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Propriedades eletrônicas e estruturais de mecro-aglomerados de GaAs. / Electronic and structural properties of GaAs micro-clusters.Piquini, Paulo Cesar 29 March 1996 (has links)
Temos utilizado o método de Hartree-Fock-Roothaan, seguido da teoria de perturbação de segunda ordem, para a determinação das propriedades estruturais e eletrônicas dos aglornerados GaAs, G2As, GaAs2, Ga3As, Ga2As2, GaAs3, G4As, Ga3As2, Ga2As4, GaAs4, Ga3As3, G4Asa, Ga3As4, Ga4As4 e seus íons positivos e negativos. A estrutura de equilíbrio de cada um destes aglomerados foi determinada através de cálculos de otimização de geometria sem a imposição de vínculos espaciais de simetria sobre a função de onda. Uma vez determinadas as estruturas dos estados fundamentais destes aglomerados, obtivemos os valores de diversas propriedades eletrônicas e energéticas, como o potencial de ionização, a afinidade eletrônica, 0 bond-order, populações orbitais de Mulliken, carga sobre os átomos, natureza dos HOMO-LUMO, etc. Com estas informações, pudemos então descrever de forma detalhada cada um destes aglomerados e comparar nossos resultados com os existentes na literatura. Realizando uma analise conjunta dos resultados obtidos, deduzimos um padrão estrutural a ser seguido por estes pequenos aglomerados de GaAs, onde as formas embrionárias destes aglomerados têm SUM estruturas geométrica e eletrônica baseadas em configurações altamente simétricas, formadas pelos átomos de As. Os átomos adicionais de Ga entram em posições que favorecem um padrão de hibridização e ordenamento químico que tende ao padrão apresentado pelo cristal de GaAs. A passagem para uma estrutura em camadas e observada ocorrer ja no aglomerado estequiométrico com oito átomos. Utilizando o princípio de hard and soft acids and bases, estudamos a reatividade química do aglomerado Ga2As2 e da superfície GaAs[ll0], quando em interação com átomos externos. / Using the Hartree-Fock-Roothaan method, followed by second-order perturbation theory we determined the structural and electronic properties of the GaAs, Ga2As, GaAs2, Ga3As, Ga2As2, GaAs3, Ga4As, Ga3As2, Ga2As3, GaAs4, Ga3As3, Ga4As3, Ga4As4, Ga4As4 clusters and its positive and negative ions. The equilibrium structure for each of these clusters was determined throgh geometry optimization calculations, without spatial symmetry constraint on the wave function. Once we have determined the ground state structures of these clusters, the values of different electronic and structural properties were evaluated. This includes the ionization potential, electron affinity, bond-order, Mulliken populations, the nature of the HOMO-LUMO orbitals, etc. With these informations we described in detail each one of the clusters, and we compared our results with the experimental and theoretical published results. Analysing the assembly of the obtained results, we can deduce a structural pattern to be followed by these small clusters of GaAs, where the embrionary forms of these clusters have the geometric and electronic structures based on highly symmetrical configurations formed by the As atoms. The Ga aditional atoms enter in positions that enhance a hybridization and chemical ordering which tends to that presented by the bulk. The change for a layer structure is observed occur yet in the eight atoms stechiometric cluster. Using the hard and soft acids and bases principle, we have studied chemical reactivity of the Ga2As2 cluster and the GaAs[ll0] surface when in interaction with atoms.
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Propriedades eletrônicas de pontos quânticos de InAs1-xPx sobre GaAs. / Electronic Properties of InAs1-xPx quantum dots on GaAs.Bufon, Carlos César Bof\' 19 February 2003 (has links)
O crescimento de pontos quânticos a partir do descasamento dos parâmetros de rede tem sido alvo de intensos estudos nos últimos dez anos. Conhecer as propriedades eletrônicas destes materiais é chave para a engenharia de sistemas quânticos. O objetivo deste trabalho é estudar as propriedades eletrônicas de pontos quânticos (QD) de InAS1-x Px enterrados em GaAs, através de Espectroscopia de Capacitância (CV). A Espectroscopia CV é uma técnica que permite determinar os estados eletrônicos e a distribuição de cargas do sistema. As amostras de InAS1-x Px foram crescidas por MOCVD (Low-Pressure Metalorganic Chemical Vapor Deposition) sobre um substrato de GaAs:Cr (001). A estrutura das amostras é do tipo MIS (Metal-Isolante-Semicondutor) com um contato traseiro do tipo n. As medidas de capacitância foram feitas a 4,2 K para diferentes valores de freqüência e campo magnético. A partir da dispersão dos estados confinados com o campo magnético aplicado perpendicular ao plano dos pontos quânticos, pode-se determinar, ◚, a freqüência natural do sistema. A partir de ◚, determinou-se 𕖮, o comprimento característico da função de onda. A concordância entre os valores de 𕖮 com as dimensões laterais dos pontos quânticos obtidos por microscopia eletrônica de transmissão (TEM) é boa. Finalmente, através das medidas de espectroscopia CV pode-se separar os efeitos de confinamento lateral e vertical, permitindo um melhor entendimento dos espectros de fotoluminescência (PL), assim como os detalhes da forma dos QD obtidos por TEM. / The growth of quantum dots in the Stranski-Krastranov mode has been subject of intense investigation in the last decade. Knowing the electronics properties of these materials is key for performing quantum systems engineering. The objective of this work is to study the quantum dots (QD) electronic properties of the InAS1-x Px embedded in GaAs. The study was done by capacitance spectroscopy (CV), which is an experimental tool that allows the evaluation of the electronic states and the charge distribution of a given quantum device. The samples of InAS1-x Px were grown by Low-Pressure Metalorganic Chemical Vapor Deposition on GaAs:Cr (001) substrates. They consist of metalinsulator-semiconductor structures with an n-type back contact. The measurements were performed at 4.2 K for different values of frequencies and magnetic field. From the confined states dispersion as a function of the applied magnetic field, perpendicular to the QD plane, the system natural frequency, ◚, was determined. From the ◚, we could determine the wave function characteristic length, 𕖮. The concordance between the 𕖮, values and the lateral sizes obtained by Transmission Electronic Microscopy (TEM) is good. Finally, by CV spectroscopy we could separate the lateral and vertical confinement effects, leading to a more complete understanding of the Photoluminescence (PL) spectra, as well as the details of the QD shape obtained by TEM.
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Conception et évaluation des performances d'un microgyromètre vibrant triaxial en GaAS à structure plane / Conception and performances evaluation of a GaAS planar triaxial vibrating rate microgyroRoland, Iännis 04 July 2012 (has links)
Cette thèse présente la conception d'un microgyromètre MEMS triaxial. Les microgyromètres ont de nombreuses applications telles que le contrôle d'attitude de drones ou l'interfaces homme/machine. Les microgyromètres triaxiaux sont particulièrement avantageux car ils permettent de déterminer les trois composantes de la vitesse de rotation à partir d'un seule structure monolithique et planaire. Le principe de fonctionnement des gyromètres vibrants à effet Coriolis (CVG) a été étudié analytiquement, puis une structure originale de gyromètre triaxial monolithique et planaire a été conçue. Cette structure est constituée de quatre poutres encastrées sur un cadre déformable. Des prototypes en silicium ont été réalisés et caractérisés. L’arséniure de gallium (GaAs) a été sélectionné pour la réalisation en raison de ses propriétés piézoélectriques et de son fort potentiel de miniaturisation. Un système d’électrodes pour l'excitation et la détection des vibrations mécaniques a été mis au point. Deux procédés d'usinage du GaAs ont été développés, un procédé de gravure chimique et un procédé de gravure plasma permettant tous les deux de graver verticalement le GaAs sur 450 micromètres de profondeur. Le procédé de gravure plasma est compatible avec la réalisation du CVG triaxial. Des résonateurs de test en GaAs dopé Carbone ont été réalisés par gravure chimique pour mesurer l'évolution en température de la résistivité et des propriétés électromécaniques de ce matériau. Ces mesures ont permis d'estimer que les marches aléatoires angulaires du CVG triaxial sont inférieures à 0,025 degré par racine d'heure sur la gamme de température [-40°C +80°C] pour les trois axes de mesure. Ceci situe le potentiel du CVG triaxial conçu parmi les CVG MEMS les plus performants. / This PhD present the conception of a triaxial MEMS microgyro. Microgyros offer a wide range of applications varying from drones attitude control to human interface devices. The triaxial microgyros offer great benefits because they allow determination of the three rotation rate components with only one monolithic planar structure. The operating principle of Coriolis Vibrating Gyro (CVG) has been studied analytically and an original structure has been designed. This structure consists of four beam clamped into a deformable frame. Some silicon prototypes have been machined and characterised. The gallium arsenide (GaAs) has been chosen for the realisation because of its piezoelectric properties and its great miniaturization potential. A transduction system based on GaAs piezoelectricity was developed. Two GaAs machining processes have been developed: a chemical etching process and a plasma etching process which both enable 450 micrometers deep vertical etching. The plasma etching technique allows high fidelity enough machining to be compatible with the triaxial CVG realisation. Some C-doped GaAs test resonators have been realised to measure the resistivity temperature dependency and electromechanical properties of this material. Those characterisations lead to estimate the angular random walk for the three axis ranges below 0,025 degree per square root hour on the temperature range [-40°C +80°C]. This sets the triaxial CVG together with the best monoaxial MEMS CVG.
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Crescimento e caracterização de heteroestruturas tensionadas de InxGa1-x-As/GaAs / Growth and characterization of stressed heterostructures of InxGa1-x-As/GaAsCeschin, Artemis Marti 17 December 1992 (has links)
Utilizando a técnica de epitaxia por feixe molecular (MBE), crescemos heteroestruturas tensionadas de InxGa1-xAs sobre substratos de GaAs (100). A composição de In, a espessura para a transição 2D-3D e a espessura crítica (hc) foram determinadas através da análise \"in situ\" pelo RHEED. Os valores da hc e da espessura para a transição 2D- 3D foram observadas ser funções da composição do In e da temperatura do substrato. Um estudo do efeito da desorientação do substrato de GaAs (100) de alguns graus sobre as qualidades ópticas (PL) de poços quânticos simples e múltiplos de InxGa1-xAs/GaAs também foi realizado. Microscopia eletrônica por transmissão (TEM) foi utilizada para a verificação da qualidade das interfaces dos poços quânticos de InxGa1-x/GaAs. Algumas estruturas de dupla barreira (AlGaAs/GaAs/InAs/GaAs/AlGaAs) foram crescidas e caracterizadas opticamente (PL) / InxGa1-xAs strained heterostructures were grown on GaAs (100) by Molecular Beam Epitaxy (MBE). Indium concentration (x), 2D-3D growth mode transition thickness and critical thickness (hc) were determined by \"in situ\" RHEED analysis. Hc and 2D-3D growth mode transition thickness values were verified to depend on In concentration and substrate temperature. The dependence of the InxGa1-xAs /GaAs simple and multiple quantum wells (SQW and MQW) PL optical quality on the GaAs (100) substrate misorientation was also studied. The SQW interfaces were investigated by Transmission Eletronic Microscopy (TEM). Some double-barrier structures (AlGaAs/GaAs/InAs/GaAs/AlGaAs was also grown and optically characterized
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Terahertz-Strahlung auf der Basis beschleunigter Ladungsträger in GaAsDreyhaupt, Andre 18 July 2008 (has links) (PDF)
Electromagnetic radiation in the frequency range between about 100 GHz and 5 THz can be used for spectroscopy and microscopy, but it is also promising for security screening and even wireless communication. In the present thesis a planar photoconducting large-area THz radiation source is presented. The device exhibits outstanding properties, in particular high THz field strength and generation efficiency and large spectral bandwidth with short THz pulse length. The THz emission is based on acceleration and deceleration of photoexcited carriers in semiconductor substrates. A metallic interdigitated structure at the surface of semi-insulating GaAs provides the electrodes of an Auston switch. In a biased structure photoexcited charge carriers are accelerated. Hence electromagnetic waves are emitted. An appropriately structured second metallization, electrically isolated from the electrodes, prevents destructive interference of the emitted waves. The structure investigated here combines several advantages of different conventional photoconducting THz sources. First, it provides high electric acceleration fields at moderate voltages owing to the small electrode separation. Second, the large active area in the mm2 range allows excitation by large optical powers of some mW. Optical excitation with near-infrared femtosecond lasers is possible with repetition rates in the GHz range. The presented results point out the excellent characteristics regarding the emitted THz field strength, average power, spectral properties, and easy handling of the interdigitated structure in comparison to various conventional emitter structures. Various modifications of the semiconductor substrate and the optimum excitation conditions were investigated. In the second part of this thesis the dynamic conductivity of GaAs/AlxGa1-xAs superlattices in an applied static electric field was investigated with time-resolved THz spectroscopy. The original goal was to explore whether the predicted effect of gain of electromagnetic radiation at THz frequencies is present in such structures. Superlattice samples were grown according to the experimental requirements, which include high specific resistance and sufficient THz transparency. The characterization of the superlattices by Fourier transform infrared spectroscopy and photoluminescence spectroscopy confirms the pronounced miniband properties of the bandstructure. Furthermore indications of Bloch oscillations were found by transport measurements. However, we could not measure a change of the dynamic conductivity when the electric field was toggled. Specific reasons for this and related experiments of other groups are discussed. / Elektromagnetische Strahlung im Frequenzbereich zwischen etwa 100 GHz und 5 THz wird für verschiedene Anwendungen wie Spektroskopie und Mikroskopie genutzt, kann aber auch für Sicherheitstechnik oder sogar Datenübertragung interessant sein. In der hier vorgestellten Forschungsarbeit wird eine großflächige fotoleitende THz-Strahlungsquelle beschrieben, die sich durch eine große THz-Feldstärke und große spektrale Bandbreite auszeichnet. Die THz-Emission basiert auf der Beschleunigung und Verzögerung fotogenerierter Ladungen in Halbleitersubstraten. Eine metallische Interdigitalstruktur auf der Oberfläche von semi-isolierendem GaAs bildet die Elektroden eines Fotoschalters. Ist an diese Struktur eine Spannung angeschlossen, werden optisch generierte Ladungsträger beschleunigt und strahlen elektromagnetische Wellen ab. Eine geeignet strukturierte und isolierte zweite Metallisierung verhindert destruktive Interferenzen der abgestrahlten Wellen. Die vorgeschlagene Struktur vereinigt dabei die Vorteile verschiedener herkömmlicher fotoleitender THz-Quellen. Einerseits ermöglicht der kleine Elektrodenabstand große elektrische Felder zur Beschleunigung fotogenerierter Ladungen schon bei moderaten Spannungen. Andererseits kann die große aktive Fläche von einigen mm2 mit großen optischen Leistungen im Bereich einiger mW angeregt werden. Die optische Anregung mit Nahinfrarot-Femtosekunden- Lasern kann mit Wiederholraten bis in den GHz-Bereich geschehen. Bedingt durch die Eigenschaften der Anregungspulse entstehen kurze spektral breite THz-Pulse. Die vorliegenden Ergebnisse verdeutlichen die hervorragenden Eigenschaften der Interdigitalstruktur im Vergleich zu verschiedenen herkömmlichen Geometrien bezüglich der Feldstärke der abgestrahlten Wellen, der mittleren Leistung und der spektralen Eigenschaften. Dabei ist die Struktur sehr einfach zu handhaben. Es wurden verschiedene Modifikationen des Substrates und die optimalen Bedingungen der optischen Anregung untersucht. Der zweite Teil dieser Arbeit behandelt die Erforschung der dynamische Leitfähigkeit von GaAs/AlxGa1-xAs-Übergittern in Abhängigkeit von einem elektrischen Feld mit Hilfe der zeitaufgelösten THz-Spektroskopie. Es sollte geklärt werden, ob der vorhergesagte Effekt der Verstärkung elektro-magnetischer Strahlung in solchen Strukturen möglich ist. Dazu wurden Übergitterproben gemäß den experimentellen Anforderungen hergestellt. Zu den Vorgaben gehört ein hoher spezifischer Widerstand und ausreichende Transparenz im THz-Bereich. Die Charakterisierung der Übergitter mit Fotolumineszenz- und Fourier-Transformations-IR-Spektroskopie bestätigte die ausgeprägten Minibandeigenschaften der Bandstruktur. Hinweise auf Bloch-Oszillationen wurden durch Ladungstransportmessungen gefunden. Dennoch war eine Änderung der dynamischen Leitfähigkeit beim Schalten des elektrischen Feldes nicht messbar. Gründe dafür und ähnliche Experimente anderer Gruppen werden diskutiert.
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Įvairialyčių AIIIBV darinių tyrimas mikrobangose / Investigation of AIIIBIV heterostructures under the action of microwave radiationKozič, Antoni 07 October 2008 (has links)
Disertacijoje nagrinėjama, kaip padidinti susiaurintų spinduliuotės jutiklių jautrį. Taip pat disertacijoje siekiama ištirti mikrobangų spinduliuotės poveikį susiaurintiems puslaidininkiniams dariniams ir atskleisti stebimų efektų fizinę prigimtį bei nustatyti bandinių struktūros įtaką detektuojamo signalo dydžiui.
Darbe sprendžiami tokie pagrindiniai uždaviniai: tiriamos įvairialyčių susiaurintų puslaidininkinių darinių savybės, priklausančios nuo darinių sluoksnių kokybės ir puslaidininkinių medžiagų parametrų bei analizuojamos savybės, priklausančios nuo stipriai legiruoto puslaidininkinio sluoksnio laidumo, nuo skiriamojo sluoksnio storio ir nuo sklendės pobūdžio metalizacijos. Siekiant užsibrėžto tikslo, buvo gaminami ir tiriami susiaurinti skirtingi įvairialyčiai dariniai (AlGaAs/GaAs, AlGaAs/InGaAs/GaAs) ir n-GaAs dariniai.
Disertaciją sudaro penki skyriai, kurių paskutinis – rezultatų apibendrinimas.
Pirmajame (įvadiniame) skyriuje nagrinėjamas problemos aktualumas, formuluojamas darbo tikslas bei uždaviniai, aprašomas mokslinis darbo naujumas, pristatomi autoriaus pranešimai, disertacijos struktūra.
Antrasis skyrius skirtas literatūros apžvalgai. Jame apžvelgiami elektromagnetinės spinduliuotės detektavimo principai, aptariamos šiluminės ir bigradientinės elektrovaros susidarymo priežastys, AlGaAs/GaAs įvairialytė sandūra, selektyvusis legiravimas bei puslaidininkinių prietaisų fizikinės galimybės.
Trečiajame skyriuje pateikta eksperimento tyrimo metodika. Išsamiai... [toliau žr. visą tekstą] / The thesis presents the investigation on how to increase the sensitivity of the narrowed sensors of radiation. Also the thesis also deals with the attempts to analyze the influence of the microwave radiation on to the narrowed semiconductor formations and to reveal the physical nature of the observed effects as well as to determine the influence of structure of the samples on the detected signal magnitude.
The work solves the following major tasks: the characteristics of the narrowed semiconductor heterostructures depending on the quality of the modulation layers and on the parameters of the semiconductor materials as well as the characteristics, depending on the selectively doped structure, on the conductivity of the highly doped semiconductor layer, and on the thickness of the separating layer, and the type of metallization of the gate. In order to achieve the goal there were produced and investigated narrowed different heterostructures (AlGaAs/GaAs, AlGaAs/InGaAs/GaAs) and n-GaAs structures.
The thesis consists of four chapters, the final one is the generalization of the results.
The first chapter (introductory) deals with the actuality of the problem, the aim and the tasks are stated, the novelty of the scientific research is described, the reports of the author are presented together with the publications, and the structure of the thesis.
The second chapter is assigned to the review of the literature. It presents the principals of electromagnetic radiation detection... [to full text]
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Įvairiatarpių GaAs/AlxGa1-xAs darinių tyrimai ir taikymai mikrobangų detekcijai / Research and application of GaAs/AlxGa1-xAs heterostructures for microwave detectionNargelienė, Viktorija 30 December 2013 (has links)
Milimetrinių bangų sritis yra perspektyvi daugelyje sričių, nuo kasdienio vartojimo įtaisų tokių, kaip telekomunikacijų tinklų įranga iki specifinių taikymų kariuomenėje, bei diagnostinėje medicinoje. Milimetrinių bangų imtuvuose dažniausiai naudojamas netiesinis elementas yra Šotkio (Schottky) diodas. Nors jo veikimo dažnių ruožas yra iki terahercų srities, tokie trūkumai kaip jautrio priklausomybė nuo temperatūros, neatsparumas elektrinėms perkrovoms, bei jo parametrų blogėjimas laikui bėgant verčia ieškoti naujų alternatyvų. Disertacijoje pristatomi dviejų tipų mikrobangų diodai, pagaminti naudojant įvairiatarpius GaAs/AlGaAs darinius. Puslaidininkinių darinių sluoksnių kokybė buvo eksperimentiškai įvertinta naudojant nuostoviosios fotoliuminescencijos ir laike koreliuoto fotonų skaičiavimo metodus. Aprašytas mikrobangų diodų gamybos procesas. Elektrinės savybės buvo įvertintos išmatavus mikrobangų diodų voltamperines charakteristikas, o detekcinės jų savybės ištirtos plačiame dažnių ruože. / Spectrum region of millimeter wave is extensively used in various areas: from consumer devices in telecommunication networks, to specific applications in military and diagnostic medicine. Schottky diode is the most commonly used two terminal device in microwave receivers. Although the operational frequency of Schottky diode is reaching the terahertz frequency range it has several drawbacks such as sensitivity dependence on temperature, long-term instability and sensitivity to overloads. These drawbacks impelled one to search new type of devices. Two types of microwave diodes fabricated using GaAs/AlGaAs heterostructures are presented in the thesis. The quality of semiconductor epitaxial layers was experimentally estimated using photoluminescence and time correlated single photon counting techniques. The process of microwave diode fabrication is described. Electrical properties of microwave diodes were estimated from current-voltage characteristics and properties of microwaves detection were investigated in wide frequency range.
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Research and application of GaAs/AlxGa1-xAs heterostructures for microwave detection / Įvairiatarpių GaAs/AlxGa1-xAs darinių tyrimai ir taikymai mikrobangų detekcijaiNargelienė, Viktorija 30 December 2013 (has links)
Spectrum region of millimeter wave is extensively used in various areas: from consumer devices in telecommunication networks, to specific applications in military and diagnostic medicine. Schottky diode is the most commonly used two terminal device in microwave receivers. Although the operational frequency of Schottky diode is reaching the terahertz frequency range it has several drawbacks such as sensitivity dependence on temperature, long-term instability and sensitivity to overloads. These drawbacks impelled one to search new type of devices. Two types of microwave diodes fabricated using GaAs/AlGaAs heterostructures are presented in the thesis. The quality of semiconductor epitaxial layers was experimentally estimated using photoluminescence and time correlated single photon counting techniques. The process of microwave diode fabrication is described. Electrical properties of microwave diodes were estimated from current-voltage characteristics and properties of microwaves detection were investigated in wide frequency range. / Milimetrinių bangų sritis yra perspektyvi daugelyje sričių, nuo kasdienio vartojimo įtaisų tokių, kaip telekomunikacijų tinklų įranga iki specifinių taikymų kariuomenėje, bei diagnostinėje medicinoje. Milimetrinių bangų imtuvuose dažniausiai naudojamas netiesinis elementas yra Šotkio (Schottky) diodas. Nors jo veikimo dažnių ruožas yra iki terahercų srities, tokie trūkumai kaip jautrio priklausomybė nuo temperatūros, neatsparumas elektrinėms perkrovoms, bei jo parametrų blogėjimas laikui bėgant verčia ieškoti naujų alternatyvų. Disertacijoje pristatomi dviejų tipų mikrobangų diodai, pagaminti naudojant įvairiatarpius GaAs/AlGaAs darinius. Puslaidininkinių darinių sluoksnių kokybė buvo eksperimentiškai įvertinta naudojant nuostoviosios fotoliuminescencijos ir laike koreliuoto fotonų skaičiavimo metodus. Aprašytas mikrobangų diodų gamybos procesas. Elektrinės savybės buvo įvertintos išmatavus mikrobangų diodų voltamperines charakteristikas, o detekcinės jų savybės ištirtos plačiame dažnių ruože.
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Crescimento e caracterização de heteroestruturas tensionadas de InxGa1-x-As/GaAs / Growth and characterization of stressed heterostructures of InxGa1-x-As/GaAsArtemis Marti Ceschin 17 December 1992 (has links)
Utilizando a técnica de epitaxia por feixe molecular (MBE), crescemos heteroestruturas tensionadas de InxGa1-xAs sobre substratos de GaAs (100). A composição de In, a espessura para a transição 2D-3D e a espessura crítica (hc) foram determinadas através da análise \"in situ\" pelo RHEED. Os valores da hc e da espessura para a transição 2D- 3D foram observadas ser funções da composição do In e da temperatura do substrato. Um estudo do efeito da desorientação do substrato de GaAs (100) de alguns graus sobre as qualidades ópticas (PL) de poços quânticos simples e múltiplos de InxGa1-xAs/GaAs também foi realizado. Microscopia eletrônica por transmissão (TEM) foi utilizada para a verificação da qualidade das interfaces dos poços quânticos de InxGa1-x/GaAs. Algumas estruturas de dupla barreira (AlGaAs/GaAs/InAs/GaAs/AlGaAs) foram crescidas e caracterizadas opticamente (PL) / InxGa1-xAs strained heterostructures were grown on GaAs (100) by Molecular Beam Epitaxy (MBE). Indium concentration (x), 2D-3D growth mode transition thickness and critical thickness (hc) were determined by \"in situ\" RHEED analysis. Hc and 2D-3D growth mode transition thickness values were verified to depend on In concentration and substrate temperature. The dependence of the InxGa1-xAs /GaAs simple and multiple quantum wells (SQW and MQW) PL optical quality on the GaAs (100) substrate misorientation was also studied. The SQW interfaces were investigated by Transmission Eletronic Microscopy (TEM). Some double-barrier structures (AlGaAs/GaAs/InAs/GaAs/AlGaAs was also grown and optically characterized
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Propriedades eletrônicas de pontos quânticos de InAs1-xPx sobre GaAs. / Electronic Properties of InAs1-xPx quantum dots on GaAs.Carlos César Bof\' Bufon 19 February 2003 (has links)
O crescimento de pontos quânticos a partir do descasamento dos parâmetros de rede tem sido alvo de intensos estudos nos últimos dez anos. Conhecer as propriedades eletrônicas destes materiais é chave para a engenharia de sistemas quânticos. O objetivo deste trabalho é estudar as propriedades eletrônicas de pontos quânticos (QD) de InAS1-x Px enterrados em GaAs, através de Espectroscopia de Capacitância (CV). A Espectroscopia CV é uma técnica que permite determinar os estados eletrônicos e a distribuição de cargas do sistema. As amostras de InAS1-x Px foram crescidas por MOCVD (Low-Pressure Metalorganic Chemical Vapor Deposition) sobre um substrato de GaAs:Cr (001). A estrutura das amostras é do tipo MIS (Metal-Isolante-Semicondutor) com um contato traseiro do tipo n. As medidas de capacitância foram feitas a 4,2 K para diferentes valores de freqüência e campo magnético. A partir da dispersão dos estados confinados com o campo magnético aplicado perpendicular ao plano dos pontos quânticos, pode-se determinar, ◚, a freqüência natural do sistema. A partir de ◚, determinou-se 𕖮, o comprimento característico da função de onda. A concordância entre os valores de 𕖮 com as dimensões laterais dos pontos quânticos obtidos por microscopia eletrônica de transmissão (TEM) é boa. Finalmente, através das medidas de espectroscopia CV pode-se separar os efeitos de confinamento lateral e vertical, permitindo um melhor entendimento dos espectros de fotoluminescência (PL), assim como os detalhes da forma dos QD obtidos por TEM. / The growth of quantum dots in the Stranski-Krastranov mode has been subject of intense investigation in the last decade. Knowing the electronics properties of these materials is key for performing quantum systems engineering. The objective of this work is to study the quantum dots (QD) electronic properties of the InAS1-x Px embedded in GaAs. The study was done by capacitance spectroscopy (CV), which is an experimental tool that allows the evaluation of the electronic states and the charge distribution of a given quantum device. The samples of InAS1-x Px were grown by Low-Pressure Metalorganic Chemical Vapor Deposition on GaAs:Cr (001) substrates. They consist of metalinsulator-semiconductor structures with an n-type back contact. The measurements were performed at 4.2 K for different values of frequencies and magnetic field. From the confined states dispersion as a function of the applied magnetic field, perpendicular to the QD plane, the system natural frequency, ◚, was determined. From the ◚, we could determine the wave function characteristic length, 𕖮. The concordance between the 𕖮, values and the lateral sizes obtained by Transmission Electronic Microscopy (TEM) is good. Finally, by CV spectroscopy we could separate the lateral and vertical confinement effects, leading to a more complete understanding of the Photoluminescence (PL) spectra, as well as the details of the QD shape obtained by TEM.
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