This thesis presents a joint experimental and theoretical study of a bimolecular collision between OH(A) and H₂ diatoms. The study focuses on the relationship between the initial, <b><i>j</i></b>, and final rotational angular momentum, <b><i>j'</i></b>. This relationship is explored from both a scalar point of view by measuring rotational energy transfer (RET), and a vectorial viewpoint by considering the collisional depolarisation. The experimental technique used in this investigation, Zeeman quantum beat spectroscopy, is first demonstrated by applying it to the determination of the lab-frame orientation of OH(X) photofragments following the photolysis of H₂O₂. The H₂O₂ is photolysed by circularly-polarised light at 248 nm, and Zeeman quantum beat spectroscopy probes the angular momentum orientation as a function of the photofragment spin-rotation level. The results of this experiment are compared with orientation parameters predicted by a simulation that couples the rotation of the parent molecule to the torsional motion during bond cleavage. The calculations from the model agree qualitatively with those from the experiment. The Zeeman quantum beat spectroscopy technique is then used to monitor the evolution of angular momentum polarisation of OH(A) radicals during collisions with H₂. The technique allows for the determination of depolarisation cross sections for oriented and aligned distributions, as a result of collisions with H₂. Alongside this, cross sections for collisional quenching to non-reactive OH(X)+H₂ and reactive H₂O+H products are determined. By resolving the fuorescence with a monochromator the contributions to depolarisation from elastic collisions (the elastic depolarisation cross sections) are measured alongside cross sections for RET. Cross sections for total depolarisation and rotational energy transfer demonstrate only weak dependence on the rotational quantum number of the OH(A) radical, <i>N</i>_OH. Competing quenching processes that fall with <i>N</i>_OH are likely a considerable cause of this weak dependence. Furthermore, the polarisation of the angular momentum of OH(A) is randomised following RET. The elastic depolarisation cross sections make only a small contribution to the depolarisation and fall with increasing <i>N</i>_OH. Collectively these trends have not been seen previously in similar studies on OH(A) collisions with atomic colliders. For the theoretical calculations, a four-atom quasi-classical trajectory (QCT) method has been developed, utilising Lagrangian multipliers to fix the OH(A) and H₂ bonds. The calculations demonstrate that collisions involving the formation of complexes that survive for several rotational periods are prevalent in this collision system, and that these lead to large amounts of depolarisation. The calculations also demonstrate that RET in the H₂ diatom supports higher levels of RET in OH(A) than seen in previous triatomic systems. Additionally, when one diatom is depolarised the accompanying diatom is typically also depolarised. These trends, at least in part, are owed to the highly attractive and anisotropic potential energy surface (PES) describing the interaction. The QCT calculations overestimate the experimentally-measured cross sections by more than a factor of 2. The calculations are adiabatic and do not account for the non-adiabatic activity associated with this collision system, and this is likely one cause of the discrepancies. In an attempt to further account for this overestimation, alternative angular momentum binning approaches for the QCT calculations are developed, but with limited success. Further exploration of the topology of the PES used in the calculations suggests that inadequacies in this surface are a major contributor to the discrepancies.

The present work focuses on the growth and characterizations of GaN and InN layers and nanostructures on p-Si(100) and p-Si(111) substrates by plasma-assisted molecular beam epitaxy and the studies of GaN/p-Si and InN/p-Si heterojunctions properties. The thesis is divided in to seven different chapters. Chapter 1 gives a brief introduction on III-nitride materials, growth systems, substrates, possible device applications and technical background. Chapter 2 deals with experimental techniques including the details of PAMBE system used in the present work and characterization tools for III-nitride epitaxial layers as well as nanostructures. Chapter 3 involves the growth of GaN films on p-Si(100) and p-Si(111) substrates. Phase pure wurtzite GaN films are grown on Si (100) substrates by introducing a silicon nitride layer followed by low temperature GaN growth as buffer layers. GaN films grown directly on Si (100) are found to be phase mixtured, containing both cubic and hexagonal modifications. The x-ray diffraction (XRD), scanning electron microscopy (SEM), photoluminescence (PL) spectroscopy studies reveal that the significant enhancement in the structural and optical properties of GaN films grown with silicon nitride buffer layer grown at 800 oC, when compared to the samples grown in the absence of silicon nitride buffer layer and with silicon nitride buffer layer grown at 600 oC. Core-level photoelectron spectroscopy of SixNy layers reveals the sources for superior qualities of GaN epilayers grown with the high temperature substrate nitridation process. The discussion has been carried out on the typical inverted rectification behavior exhibited by n-GaN/p-Si heterojunctions. Considerable modulation in the transport mechanism is observed with the nitridation conditions. The heterojunction fabricated with the sample of substrate nitridation at high temperature exhibites superior rectifying nature with reduced trap concentrations. Lowest ideality factors (~1.5) are observed in the heterojunctions grown with high temperature substrate nitridation which is attributed to the recombination tunneling at the space charge region transport mechanism at lower voltages and at higher voltages space charge limited current conduction is the dominating transport mechanism. Whereas, thermally generated carrier tunneling and recombination tunneling are the dominating transport mechanisms in the heterojunctions grown without substrate nitridation and low temperature substrate nitridation, respectively. A brief comparison of the structural, optical and heterojunction properties of GaN grown on Si(100) and Si(111) has been carried out. Chapter 4 involves the growth and characterizations of InN nanostructures and thinfilms on p-Si(100) and p-Si(111) substrates. InN QDs are grown on Si(100) at different densities. The PL characteristics of InN QDs are studied. A deterioration process of InN QDs, caused by the oxygen incorporation into the InN lattice and formation of In2O3/InN composite structures was established from the results of TEM, XPS and PL studies. The results confirm the partial oxidation of the outer shell of the InN QDs, while the inner core of the QDs remains unoxidized. InN nanorods are grown on p-Si(100), structural characterizations are carried out by SEM, and TEM. InN nanodots are grown on p-Si(100), structural characterizations are performed. InN films were grown on Si(100) and Si(111) substrates and structural characterizations are carried out. Chapter 5 deals with the the heterojunction properties of InN/p-Si(100) and InN/p-Si(111).The transport behavior of the InN NDs/p-Si(100) diodes is studied at various bias voltages and temperatures. The temperature dependent ZB BH and ideality factors of the forward I-V data are observed, while it is governed through the modified Richardson’s plot. The difference in FB BH and C-V BH and the deviation of ideality factor from unity indicate the presence of inhomogeneities at the interface. The band offsets derived from C-V measurements are found to be Δ EC=1.8 eV and Δ EV =1.3 eV, which are in close agreement with Anderson’s model. The band offsets of InN/p-Si heterojunctions are estimated using XPS data. A type-III band alignment with a valence band offset of Δ EV =1.39 eV and conduction band offset of ΔEC=1.81 eV is identified. The charge neutrality level model provides a reasonable description of the band alignment of the InN/p-Si interface. The interface dipole deduced by comparison with the electron affinity model is 0.06 eV. The transport studies of InN NR/p-Si(100) heterojunctions have been carried out by conductive atomic force microscopy (CAFM) as well as conventional large area contacts. Discussion of the electrical properties has been carried out based on local current-voltage (I-V) curves, as well as on the 2D conductance maps. The comparative studies on transport properties of diodes fabricated with InN NRs and NDs grown on p-Si(100) substrates and InN thin films grown on p-Si(111) substrates have also been carried out. Chapter 6 deals with the growth and characterizations of InN/GaN heterostructures on p-Si(100) and p-Si(111) substarets and also on the InN/GaN/p-Si heterojunction properties. The X-ray diffraction (XRD), scanning electron microscopy (SEM) studies reveal a considerable variation in crystalline quality of InN with grown parameters. Deterioration in the rectifying nature is observed in the case of InN/GaN/p-Si(100) heterojunction substrate when compared to InN/GaN/p-Si (111) due to the defect mediated tunneling effect, caused by the high defect concentration in the GaN and InN films grown on Si(100) and also due to the trap centers exist in the interfaces. Reduction in ideality factor is also observed in the case of n-InN/n-GaN/p–Si(111) when compared to n-InN/n-GaN/p–Si(100) heterojunction. The sum of the ideality factors of individual diodes is consistent with experimentally observed high ideality factors of n-InN/n-GaN/p–Si double heterojunctions due to double rectifying heterojunctions and metal semiconductor junctions. Variation of effective barrier heights and ideality factors with temperature are confirmed, which indicate the inhomogeneity in barrier height, might be due to various types of defects present at the GaN/Si and InN/GaN interfaces. The dependence of forward currents on both the voltage and temperatures are explained by multi step tunneling model and the activation energis were estimated to be 25meV and 100meV for n-InN/n-GaN/p–Si(100) and n-InN/n-GaN/p–Si(111) heterojunctions, respectively. Chapter 7 gives the summary of the present study and also discusses about future research directions in this area.

Les matériaux piézoélectriques, comme le titanate-zirconate de plomb Pb(ZrxTi1-x)O3 (PZT), l’oxyde de zinc ZnO, ainsi que la solution solide de Pb(Mg1/3Nb2/3)O3-PbTiO3 (PMN-PT), sont actuellement l’objet d’études de plus en plus nombreuses à cause de leurs applications innovantes dans les systèmes micro-électromécaniques (MEMS). Afin de les intégrer sur substrat de silicium, certaines précautions doivent être prises en compte concernant par exemple des couches tampon, les électrodes inférieures. Dans cette thèse, des films piézoélectriques (PZT et PMN-PT) ont été épitaxiés avec succès sous forme de monocristaux sur silicium et SOI (silicon-on-insulator) par procédé sol-gel. En effet, des études récentes ont montré que les films piézoélectriques monocristallins semblent posséder des propriétés supérieures à celles des films polycristallins, permettant ainsi une augmentation de la performance des dispositifs MEMS. Le premier objectif de cette thèse était de réaliser l'épitaxie de film monocristallin de matériaux piézoélectriques sur silicium. L'utilisation d’une couche tampon d'oxyde de gadolinium (Gd2O3) ou de titanate de strontium (SrTiO3 ou STO) déposés par la technique d’épitaxie par jets moléculaires (EJM) a été explorée en détail pour favoriser l’épitaxie du PZT et PMN-PT sur silicium. Sur le système Gd2O3/Si(111), l’étude par diffraction des rayons X (XRD) de la croissance du film PZT montre que le film est polyphasé avec la présence de la phase parasite pyrochlore non ferroélectrique. Cependant, le film PZT déposé sur le système STO/Si(001) est parfaitement épitaxié sous forme d’un film monocristallin. Afin de mesurer ses propriétés électriques, une couche de ruthenate de strontium conducteur SrRuO3 (SRO) déposée par ablation laser pulsé (PLD) a été utilisée comme l'électrode inférieure à cause de son excellente conductibilité et de sa structure cristalline pérovskite similaire à celle du PZT. Les caractérisations électriques sur des condensateurs Ru/PZT/SRO démontrent de très bonnes propriétés ferroélectriques avec présence de cycles d'hystérésis. Par ailleurs, le matériau relaxeur PMN-PT a aussi été épitaxié sur STO/Si comme l’a confirmé la diffraction des rayons X ainsi que la microscopie électronique en transmission (TEM). Ce film monocristallin est de la phase de perovskite sans présence de pyrochlore. En outre, une étude en transmission du rayonnement infrarouge au synchrotron a prouvé une transition de phase diffuse sur une large gamme de température, comme attendue dans le cas d’un relaxeur. L'autre intérêt d'avoir des films PZT monocristallins déposés sur silicium et SOI est de pouvoir utiliser les méthodes de structuration du silicium bien standardisées maintenant pour fabriquer les dispositifs MEMS. La mise au point d’un procédé de micro-structuration en salle blanche a permis de réaliser des cantilevers et des membranes afin de caractériser mécaniquement les couches piézoélectriques. Des déplacements par l'application d'une tension électrique ont ainsi pu être détectés par interférométrie. Finalement, cette caractérisation par interférométrie a été combinée avec une modélisation basée sur la méthode des éléments finis. Dans le futur, il sera nécessaire d’optimiser le procédé de microfabrication du dispositif MEMS afin d’en améliorer les performances électromécaniques. Enfin, des caractérisations au niveau du dispositif MEMS lui-même devront être développées en vue de leur utilisation dans de futures applications. / Recently, piezoelectric materials, like lead titanate zirconate Pb(ZrxTi1-x)O3 (PZT), zinc oxide ZnO, and the solid solution Pb(Mg1/3Nb2/3)O3-PbTiO3 (PMN-PT), increasingly receive intensive studies because of their innovative applications in the microelectromechanical systems (MEMS). In order to integrate them on silicon substrate, several preliminaries must be taken into considerations, e.g. buffer layer, bottom electrode. In this thesis, piezoelectric films (PZT and PMN-PT) have been successfully epitaxially grown on silicon and SOI (silicon-on-insulator) in the form of single crystal by sol-gel process. In fact, recent studies show that single crystalline films seem to possess the superior properties than that of polycrystalline films, leading to an increase of the performance of MEMS devices. The first objective of this thesis was to realize the epitaxial growth of single crystalline film of piezoelectric materials on silicon. The use of a buffer layer of gadolinium oxide(Gd2O3) or strontium titanate (SrTiO3 or STO) deposited by molecular beam epitaxy (MBE) has been studied in detail to integrate epitaxial PZT and PMN-PT films on silicon. For Gd2O3/Si(111) system, the study of X-ray diffraction (XRD) on the growth of PZT film shows that the film is polycrystalline with coexistence of the nonferroelectric parasite phase, i.e. pyrochlore phase. On the other hand, the PZT film deposited on STO/Si(001) substrate is successfully epitaxially grown in the form of single crystalline film. In order to measure the electrical properties, a layer of strontium ruthenate (SrRuO3 or SRO) deposited by pulsed laser deposition (PLD) has been employed for bottom electrode due to its excellent conductivity and perovskite crystalline structure similar to that of PZT. The electrical characterization on Ru/PZT/SRO capacitors demonstrates good ferroelectric properties with the presence of hysteresis loop. Besides, the relaxor ferroelectric PMN-PT has been also epitaxially grown on STO/Si and confirmed by XRD and transmission electrical microscopy (TEM). This single crystalline film has the perovskite phase without the appearance of pyrochlore. Moreover, the study of infrared transmission using synchrotron radiation has proven a diffused phase transition over a large range of temperature, indicating a typical relaxor ferroelectric material. The other interesting in the single crystalline PZT films deposited on silicon and SOI is to employ them in the application of MEMS devices, where the standard silicon techniques are used. The microfabrication process performed in the cleanroom has permitted to realize cantilevers and membranes in order to mechanically characterize the piezoelectric layers. Mechanical deflection under the application of an electric voltage could be detected by interferometry. Eventually, this characterization by interferometry has been studied using the modeling based on finite element method and analytic method. In the future, it will be necessary to optimize the microfabrication process of MEMS devices based on single crystalline piezoelectric films in order to ameliorate the electromechanical performance. Finally, the characterizations at MEMS device level must be developed for their utilization in the future applications.

Tato diplomová práce se zabývá přípravou nanostruktur z indium arsenidu (InAs) pomocí metody molekulární svazkové epitaxe (MBE). Důraz je kladen na výrobu struktur ve formě nanodrátů na křemíkovém substrátu. V úvodní části práce je popsána motivace pro studium III-V polovodičů a konkrétně InAs. Následující kapitoly vysvětlují dva základní princpy tvorby nanodrátů. Experimentální část práce diskutuje možnost přípravy indiového katalyzátoru pro samokatalyzovaný růst InAs nanodrátů v konkrétní aparatuře MBE. Následuje prezentace výsledků růstu InAs nanodrátů mechanismem selektivní epitaxe (SAE). Nanodráty byly vyrobeny na substrátu s termálně dekomponovaným oxidem a rovněž na substrátech s litograficky připravenou oxidovou maskou.

Nous présentons une étude des effets de contrainte induits par l’épitaxie dans des couches minces La1-xSrxMnO3 (LSMO) (001) (x = 0.33) pour 3 épaisseurs de films (50, 25 et 12 nm) déposés par Ablation Laser Pulsée (PLD) sur différents substrats tels que SrTiO3 (STO) (001), STO buffered MgO (001), NdGaO3 (NGO) (110) et (LaAlO3)0.3(Sr2AlTaO6)0.7 (LSAT) (001). L’étude est complétée par l’effet de la composition sur les propriétés magnétiques de couches minces de La1-xSrxMnO3 avec x=0,33 et 0,38 déposées par Epitaxie à Jets Moléculaires (MBE). Des caractérisations par diffraction de rayons X (XRD), et microscopie à force atomique (AFM), des mesures de résistivité électrique en quatre points en fonction de la température, d’aimantation par magnetometrie à SQUID (Superconducting Quantum Interference Device) et d’anisotropie magnétique par magnétométrie magnéto-optique Kerr vectorielle (MOKE) sont présentées. Les évolutions angulaires de l’anisotropie magnétique, de l’aimantation à rémanence, du champ coercitif et du champ de renversement d’aimantation ont ainsi pu être analysées pour des films épitaxiés LSMO de différentes épaisseurs. Des études en fonction de la température complètent les données. L’origine de l’anisotropie (magnétique, magnétocristalline, magnétostrictive ou liée aux effets de marches et d’angle de désorientation du substrat) est finalement discutée. / We report a quantitative analysis of thickness dependent epitaxial strain-induced effects in La1-xSrxMnO3 (LSMO) (001) (x = 0.33) thin films of thicknesses (50, 25 and 12 nm) grown on various single crystal substrates such as SrTiO3 (STO) (001), STO buffered MgO (001), NdGaO3 (NGO) (110) and (LaAlO3)0.3(Sr2AlTaO6)0.7 (LSAT) (001) by Pulsed Laser Deposition (PLD) technique. We also report the composition dependent magnetic properties of LSMO thin films with x = 0.33 and 0.38 in particular grown onto LSAT (001) substrate by Molecular Beam Epitaxy (MBE). The study mainly includes measurements such as X-ray Diffraction (XRD), Atomic Force Microscopy (AFM), temperature dependent four-probe resistivity, magnetization properties by Superconducting Quantum Interference Device (SQUID), magnetic anisotropy by Magneto-Optical Kerr Magnetometry (MOKE). Our results highlight the detailed study of angular evolution and thickness dependent magnetic anisotropy, remanence, coercivity and switching field in epitaxial LSMO thin films. Temperature-dependent studies are also performed on few selected films. We will also discuss the cause of magnetic anisotropy in LSMO films i.e., magneto-crystalline and magnetostriction anisotropy and the effects of steps or substrate mis-cut induced anisotropy.

L’intégration monolithique hétérogène de composants III-N sur silicium (Si) offre de nombreuses possibilités en termes d’applications. Cependant, gérer l’hétéroépitaxie de matériaux à paramètres de maille et coefficients de dilatation très différents, tout en évitant les contaminations, et concilier des températures optimales de procédé parfois très éloignées requière inévitablement certains compromis. Dans ce contexte, nous avons cherché à intégrer des transistors à haute mobilité électronique (HEMT) à base de nitrure de Gallium (GaN) sur substrat Si par épitaxie sous jets moléculaires (EJM) en vue de réaliser des circuits monolithiques GaN sur CMOS Si. / The monolithic integration of heterogeneous devices and materials such as III-N compounds with silicon (Si) CMOS technology paves the way for new circuits applications and capabilities for both technologies. However, the heteroepitaxy of such materials on Si can be challenging due to very different lattice parameters and thermal expansion coefficients. In addition, contamination issues and thermal budget constraints on CMOS technology may prevent the use of standard process parameters and require various manufacturing trade-offs. In this context, we have investigated the integration of GaN-based high electron mobility transistors (HEMTs) on Si substrates in view of the monolithic integration of GaN on CMOS circuits.

Trotz einer Vielzahl von Forschungsarbeiten auf dem Gebiet der Phthalocyanin-basierten organischen Verbindungen fehlt nach wie vor ein umfassendes Verständnis des Zusammenspiels zwischen strukturellen und elektronischen Eigenschaften, die sich bei der Abscheidung dieser Stoffe auf anorganische kristallinen Substraten ausbilden. Vor diesem Hintergrund wurden für die vorliegende Arbeit vier metallbasierte Phthalocyanine ausgewählt und mittels organischer Molekularstrahl-Abscheidung (OMBD) im Ultrahochvakuum (UHV) auf Ag (111) Einkristalle adsorbiert. Für die anschließende eingehende Untersuchung dieser Proben wurden insbesondere Rastertunnelmikroskopie (STM) und -spektroskopie (STS) angewandt. Ergänzend kamen Ultraviolett- und Röntgen-Photoelektronenspektroskopie (UPS und XPS) zum Einsatz, wodurch komplementäre Informationen gewonnen wurden. Die aus diesen Untersuchungen resultierenden Ergebnisse liefern einen wesentlichen Beitrag zum oben genannten Forschungsgebiet. Die in dieser Arbeit untersuchten Metall-Phthalocyanine (MePc) wurden so ausgewählt, dass eine möglichst große Vielfalt an geometrischen und elektronischen Eigenschaften abgedeckt wurde. Planare cobaltbasierte Phthalocyanin-Moleküle wurden in zwei Konfigurationen untersucht: einerseits das protonierte CoPc, das sich als organischer p-Halbleiter verhält, und andererseits das vollständig fluorinierte F16CoPc, das n-Halbleitereigenschaften besitzt. Bei beiden Systemen zeigte sich an der Position des Cobaltions eine Kopplung zwischen den Molkülorbitalen des Adsorbats und den Elektronenzuständen des Substrates. Das nichtplanare Zinn-Phthalocyanin ist von besonderem Interesse aufgrund seiner beiden möglichen Adsorptionskonformationen up und down, bei denen sich das Sn-Ion oberhalb beziehungsweise unterhalb des Phthalocyaninliganden befindet. Damit stellt dieses System einen möglichen Kandidaten für Anwendungen als molekularer Schalter oder als Speichereinheit dar. In der vorliegenden Studie werden lokalisierte Schaltvorgänge einzelner Moleküle zusammen mit der Möglichkeit einer kontrollierten molekularen Nanostrukturierung gezeigt. Lutetium (III) bisphthalocyanin wurde ausgewählt als Vertreter einer neuen Gruppe von MePc, die eine Sandwichstruktur ausbilden, bei der zwei π-konjugierte Phthalocyaninliganden über ein Seltenerd-Ion miteinander verbunden sind. Die Untersuchung dieses Systems liefert wichtige neue Erkenntnisse, wie zum Beispiel ein umfassendes Verständnis der Vorgänge bei der Selbstassemblierung innerhalb der ersten und zweiten organischen Monolage. Zudem wurde bei der Charakterisierung des Tunneltransports durch einzelne Moleküle mittels STS ein negativer differentieller Widerstand (NDR) gefunden, der von der Anzahl molekularer Lagen abhängt.

The term "topological insulator" (TI) represents a novel class of compounds which are insulating in the bulk, but simultaneously and unavoidably have a metallic surface. The reason for this is the non-trivial band topology, arising from particular band inversions and the spin-orbit interaction, of the bulk. These topologically protected metallic surface states are characterized by massless Dirac dispersion and locked helical spin polarization, leading to forbidden back-scattering with robustness against disorder. Based on the extraordinary features of the topological insulators an abundance of new phenomena and many exciting experiments have been proposed by theoreticians, but still await their experimental verification, not to mention their implementation into applications, e.g. the creation of Majorana fermions, advanced spintronics, or the realization of quantum computers. In this perspective, the 3D TIs Bi2Te3 and Bi2Se3 gained a lot of interest due to their relatively simple electronic band structure, having only a single Dirac cone at the surface. Furthermore, they exhibit an appreciable bulk band gap of up to ~ 0.3 eV, making room temperature applications feasible. Yet, the execution of these proposals remains an enormous experimental challenge. The main obstacle, which thus far hampered the electrical characterization of topological surface states via transport experiments, is the residual extrinsic conductivity arising from the presence of defects and impurities in their bulk, as well as the contamination of the surface due to exposure to air. This thesis is part of the actual effort in improving sample quality to achieve bulk-insulating Bi2Te3 films and study of their electrical properties under controlled conditions. Furthermore, appropriate capping materials preserving the electronic features under ambient atmosphere shall be identified to facilitate more sophisticated ex-situ experiments. Bi2Te3 thin films were fabricated by molecular beam epitaxy (MBE). It could be shown that, by optimizing the growth conditions, it is indeed possible to obtain consistently bulk-insulating and single-domain TI films. Hereby, the key factor is to supply the elements with a Te/Bi ratio of ~8, while achieving a full distillation of the Te, and the usage of substrates with negligible lattice mismatch. The optimal MBE conditions for Bi2Te3 were found in a two-step growth procedure at substrate temperatures of 220°C and 250°C, respectively, and a Bi flux rate of 1 Å/min. Subsequently, the structural characterization by high- and low-energy electron diffraction, photoelectron spectroscopy, and, in particular, the temperature-dependent conductivity measurements were entirely done inside the same ultra-high vacuum (UHV) system, ensuring a reliable record of the intrinsic properties of the topological surface states. Bi2Te3 films with thicknesses ranging from 10 to 50 quintuple layers (QL; 1QL~1 nm) were fabricated to examine, whether the conductivity is solely arising from the surface states. Angle resolved photoemission spectroscopy (ARPES) demonstrates that the chemical potential for all these samples is located well within the bulk band gap, and is only intersected by the topological surface states, displaying the characteristic linear dispersion. A metallic-like temperature dependency of the sheet resistance is observed from the in-situ transport experiments. Upon going from 10 to 50QL the sheet resistance displays a variation by a factor 1.3 at 14K and of 1.5 at room temperature, evidencing that the conductivity is indeed dominated by the surface. Low charge carrier concentrations in the range of 2–4*10^12 cm^−2 with high mobility values up to 4600 cm2/Vs could be achieved. Furthermore, the degradation effect of air exposure on the conductance of the Bi2Te3 films was quantified, emphasizing the necessity to protect the surface from ambient conditions. Since the films behave inert to pure oxygen, water/moisture is the most probable source of degeneration. Moreover, epitaxially grown elemental tellurium was identified as a suitable capping material preserving the properties of the intrinsically insulating Bi2Te3 films and protecting from alterations during air exposure, facilitating well-defined and reliable ex-situ experiments. These findings serve as an ideal platform for further investigations and open the way to prepare devices that can exploit the intrinsic features of the topological surface states.:Abstract Kurzfassung Acronyms List of Symbols Introduction 1 Topological insulators 1.1 Basic theory of topological insulators 1.2 3D topological insulator materials: bismuth chalcogenides 2 Experimental techniques 2.1 General layout of the UHV-system 2.2 Molecular beam epitaxy 2.3 Structural and spectroscopic characterization 2.3.1 RHEED and LEED 2.3.2 Photoelectron spectroscopy 2.3.3 Ex situ x-ray diffraction 2.4 In situ electrical resistance measurements 2.4.1 In situ transport setup 2.4.2 Measurement equipment and operation modes 2.5 Substrates and sample holders 3 MBE growth and structural characterization of Bi2Te3 thin films 3.1 Bi2Te3 growth optimization and in situ structural characterization 3.1.1 1-step growth on Al2O3 (0001) 3.1.2 2-step growth on Al2O3 (0001) 3.1.3 2-step growth on BaF2 (111) 3.2 Ex situ structural characterization 4 In situ spectroscopy and transport properties of Bi2Te3 thin films 4.1 In situ spectroscopy of Bi2Te3 thin films 4.1.1 XPS 4.1.2 ARPES 4.2 Combined ARPES and in situ electrical resistance measurements of bulk-insulating Bi2Te3 thin films 4.2.1 Quality of the in situ electrical sample contacts 4.2.2 Verification of the intrinsic conduction through topological surface states of bulk-insulating Bi2Te3 thin films 5 Effect of surface contaminants on the TI properties 5.1 Effect of air exposure on the electrical conductivity of Bi2Te3 surfaces 5.2 Determination of the contaminants causing degradation of the TI properties 5.3 Long-time resistance behavior of a Bi2Te3 film exposed to minimal traces of contaminants 6 Protective capping of bulk-insulating Bi2Te3 thin films 6.1 Capping with BaF2 6.1.1 MBE growth and structure of BaF2 on Bi2Te3 thin films 6.1.2 Electron spectroscopy and electrical transport properties of BaF2 capped Bi2Te3 6.2 Capping with tellurium 6.2.1 MBE growth and structure of Te on Bi2Te3 thin films 6.2.2 Photoelectron spectroscopy and electrical transport properties of Te capped Bi2Te3 6.2.3 De-capping of Te 6.2.4 Efficiency of Te capping against air exposure 7 Conclusion and outlook Bibliography Versicherung Curriculum vitae Veröffentlichungen / Der Begriff "Topologischer Isolator" (TI) beschreibt eine neuartige Klasse von Verbindungen deren Inneres (engl. Bulk) isolierend ist, dieses Innere aber gleichzeitig und zwangsläufig eine metallisch leitende Oberfläche aufweist. Dies ist begründet in der nicht-trivialen Topologie dieser Materialien, welche durch eine spezielle Invertierung einzelner Bänder in der Bandstruktur und der Spin-Bahn-Kopplung im Materialinneren hervorgerufen ist. Diese topologisch geschützten, metallischen Oberflächenzustände sind gekennzeichnet durch eine masselose Dirac Dispersionsrelation und gekoppelte Helizität der Spinpolarisation, welche die Rückstreuung der Ladungsträger verbietet und somit zur Stabilisierung der Zustände gegenüber Störungen beiträgt. Auf Grundlage dieser außergewöhnlichen Merkmale haben Theoretiker eine Fülle neuer Phänomene und spannender Experimente vorhergesagt. Deren experimentelle Überprüfung steht jedoch noch aus, geschweige denn deren Umsetzung in Anwendungen, wie zum Beispiel die Erzeugung von Majorana Teilchen, fortgeschrittene Spintronik, oder die Realisierung von Quantencomputern. Aufgrund ihrer relativ einfachen Bandstruktur, welche nur einen Dirac-Kegel an der Oberfläche aufweist, haben die 3D TI Bi2Te3 und Bi2Se3 in den letzten Jahren großes Interesse erlangt. Weiterhin besitzen diese Materialien eine merkliche Bandlücke von bis zu ~0,3 eV, welche sogar Anwendungen bei Raumtemperatur ermöglichen könnten. Dennoch ist deren experimentelle Umsetzung nachwievor eine enorme Herausforderung. Das Haupthindernis, welches bis jetzt insbesondere die elektrische Charakterisierung the topologischen Oberflächenzustände behindert hat, ist die zusätzliche Leitfähigkeit des Materialinneren, welche durch Kristalldefekte und Beimischungen, sowie die Verunreinigung der Probenoberfläche durch Luftexposition bedingt wird. Die vorliegende Arbeit liefert einen Beitrag zu aktuellen den Anstrengungen in der Verbesserung der Probenqualität der TI um die Leitfähigkeit des Materialinneren zu unterdrücken, sowie die anschließende Untersuchung der elektrischen Eigenschaften unter kontrollierten Bedingungen durchzuführen. Weiterhin sollen geeignete Deckschichten identifiziert werden, welche die besonderen elektronischen Merkmale der TI nicht beeinflussen sowie diese gegen äußere Einflüsse schützen, und somit die Durchführung anspruchsvoller ex situ Experimente ermöglichen können. Die untersuchten Bi2Te3 Schichten wurden mittels Molekularstrahlepitaxie (MBE) hergestellt. Es konnte gezeigt werden, dass es allein durch Optimierung der Wachstumsbedingungen möglich ist Proben herzustellen, die gleichbleibend isolierende Eigenschaften des TI Inneren aufweisen und Eindomänen-Ausrichtung besitzen. Die zentralen Faktoren sind hierbei die Aufrechterhaltung eines Flussratenverhältnisses von Te/Bi ~8 der einzelnen Elemente, sowie die Wahl einer ausreichend hohen Substrattemperatur, um ein vollständiges Abdampfen (Destillation) des überschüssigen Tellur zu erreichen. Weiterhin müssen Substrate mit gut angepassten Gitterparametern verwendet werden, welches bei BaF2 (111) gegeben ist. Optimales MBE Wachstum konnte durch ein Zwei-Stufen Prozess bei Substrattemperaturen von 220°C und 250°C und einer Bi-Verdampfungsrate von 1 Å/min erreicht werden. Die nachfolgende Charakterisierung der strukturellen Eigenschaften, Photoelektronenspektroskopie, sowie temperaturabhängige Leitfähigkeitsmessungen wurden alle in einem zusammenhängenden Ultrahochvakuum-System durchgeführt. Auf diese Weise wird eine zuverlässige Erfassung der intrinsischen Eigenschaften der TI sichergestellt. Zur Überprüfung, ob die Leitfähigkeit der Proben tatsächlich nur durch die Oberflächenzustände hervorgerufen wird, wurden Filme mit Schichtdicken im Bereich von 10 bis 50 Quintupel-Lagen (QL; 1QL~ 1 nm) hergestellt und charakterisiert. Winkelaufgelöste Photoelektronenspektroskopie (ARPES) belegt, dass das chemische Potential (Fermi-Niveau) in allen Proben innerhalb der Bandlücke der Bandstruktur des Materialinneren liegt und nur von den topologisch geschützten Oberflächenzuständen gekreuzt wird, welche die charakteristische lineare Dirac Dispersionsrelation aufweisen. Die temperaturabhängigen Widerstandsmessungen zeigen ein metallisches Verhalten aller Proben. Bei der Variation der Schichtdicke von 10 zu 50QL wird eine Streuung des Flächenwiderstandes vom Faktor 1,3 bei 14K und 1,5 bei Raumtemperatur beobachtet. Dies beweist, dass die gemessene Leitfähigkeit vorrangig durch die topologisch geschützten Oberflächenzustände hervorgerufen wird. Eine geringe Oberflächenladungsträgerkonzentration im Bereich von 2–4*10^12 cm^−2 und hohe Mobilitätswerte von bis zu 4600 cm2/Vs wurden erreicht. Weiterhin wurden die negativen Auswirkungen auf die Eigenschaften der TI durch Luftexposition quantifiziert, welches die Notwendigkeit belegt, die Oberfläche der TI vor Umgebungseinflüssen zu schützen. Die Proben verhalten sich inert gegenüber reinem Sauerstoff, daher ist Wasser aus der Luftfeuchte höchstwahrscheinlich der Hauptgrund für die beobachtbare Verschlechterung. Darüber hinaus konnte epitaktisch gewachsenes Tellur als geeignete Deckschicht ausfindig gemacht werden, welches die Eigenschaften der Bi2Te3 Filme nicht beeinflusst, sowie gegen Veränderungen durch Luftexposition schützt. Die gewonnenen Erkenntnisse stellen eine ideale Grundlage für weiterführende Untersuchungen dar und ebnen den Weg zur Entwicklung von Bauelementen welche die spezifischen Besonderheiten der topologischen Oberflächenzustände.:Abstract Kurzfassung Acronyms List of Symbols Introduction 1 Topological insulators 1.1 Basic theory of topological insulators 1.2 3D topological insulator materials: bismuth chalcogenides 2 Experimental techniques 2.1 General layout of the UHV-system 2.2 Molecular beam epitaxy 2.3 Structural and spectroscopic characterization 2.3.1 RHEED and LEED 2.3.2 Photoelectron spectroscopy 2.3.3 Ex situ x-ray diffraction 2.4 In situ electrical resistance measurements 2.4.1 In situ transport setup 2.4.2 Measurement equipment and operation modes 2.5 Substrates and sample holders 3 MBE growth and structural characterization of Bi2Te3 thin films 3.1 Bi2Te3 growth optimization and in situ structural characterization 3.1.1 1-step growth on Al2O3 (0001) 3.1.2 2-step growth on Al2O3 (0001) 3.1.3 2-step growth on BaF2 (111) 3.2 Ex situ structural characterization 4 In situ spectroscopy and transport properties of Bi2Te3 thin films 4.1 In situ spectroscopy of Bi2Te3 thin films 4.1.1 XPS 4.1.2 ARPES 4.2 Combined ARPES and in situ electrical resistance measurements of bulk-insulating Bi2Te3 thin films 4.2.1 Quality of the in situ electrical sample contacts 4.2.2 Verification of the intrinsic conduction through topological surface states of bulk-insulating Bi2Te3 thin films 5 Effect of surface contaminants on the TI properties 5.1 Effect of air exposure on the electrical conductivity of Bi2Te3 surfaces 5.2 Determination of the contaminants causing degradation of the TI properties 5.3 Long-time resistance behavior of a Bi2Te3 film exposed to minimal traces of contaminants 6 Protective capping of bulk-insulating Bi2Te3 thin films 6.1 Capping with BaF2 6.1.1 MBE growth and structure of BaF2 on Bi2Te3 thin films 6.1.2 Electron spectroscopy and electrical transport properties of BaF2 capped Bi2Te3 6.2 Capping with tellurium 6.2.1 MBE growth and structure of Te on Bi2Te3 thin films 6.2.2 Photoelectron spectroscopy and electrical transport properties of Te capped Bi2Te3 6.2.3 De-capping of Te 6.2.4 Efficiency of Te capping against air exposure 7 Conclusion and outlook Bibliography Versicherung Curriculum vitae Veröffentlichungen

Sources of single and polarization-entangled photons are an essential component in a variety of potential quantum information applications. Suitable emitters need to generate photons deterministically and at fast repetition rates, with highest degrees of single-photon purity, entanglement and indistinguishability. Semiconductor quantum dots are among the leading candidates for this task, offering entangled-photon pair emission on-demand, challenging current state-of-the-art sources based on the probabilistic spontaneous parametric down-conversion (SPDC). Unfortunately, their susceptibility to perturbations from the solid-state environment significantly affects the photon coherence and entanglement degree. Furthermore, most quantum dot types suffer from poor wavelength control and emitter yield, due to a random growth process. This thesis investigates the emerging family of GaAs/AlGaAs quantum dots obtained by in-situ Al droplet etching and nanohole infilling. Particular focus is laid on the interplay of growth parameters, quantum dot morphology and optical properties. An unprecedented emission wavelength control with distributions as narrow as ± 1 nm is achieved, using four independent growth parameters: The GaAs infilling amount, the deposition sequence, the migration time and the Al concentration in the barrier material. This enables the generation of large emitter ensembles tailored to match the optical transitions of rubidium, a leading quantum memory candidate. The photon coherence is enhanced by an optimized As flux during the growth process using the GaAs surface reconstruction. With these improvements, we demonstrate for the first time two-photon interference from separate, frequency-stabilized quantum dots using a rubidium-based Faraday filter as frequency reference. Two-photon resonant excitation of the biexciton state is employed for the coherent and deterministic generation of photon pairs with negligible multi-photon emission probability. The GaAs/AlGaAs quantum dots exhibit a very small average fine structure of (4.8 ±2.4) µeV and short average radiative lifetimes of 200 ps, enabling entanglement fidelities up to F = 0.94, which are among the highest reported for any entangled-photon source to date. Furthermore, almost all fabricated emitters on a single wafer exhibit fidelities beyond the classical limit - without any post-growth tuning. By embedding the quantum dots into a broadband-optical antenna we enhance the photon collection efficiency significantly without impairing the high degrees of entanglement. Thus, for the first time, quantum dots are able to compete with SPDC sources, paving the way towards the realization of a semiconductor-based quantum repeater - among many other key enabling quantum photonic elements.:Contents List of Figures ix List of Tables xiii 1 Introduction 1 1.1 Researchmotivation ...................1 1.1.1 Structure of this thesis ................. 3 1.2 Applications based on entangled photons ............. 4 1.2.1 Quantum bits ...................4 1.2.2 Quantum key distribution ................ 5 1.2.3 Qubit teleportation .................. 7 1.2.4 Teleportation of entanglement ..............9 1.2.5 The photonic quantumrepeater .............. 10 1.3 Generation of entangled photons ...............12 1.3.1 The ideal entangled-photon source ............. 12 1.3.2 Non-deterministic photon sources ............. 13 1.3.3 Deterministic photon sources ..............14 2 Fundamentals 17 2.1 Semiconductor quantumdots ................17 2.1.1 Introduction to semiconductor quantum dots .......... 17 2.1.2 Formation of confined excitonic states ............ 19 2.1.3 Energy hierarchy of excitonic states ............. 21 2.2 Entangled photons from semiconductor quantumdots ......... 22 2.2.1 The concept of entanglement ............... 22 2.2.2 Polarization-entangled photon pairs fromthe biexciton radiative decay .. 23 2.2.3 Origin and impact of the exciton fine structure splitting ....... 25 2.2.4 Impact of spin-scattering, dephasing and background photons on the degree of entanglement ..................29 2.3 Quantum dot entangled-photon sources - State of the art ........32 2.4 Exciton radiative lifetime .................. 34 2.4.1 The concept of radiative lifetime .............. 34 2.4.2 Measurement of the radiative lifetime ............35 2.5 Single-photon purity ...................37 2.5.1 Photon number distributions ............... 37 2.5.2 Second-order correlation function .............38 2.5.3 Measurement of the second-order correlation function ....... 40 2.6 Measurement of entanglement ................42 2.6.1 Quantum state tomography ...............43 2.7 Photon coherence and spectral linewidth .............46 2.7.1 The concept of coherence ................ 46 2.7.2 First-order coherence ................. 46 2.7.3 Relation between coherence and spectral linewidth ........ 49 2.7.4 homogeneous vs. inhomogeneous broadening in single quantumdots ..50 2.8 Photon indistinguishability .................51 2.8.1 Hong-Ou-Mandel interference ..............51 2.8.2 Hong-Ou-Mandel interference between photons fromseparate sources .. 52 2.8.3 The Bell state measurement with linear optics .......... 53 3 Experimentalmethods 55 3.1 The GaAs and AlAs material system ............... 55 3.2 Molecular beam epitaxy ..................56 3.2.1 The Concept of molecular beam epitaxy ...........56 3.2.2 Layout and components of the III-V Omicron MBE ........58 3.2.3 Growth parameters .................. 59 3.2.4 Reflection high-energy electron diffraction (RHEED) ........ 60 3.2.5 Growth rate determination using RHEED oscillations .......61 3.3 Optical setups .....................63 4 Results 67 4.1 Growth of GaAs/AlGaAs quantum dots by in-situ Al droplet etching .....68 4.1.1 Motivation for the study of GaAs / AlGaAs quantum dots ......68 4.1.2 GaAs / AlGaAs quantum dot growth process ..........69 4.1.3 Interplay between growth parameters, quantumdot morphology and optical properties ................. 71 4.1.4 Nanohole morphology and quantumdot formation ........ 73 4.1.5 Optical characterization ................75 4.1.6 Deterministic wavelength control .............77 4.1.7 Photon coherence and radiative lifetime ...........84 4.1.8 Decoherence processes in semiconductor quantum dots ......86 4.1.9 Chamber conditioning and growth process optimization ......87 4.1.10 Arsenic flux calibration using the GaAs surface reconstruction ..... 88 4.1.11 Enhanced photon coherence after growth process adjustments ....92 4.2 Two-photon interference from frequency-stabilized GaAs/AlGaAs quantum dots .................94 4.2.1 Frequency tuning of semiconductor quantumdots ........95 4.2.2 Experimental setup .................. 95 4.2.3 Optical characterization of the separate GaAs/AlGaAs quantum dots ... 98 4.2.4 Faraday anomalous dispersion optical filter and frequency feedback ... 99 4.2.5 Two-photon interference between remote, frequency-stabilized quantum dots 100 4.3 Solid-state ensemble of highly entangled photon sources at rubidiumatomic transitions ........................102 4.3.1 Fine-structure splitting ................103 4.3.2 Resonant excitation of the biexciton state ...........105 4.3.3 Single photon purity and radiative lifetime ........... 107 4.3.4 Radiative lifetime of GaAs/AlGaAs quantumdots - comparison to other quantumdot types ...................108 4.3.5 Degree of entanglement ................109 4.3.6 Highly-efficient extraction of the obtained entangled photons ..... 116 5 Conclusions 119 5.1 Summary ....................... 119 5.2 Discussion and outlook ..................122 Bibliography 127 Publications and scientific presentations 150 Acknowledgments 154 Selbstständigkeitserklärung 157 Curriculum vitae 157

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