La microscopie à émission de photons spectrale (SPEM) est une technique non destructive utilisée comme outil de localisation des défauts et comme indicateur des mécanismes de défaillance. Cette thèse présente un nouveau système de SPEM développé pour étudier la fiabilité des dispositifs de puissance à large bande interdite, notamment les MOSFET SiC et les MEMTs AlGaN/GaN. Un aperçu des différents aspects fondamentaux de l'émission de lumière dans les dispositifs à semi-conducteurs est présenté. L'analyse spectrale en électroluminescence des MOSFET SiC à haute puissance et des HEMTs AlGaN/GaN est rapportée et corrélée avec des analyses électriques et micro-structurales pour localiser les défaillances et identifier l'origine physique de la dérive des performances de ces composants. / Spectroscopic photon emission microscopy (SPEM) is a non-destructive technique used as a defect localizing tool and as an indicator of the failure mechanisms. This thesis presents a new system of SPEM developed to study the reliability of wide band Gap power devices notably SiC MOSFETs and AlGaN/GaN HEMTs. An overview of different fundamental aspects of the light emission defects on semiconductors devices is presented. The electroluminescence spectral analysis of high power stressed SiC MOSFETs and AlGaN/GaN HEMTs is reported and correlated with electrical and micro-structural analysis to localize the failures and identify the physical origin of the performance drift of these components.

Les nano-antennes optiques constituent un élément clé pour le contrôle et l'intéraction lumière/matière à l'échelle nanométrique. Ces systèmes opèrent dans le domaine de l'optique visible et proche infrarouge. Les propriétés de ces composants sont contrôlées en modifiant la taille, la forme et le matériau utilisé. Ces paramètres sont ajustés par les processus de fabrication de l'antenne. Dans le domaine des radio-fréquences, le tuner permet d'ajuster la fréquence de résonance de l'antenne de façon dynamique. Nous avons dans le cadre de cette thèse voulu adapter ce concept de tuner au domaine de l'optique. Le principe employé consiste à changer la résistance de charge de l'antenne, c'est-à-dire l'indice du milieu électrique environnant. Pour cela, nous avons utilisé un matériau anisotrope constitué de molécules de cristaux liquides. L'indice optique est alors modifié par l 'application d'un champ électrique statique. Le changement des propriétés spectrales ainsi que de diffusion d'une antenne de type dimère sont ici démontrées.Toujours en analogie avec les antennes radio-fréquences, nous avons étudié la propriété de transduction électron-photon dans le cas des antennes optiques. Dans ce but, nous avons considéré deux configurations. La première concerne l'utilisation de nanotubes de carbone placés dans une configuration de transistor à effet de champ. Ces objets émettent de la lumière par une recombinaison de paires électrons-trous dans le domaine des longueurs d'ondes Télécom. La seconde configuration emploie des jonctions tunnels fabriquées par électro-migration. Dans ce cas là, la jonction est assimilée à une antenne à interstice. A cause des faibles dimensions des jonctions (autour de 1 nm), nous nous sommes intéressés à la réponse en optique non linéaire de ses objets. Cette technique permet de localiser la jonction tunnel grâce à une forte exaltation du signal. L'etude des différentes caractérisques de ses jonctions sont ici présentées. Une fois la transduction du signal réalisée par l'antenne radiofréquence, celui-ci est acheminé via une ligne de transmission. A l' échelle nanométrique, les guides plasmoniques s'avèrent être un type de structure approprié. Dans ce cas, les guides peuvent à la fois servir d''electrode mais aussi de guide. Dans le cadre de cette thèse, nous avons étudié par microscopie à fuites radiatives, dans l'espace direct et réciproque, la plus simple des géométries : le guide ruban métallique. Nous avons cherché à comprendre, pourquoi ce type de structure présente une largeur de coupure.

Esta tese de doutorado é o resultado de um estudo dos mecanismos de operação de dispositivos poliméricos emissores de luz, com um particular enfoque nos processos de injeção e transporte de portadores de carga em polímeros derivados do poli(p-fenileno vinileno), PPV. Para tanto, se fez necessário o domínio de todas as etapas de produção e caracterização, desde a síntese química dos polímeros até a fabricação propriamente dita dos dispositivos, as quais são brevemente descritas neste trabalho. Basicamente, dois tipos diferentes de dispositivos foram caracterizados: diodos poliméricos emissores de luz (PLEDs), nos quais a camada ativa é composta por um filme fino (100-500 nm de espessura) do polímero eletroluminescente puro, e células eletroquímicas emissoras de luz (LECs), compostas por blendas do polímero conjugado com um eletrólito polimérico condutor iônico. As propriedades ópticas dos dispositivos foram analisadas através dos espectros de absorção óptica na região do ultravioleta/visível e de emissão (foto e eletroluminescência) enquanto as propriedades de injeção e de transporte de carga foram exploradas através de medidas elétricas de corrente-voltagem (I-V), espectroscopia de impedância no domínio da freqüência (condutividade ac), espectroscopia de fotocorrente e ressonância magnética detectada eletricamente (EDMR). A influência de parâmetros como a estrutura dos dispositivos, os metais utilizados como eletrodos e a temperatura permitiram uma análise mais detalhada de alguns modelos teóricos utilizados na interpretação dos resultados experimentais, fornecendo, dessa forma, um maior conhecimento das propriedades físicas dos materiais estudados. / This PhD thesis is an extensive study of the operation mechanisms of polymeric light-emitting devices, with a particular focus on the injection and transport properties of charge-carriers in poly(p-phenylene vinylene), PPV, derivatives. Therefore, it was necessary to dominate all the processes of fabrication and characterization of such devices, from the chemical synthesis of the polymers to the device fabrication, which are briefly described along this work. Two different kinds of devices were studied: polymeric ligh-emitting diodes (PLEDs) composed by a single thin layer (100-500 nm thick) of the pure electroluminescent polymer, and light-emitting electrochemical cells (LECs), which active layers are formed by a blend of the conjugated polymer and an ionic conductive polymeric electrolyte. The optical properties of the devices were analyzed by optical absorption in the ultraviolet-visible range and emission (photo- and electroluminescence) spectra. The charge injection and transport properties were studied by electrical measurements like current-voltage (I-V) curves, impedance spectroscopy in the frequency domain (ac conductivity), photocurrent spectroscopy and electrically detected magnetic resonance (EDMR). The influence of parameters like the device structure, the electrodes work function and the temperature allowed a detailed analysis of some theoretical models commonly used in the interpretation of the experimental results, providing more information about the physical properties of the studied conjugated polymers.

La résine époxy dont ce travail fait l'objet, trouve son application dans les transformateurs moyenne et haute tension. Sa particularité est d'être renforcée par des particules métalliques et minérales et d'être utilisée au dessus de sa température de transition vitreuse (Tg=65°C). La durée de vie de cette résine - comme celle de tout isolant organique de type polymère - peut être conditionnée par la contrainte électrique et notamment par des mécanismes de dégradation et de rupture diélectrique. En amont de cela il y a le vieillissement électrique dont aucun mécanisme physique n'est à ce jour démontré. Une hypothèse cependant est avancée : la charge d'espace et l'électroluminescence seraient des marqueurs de vieillissement électrique. Dans les termes de cette hypothèse, nous avons voulu comprendre le comportement de cette résine vis-à-vis de la charge d'espace, de l'électroluminescence, du courant, et de la photoluminescence. Nous avons notamment révélé que des phénomènes de charge d'espace et d'électroluminescence tiennent place dans cette résine époxy, avec une forte accélération des processus au-delà de 10kV/mm. Il reste à valider la phase en aval de notre modèle de vieillissement, à savoir : l'implication de la charge d'espace et de phénomènes collatéraux à l'électroluminescence dans la formation de vacuoles et/ou dans la modification critique des propriétés électriques, phénoménologie usuellement associée à la question du vieillissement électrique.

Single self-assembled semiconductor quantum dots (QDs) are able to emit single-photons and entangled-photons pairs. They are therefore considered as potential candidate building blocks for quantum information processing (QIP) and communication. To exploit them fully, the ability to precisely control their optical properties is needed due to several reasons. For example, the stochastic nature of their growth ends up with only little probability of finding any two or more QDs emitting indistinguishable photons. These are required for two-photon quantum interference (partial Bell-state measurement), which lies at the heart of linear optics QIP. Also, most of the as-grown QDs do not fulfil the symmetries required for generation of entangled-photon pairs. Additionally, tuning is required to establish completely new systems, for example, 87Rb atomic-vapors based hybrid semiconductoratomic (HSA) interface or QDs with significant heavy-hole (HH)-light-hole (LH) mixings. The former paves a way towards quantum memories and the latter makes the optical control of hole spins much easier required for spin- based QIP. This work focuses on the optical properties of a new type of QDs optimized for HSA experiments and their broadband tuning using strain. It was created by integrating the membranes, containing QDs, onto relaxor-ferroelectric actuators and was quantified with a spatial resolution of ~1 µm by combining measurements of the µ-photoluminescence of the regions surrounding the QDs and dedicated modeling. The emission of a neutral exciton confined in a QD usually consists of two fine-structure-split lines which are linearly polarized along orthogonal directions. In our QDs we tune the emission energies as large as ~23meV and the fine-structure-splitting by more than 90 µeV. For the first time, we demonstrate that strain is able to tune the angle between the polarization direction of these two lines up to 40° due to increased strain-induced HH-LH mixings up to ~55%. Compared to other quantum emitters, QDs can be easily integrated into optoelectronic devices, which enable, for example, the generation of non-classical light under electrical injection. A novel method to create sub-micrometer sized current-channels to efficiently feed charge carriers into single QDs is presented in this thesis. It is based on focused-laserbeam assisted thermal diffusion of manganese interstitial ions from the top GaMnAs layer into the underlying layer of resonant tunneling diode structures. The combination of the two methods investigated in this thesis may lead to new QDbased devices, where direct laser writing is employed to preselect QDs by creating localized current-channels and strain is used to fine tune their optical properties to match the demanding requirements imposed by QIP concepts.

This PhD thesis is devoted to study electro-optic properties of Gemanium/Silicon-Germanium (Ge/SiGe) multiple quantum wells (MQWs) for light modulation, detection, and emission on Si platform. It reports the first development of high speed, low energy Ge/SiGe electro-absorption modulator in a waveguide configuration based on the quantum-confined Stark effect (QCSE), demonstrates the first Ge/SiGe photodiode with high speed performance compatible with 40 Gb/s data transmission, and realizes the first Ge/SiGe light emitting diode based on Ge direct gap transition at room temperature. Extensive DC and RF measurements were performed on each tested prototype, which was realized using the same epitaxial growth and fabrication process. Simple theoretical models were employed to describe experimental properties of the Ge/SiGe MQWs. The studies show that Ge/SiGe MQWs could potentially be employed as a new photonics platform for the development of a high speed optical link fully compatible with silicon technology.

Maleimide based highly luminescent material Cbz-MI with donor acceptor donor (D-A-D) backbone has been synthesized and characterized. An organic light emitting diode fabricated using this material as emitting layer exhibited EQE of 2.5% in the yellow region of visible spectrum. Due to the small energy gap of materials emitting in this region of spectrum, EQE of OLED is usually limited by various non-radiative decays and high EQE of OLED using this material proves that most of the nonradiative decay pathways have been avoided by the careful design of molecule and device structure. Although Cbz-MI did not show TADF properties, but if tailored with right electron donor along with maleimide as an acceptor, such derivatives may exhibit TADF properties

Submitted by Claudinei Pracidelli (cpracide@ipen.br) on 2016-11-11T13:09:25Z No. of bitstreams: 0 / Made available in DSpace on 2016-11-11T13:09:25Z (GMT). No. of bitstreams: 0 / Neste trabalho, cristais de TlBr foram crescidos e purificados pelo método de Bridgman Repetido, a partir de sais comerciais de TlBr, e caracterizados para serem usados como detectores de radiação à temperatura ambiente. Para avaliar a eficiência de purificação, estudos da diminuição da concentração de impurezas foram feitos após cada crescimento, analisando as impurezas traço por Espectrometria de Massas com Plasma (ICP-MS). Um decréscimo significativo da concentração de impurezas em função do número de purificações foi observado. Os cristais crescidos apresentaram boa qualidade cristalina de acordo com os resultados de análise por Difração de Raios X (DRX), boa qualidade morfológica e estequiometria adequada de acordo com os resultados de análise por MEV(SE) e MEV(EDS). Um modelo matemático definido por equações diferenciais foi desenvolvido para avaliar as concentrações de impurezas no cristal de TlBr e suas segregações em função do número de crescimentos pelo método de Bridgman. Este modelo pode ser usado para calcular o coeficiente de migração das impurezas e mostrou ser útil para prever o número necessário de repetições de crescimento Bridgman para atingir nível de pureza adequado para assegurar a qualidade do cristal como detector de radiação. Os coeficientes se segregação obtidos são parâmetros importantes para análise microestrutural e análise de transporte de cargas nos cristais detectores. Para avaliar os cristais a serem usados como detectores de radiação, medidas de suas resistividades e resposta à incidência de radiação gama das fontes de 241Am (59,5keV) e 133Ba (81 keV) foram realizadas. Essa resposta foi dependente da pureza do cristal. Os detectores apresentaram um avanço significativo na eficiência de coleta de cargas em função da pureza. / Tese (Doutorado em Tecnologia Nuclear) / IPEN/T / Instituto de Pesquisas Energeticas e Nucleares - IPEN-CNEN/SP

Esta tese de doutorado é o resultado de um estudo dos mecanismos de operação de dispositivos poliméricos emissores de luz, com um particular enfoque nos processos de injeção e transporte de portadores de carga em polímeros derivados do poli(p-fenileno vinileno), PPV. Para tanto, se fez necessário o domínio de todas as etapas de produção e caracterização, desde a síntese química dos polímeros até a fabricação propriamente dita dos dispositivos, as quais são brevemente descritas neste trabalho. Basicamente, dois tipos diferentes de dispositivos foram caracterizados: diodos poliméricos emissores de luz (PLEDs), nos quais a camada ativa é composta por um filme fino (100-500 nm de espessura) do polímero eletroluminescente puro, e células eletroquímicas emissoras de luz (LECs), compostas por blendas do polímero conjugado com um eletrólito polimérico condutor iônico. As propriedades ópticas dos dispositivos foram analisadas através dos espectros de absorção óptica na região do ultravioleta/visível e de emissão (foto e eletroluminescência) enquanto as propriedades de injeção e de transporte de carga foram exploradas através de medidas elétricas de corrente-voltagem (I-V), espectroscopia de impedância no domínio da freqüência (condutividade ac), espectroscopia de fotocorrente e ressonância magnética detectada eletricamente (EDMR). A influência de parâmetros como a estrutura dos dispositivos, os metais utilizados como eletrodos e a temperatura permitiram uma análise mais detalhada de alguns modelos teóricos utilizados na interpretação dos resultados experimentais, fornecendo, dessa forma, um maior conhecimento das propriedades físicas dos materiais estudados. / This PhD thesis is an extensive study of the operation mechanisms of polymeric light-emitting devices, with a particular focus on the injection and transport properties of charge-carriers in poly(p-phenylene vinylene), PPV, derivatives. Therefore, it was necessary to dominate all the processes of fabrication and characterization of such devices, from the chemical synthesis of the polymers to the device fabrication, which are briefly described along this work. Two different kinds of devices were studied: polymeric ligh-emitting diodes (PLEDs) composed by a single thin layer (100-500 nm thick) of the pure electroluminescent polymer, and light-emitting electrochemical cells (LECs), which active layers are formed by a blend of the conjugated polymer and an ionic conductive polymeric electrolyte. The optical properties of the devices were analyzed by optical absorption in the ultraviolet-visible range and emission (photo- and electroluminescence) spectra. The charge injection and transport properties were studied by electrical measurements like current-voltage (I-V) curves, impedance spectroscopy in the frequency domain (ac conductivity), photocurrent spectroscopy and electrically detected magnetic resonance (EDMR). The influence of parameters like the device structure, the electrodes work function and the temperature allowed a detailed analysis of some theoretical models commonly used in the interpretation of the experimental results, providing more information about the physical properties of the studied conjugated polymers.

To investigate quantum confinement effects on silicon (Si) light source electroluminescence (EL) properties like quantum efficiency, external power efficiency and spectral emission, thin Si finger junctions with nanometre-scale dimensions were designed and manufactured in a fully customized silicon-on-insulator (SOI) semiconductor production technology. Since commonly available photolithography is unusable to consistently define and align nanometre-scale line-widths accurately and electron-beam lithography (EBL) by itself is too time-expensive to expose complete wafers, the wafer manufacturing process employed a selective combination of photolithography and EBL. The SOI wafers were manufactured in the clean-rooms of both the Carl and Emily Fuchs Institute for Microelectronics (CEFIM) at the University of Pretoria (UP) and the Georgia Institute of Technology’s Microelectronic Research Centre (MiRC), which made a JEOL JBX-9300FS electron-beam pattern generator (EPG) available. As far as is known this was the first project in South Africa (and possibly at the MiRC) that employed EBL to define functional nanometre-scale semiconductor devices. Since no standard process recipe could be employed, the complete design and manufacturing process was based on self-obtained equipment characterization data and material properties. The manufacturing process was unprecedented in both the CEFIM and MiRC clean-rooms. The manufacture of nanometre-scale Si finger junctions not only approached the manufacturing limits of the employed processing machinery, but also had to overcome undesirable physical effects that in larger-scale semiconductor manufacture usually are negligible. The device design, mask layout and manufacturing process therefore had to incorporate various material, equipment limitation and physical phenomena like impurity redistribution occurring during the physical manufacturing process. Although the complicated manufacturing process allowed many unexpected problems to occur, it was expected that at least the simple junction breakdown devices be functional and capable of delivering data regarding quantum confinement effects. Although due to design and processing oversights only 29 out of 505 measured SOI light sources were useful light emitters, the design and manufacture of the SOI light sources was successful in the sense that enough SOI light sources were available to conduct useful optical characterization measurements. In spite of the fact that the functional light sources did not achieve the desired horizontal (width) confinement, measured optical spectra of certain devices indicate that vertical (thickness) confinement had been achieved. All spectrometer-measured thickness-confined SOI light sources displayed a pronounced optical power for 600 nm < λ < 1 μm. The SOI light source with the highest optical power output emitted about 8 times more optical power around λ = 850 nm than a 0.35 μm bulk-CMOS avalanche light-source operating at the same current. Possible explanations for this effect are given. It was shown that the buried oxide (BOX) layer in a SOI process could be used to reflect about 25 % of the light that would usually be lost to downward radiation back up, thereby increasing the external power efficiency of SOI light sources. This document elaborates on the technical objectives, approach, chip and process design, physical wafer manufacture, production process control and measurement of the nanometre-scale SOI light sources. Copyright / Dissertation (MEng)--University of Pretoria, 2010. / Electrical, Electronic and Computer Engineering / unrestricted