Confiabilidade é um parâmetro de projeto importante para aplicações criticas tanto na Terra como também no espaço. Os FPGAs baseados em memoria SRAM são atrativos para implementar aplicações criticas devido a seu alto desempenho e flexibilidade. No entanto, estes FPGAs são susceptíveis aos efeitos da radiação tais como os erros transientes na memoria de configuração. Além disso, outros efeitos como o envelhecimento (aging) ou escalonamento da tensão de alimentação (voltage scaling) incrementam a sensibilidade à radiação dos FPGAs. Nossos resultados experimentais mostram que o envelhecimento e o escalonamento da tensão de alimentação podem aumentar ao menos duas vezes a susceptibilidade de FPGAs baseados em SRAM a erros transientes. Estes resultados são inovadores porque estes combinam três efeitos reais que acontecem em FPGAs baseados em SRAM. Os resultados podem guiar aos projetistas a prever os efeitos dos erros transientes durante o tempo de operação do dispositivo em diferentes níveis de tensão. A correção da memoria usando a técnica de scrubbing é um método efetivo para corrigir erros transientes em memorias SRAM, mas este método impõe custos adicionais em termos de área e consumo de energia. Neste trabalho, nos propomos uma nova técnica de scrubbing usando a redundância interna a nível de quadros chamada FLR- scrubbing. Esta técnica possui mínimo consumo de energia sem comprometer a capacidade de correção. Como estudo de caso, a técnica foi implementada em um FPGA de tamanho médio Xilinx Virtex-5, ocupando 8% dos recursos disponíveis e consumindo seis vezes menos energia que um circuito corretor tradicional chamado blind scrubber. Além, a técnica proposta reduz o tempo de reparação porque evita o uso de uma memoria externa como referencia. E como outra contribuição deste trabalho, nos apresentamos os detalhes de uma plataforma de injeção de falhas múltiplas que permite emular os erros transientes na memoria de configuração do FPGA usando reconfiguração parcial dinâmica. Resultados de campanhas de injeção são apresentados e comparados com experimentos de radiação acelerada. Finalmente, usando a plataforma de injeção de falhas proposta, nos conseguimos analisar a efetividade da técnica FLR-scrubbing. Nos também confirmamos estes resultados com experimentos de radiação acelerada. / Reliability is an important design constraint for critical applications at ground-level and aerospace. SRAM-based FPGAs are attractive for critical applications due to their high performance and flexibility. However, they are susceptible to radiation effects such as soft errors in the configuration memory. Furthermore, the effects of aging and voltage scaling increment the sensitivity of SRAM-based FPGAs to soft errors. Experimental results show that aging and voltage scaling can increase at least two times the susceptibility of SRAM-based FPGAs to Soft Error Rate (SER). These findings are innovative because they combine three real effects that occur in SRAM-based FPGAs. Results can guide designers to predict soft error effects during the lifetime of devices operating at different power supply voltages. Memory scrubbing is an effective method to correct soft errors in SRAM memories, but it imposes an overhead in terms of silicon area and energy consumption. In this work, it is proposed a novel scrubbing technique using internal frame redundancy called Frame-level Redundancy Scrubbing (FLRscrubbing) with minimum energy consumption overhead without compromising the correction capabilities. As a case study, the FLR-scrubbing controller was implemented on a mid-size Xilinx Virtex-5 FPGA device, occupying 8% of available slices and consumes six times less energy per scrubbed frame than a classic blind scrubber. Also, the technique reduces the repair time by avoiding the use of an external golden memory for reference. As another contribution, this work presents the details of a Multiple Fault Injection Platform that emulates the configuration memory upsets of an FPGA using dynamic partial reconfiguration. Results of fault injection campaigns are presented and compared with accelerated ground-level radiation experiments. Finally, using our proposed fault injection platform it was possible to analyze the effectiveness of the FLR-scrubbing technique. Accelerated radiation tests confirmed these results.

Confiabilidade é um parâmetro de projeto importante para aplicações criticas tanto na Terra como também no espaço. Os FPGAs baseados em memoria SRAM são atrativos para implementar aplicações criticas devido a seu alto desempenho e flexibilidade. No entanto, estes FPGAs são susceptíveis aos efeitos da radiação tais como os erros transientes na memoria de configuração. Além disso, outros efeitos como o envelhecimento (aging) ou escalonamento da tensão de alimentação (voltage scaling) incrementam a sensibilidade à radiação dos FPGAs. Nossos resultados experimentais mostram que o envelhecimento e o escalonamento da tensão de alimentação podem aumentar ao menos duas vezes a susceptibilidade de FPGAs baseados em SRAM a erros transientes. Estes resultados são inovadores porque estes combinam três efeitos reais que acontecem em FPGAs baseados em SRAM. Os resultados podem guiar aos projetistas a prever os efeitos dos erros transientes durante o tempo de operação do dispositivo em diferentes níveis de tensão. A correção da memoria usando a técnica de scrubbing é um método efetivo para corrigir erros transientes em memorias SRAM, mas este método impõe custos adicionais em termos de área e consumo de energia. Neste trabalho, nos propomos uma nova técnica de scrubbing usando a redundância interna a nível de quadros chamada FLR- scrubbing. Esta técnica possui mínimo consumo de energia sem comprometer a capacidade de correção. Como estudo de caso, a técnica foi implementada em um FPGA de tamanho médio Xilinx Virtex-5, ocupando 8% dos recursos disponíveis e consumindo seis vezes menos energia que um circuito corretor tradicional chamado blind scrubber. Além, a técnica proposta reduz o tempo de reparação porque evita o uso de uma memoria externa como referencia. E como outra contribuição deste trabalho, nos apresentamos os detalhes de uma plataforma de injeção de falhas múltiplas que permite emular os erros transientes na memoria de configuração do FPGA usando reconfiguração parcial dinâmica. Resultados de campanhas de injeção são apresentados e comparados com experimentos de radiação acelerada. Finalmente, usando a plataforma de injeção de falhas proposta, nos conseguimos analisar a efetividade da técnica FLR-scrubbing. Nos também confirmamos estes resultados com experimentos de radiação acelerada. / Reliability is an important design constraint for critical applications at ground-level and aerospace. SRAM-based FPGAs are attractive for critical applications due to their high performance and flexibility. However, they are susceptible to radiation effects such as soft errors in the configuration memory. Furthermore, the effects of aging and voltage scaling increment the sensitivity of SRAM-based FPGAs to soft errors. Experimental results show that aging and voltage scaling can increase at least two times the susceptibility of SRAM-based FPGAs to Soft Error Rate (SER). These findings are innovative because they combine three real effects that occur in SRAM-based FPGAs. Results can guide designers to predict soft error effects during the lifetime of devices operating at different power supply voltages. Memory scrubbing is an effective method to correct soft errors in SRAM memories, but it imposes an overhead in terms of silicon area and energy consumption. In this work, it is proposed a novel scrubbing technique using internal frame redundancy called Frame-level Redundancy Scrubbing (FLRscrubbing) with minimum energy consumption overhead without compromising the correction capabilities. As a case study, the FLR-scrubbing controller was implemented on a mid-size Xilinx Virtex-5 FPGA device, occupying 8% of available slices and consumes six times less energy per scrubbed frame than a classic blind scrubber. Also, the technique reduces the repair time by avoiding the use of an external golden memory for reference. As another contribution, this work presents the details of a Multiple Fault Injection Platform that emulates the configuration memory upsets of an FPGA using dynamic partial reconfiguration. Results of fault injection campaigns are presented and compared with accelerated ground-level radiation experiments. Finally, using our proposed fault injection platform it was possible to analyze the effectiveness of the FLR-scrubbing technique. Accelerated radiation tests confirmed these results.

<p>This report briefly describes the special requirements for a computer board for use in space. In particular, component selection and ways of mitigating the soft and hard errors are discussed. Furthermore, one implementation for a low-cost, relatively high performance computer that will work in the harsh space environment is presented. The report is primarily intended for those familiar with digital design, who need an introduction to construction of space or other high-reliability hardware. </p><p>As the quality (resolution) of imagers, spectrometers and other data sources in scientific satellite payloads is increasing, there is also an increasing demand for more processing power in order to compress or in other way process the data before transmitting it on the limited bandwidth microwave downlink to Earth. Scientific instruments are usually mission specific and have rather low budget, so there is a need for a powerful computer board that can be used for a number of missions in order to keep the engineering costs down.</p>

La miniaturisation des gravures des transistors résulte en une augmentation de la sensibilité aux soft-erreurs des circuits intégrés face aux particules énergétiques présentes dans l'environnement dans lequel ils opèrent. Une expérimentation, présentée au cours de cette thèse, concernant l'étude de la sensibilité face aux soft-erreurs, dans l'environnement réel, des mémoires SRAM provenant de deux générations de technologies successives, a mis en évidence la criticité de cette thématique. Cela pour montrer la nécessité de l'évaluation des circuits faces aux effets des radiations, surtout les circuits commerciaux qui sont de plus en plus utilisés dans les applications spatiales et avioniques et même dans les hautes altitudes, afin de trouver les méthodologies permettant leurs durcissements. Plusieurs méthodes d'injection de fautes, ayant pour but l'évaluation de la sensibilité des circuits intégrés face aux soft-erreurs, ont été le sujet de plusieurs recherches. Les travaux réalisés au cours de cette thèse ont eu pour but le développement d'une méthode automatisable, avec son outil, permettant l'émulation des effets des radiations sur des circuits dont on dispose de leurs codes HDL. Cette méthode, appelée NETFI (NETlist Fault Injection), est basée sur la manipulation de la netlist du circuit synthétisé pour permettre l'injection de fautes de types SEU, SET et Stuck_at. NETFI a été appliquée sur plusieurs architectures pour étudier ses potentialités ainsi que son efficacité. Une étude sur un algorithme tolérant aux fautes, dit self-convergent, exécuté par un processeur LEON3, a été aussi présenté dans le but d'effectuer une comparaison des résultats issus de NETFI avec ceux issus d'une méthode de l'état de l'art appelée CEU (Code Emulated Upset).

Les effets dus à la radiation peuvent provoquer des pannes dans des circuits intégrés. Lorsqu'une particule subatomique, fait se déposer une charge dans les régions sensibles d'un transistor cela provoque une impulsion de courant. Cette impulsion peut alors engendrer l'inversion d'un bit ou se propager dans un réseau de logique combinatoire avant d'être échantillonnée par une bascule en aval.Selon l'état du circuit au moment de la frappe de la particule et selon l'application, cela provoquera une panne observable ou non. Parmi les événements induits par la radiation, seule une petite portion génère des pannes. Il est donc essentiel de déterminer cette fraction afin de prédire la fiabilité du système. En effet, les raisons pour lesquelles une perturbation pourrait être masquée sont multiples, et il est de plus parfois difficile de préciser ce qui constitue une erreur. A cela s'ajoute le fait que les circuits intégrés comportent des milliards de transistors. Comme souvent dans le contexte de la conception assisté par ordinateur, les approches hiérarchiques et les techniques d'abstraction permettent de trouver des solutions.Cette thèse propose donc plusieurs nouvelles techniques pour analyser les effets dus à la radiation. La première technique permet d'accélérer des simulations d'injections de fautes en détectant lorsqu'une faute a été supprimée du système, permettant ainsi d'arrêter la simulation. La deuxième technique permet de regrouper en ensembles les éléments d'un circuit ayant une fonction similaire. Ensuite, une analyse au niveau des ensemble peut être faite, identifiant ainsi ceux qui sont les plus critiques et qui nécessitent donc d'être durcis. Le temps de calcul est ainsi grandement réduit.La troisième technique permet d'analyser les effets des fautes transitoires dans les circuits combinatoires. Il est en effet possible de calculer à l'avance la sensibilité à des fautes transitoires de cellules ainsi que les effets de masquage dans des blocs fréquemment utilisés. Ces modèles peuvent alors être combinés afin d'analyser la sensibilité de grands circuits. La contribution finale de cette thèse consiste en la définition d'un nouveau langage de modélisation appelé RIIF (Reliability Information Ineterchange Format). Ce langage permet de décrire le taux des fautes dans des composants simples en fonction de leur environnement de fonctionnement. Ces composants simples peuvent ensuite être combinés permettant ainsi de modéliser la propagation de leur fautes vers des pannes au niveau système. En outre, l'utilisation d'un langage standard facilite l'échange de données de fiabilité entre les partenaires industriels.Au-delà des contributions principales, cette thèse aborde aussi des techniques permettant de protéger des mémoires associatives ternaires (TCAMs). Les approches classiques de protection (codes correcteurs) ne s'appliquent pas directement. Une des nouvelles techniques proposées consiste à utiliser une structure de données qui peut détecter, d'une manière statistique, quand le résultat n'est pas correct. La probabilité de détection peut être contrôlée par le nombre de bits alloués à cette structure. Une autre technique consiste à utiliser un détecteur de courant embarqué (BICS) afin de diriger un processus de fond directement vers le région touchée par une erreur. La contribution finale consiste en un algorithme qui permet de synthétiser de la logique combinatoire afin de protéger des circuits combinatoires contre les fautes transitoires.Dans leur ensemble, ces techniques facilitent l'analyse des erreurs provoquées par les effets dus à la radiation dans les circuits intégrés, en particulier pour les très grands circuits composés de blocs provenant de divers fournisseurs. Des techniques pour mieux sélectionner les bascules/flip-flops à durcir et des approches pour protéger des TCAMs ont étés étudiées. / The main objective of this thesis is to develop techniques that can beused to analyze and mitigate the effects of radiation-induced soft errors in industrialscale integrated circuits. To achieve this goal, several methods have been developedbased on analyzing the design at higher levels of abstraction. These techniquesaddress both sequential and combinatorial SER.Fault-injection simulations remain the primary method for analyzing the effectsof soft errors. In this thesis, techniques which significantly speed-up fault-injectionsimulations are presented. Soft errors in flip-flops are typically mitigated by selectivelyreplacing the most critical flip-flops with hardened implementations. Selectingan optimal set to harden is a compute intensive problem and the second contributionconsists of a clustering technique which significantly reduces the number offault-injections required to perform selective mitigation.In terrestrial applications, the effect of soft errors in combinatorial logic hasbeen fairly small. It is known that this effect is growing, yet there exist few techniqueswhich can quickly estimate the extent of combinatorial SER for an entireintegrated circuit. The third contribution of this thesis is a hierarchical approachto combinatorial soft error analysis.Systems-on-chip are often developed by re-using design-blocks that come frommultiple sources. In this context, there is a need to develop and exchange reliabilitymodels. The final contribution of this thesis consists of an application specificmodeling language called RIIF (Reliability Information Interchange Format). Thislanguage is able to model how faults at the gate-level propagate up to the block andchip-level. Work is underway to standardize the RIIF modeling language as well asto extend it beyond modeling of radiation-induced failures.In addition to the main axis of research, some tangential topics were studied incollaboration with other teams. One of these consisted in the development of a novelapproach for protecting ternary content addressable memories (TCAMs), a specialtype of memory important in networking applications. The second supplementalproject resulted in an algorithm for quickly generating approximate redundant logicwhich can protect combinatorial networks against permanent faults. Finally anapproach for reducing the detection time for errors in the configuration RAM forField-Programmable Gate-Arrays (FPGAs) was outlined.

This report briefly describes the special requirements for a computer board for use in space. In particular, component selection and ways of mitigating the soft and hard errors are discussed. Furthermore, one implementation for a low-cost, relatively high performance computer that will work in the harsh space environment is presented. The report is primarily intended for those familiar with digital design, who need an introduction to construction of space or other high-reliability hardware. As the quality (resolution) of imagers, spectrometers and other data sources in scientific satellite payloads is increasing, there is also an increasing demand for more processing power in order to compress or in other way process the data before transmitting it on the limited bandwidth microwave downlink to Earth. Scientific instruments are usually mission specific and have rather low budget, so there is a need for a powerful computer board that can be used for a number of missions in order to keep the engineering costs down.

The performance of a modern computing system is improving with technology scaling due to advancements in the modern semiconductor industry. However, the power efficiency along with reliability does not scale linearly with performance efficiency. High leakage and standby power in sub 100 nm technology are critical challenges faced by circuit designers. Recent developments in device physics have shown that emerging non-volatile memories are very effective in reducing power dissipation because they eliminate stand by power and exhibit almost zero leakage powerThis dissertation studies the use of emerging non-volatile memory devices in designing circuit architecture for improving power dissipation and the performance of the computing system. More specically, it proposes a novel spintronic Ternary Content AddressableMemory (TCAM), a novel memristive TCAM with improved power and performance efficiency. Our experimental evaluation on 45 nm technology for a 256-bit word-size spintronic TCAM at a supply voltage of 1 V with a sense margin of 50 mV show that the delay is lessthan 200 ps and the per-bit search energy is approximately 3 fJ. The proposed spintronic TCAM consumes at least 30% less energy when compared to state-of-the-art TCAM designs. The search delay on a 144-bit proposed memristive TCAM at a supply voltage of 1 V and a sense margin of 140 mV is 175 ps with per bit search energy of 1.2 fJ on a 45 nm technology. It is 1.12 x times faster and dissipates 67% less search energy per bit than the fastest existing 144-bit MTCAM design.Emerging non-volatile memories are well known for their ability to perform fast analog multiplication and addition when they are arranged in crossbar fashion and are especially suited for neural network applications. However, such systems require the on-chip implementation of the backpropagation algorithm to accommodate process variations. This dissertation studies the impact of process variation in training memristive neural network architecture. It proposes a low hardware overhead on-chip implementation of the backpropagation algorithm that utilizes effectively the very dense memristive cross-bar arrayand is resilient to process variations.Another important issue that needs a careful study due to shrinking technology node is the impact of space or terrestrial radiation in Integrated Circuits (ICs) because the probability of a high energy particle causing an error increases with a decrease in thethreshold voltage and the noise margin. Moreover, single-event effects (SEEs) sensitivity depends on the set of input vectors used at the time of testing due to logical masking. This dissertation analyzes the impact of input test set on the cross section of the microprocessorand proposes a mechanism to derive a high-quality input test set using an automatic test pattern generation (ATPG) for radiation testing of microprocessors arithmetic and logical units..

L'objectif principal de cette thèse est de développer des techniques d'analyse et mitigation capables à contrer les effets des Evènements Singuliers (Single Event Effects) - perturbations externes et internes produites par les particules radioactives, affectant la fiabilité et la sureté en fonctionnement des circuits microélectroniques complexes. Cette thèse à la vocation d'offrir des solutions et méthodologies industrielles pour les domaines d'applications terrestres exigeant une fiabilité ultime (télécommunications, dispositifs médicaux, ...) en complément des travaux précédents sur les Soft Errors, traditionnellement orientés vers les applications aérospatiales, nucléaires et militaires.Les travaux présentés utilisent une décomposition de sources d'erreurs dans les circuits actuels, visant à mettre en évidence les contributeurs les plus importants.Les upsets (SEU) - Evènements Singuliers (ES) dans les cellules logiques séquentielles représentent actuellement la cible principale pour les efforts d'analyse et d'amélioration à la fois dans l'industrie et dans l'académie. Cette thèse présente une méthodologie d'analyse basée sur la prise en compte de la sensibilité de chaque état logique d'une cellule (state-awareness), approche qui améliore considérablement la précision des résultats concernant les taux des évènements pour les instances séquentielles individuelles. En outre, le déséquilibre intrinsèque entre la susceptibilité des différents états des bascules est exploité pour mettre en œuvre une stratégie d'amélioration SER à très faible coût.Les fautes transitoires (SET) affectant la logique combinatoire sont beaucoup plus difficiles à modéliser, à simuler et à analyser que les SEUs. L'environnement radiatif peut provoquer une multitude d'impulsions transitoires dans les divers types de cellules qui sont utilisés en configurations multiples. Cette thèse présente une approche pratique pour l'analyse SET, applicable à des circuits industriels très complexes. Les principales étapes de ce processus consiste à: a) caractériser complètement la bibliothèque de cellules standard, b) évaluer les SET dans les réseaux logiques du circuit en utilisant des méthodes statiques et dynamiques et c) calculer le taux SET global en prenant en compte les particularités de l'implémentation du circuit et de son environnement.L'injection de fautes reste la principale méthode d'analyse pour étudier l'impact des fautes, erreurs et disfonctionnements causés par les évènements singuliers. Ce document présente les résultats d'une analyse fonctionnelle d'un processeur complexe dans la présence des fautes et pour une sélection d'applications (benchmarks) représentatifs. Des techniques d'accélération de la simulation (calculs probabilistes, clustering, simulations parallèles) ont été proposées et évalués afin d'élaborer un environnement de validation industriel, capable à prendre en compte des circuits très complexes. Les résultats obtenus ont permis l'élaboration et l'évaluation d'un hypothétique scénario de mitigation qui vise à améliorer sensiblement, et cela au moindre coût, la fiabilité du circuit sous test. Les résultats obtenus montrent que les taux d'erreur, SDC (Silent Data Corruption) et DUE (Detectable Uncorrectable Errors) peuvent être considérablement réduits par le durcissement d'un petite partie du circuit (protection sélective). D'autres techniques spécifiques ont été également déployées: mitigation du taux de soft-errors des Flip-Flips grâce à une optimisation du Temporal De-Rating par l'insertion sélective de retard sur l'entrée ou la sortie des bascules et biasing du circuit pour privilégier les états moins sensibles.Les méthodologies, algorithmes et outils CAO proposés et validés dans le cadre de ces travaux sont destinés à un usage industriel et ont été valorisés dans le cadre de plateforme CAO commerciale visant à offrir une solution complète pour l'évaluation de la fiabilité des circuits et systèmes électroniques complexes. / The main objective of this thesis is to develop analysis and mitigation techniques that can be used to face the effects of radiation-induced soft errors - external and internal disturbances produced by radioactive particles, affecting the reliability and safety in operation complex microelectronic circuits. This thesis aims to provide industrial solutions and methodologies for the areas of terrestrial applications requiring ultimate reliability (telecommunications, medical devices, ...) to complement previous work on Soft Errors traditionally oriented aerospace, nuclear and military applications.The work presented uses a decomposition of the error sources, inside the current circuits, to highlight the most important contributors.Single Event Effects in sequential logic cells represent the current target for analysis and improvement efforts in both industry and academia. This thesis presents a state-aware analysis methodology that improves the accuracy of Soft Error Rate data for individual sequential instances based on the circuit and application. Furthermore, the intrinsic imbalance between the SEU susceptibility of different flip-flop states is exploited to implement a low-cost SER improvement strategy.Single Event Transients affecting combinational logic are considerably more difficult to model, simulate and analyze than the closely-related Single Event Upsets. The working environment may cause a myriad of distinctive transient pulses in various cell types that are used in widely different configurations. This thesis presents practical approach to a possible exhaustive Single Event Transient evaluation flow in an industrial setting. The main steps of this process consists in: a) fully characterize the standard cell library using a process and library-aware SER tool, b) evaluate SET effects in the logic networks of the circuit using a variety dynamic (simulation-based) and static (probabilistic) methods and c) compute overall SET figures taking into account the particularities of the implementation of the circuit and its environment.Fault-injection remains the primary method for analyzing the effects of soft errors. This document presents the results of functional analysis of a complex CPU. Three representative benchmarks were considered for this analysis. Accelerated simulation techniques (probabilistic calculations, clustering, parallel simulations) have been proposed and evaluated in order to develop an industrial validation environment, able to take into account very complex circuits. The results obtained allowed the development and evaluation of a hypothetical mitigation scenario that aims to significantly improve the reliability of the circuit at the lowest cost.The results obtained show that the error rate, SDC (Silent Data Corruption) and DUE (Detectable Uncorrectable Errors) can be significantly reduced by hardening a small part of the circuit (Selective mitigation).In addition to the main axis of research, some tangential topics were studied in collaboration with other teams. One of these consisted in the study of a technique for the mitigation of flip-flop soft-errors through an optimization of the Temporal De-Rating (TDR) by selectively inserting delay on the input or output of flip-flops.The Methodologies, the algorithms and the CAD tools proposed and validated as part of the work are intended for industrial use and have been included in a commercial CAD framework that offers a complete solution for assessing the reliability of circuits and complex electronic systems.

Safety-critical applications employed in automotive, avionics and aerospace domains are placed under strict demands for performance, power efficiency and fault tolerance. Development of system hardware and software satisfying all criteria is challenging and time-consuming. System co-design based on specifications and desired high-performance requirements, is one solution to this problem, however, it remains a largely unexplored territory. Currently at KTH Royal Institute of Technology, a co-design framework in relation to theoretical system design models is being researched with the objective to move the embedded system design to a higher abstraction level. Presently, it focuses on correct-by-construction design of low power and reliable safety-critical systems. This thesis intends to assess the accuracy of this framework in comparison to conventional design approaches. The accuracy is evaluated empirically in terms of extra functional requirements - average total power consumption and Mean Time Between Failure (MTBF). A simple payload Central Direct Memory Access (CDMA) application is integrated with Xilinx Soft Error Mitigation (SEM) IP Core and source of system failure is a Single Event Upset (SEU) which occurs due to ionizing radiations. Measurements obtained from this reference system are compared to results determined theoretically from model related equations for the same system. Comparison of measured MTBF values with theoretical estimations shows that measured ones are higher by an average huge difference of 324.63%. Similarly for power consumption, measurements were found to be higher than estimated ones by 0.4465 Watts. In conclusion, it can be said that theoretical model design framework is not accurate and models must somehow take into account implementation dependent factors. Nevertheless, this case study provided a good insight and pathways for enhancements and optimizations to turn this reference into a dependable platform. Finally, future work required for desirable experiment system improvements are identified. / Säkerhetskritiska applikationer som används inom fordons-, flyg- och flygindustrin ställs strikta krav på prestanda, energieffektivitet och feltolerans. Utveckling av systemhårdvara och mjukvara som uppfyller alla kriterier är utmanande och tidskrävande. Systemdesign baserad på specifikationer och önskade högpresterande krav är en lösning på detta problem, men det är fortfarande ett i stort sett outforskat område. För närvarande vid KTH Royal Institute of Technology undersöks ett ramverk för samdesign i relation till teoretiska systemdesignmodeller undersöks med målet att flytta den inbyggda systemdesignen till en högre abstraktionsnivå. Nuvarande, den fokuserar på korrekt konstruktion av låg effekt och pålitliga säkerhetskritiska system. Denna avhandling avser att bedöma riktigheten i detta ramverk i jämförelse med konventionella designmetoder. Noggrannheten utvärderas empiriskt när det gäller extra funktionskrav - genomsnittlig total strömförbrukning och medeltid mellan misslyckande (MTBF). En enkel nyttolast central direktminnesåtkomst (CDMA) applikation är integrerad med Xilinx begränsning av en händelse (SEM) IP kärnan och källan till systemfel är en singelhändelse upprörd (SEU) som uppstår på grund av joniserande strålning. Mätningar erhållna från detta referenssystem jämförs med resultat som bestämts teoretiskt från modellrelaterade ekvationer för samma system. Jämförelse av uppmätta MTBF -värden med teoretiska uppskattningar visar att uppmätta värden är högre med en genomsnittlig enorm skillnad på 324,63%. På samma sätt för strömförbrukning befanns mätningarna vara högre än beräknade med 0,4465 Watt. Sammanfattningsvis kan man säga att det teoretiska ramverket för modelldesign inte är korrekt och att modellerna på något sätt måste ta hänsyn till implementeringsberoende faktorer. Ändå gav denna fallstudie en bra insikt och vägar för förbättringar och optimeringar för att göra denna referens till en pålitlig plattform. Slutligen identifieras framtida arbete som krävs för önskvärda experimentsystemförbättringar.