, por outro lado,
a corrente paramagnética e a função dielétrica estão relacionadas ao número de
fidelidade, que por sua vez é determinado pelo comprimento de coerência. Por
outro lado, para supercondutores de tipo d-wave, observamos que sua métrica
quântica mostra um comportamento singular e que seu número de fidelidade
diverge. O resultado mais relevante desta dissertação é que descobrimos que
supercondutores singletos, descritos pela teoria do campo médio BCS, exibem
uma métrica quântica não trivial, e que para supercondutores de tipo s-wave
as respostas eletromagnéticas mencionadas estão diretamente relacionadas à
geometria quântica, o que não havia sido encontrado anteriormente. / [en] Quantum geometry in condensed matter physics allows us to understand
various geometric properties of the Brillouin zone states, such as the Berry
curvature and the quantum metric. Especially in relation to the latter, studies
have been observed that show its relationship with superconductivity. Motivated by these investigations, this dissertation aims to investigate the quantum geometric properties of singlet superconductors, such as s-wave and d-wave
types, and identify their relation to various electromagnetic responses. We begin by showing the description of these superconductors through mean field theory, subsequently analyzing their quantum metric, which is defined by the
overlap of two quasihole states at slightly different momenta. Subsequently,
we study the fidelity number, which is defined as the momentum integration
of the quantum metric and represents the average distance between neighboring quasihole states. Furthermore, we express this fidelity number as a fidelity
marker defined locally at each lattice site, which allows us to observe the effect
of non-magnetic impurities on this marker. For s-wave superconductors, we
show that electromagnetic responses such as infrared absorption are related
to the quantum metric, while on the other hand, the paramagnetic current
and the dielectric function are related to the fidelity number, which in turn
is determined by the coherence length. On the other hand, for d-wave super-conductors, we observe that their quantum metric shows a singular behavior
and that their fidelity number diverges. The most relevant result of this dissertation is that we have discovered that singlet superconductors, described by
the BCS mean field theory, exhibit a nontrivial quantum metric, and that for
s-wave superconductors the aforementioned electromagnetic responses are directly related to the quantum geometry, which has not been found previous.
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