Logging While Drilling (LWD) instruments used in oil and gas exploration are subjected to extreme environmental conditions that make reliable operation a major challenge. The sensors directly exposed to this environment experience accelerated aging and may suffer physical damage leading to failure. The cost of drilling and rig operations is very high magnifying any failures or issues with LWD tools. The goal of this report is to present a built-in self-test for an instrument sensor that provides a means to evaluate sensor functionality. The sensor is a piezoelectric ultrasonic transducer. A brief review of the sensor physics will be given. I will review some methods for characterizing piezoelectric ceramic materials and transducers. The application of sensor test methods is applied in an ultrasound pulse-echo application. A brief review of the application circuit will be covered including state of the art in commercial ultrasound integrated circuit design. A prototype of the BIST method is evaluated using test transducers to verify the circuit provides indication of a transducers ability to function correctly. The prototype is achieved through the AD5933 demo board and MATLAB is used for data processing. / text

Jitter is a dominant factor contributing to a high bit error rate (BER) in high speed I/O circuitry, and it aggravates the quality of a clock signal from a phase-locked loop (PLL), subsequently impacting a given timing budget. The recent proliferation of systems-on-a-chip (SoCs) with help of technology scaling makes jitter measurement more challenging as the SoCs integrate more I/O circuitry and PLLs within a chip. Jitter has been, however, one of the most difficult parameters to measure accurately when validating the high speed serial I/O circuitry or PLLs, mostly due to its small value. External instruments with full-fledged high precision measurement hardware, along with comprehensive analysis tools, have been used for jitter measurement, but increased test cost from long test time, signal integrity, and human intervention prevent this approach from being used for high volume manufacturing testing. Built-in self-test (BIST) solutions have recently become attractive to overcome these drawbacks, but complicated analog circuit designs that are sensitive to ever increasing process variations, and associated complex analysis methods impede their adoption in the SoCs. This dissertation studies practical random jitter measurement methods that achieve measurement accuracy by exploiting a differential approach and make the proposed methods tester-friendly solutions for an automatic test equipment (ATE). We first propose a method of measuring the average value of the random jitter, rather than measuring the jitter at every clock cycle, that can be converted to the root-mean-square (RMS) value of the random jitter, which is the key indicator of the quantity of the random jitter. Then, we propose a simple but accurate delay measurement method which uses the proposed jitter measurement method for random jitter measurement when a reference signal, such as a golden PLL output in high speed I/O validation, is not available. The validity of the proposed random jitter measurement method is supported by measurement results from a test chip. The impact of substrate noise on the signal of interest is also shown with measurements using a test chip. To address the random jitter of a clock signal when the clock is operating in its functional mode, we demonstrate a novel method for random jitter measurement that explores the shmoo capability of a low-cost production tester without relying on any BIST circuitry. / text

Analog and mixed signal device testing is resource intensive due to the spectral and temporal speci cations of the input/output interface signals. These devices and circuits are commonly validated by parametric speci fication tests to ensure compliance with the required performance criteria. Analog signal complexity increases resource requirements for the Automatic Test Equipment (ATE) systems used for commercial testing, making mixed signal testing resource ine cient as compared to digital structural testing. This dissertation proposes and implements a test ecosystem to address these constraints where Built In Self Test (BIST) modules are designed for internal stimulus generation. Data learning and processing algorithms are developed for output response shaping. This modi ed output response is then compared against the established performance matrices to maintain test quality with low cost receiver hardware. BIST modules reduce dependence on ATE resources for stimulus and output observation while improving capability to test multiple devices in parallel. Data analysis algorithms are used to predict specification parameters based on learning methods applied to measurable device parameters. Active hardware resources can be used in conjunction with post processing resources to implement complex speci cation based tests within the hardware limitations. This dissertation reviews the results obtained with the consolidated approach of using BIST, output response analysis and active hardware resources to reduce test cost while maintaining test quality. / text

The movement to smart mobile connected devices which consolidate functions of traditionally separate devices is driving innovation in System-on-chips (SoCs). One of the innovations helping to meet the current needs of SoCs is the integration of larger memory with the processor, and with this, comes the challenge of testing all the memory cells. The programmable memory BIST offers a flexible approach to designers and testers because it allows the memory test algorithms to be updated when new memory fault models are discovered. But this flexibility comes as a trade-off to area as the BIST circuitry needs to be integrated next to the memory array. This report proposes enhancements to an existing design that will improve flexibility by enhancing the address generation schemes while simultaneously eliminating the need for an auxiliary memory in cases where a Type-1 NPSF background will be used. A comparison of the base design to the proposed design shows the address and data generation improvements can be achieved with only 1.8% increase in area with an 8KB memory. / text

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Since the invention of SRAM (Static Random Access Memory), many improvements have been proposed. The major targets are speed, area, and power consumption. The evolution of the CMOS process technology makes it possible to implement SRAM by using dual threshold voltage transistors. Hence, we will use TSMC (Taiwan Semiconductor Manufacturing Company) 0.25 $mu$m 1P5M CMOS process to realize the dual threshold voltage SRAM in this thesis. In order to reduce SRAM internal power consumption, we also propose quenchers to suppress unwanted oscillation between bit lines. In addition, several types of BIST (Build In Self Test) comparators are also proposed to test the mentioned SRAM. After detailed simulations, the proposed comparators possess impressive results in high fan-in, low transistor count, and high speed. The proposed SRAM and BIST comparators are fabricated by the CMOS process provided by National Science Council Chip Implementation Center (CIC). The measurements of the chips are fully corrected to meet the design goals.

abstract: RF transmitter manufacturers go to great extremes and expense to ensure that their product meets the RF output power requirements for which they are designed. Therefore, there is an urgent need for in-field monitoring of output power and gain to bring down the costs of RF transceiver testing and ensure product reliability. Built-in self-test (BIST) techniques can perform such monitoring without the requirement for expensive RF test equipment. In most BIST techniques, on-chip resources, such as peak detectors, power detectors, or envelope detectors are used along with frequency down conversion to analyze the output of the design under test (DUT). However, this conversion circuitry is subject to similar process, voltage, and temperature (PVT) variations as the DUT and affects the measurement accuracy. So, it is important to monitor BIST performance over time, voltage and temperature, such that accurate in-field measurements can be performed. In this research, a multistep BIST solution using only baseband signals for test analysis is presented. An on-chip signal generation circuit, which is robust with respect to time, supply voltage, and temperature variations is used for self-calibration of the BIST system before the DUT measurement. Using mathematical modelling, an analytical expression for the output signal is derived first and then test signals are devised to extract the output power of the DUT. By utilizing a standard 180nm IBM7RF CMOS process, a 2.4GHz low power RF IC incorporated with the proposed BIST circuitry and on-chip test signal source is designed and fabricated. Experimental results are presented, which show this BIST method can monitor the DUT’s output power with +/- 0.35dB accuracy over a 20dB power dynamic range. / Dissertation/Thesis / Masters Thesis Electrical Engineering 2015

The ever-increasing complexity and size of current circuit designs have made testing and verification major bottlenecks in the design flow of VLSI (Very Large Scale Integrated) circuits. Statistics show that more than 70% of the design effort can be spent on functional verification and manufacturing testing. This percentage is expected to increase in the future if no significant strides in these areas are made. In this dissertation, we target three related problems in simulation-based Design Verification and Testing: Sequential ATPG (Automatic Test Pattern Generation), Unbounded Model Checking (UMC) of safety properties, and low power testing for full-scan sequential circuits. We model these three problems as simulation-based pattern generation problems and exploit novel ATPG algorithms to increase the effectiveness of sequential ATPGs. The main challenge for fault/error detection in sequential circuits is the large number of flip-flops (FFs) in modern designs. Due to the large number and variable length of test sequences required for such circuits, the existing deterministic ATPG algorithms fail to achieve high test coverages. Such algorithms typically work by first unrolling the sequential circuit and then performing frequent backtracking to generate test vectors for fault detection. For the hard-to-detect faults, these schemes either run out of memory or require a huge computational effort. We show that simulation-based ATPGs, on the other hand, scale very well for large circuits as they perform only forward simulation. A fundamental problem associated with simulation-based ATPGs is to avoid exhaustive circuit simulation, which is impractical for large designs in the real world, by choosing high quality test vectors that achieve a high test coverage within a low simulation time. We tackle this primary problem by exploiting different correlation-based heuristics. The intuition behind using correlation-based heuristics is to better guide the pattern generation engine such that the specific objective of either fault detection or property verification in UMC or minimizing power consumption during the testing, is achieved in an efficient manner without resorting to exhaustive simulation. In particular, we model and explore the following correlations: (1) temporal correlations, i.e. correlations on each primary input (PI) in different time frames, and (2) spatial correlations, i.e. correlations among different FFs in the same time frame. We employ temporal correlations in the context of pattern generation of a built-in-self-test (BIST) architecture and we explore spatial correlations to guide a logic-simulation-based sequential ATPG and low power scan test generation. Experimental results on ISCAS and ITC benchmark circuits have shown that those correlations can enhance the simulation to discover more faults or design errors in a significantly shorter time. / Ph. D.

Développer un générateur de signal analogique efficace est un élément clés pour les BIST des circuits analogiques et mixtes afin de produire le stimulus de test approprié, et remplacer les générateurs de signaux externes couteux dans les protocoles de standard de test fonctionnel analogique et mixte. Dans cette optique, nous présentons dans cette thèse des stratégies différentes de génération de signal sinusoïdal, basées sur les techniques d’annulation d’harmonique, pour le design d’un synthétiseur embarqué de signal sinusoïdal à haute fréquence. Les générateurs proposés utilisent des circuits numériques pour produire un ensemble de signaux carrés déphasés. Ces signaux carrés sont pondérés et combinés en appliquant différentes stratégies d’annulation d’harmonique dans un convertisseur numérique-analogique simplifié. Le générateur sélectionné permet d’annuler toutes les harmoniques en dessous de la 11ème. De plus, une simple stratégie de calibration a été conçue pour compenser l’effet de mismatch et de la variation de process de fabrication sur l’efficacité de la technique d’annulation d’harmonique. La simplicité du circuit rend cette approche adaptable pour le BIST des circuits intégrés analogique et mixte. Les modèles comportementaux, les simulations électriques d’un design en 28nm FDSOI et les résultats expérimentaux sont fournis pour valider la fonctionnalité du générateur proposé. Les résultats obtenus montrent des performances du circuit calibré autour de 52dB de SFDR pour un signal généré à 166MHz. / One of the main key points to enable mixed-signal BIST solutions is the development of efficient on-chip analog signal generators that can provide appropriate test stimuli and replace costly external signal generators in standard analog and mixed-signal functional test protocols. In this line, we present in this thesis different sinewave generation strategies based on harmonic cancellation techniques to design a high-frequency on-chip sinusoidal synthetize. The proposed generators employ digital hardware to provide a set of phase-shifted digital square-wave signals. These square-wave signals are scaled and combined using different harmonic cancellation strategies in a simplified current-steering DAC. The selected generator allows the cancellation of all harmonic components up to the eleventh. Additionally, a simple calibration strategy has been devised to compensate the impact of process variations and mismatch on the effectiveness of the harmonic cancellation. The simplicity of the circuitry makes this approach suitable for mixed-signal BIST applications. Electrical simulations of a 28nm FDSOI design and experimental results are provided to validate the functionality of the proposed signal generator. Obtained results show a calibrated performance around 52dB of SFDR for a generated sinusoidal signal at 166 MHz.