We have embarked on a systematic study of novel charge states at oxide interfaces. We have performed pulsed laser deposition (PLD) growth of epitaxial oxide thin films on single crystal oxide substrates. We studied the effects of epitaxial strain and rare-earth composition of the metal oxide thin films. We have successfully created TiO₂ terminated SrTiO₃ (STO) substrates and have grown epitaxial thin films of LaAlO₃ (LAO), LaGaO₃ (LGO), and RAlO₃ on STO using a KrF pulsed excimer laser. Current work emphasizes the importance of understanding the effect of both epitaxial strain and R³+ magnetism on the interface between RAlO₃ and STO. We have demonstrated that the interfaces between LAO/STO and LGO/STO are metallic with carrier concentrations of 1.1 x 10¹⁴ cm[superscript -2] and 4.5 x 10¹⁴ cm[superscript −2], respectively. Rare-earth aluminate films, RAlO₃, with R = Ce, Pr, Nd, Sm, Eu, Gd, and Tb, were also grown on STO. Conducting interfaces were found for R = Pr, Nd and Gd, and the results indicate that for R [does not equal] La the magnetic nature of the R³+ ion causes increased scattering with decreasing temperature that is modeled by the Kondo effect. Epitaxial strain between the polar RAlO₃ films and STO appears to play a crucial role in the transport properties of the metallic interface, where a decrease in the R³+ ion size causes an increase in sheet resistance and an increase in the onset temperatures for increased scattering. / text

No description available.

Spintronics (spin based electronics) is a relatively new topic of research which is important both from the fundamental and technological point of view. In conventional electronics charge of the electron is manipulated and controlled to realize electronic devices. Spintronics uses charge as well as the spin degree of freedom of electrons, which is completely ignored in the charge based devices. This new device concept brings in a whole new set of device possibilities with potential advantages like higher speed, greater efficiency, non-volatility, reduced power consumption etc. The first realization of the spintronic device happened in 1989, owing to the discovery of the Giant Magneto-resistive (GMR) structure showing a large resistance change by the application of an external magnetic field. Nobel Prize in Physics is awarded for this discovery in 2007. In less than ten years, such devices moved from the lab to commercial devices, as read head sensors in hard disc drives. This new sensor led to an unprecedented yearly growth in the area l density of bits in a magnetic disc drive. Since 2005, another spintronic device known as Magnetic Tunnel Junction (MTJ) which shows a better performance replaced the existing GMR structures in the read heads. Another device which can potentially replace Si based Dynamic Random Access Memory (DRAM) is Magneto-resistive Random Access Memory (MRAM). Being magnetic it is non-volatile, which means not only it retains its memory with the power turned off but also there is no constant power required for frequent refreshing. This can save a lot of power(~ 10-15 Watts in a DRAM), which is quite significant amount for any portable device which runs under battery. Prototype of a commercial MRAM is also made during 2004-2005 by Infineon and Freescale Semiconductors. Recent development has shown switching of magnetic moment by spin-polarised currents (known as spin transfer torque), electric fields, and photonic fields. Instead of Oersted field switching in the conventional MRAM devices, spin torque effect can also be used to switch a magnetic element more efficiently. Recently Spin-Torque MRAM has gained lot of interest due to it’s less power consumption during the writing process. A continuous research effort is going on in realizing other proposed spintronic devices, such as Spin Torque Oscillator, Spin Field Effect Transistor , Race Track Memory etc. which are yet to get realized or yet to make their entry in the commercial devices. Spintronics can be divided in to two broad subfields viz.(1) Semiconductor Spintronics and (2) Metallic Spintronics. Most of the devices belong to the second class whereas the former one is rich in fundamental science and not yet cleared its path towards the world of application. Any spintronic device requires ferromagnetic material which is generally the source of spin polarized electrons. For semiconductor spintronic devices, the main obstacle is the non-existence of the ferromagnetic semiconductor above room temperature (RT). So the development in this direction is very much dependent on the material science research and discovery of novel material systems. Almost a decade back, Dilute Magnetic Semiconductors (DMS) are proposed to behaving RT ferromagnetism. As a result an intense theoretical and experimental research is being carried out since then on these materials. Still a general consensus is lacking both in terms of theory as well as experiment. There are many methodologies and thin film deposition protocols have been followed by different research groups to realize spintronic device concepts. The deposition techniques such as magnetron sputtering, molecular beam epitaxy have been found very efficient for growing metallic spintronic devices. For semiconductor spintronics especially in the area of Dilute Magnetic Semiconductors (DMS) pulsed laser ablation is also considered to be a viable technique. Even though pulsed laser ablation is a very powerful technique to prepare stoichiometric multi-component oxide films, it’s viability for the growth of metallic films and multilayer is considered to be limited. In this regard, we have used pulsed laser ablation to prepare pure and Co doped ZnO films, to examine the magnetic and magneto-transport behavior of these oxides. In addition extensive work has been carried out to optimize and reproducibly prepare metallic multilayer by Pulsed Laser Deposition to realize Spin Valve (SV) effect, which proves the viability of this technique for making metallic multilayer. This thesis deals with the study of Pulsed Laser Deposition(PLD) deposited DMSs and metallic SVs. The thesis is organized into seven chapters as described below: • Chapter:1 This chapter gives an introduction to Spintronics and the different device structures. It is followed by a brief description of the motivation of the present work. Since magnetism is at the heart of the spintronics, next we attempt to introduce some of the basic concepts in magnetism, which are related to the topics discussed in the following chapters. We discuss about various exchange interactions responsible for the long range ferromagnetic ordering below Curie temperature in different compounds. Other magnetic properties are also discussed. Then another important phenomenon called magnetic anisotropy is brought in. We discuss the origin of different types of anisotropy in materials. These anisotropies are also responsible for magnetic domain formation. Then a description of the different types of domain walls are introduced. Unlike conventional electronics, spintronics deals with spin polarized current. A short description of spin polarization from the band picture and concept of half-metal is introduced. The next part (Section-I) of this chapter gives an overview of the challenges in semiconductor spintronics. The spin injection efficiency from a ferromagnetic metal to a semiconductor is found to be poor. This problem is attributed to the conductivity mismatch at the interface. DMS materials can be potential candidates in order to solve this problem. Ferromagnetism in these proposed materials cannot be explained in terms of the standard exchange mechanisms. A model was first proposed for the hole doped system based on Zener model. A more apt model for the n-doped high dielectric materials is then proposed based on Bound Magnetic Polarons (BMP). These models for the unusual ferromagnetism are briefly discussed. Although ferromagnetism is observed by different groups, often questions are raised about the intrinsic origin of this behavior and the topic is still under debate. In this study we have tried to correlate the magnetic property with the transport property as the transport properties are generally not affected much by the presence of external impurities and probes the intrinsic property of the material. Transport and the magneto-transport in disordered materials in general are discussed. A specific model proposed for degenerate semiconductors, which is used for fitting our experimental data is explained. As the ferromagnetism in these materials are generally found to be related to the defects, different types of possible defects are described. Section-II deals with the metallic SV devices. In the history of spintronics, this is one of the most basic and most studied structures, but still having a lot of interest both fundamentally and technologically. A brief history of this discovery and a chronological progress in the device structure is discussed. Our work focuses on the metallic spin valve (SV) structures. Different types of SVs and their properties are explained. In a SV structure one of the ferromagnets (FM) is pinned using an adjuscent antiferromagnetic layer by an effect called exchange bias. A brief description of exchange bias and the effects of different parameters is given. This is followed by a discussion about the theory of GMR which deals with the spin dependent scattering at the bulk and at the interfaces, their relative contributions, effect of the band matching etc. A simple resistor model is used to explain the qualitative behavior of these SVs. The chapter is concluded with a brief summery and applications. • Chapter:2 This chapter provides a brief description of some of the experimental apparatus that are used to perform various experiments. The chapter is organized according to the general functionality of the techniques. This includes different thin film deposition techniques which are used depending on the requirements and also for comparing the properties of the samples, grown by different techniques. Structural, spectroscopic, magnetic and different microscopy techniques which are extensively used throughout, are discussed and their working principles are explained. This work also involves nano/microstructuring of devices. Mainly two structuring techniques are used viz. e-beam lithography and optical lithography by laser writer. In this section we will be discussing about these two techniques and other associated techniques like lift-off, etching etc. Effect of different parameters on the device structures are highlighted. • Chapter:3 Chapter-3 deals with the synthesis and characterization of the pure and 5% Co doped ZnO bulk samples. First a brief introduction about the ZnO crystal structure, band structure and other properties are given followed by the synthesis technique followed in our study. Synthesis is done by low temeperature in organic co-precipitation method. This liquid phase synthesis gives better homogeniety. As-grown sample is also sintered at a higher temperature. Structural study confirms the proper synthesis of the intended compound. Spectroscopic as well as magnetic study of the bulk doped sample indicates the presence of Co nano clusters in the low temperature synthesized sample, whereas after sintering indication of Co2+ is observed which reflects in the magnetic property as well. These samples are used as target material for laser ablation. • Chapter:4 Chapter-4 presents the results of the pure and Co doped ZnO thin film samples. Thin films are grown by PLD method on r-plane Sapphire substrates. Details of the growth technique and the deposition parameters are explained. Our result shows that 5% Co doped ZnO thin film is ferromagnetic in nature as expected in a DMS material, although the film is grown using a paramagnetic target. We also report that pure ZnO grown in an oxygen deficient condition giving ferromagnetic behavior. Not only that, the obtained saturation moment is much higher compared to the Co doped sample. We have demonstrated that the FM can be tuned by tuning the oxygen content and FM disappears when the film is annealed in an oxygen environment .But for the Co doped sample magnetic property could not be tuned much as Co doping stabilizes the surface states. To exclude the possibilities of the extrinsic origin we have done a detailed magneto-transport study for both doped and undoped films. For ZnO, we have shown a one to one correlation of the magnetic and magneto-transport data which further supports the fact that the obtained magnetic behavior is intrinsic. Fitting of the magnetorsistance (MR) data for the pure and Co doped ZnO samples is done using a semi-empirical formula, consisting of both positive and negative MR terms originally proposed for degenerate semiconductors .Excellent agreement of the experimental data is found with the formula. For pure ZnO sample we have extracted the mobility, carrier concentration etc .by Hall measurement. The fabrication steps of Hall bar sample which involves optical lithography and ion beam etching are discussed. 3D e-e interaction induced transport mechanism is found to be dominant in case of oxygen deficient pure ZnO. • Chapter:5 Chapter-5 demonstrates the tuning of band gap of ZnO by alloying with MgO. By changing the ZnO:MgO ratio in PLD grown films, we could tune the band gap over a wide range. Composition alanalysis is done by Rutherford Back-Scattering. Structural and spectroscopic studies are carried out, which shows tuning of band gap upon alloying with MgO. We could tune ZnO band gap from 3.3eV to 3.92eV by30% MgO alloying, while retaining the Wurtzite crystal structure. • Chapter:6 Chapter-6 demonstrates the metallic Pseudo Spin Valve (PSV) structures grown by sputtering and by PLD. Main focus of this chapter is to show that, PLD can be aviable technique for making metallic PSV and Spin Valve (SV) structures. This is almost an unexplored technique for growing metallic thin film SVs, as it is evident in the literature. NiFe and Co are used as the soft and hard FM layers respectively, Au and Cu are used as the spacer layer. FeMn is used for pinning the Co layer in case of the SV structures. The first section describes the properties of these materials and then substrate preparation, deposition parameters etc. are explained in details. Properties of sputter deposited PSV structures are also described. Thickness variation of different layers, double PSV structure and angular variation of the MR properties are presented. Generally two measurement geometries are followed for the SV measurements viz.(1) Current In Plane (CIP) and (2) Current Perpendicular to Plane(CPP). We have carried out MR studies in both the measurement geometries. Measurement in CPP geometry is much more involved than CIP and need structuring with multiple lithography steps. CPP measurement geometry scheme and the process steps are discussed. For this measurement a special ac bridge technique is followed which is also discussed. In the next part we have demonstrated PSV and SV structures, grown, using PLD in an Ultra High Vacuum (UHV) system. Not only that, we have obtained a CIPMR as high as 3.3%. PLD is generally thought to be a technique for oxide deposition and metallic multilayers are not deposited due to particulate formation, high enegy of the adatom species which can lead to inter-mixing at the interface etc. But in this study we have shown that by properly tuning the deposition parameters, it is possible to grow SVs using PLD. We have found the roughness of the PLD grown films are much lower compared to the sputtered films. For top SV structures we have obtained exchange bias even in the absence of applied field during deposition. This effect is observed by performing magnetic and magneto-resistance measurements. Effect of different layer thicknesses, field annealing etc. are discussed. Two different spacer layers are used and their properties are compared. We have found that the interface engineered structures are giving highest MR among the different samples. Then a conclusion of our study is presented followed by a discussion on the difficulties and challenges faced for optimizing the PLD grown SVs. • Chapter:7 Finally, in Chapter-7, various results are summarized and a broad outlook is given. Perspectives for the continuation of the present work is also given.

White light emitting diodes (LED) have drawn increasing attention due to their low energy consumption, high efficiency and potential to become primary lighting source by replacing conventional light sources. White light emission is usually generated either by coating yellow phosphor on a blue-LED or blending red, green and blue phosphor in an appropriate ratio. Maintaining appropriate proportions of individual components in the blend is difficult and the major demerit of such system is the overall self-absorption, which changes the solution concentration. This results in uncontrolled changes in the whiteness of the emitted light. Zinc Oxide (ZnO), a wide bandgap semiconductor with a large exciton binding energy at room temperature has been recognized as a promising material for ultraviolet LEDs and laser diodes. Tuning of structural, optical and electrical properties of ZnO thin films by different dopants (Lithium, Indium and Gallium) is dealt in this thesis. The achievement of white light emission from a semiconducting material without using phosphors offers an inexpensive fabrication technology, good luminescence, low turn-on voltage and high efficiency. The present work is organized chapter wise, which has 8 chapters including the summary and future work. Chapter 1: Gives a brief discussion on the overview of ZnO as an optoelectronic material, crystal structure of semiconductor ZnO, the effect of doping, optical properties and its possible applications in optoelectronic devices. Chapter 2: Deals with various deposition techniques used in the present study, includes pulsed laser deposition and thermal evaporation. The experimental set up details and the deposition procedures are described in detail. A brief note on the structural characterization equipments, namely X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS) and the optical characterization techniques namely Raman spectroscopy, transmission spectroscopy and photoluminescence (PL) spectroscopy is presented. The electrical properties of the films were studied by current- voltage, capacitance - voltage and Hall Effect measurements and the experimental details are discussed. Chapter 3: High quality ZnO/Si heterojunctions fabricated by growing ZnO thin films on p-type Si (100) substrate by pulsed laser deposition without using buffer layers are discussed in this chapter. The crystallinity of the heterojunction was analyzed by high resolution X-ray diffraction and atomic force microscopy. The optical quality of the film was analyzed by room temperature (RT) photoluminescence measurements. The high intense band to band emission confirmed the high quality of the ZnO thin films on Si. The electrical properties of the junction were studied by temperature dependent resistivity, current- voltage measurements and RT capacitance-voltage (C-V) analysis. ZnO thin film showed the lowest resistivity of 6.4x10-3 Ω.cm, mobility of 7 cm2/V.sec and charge carrier concentration of 1.58x1019cm-3 at RT. The charge carrier concentration and the barrier height (BH) were calculated to be 9.7x1019cm-3 and 0.6 eV respectively from the C-V plot. The BH and ideality factor, calculated by using the thermionic emission (TE) model were found to be highly temperature dependent. We observed a much lower value in Richardson constant, 5.19x10-7 A/cm2K2 than the theoretical value (32 A/cm2K2) for ZnO. This analysis revealed the existence of a Gaussian distribution (GD) with a standard deviation of σ2=0.035 V. By implementing GD to the TE, the values of BH and Richardson constant were obtained as 1.3 eV and 39.97 A/cm2K2 respectively from the modified Richardson plot. The obtained Richardson constant value is close to the theoretical value for n-ZnO. These high quality heterojunctions can be used for solar cell applications. Chapter 4: This chapter describes the structural and optical properties of Li doped ZnO thin films and the properties of ZnO/Li doped ZnO multilayered thin film structures. Thin films of ZnO, Li doped ZnO (ZLO) and multilayer of ZnO and ZLO (ZnO/ZLO) were grown on silicon and Corning glass substrates by pulsed laser deposition technique. Single phase formation and the crystalline qualities of the films were analyzed by X-ray diffraction and Li composition in the film was investigated to be 15 Wt % by X-ray photoelectron spectroscopy. Raman spectrum reveals the hexagonal wurtzite structure of ZnO, ZLO and ZnO/ZLO multilayer, confirms the single phase formation. Films grown on Corning glass show more than 80 % transmittance in the visible region and the optical band gaps were calculated to be 3.245, 3.26 and 3.22 eV for ZnO, ZLO and ZnO/ZLO respectively. An efficient blue emission was observed in all films that were grown on silicon (100) substrate by photoluminescence (PL). PL measurements at different temperatures reveal that the PL emission intensity of ZnO/ZLO multilayer was weakly dependent on temperature as compared to the single layers of ZnO and ZLO and the wavelength of emission was independent of temperature. Our results indicate that ZnO/ZLO multilayer can be used for the fabrication of blue light emitting diodes. Chapter 5: This chapter is divided in to two parts. The fabrication and characterization of In doped ZnO thin films grown on Corning glass substrate is discussed in the first section. Zinc Oxide (ZnO) and indium doped ZnO (IZO) thin films with different indium compositions were grown by pulsed laser deposition technique. The effect of indium concentration on the structural, morphological, optical and electrical properties of the film was studied. The films were oriented along the c-direction with wurtzite structure and are highly transparent with an average transmittance of more than 80 % in the visible wavelength region. The energy band gap was found to be decreasing with increasing indium concentration. High transparency makes the films useful as optical windows while the high band gap values support the idea that the film could be a good candidate for optoelectronic devices. The value of resistivity observed to be decreasing initially with doping concentration and subsequently increasing. The XPS and Raman spectrum confirm the presence of indium in indium doped ZnO thin films. The photoluminescence spectrum showed a tunable red light emission with different In concentrations. Undoped and In doped ZnO (IZO) thin films were grown on Pt coated silicon substrates (Pt/Si) to fabricate Pt/ZnO:Inx Schottky contacts (SC) is discussed in the second section. The SCs were investigated by conventional two probe current-voltage (I-V) measurement and by the I-V spectroscopy of conductive atomic force microscopy (C-AFM). X-ray diffraction technique was used to examine the thin film quality. Changes in various parameters like Schottky barrier height (SBH) and ideality factor (IF) as a function of temperature were presented. The estimated BH was found to be increasing and the IF was found to be decreasing with increase in temperature. The variation of SBH and IF with temperature has been explained by considering the lateral inhomogeneities in nanometer scale lengths at metal–semiconductor (MS) interface. The inhomogeneities of SBH in nanometer scale length were confirmed by C-AFM. The SBH and IF estimated from I-V spectroscopy of C-AFM showed large deviation from the conventional two probe I-V measurements. IZO thin films showed a decrease in SBH, lower turn on voltage and an enhancement in forward current with increase in In concentration. Chapter 6: In this chapter the properties of Ga doped ZnO thin films with different Ga concentrations along with undoped ZnO as a reference is discussed. Undoped and Ga doped ZnO thin films with different Ga concentrations were grown on Corning glass substrates by PLD. The structural, optical and electrical properties of Ga doped ZnO thin films are discussed. The XRD, XPS and Raman spectrum reveal the phase formation and successful doping of Ga on ZnO. All the films show good transmittance in the visible region and the photoluminescence of Ga doped ZnO showed a stable emission in the blue- green region. The resistivity of Ga doped ZnO thin films was found to be first decreasing and then increasing with increase in Ga concentrations. Chapter 7: The effect of co-doping to ZnO on the structural, optical and electrical properties was described in this chapter. Ga and In co-doped ZnO (GIZO) thin films together with ZnO, In doped ZnO (IZO), Ga doped ZnO (GZO), IZO/GZO multilayer for comparison, were grown on Corning glass and boron doped Si substrates by PLD. GIZO showed better structural, optical and electrical properties compared with other thin films. The Photoluminescence spectra of GIZO showed a strong white light emission and the current-voltage characteristics showed relatively lower turn on voltage and larger forward current. The CIE co-ordinates for GIZO were observed to be (0.31, 0.33) with a CCT of 6650 K, indicating a cool white light and established a possibility of white light emitting diodes. Finally the chapter 8 presents the summary derived out of the work and a few suggestions on future work.

Cette thèse porte sur la synthèse et la caractérisation de nouvelles phases d’oxydes multifonctionnels de la famille Ln2B2O7 avec Ln = lanthanide, B = Ti ; Zr. Ces oxydes présentent de nombreuses propriétés : photocatalytiques, ferroélectriques, piézoélectriques, de luminescence... Sous forme massive, des solutions solides (La1-xLnx)2Ti2O7 avec Ln = Pr à Lu et La2(Ti1-xZrx)2O7 ont été synthétisées par réaction solide-solide. L’étude portant sur la substitution du site Ln a permis de déterminer les limites de stabilité de la phase pérovskite en feuillets en fonction de la nature du lanthanide. Des analyses menées par spectrométrie Raman, ainsi que par spectrofluorimétrie ont mis en évidence des propriétés de luminescence dans les solutions solides (La1-xEux)2Ti2O7 et (La1-xTbx)2Ti2O7, suggérant ainsi la possibilité d’utiliser ces composés pour la fabrication de nouveaux systèmes luminophores. Des couches minces de Ln2Ti2O7 ont été élaborées par ablation laser pulsé, puis caractérisées par diffraction de rayons X haute résolution et par microscopie électronique à transmission haute résolution. Les nouvelles limites de stabilité des films minces à structure pérovskite en feuillets ont pu être déterminées dans le cas de dépôts réalisés sur des substrats de SrTiO3 et LaAlO3 orientés (100) et (110). Le caractère piézoélectrique/ferroélectrique des films de Ln2Ti2O7 cristallisés dans la phase α monoclinique a été confirmé à l’échelle locale par la microscopie à force piézoélectrique. Enfin, nous avons montré que la croissance épitaxiale d’un film de La2Zr2O7 déposé sur SrTiO3-(110) pouvait conduire à l'existence de la ferroélectricité en raison d'une structure pyrochlore géométriquement frustrée et la perte de la symétrie cubique. Ces résultats prometteurs font de ces composés Ln2B2O7 des candidats de premier choix en vue du développement de nouvelles phases oxydes multifonctionnelles. De plus, l’absence de plomb au sein de ces structures, ainsi que leur formidable résistance à la température et à l’irradiation ouvrent des perspectives intéressantes quant à l’utilisation de ces matériaux dans les équipements électroniques et en milieux extrêmes. / This thesis focuses on the synthesis and characterization of new multifunctional Ln2B2O7 oxides phases with Ln = lanthanide, B = Ti, Zr. These oxides possess many properties, including photocatalysis, ferroelectricity, piezoelectricity and luminescence. In bulk form, solid solutions of (La1-xLnx)2Ti2O7 with Ln = Pr to Lu and La2(Ti1-xZrx)2O7 were synthesis by solid-solid reaction. Study on the Ln site substitution highlighted the limits of stability of the layered perovskite depending on the nature of the lanthanide. Analysis carried out by Raman spectroscopy and spectrofluorimetry also permit the detection of luminescence in (La1-xEux)2Ti2O7 and (La1-xTbx)2Ti2O7 solid solutions, suggesting the possibility to use such compounds for fabrication of new phosphor systemes. Ln2Ti2O7 thin films were grown by pulsed laser deposition, and characterized by high resolution X-rays diffraction and high resolution transmission electron microscopy. The new limits of stability of films with layeredperovskite structure have been determined in the case of samples grown on (100)- and (110)-oriented SrTiO3 and LaAlO3 substrates. The piezoelectric/ferroelectrique properties of Ln2Ti2O7 thin films crystallized in the monoclinic α phase were confirmed at the local level by piezoelectric force microscopy measurements. Finally, we have shown the the epitaxial growth of La2Zr2O7 films deposited on (110)-oriented SrTiO3 substrate can induce ferroelectricity for geometrically frustrated pyrochlore structure with the loss of cubic symmetry. These interesting results make Ln2B2O7 compounds promising candidates for the development of new multifunctional oxides. Moreover, the absence of lead in these structures and their resistance to the temperature and irradiation open interesting perspectives for the use of such materials in electronic equipments and in extreme environments.

Cette thèse concerne la réalisation des films minces d’oxydes et l’étude de leurs propriétés physiques pour les cellules photovoltaïques (PV) et les modules thermoélectriques. Dans une première partie, les propriétés de l’oxyde de titane TiOx (1,45<x<2) sont mises en évidence pour une utilisation en tant qu’oxyde transparent conducteur optiquement actif à disposer en face avant des cellules PV ou, comme couche de couplage optique à intercaler entre le métal réflecteur et la couche absorbante d’une cellule PV. Les couches sont déposées par ablation laser pulse (PLD). Cette méthode permet d’obtenir des couches stoechiométriques ou déficitaires en oxygène grâce au contrôle de la pression d’oxygène pendant le dépôt. Les couches sont dopées par Nb pour un gain en conductivité électrique et/ou par Nd pour la conversion des photons UV en photons du Proche IR. Les films d’une part, isolants, transparents et luminescents ou d’autre part, conducteurs et absorbants ont été obtenus. La présence de polarons et/ou de bipolarons dans les couches TiO₁,₄₅₋₁,₆₀ explique la discontinuité observée sur leurs courbes de thermoconductivité. Une seconde partie du manuscrit concerne la thermoelectricité ou il est question de modifier les propriétés des cobaltites de calcium pour la conversion en énergie électrique des gradients de température faibles, centres autour de 300-365 K. Le contrôle de la concentration en oxygène des films a permis d’obtenir les phases polymorphes CaxCoO₂, Ca₃Co₄O₉, et Ca₃Co₄O₆,₄₋₆,₈ présentant des comportements semiconducteurs ou métalliques en fonction de la température de dépôt. Les films Ca₃Co₄O₆,₄₋₆,₈ montrent de faibles résistivités (3,8-6 mΩ.cm) et des coefficients de Seebeck élevés (S) ≥ 1000 μV/K qui doivent être confirmes pour que de tels films soient utilisés dans les thermogénérateurs. / This thesis concerns the realization of oxide thin films and the study of their properties for photovoltaic or thermoelectric devices. In the first part, the TiOx properties are studied for use as an optically active transparent conductive oxide to put in front of the PV cells or, as optical coupling layer to interpose between the metal reflector and the absorbent layer of a PV cell. The layers are deposited by pulsed laser deposition (PLD). This method allows to get stoichiometric or oxygen deficient layers by controlling the oxygen partial pressure during the growth. The layers are doped with Nb to enhance electrical conductivity and/or with Nd for the conversion of Ultra-Violet photons to Near Infra-Red photons. Insulating and transparent layers, luminescent layers or conducting and absorbent layers are obtained. The TiO₁,₄₅₋₁,₆₀ films show polaronic or bipolaronic conductivity and exhibited the jump of electrical conductivity with jump height and temperature depending on the nature of the dopants. A second part of the manuscript concerns thermoelectricity in which the properties of cobalt calcium oxide are modulated for an efficient conversion of low temperature gradients centered at 300-365K. The control of the oxygen concentration of films allows to obtain the polymorphic phases CaxCoO₂,Ca₃Co₄O₉ and Ca₃Co₄O₆,₄₋₆,₈ having metallic or semiconducting behavior depending on the deposition temperature. The Ca₃Co₄O₆,₄₋₆,₈ films show high Seebeck coefficients (S) ≥ 1 000 μV/K and low electrical resistivity (3.8 to 6 mΩ.cm). Such interesting values have to be confirmed by additional experiments in order to be used as thermoelectric films.

Die vorliegende Arbeit befasst sich mit der Untersuchung von Schottky-Kontakten auf halbleitenden Zinkoxid- und β-Galliumoxid-Dünnfilmen. Nach einer kurzen Einführung in die verwendeten Materialsysteme und die Theorie von Schottky-Kontakten werden die Eigenschaften von verschiedenartig hergestellten Schottky-Kontakten auf Zinkoxid aufgezeigt. Dazu werden typischerweise Strom-Spannungs- und Kapazitäts-Spannungs-Messungen genutzt. Für die Zinkoxid-basierten Schottky-Kontakte konnte anhand verschiedenartig hergestellter Schottky-Kontakte gezeigt werden, dass deren Barrierenformation maßgeblich von Sauerstoffvakanzen nahe der Metall-Halbleiter-Grenzfläche beeinflusst wird. Zur Realisierung von Galliumoxid-basierten Schottky-Kontakten wurden zunächst die Eigenschaften von undotierten und Silizium-dotierten Galliumoxid-Dünnfilmen untersucht. Diese Dünnfilme sind mittels gepulster Laserabscheidung auf c-plane Saphir hergestellt. Als Prozessparameter sind in dieser Arbeit die Wachstumstemperatur, der Sauerstoffpartialdruck in der Kammer und der Silizumgehalt bspw. in Bezug auf Leitfähigkeit, Oberflächenmorphologie oder Kristallinität zur Realisierung von Schottky-Kontakten optimiert. Auf diesen Dünnfilmen wurden mit verschiedenen Herstellungsverfahren, wie thermischer Verdampfung, (reaktiver) Kathodenzerstäubung oder (reaktiver) Distanz-Kathodenzerstäubung, Metall- bzw. Metalloxid-Schottky-Kontakte aufgebracht. Dabei werden unter anderem die elektrischen Eigenschaften direkt nach der Herstellung und deren Entwicklung im weiteren zeitlichen Verlauf untersucht. Des Weiteren werden die Temperaturstabilität oder aber die Spannungsstabilität der Schottky-Kontakte studiert. Ein Vergleich zu Schottky-Kontakten auf β-Galliumoxid-Volumenmaterial wird anhand mittels reaktiver Distanz-Kathodenzerstäubung hergestellter Platinoxid-Dioden durchgeführt.

Die vorliegende Arbeit behandelt die Herstellung und optische Untersuchung von Halbleiterheterostrukturen, genauer Mikrokavitäten, in denen ein Bose–Einstein Kondensat (BEK) von sogenannten Exziton-Polaritonen im Festkörper erzeugt und beobachtet werden soll. Diese Strukturen bestehen aus zwei hochreflektierenden Braggspiegeln (BS) und einer ZnO-Kavität als aktivem Material. Zunächst wurde die Abscheidung der BS hinsichtlich genauer Schichtdickenkontrolle und Reproduzierbarkeit verbessert. Um Kavitätsschichten hinreichender Qualität herzustellen, wurden mehrere Ansätze zur Optimierung dieser planaren Schichtabscheidung mittels gepulster Laserdeposition verfolgt. Dabei kamen Techniken, wie das Ausheizen der Proben oder deren Glättung durch Ionenstrahlbeschuß zum Einsatz, um die elektronischen Eigenschaften bzw. die Oberflächen der Kavitätsschichten erheblich zu verbessern. Desweiteren wurde erfolgreich ein Verfahren entwickelt, freistehende, nahezu einkristalline ZnO-Nanodrähte mit Braggspiegeln zu ummanteln. Alle hergestellten Strukturen wurden in ihren strukturellen Eigenschaften, speziell hinsichtlich ihrer Rauhigkeit und Kristallinität, verglichen und mittels orts- und/oder winkelaufgelöster Photolumineszenzspektroskopie sowie Reflexionsmessungen bezüglich ihrer optischen Eigenschaften untersucht. Dabei konnte in fast allen Proben die starke Kopplung, welche die Grundlage für ein BEK darstellt, gezeigt werden. Hinweise für eine höhere Kopplungsstärke in den Nanodraht-basierten Mikrokavitäten wurden gefunden. Der Nachweis von BEK bis nahe Raumtemperatur gelang an der vielversprechendsten planaren Probe, die einen Qualitätsfaktor von ca. 1000 aufweist. Die Eigenschaften des BEK wurden für verschiedene Temperaturen und Detunings untersucht. Es hat sich gezeigt, daß ein negatives Detuning unerläßlich für die Bildung eines BEK in ZnO-basierten Mikrokavitäten ist. Die Impulsraumverteilung der Kondensat-Polaritonen läßt auf ausgeprägte dynamische Eigenschaften dieser Teilchen bei tiefen Temperaturen schließen. / The present work covers the fabrication and optical investigation of semiconductor microcavities for Bose–Einstein condensation (BEC) of exciton-polaritons. These microcavities consist of highly reflective distributed Bragg reflectors (DBR) surrounding a ZnO-cavity as active medium. In the first step, the growth of DBRs was optimised with respect to exact thickness control and high reproducibility. For the active material, several growth strategies have been pursued, in order to optimise the conditions for the growth of planar thin films by pulsed laser deposition. Techniques like annealing or ion beam smoothing were successfuly applied in order to either improve the electronic properties or decrease the roughness of the ZnO-cavity layer. Furthermmore, a successful technology was developed in order to coat highly-crstalline free-standing ZnO nanowires with concentrical DBR shells. All samples have been investigated regarding their roughness and crystallinity as well as their optical properties. For the latter spatially and/or angular-resolved photoluminescence spectroscopy and reflection measurements have been carried out. Thereby, the strong coupling regime – being prerequisite for BEC – could be demonstrated in almost all of the synthesized structures. For the nanowire-based microcavities hints for an enhanced coupling strength have been found. In one of the planar samples, showing the high quality factor of 1000, the formation of BEC almost up to room temperature was observed and was studied as a function of temperature and detuning. Negative detuning was found to be mandatory for the formation of a BEC in ZnO-based microcavities. The distinct momentum- respective in-plane wavevector distribution of the condensate polaritons revealed a strong dynamic character of these particles at low temperatures.

In dieser Arbeit werden die Auswirkungen epitaktischer Dehnung auf die Eigenschaften ferromagnetischer und ferroelektrischer Perowskitschichten untersucht. Dazu wird der biaxiale Dehnungszustand einer Schicht reversibel verändert, indem einkristalline piezoelektrische Pb(Mg1/3Nb2/3)0.72Ti0.28O3 (001) Substrate (PMN-PT) verwendet werden. Ergänzt werden die Messungen mit dieser “dynamischen” Methode durch Untersuchungen an statisch gedehnten Schichten, gewachsen auf LaAlxSc1-xO3-Pufferschichten mit gezielt abgestimmter Gitterfehlpassung. Drei verschiedene Materialsysteme werden studiert: die ferromagnetischen Oxide La0.8Sr0.2CoO3 und SrRuO3 und das ferroelektrische Pb(Zr,Ti)O3. Für La0.8Sr0.2CoO3 wird ein dehnungsinduzierter Übergang von der bekannten ferromagnetischen Phase zu einer magnetisch weniger geordneten, spinglasartigen Phase nachgewiesen. Es ergeben sich keine Hinweise auf eine Beeinflussung des Co-Spinzustandes. In epitaktischen SrRuO3-Schichten bewirkt eine Zugdehnung einen strukturellen Phasenübergang von der orthorhombischen Bulk-Phase zu einer out-of-plane orientierten tetragonalen Phase. Die leichte Richtung liegt in der Ebene. Reversible Dehnungsmessungen zeigen einen deutlichen Einfluss auf die ferromagnetische Ordnungstemperatur und deuten auf eine geringe Veränderung des magnetischen Moments hin. Der Dehnungseffekt auf die elektrischen Transporteigenschaften wird bestimmt. Pb(Zr,Ti)O3 wird als ferroelektrisches Standardmaterial genutzt, um erstmalig den Einfluss biaxialer Dehnung auf das ferroelektrische Schaltverhalten dünner Schichten zu untersuchen. Für kleine elektrische Felder zeigen die Messungen das typische Verhalten einer gepinnten Domänenwandbewegung. Hier wird der Schaltvorgang unter Piezokompression stark beschleunigt. Werden an die elektrischen Kontakte größere elektrische Felder angelegt, geht die Domänenwandbewegung in das Depinning-Regime über. Die Schaltkinetik wird in diesem Bereich unter Piezokompression leicht verlangsamt. / In this work, the effect of epitaxial strain on the properties of ferromagnetic and ferroelectric perovskite thin films is studied. Single-crystalline piezoelectric Pb(Mg1/3Nb2/3)0.72Ti0.28O3 (001) substrates (PMN-PT) are utilized to reversibly change the biaxial strain state of the films. The measurements performed by this “dynamic” approach are complemented by studying statically strained films grown on LaAlxSc1-xO3 buffer layers with deliberately tuned lattice misfit. Three different material systems are investigated: the ferromagnetic oxides La0.8Sr0.2CoO3 and SrRuO3 and the ferroelectric compound Pb(Zr,Ti)O3. In case of La0.8Sr0.2CoO3 a strain-induced transition from the known ferromagnetic phase to a magnetically less ordered spinglas-like phase is observed. No indications for an effect on the Co spin state are found. In epitaxial SrRuO3 films tensile strain is causing a structural phase transition from the bulk-like orthorhombic structure to an out-of-plane oriented tetragonal phase. The magnetic easy axis is in the film plane. Reversible strain experiments show a significant effect on the ferromagnetic ordering temperature and point to a small change of the magnetic moment. The strain effect on the electric transport properties is also determined. Pb(Zr,Ti)O3 as a standard ferroelectric material is used to study the influence of biaxial strain on the ferroelectric switching behaviour of thin films for the first time. At small electric fields the measurements reveal the typical signs of creep-like domain wall motion caused by wall pinning. In this regime the switching process is accelerated strongly under piezo-compression. For higher electric fields a transition of the domain wall motion to the depinning regime is observed. Here, the switching kinetics is slowed down moderately by compressive strain.

In dieser Arbeit werden die Auswirkungen epitaktischer Dehnung auf die Eigenschaften ferromagnetischer und ferroelektrischer Perowskitschichten untersucht. Dazu wird der biaxiale Dehnungszustand einer Schicht reversibel verändert, indem einkristalline piezoelektrische Pb(Mg1/3Nb2/3)0.72Ti0.28O3 (001) Substrate (PMN-PT) verwendet werden. Ergänzt werden die Messungen mit dieser “dynamischen” Methode durch Untersuchungen an statisch gedehnten Schichten, gewachsen auf LaAlxSc1-xO3-Pufferschichten mit gezielt abgestimmter Gitterfehlpassung. Drei verschiedene Materialsysteme werden studiert: die ferromagnetischen Oxide La0.8Sr0.2CoO3 und SrRuO3 und das ferroelektrische Pb(Zr,Ti)O3. Für La0.8Sr0.2CoO3 wird ein dehnungsinduzierter Übergang von der bekannten ferromagnetischen Phase zu einer magnetisch weniger geordneten, spinglasartigen Phase nachgewiesen. Es ergeben sich keine Hinweise auf eine Beeinflussung des Co-Spinzustandes. In epitaktischen SrRuO3-Schichten bewirkt eine Zugdehnung einen strukturellen Phasenübergang von der orthorhombischen Bulk-Phase zu einer out-of-plane orientierten tetragonalen Phase. Die leichte Richtung liegt in der Ebene. Reversible Dehnungsmessungen zeigen einen deutlichen Einfluss auf die ferromagnetische Ordnungstemperatur und deuten auf eine geringe Veränderung des magnetischen Moments hin. Der Dehnungseffekt auf die elektrischen Transporteigenschaften wird bestimmt. Pb(Zr,Ti)O3 wird als ferroelektrisches Standardmaterial genutzt, um erstmalig den Einfluss biaxialer Dehnung auf das ferroelektrische Schaltverhalten dünner Schichten zu untersuchen. Für kleine elektrische Felder zeigen die Messungen das typische Verhalten einer gepinnten Domänenwandbewegung. Hier wird der Schaltvorgang unter Piezokompression stark beschleunigt. Werden an die elektrischen Kontakte größere elektrische Felder angelegt, geht die Domänenwandbewegung in das Depinning-Regime über. Die Schaltkinetik wird in diesem Bereich unter Piezokompression leicht verlangsamt.:1 Einführung 1.1 Motivation 1.2 Methodik 1.3 Übersicht 2 Probenherstellung und -charakterisierung 2.1 Gepulste Laserdeposition 2.1.1 Prinzip 2.1.2 Aufbau 2.1.3 RHEED 2.1.4 Optimierung des Schichtwachstums 2.1.5 Targets 2.1.6 Substrate 2.2 Röntgendiffraktion 2.2.1 Röntgenmethoden 2.2.2 Röntgenreflektometrie 2.3 SQUID-Magnetometrie 2.4 Rasterkraftmikroskopie 2.5 Transportmessungen 2.6 Elektrische Polarisationsmessungen 3 PMN-PT 3.1 PMN-PT als piezoelektrisches Dünnschicht-Substrat 3.2 PMN-PT als Piezoaktuator 3.3 Temperaturabhängigkeit der Piezodehnung 3.4 Dehnungsübertragung in die Schicht 4 Puffersysteme 4.1 Motivation 4.2 LaAlxSc1−xO3 4.3 BaxSr1−xTiO3 5 Dehnungseinfluss auf ferromagnetische Filme - La0.8Sr0.2CoO3 5.1 Grundlagen zu La1−xSrxCoO3 5.1.1 Struktur 5.1.2 Spinzustand 5.1.3 Magnetische Wechselwirkungen / Doppelaustausch 5.1.4 Phasendiagramm / magnetische Phasenseparation 5.2 Messungen 5.2.1 Gitter- und Mikrostruktur 5.2.2 Curie-Temperatur 5.2.3 Magnetoelastischer Effekt 5.2.4 Magnetisierungsschleifen 5.2.5 elektrischer Transport 5.3 Zusammenfassung und Ausblick 6 Dehnungseinfluss auf ferromagnetische Filme - SrRuO3 6.1 Grundlagen zu SrRuO3 6.1.1 Struktur 6.1.2 Magnetismus 6.1.3 Elektrischer Transport 6.2 Messungen 6.2.1 Gitter- und Mikrostruktur 6.2.2 Magnetismus 6.2.3 Elektrischer Transport 6.3 Zusammenfassung und Ausblick 7 Dehnungseinfluss auf ferroelektrische Filme - PbZr1−xTixO3 7.1 Grundlagen 7.1.1 PbZr1−xTixO3 7.1.2 Elektrische Polarisation 7.1.3 Koerzitivfeld 7.1.4 Domänendynamik 7.2 Messungen 7.2.1 Gitterstruktur 7.2.2 Standardcharakterisierung: Dehnungseinfluss auf die remanente Polarisation Pr und das Koerzitivfeld EC 7.2.2.1 Statische Messungen 7.2.2.2 Dehnungsmessungen 7.2.3 PUND-Messungen: Dehnungseinfluss auf die charakteristische Schaltzeit tsw 7.3 Zusammenfassung und Ausblick 8 Zusammenfassung / In this work, the effect of epitaxial strain on the properties of ferromagnetic and ferroelectric perovskite thin films is studied. Single-crystalline piezoelectric Pb(Mg1/3Nb2/3)0.72Ti0.28O3 (001) substrates (PMN-PT) are utilized to reversibly change the biaxial strain state of the films. The measurements performed by this “dynamic” approach are complemented by studying statically strained films grown on LaAlxSc1-xO3 buffer layers with deliberately tuned lattice misfit. Three different material systems are investigated: the ferromagnetic oxides La0.8Sr0.2CoO3 and SrRuO3 and the ferroelectric compound Pb(Zr,Ti)O3. In case of La0.8Sr0.2CoO3 a strain-induced transition from the known ferromagnetic phase to a magnetically less ordered spinglas-like phase is observed. No indications for an effect on the Co spin state are found. In epitaxial SrRuO3 films tensile strain is causing a structural phase transition from the bulk-like orthorhombic structure to an out-of-plane oriented tetragonal phase. The magnetic easy axis is in the film plane. Reversible strain experiments show a significant effect on the ferromagnetic ordering temperature and point to a small change of the magnetic moment. The strain effect on the electric transport properties is also determined. Pb(Zr,Ti)O3 as a standard ferroelectric material is used to study the influence of biaxial strain on the ferroelectric switching behaviour of thin films for the first time. At small electric fields the measurements reveal the typical signs of creep-like domain wall motion caused by wall pinning. In this regime the switching process is accelerated strongly under piezo-compression. For higher electric fields a transition of the domain wall motion to the depinning regime is observed. Here, the switching kinetics is slowed down moderately by compressive strain.:1 Einführung 1.1 Motivation 1.2 Methodik 1.3 Übersicht 2 Probenherstellung und -charakterisierung 2.1 Gepulste Laserdeposition 2.1.1 Prinzip 2.1.2 Aufbau 2.1.3 RHEED 2.1.4 Optimierung des Schichtwachstums 2.1.5 Targets 2.1.6 Substrate 2.2 Röntgendiffraktion 2.2.1 Röntgenmethoden 2.2.2 Röntgenreflektometrie 2.3 SQUID-Magnetometrie 2.4 Rasterkraftmikroskopie 2.5 Transportmessungen 2.6 Elektrische Polarisationsmessungen 3 PMN-PT 3.1 PMN-PT als piezoelektrisches Dünnschicht-Substrat 3.2 PMN-PT als Piezoaktuator 3.3 Temperaturabhängigkeit der Piezodehnung 3.4 Dehnungsübertragung in die Schicht 4 Puffersysteme 4.1 Motivation 4.2 LaAlxSc1−xO3 4.3 BaxSr1−xTiO3 5 Dehnungseinfluss auf ferromagnetische Filme - La0.8Sr0.2CoO3 5.1 Grundlagen zu La1−xSrxCoO3 5.1.1 Struktur 5.1.2 Spinzustand 5.1.3 Magnetische Wechselwirkungen / Doppelaustausch 5.1.4 Phasendiagramm / magnetische Phasenseparation 5.2 Messungen 5.2.1 Gitter- und Mikrostruktur 5.2.2 Curie-Temperatur 5.2.3 Magnetoelastischer Effekt 5.2.4 Magnetisierungsschleifen 5.2.5 elektrischer Transport 5.3 Zusammenfassung und Ausblick 6 Dehnungseinfluss auf ferromagnetische Filme - SrRuO3 6.1 Grundlagen zu SrRuO3 6.1.1 Struktur 6.1.2 Magnetismus 6.1.3 Elektrischer Transport 6.2 Messungen 6.2.1 Gitter- und Mikrostruktur 6.2.2 Magnetismus 6.2.3 Elektrischer Transport 6.3 Zusammenfassung und Ausblick 7 Dehnungseinfluss auf ferroelektrische Filme - PbZr1−xTixO3 7.1 Grundlagen 7.1.1 PbZr1−xTixO3 7.1.2 Elektrische Polarisation 7.1.3 Koerzitivfeld 7.1.4 Domänendynamik 7.2 Messungen 7.2.1 Gitterstruktur 7.2.2 Standardcharakterisierung: Dehnungseinfluss auf die remanente Polarisation Pr und das Koerzitivfeld EC 7.2.2.1 Statische Messungen 7.2.2.2 Dehnungsmessungen 7.2.3 PUND-Messungen: Dehnungseinfluss auf die charakteristische Schaltzeit tsw 7.3 Zusammenfassung und Ausblick 8 Zusammenfassung